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TW200509316A - Multi-bit vertical memory cell and manufacturing method thereof - Google Patents

Multi-bit vertical memory cell and manufacturing method thereof

Info

Publication number
TW200509316A
TW200509316A TW092122631A TW92122631A TW200509316A TW 200509316 A TW200509316 A TW 200509316A TW 092122631 A TW092122631 A TW 092122631A TW 92122631 A TW92122631 A TW 92122631A TW 200509316 A TW200509316 A TW 200509316A
Authority
TW
Taiwan
Prior art keywords
conductive layer
trench
bit
layer
memory cell
Prior art date
Application number
TW092122631A
Other languages
Chinese (zh)
Other versions
TWI229923B (en
Inventor
Ching-Nan Hsiao
Chi-Hui Lin
Ying-Cheng Chuang
Original Assignee
Nanya Technology Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nanya Technology Corp filed Critical Nanya Technology Corp
Priority to TW92122631A priority Critical patent/TWI229923B/en
Publication of TW200509316A publication Critical patent/TW200509316A/en
Application granted granted Critical
Publication of TWI229923B publication Critical patent/TWI229923B/en

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  • Non-Volatile Memory (AREA)
  • Semiconductor Memories (AREA)

Abstract

The present invention provides a multi-bit vertical memory cell including following manufacturing processes: to first provide a semiconductor substrate having a trench, to form a first doped region in the semiconductor substrate on the trench bottom, to form a bit-line insulation layer on the first doped region, and to form a first conductive layer as the floating gate on the bit-line insulation layer with the first conductive layer located on the sidewall of the trench; then, to form an insulation layer on the first conductive layer and a second conductive layer as the floating gate on the insulation layer, while proceeding ion doping step onto the surface of semiconductor substrate to form a second doped region; then to form a dielectric layer on the sidewall of the first conductive layer and the second conductive layer and fill a third conductive layer into the trench as the control gate.
TW92122631A 2003-08-18 2003-08-18 Multi-bit vertical memory cell TWI229923B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW92122631A TWI229923B (en) 2003-08-18 2003-08-18 Multi-bit vertical memory cell

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW92122631A TWI229923B (en) 2003-08-18 2003-08-18 Multi-bit vertical memory cell

Publications (2)

Publication Number Publication Date
TW200509316A true TW200509316A (en) 2005-03-01
TWI229923B TWI229923B (en) 2005-03-21

Family

ID=36083229

Family Applications (1)

Application Number Title Priority Date Filing Date
TW92122631A TWI229923B (en) 2003-08-18 2003-08-18 Multi-bit vertical memory cell

Country Status (1)

Country Link
TW (1) TWI229923B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI606578B (en) * 2016-07-18 2017-11-21 新唐科技股份有限公司 Non-volatile memory array and method of fabricating the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI606578B (en) * 2016-07-18 2017-11-21 新唐科技股份有限公司 Non-volatile memory array and method of fabricating the same

Also Published As

Publication number Publication date
TWI229923B (en) 2005-03-21

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Legal Events

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