TR201009280T1 - Rastlantısal geometriye sahip olan nesnelerin topografyalarının elde edilmesi. - Google Patents
Rastlantısal geometriye sahip olan nesnelerin topografyalarının elde edilmesi.Info
- Publication number
- TR201009280T1 TR201009280T1 TR2010/09280T TR201009280T TR201009280T1 TR 201009280 T1 TR201009280 T1 TR 201009280T1 TR 2010/09280 T TR2010/09280 T TR 2010/09280T TR 201009280 T TR201009280 T TR 201009280T TR 201009280 T1 TR201009280 T1 TR 201009280T1
- Authority
- TR
- Turkey
- Prior art keywords
- sensor system
- angle
- field
- objects
- difference
- Prior art date
Links
- 238000012876 topography Methods 0.000 title abstract 2
- 230000003287 optical effect Effects 0.000 abstract 3
- 238000000034 method Methods 0.000 abstract 2
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F42—AMMUNITION; BLASTING
- F42B—EXPLOSIVE CHARGES, e.g. FOR BLASTING, FIREWORKS, AMMUNITION
- F42B35/00—Testing or checking of ammunition
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Steroid Compounds (AREA)
Abstract
Bir nesnenin bir yüzey görüntüsünü elde etmek için optik bir sensor sistemi üzerinde konumlandırılması için bir metot tarif edilmektedir, bu sensor sistemi bu nesnenin sensor sisteminin optik eksenine dik olan bir motor ekseni etrafında döndürülmesi ve nesnenin X, Y ve Z doğrultularında çevrilmesi için bir motor setine sahip olup, bu metot: (a) sensor sisteminin bir goruş alanındaki bir alanın kabartma haritasının elde edilmesi; (b) alanın kabartma haritasının topografyasının normal bir örneğinin hesaplanması; (c) sensor sisteminin normal ve optik ekseni arasındaki bir açı farkının belirlenmesi; (d) alan yüzeyinin sensor eksenine dik olup olmadığını belirlemek için açı farkının bir eşik açısıyla karşılaştırılması; (e) açı farkının eşik açısından buyuk olması durumunda, eşik açısından daha kuçuk olan yeni bir fark açısının elde edilmesi için nesnenin döndürülmesi; ve (f) döndürme işlemi alanın yerini değiştirdikten sonra goruş alanındaki alanın normal duruma getirilmesi için nesnenin çevrilmesini içermektedir.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US5387408P | 2008-05-16 | 2008-05-16 |
Publications (1)
Publication Number | Publication Date |
---|---|
TR201009280T1 true TR201009280T1 (tr) | 2011-09-21 |
Family
ID=41315851
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TR2010/09280T TR201009280T1 (tr) | 2008-05-16 | 2009-05-15 | Rastlantısal geometriye sahip olan nesnelerin topografyalarının elde edilmesi. |
Country Status (12)
Country | Link |
---|---|
US (1) | US8139230B2 (tr) |
EP (1) | EP2277001B1 (tr) |
CN (1) | CN102027316B (tr) |
AU (1) | AU2009245974B2 (tr) |
BR (1) | BRPI0912742B1 (tr) |
CA (1) | CA2722154C (tr) |
ES (1) | ES2667032T3 (tr) |
MX (1) | MX2010012506A (tr) |
RU (1) | RU2502953C2 (tr) |
TR (1) | TR201009280T1 (tr) |
WO (1) | WO2009137937A1 (tr) |
ZA (1) | ZA201007750B (tr) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB0811985D0 (en) * | 2008-07-01 | 2008-07-30 | Univ Huddersfield | Surface analysis apparatus and method |
TR201208652T2 (tr) * | 2010-04-08 | 2013-01-21 | Forensic Technology Wai, Inc. | Çizik ve çentik içeren bir nesnenin modifiye edilmiş 3b görüntüsünün üretilmesi |
ES2877098T3 (es) * | 2010-05-03 | 2021-11-16 | Ultra Electronics Forensic Tech Inc | Vinculación de microscopios para el análisis de objetos que comprenden marcas de herramientas |
RU2557674C2 (ru) * | 2010-06-16 | 2015-07-27 | Ультра Элетроникс Форенсик Текнолоджи Инк. | Получение пространственных топографических изображений следов от инструмента с использованием нелинейного фотометрического стерео способа |
CN103837102B (zh) * | 2014-03-13 | 2017-11-24 | 中国科学院光电技术研究所 | 一种测量圆形光学平面表面粗糙度的取样方法 |
CN111442738B (zh) * | 2020-03-23 | 2020-11-03 | 四川大学 | 一种子弹壳底火三维痕迹特征采集装置及方法 |
US11748871B2 (en) * | 2020-09-28 | 2023-09-05 | KLA Corp. | Alignment of a specimen for inspection and other processes |
US11328409B2 (en) * | 2020-09-30 | 2022-05-10 | Mitutoyo Corporation | System and method utilizing multi-point autofocus to align an optical axis of an optical assembly portion to be normal to a workpiece surface |
CN114061485A (zh) * | 2021-11-17 | 2022-02-18 | 桂林欧瑞德科技有限责任公司 | 一种自动调整激光入射角的控制装置及其使用方法 |
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US3800074A (en) | 1972-06-28 | 1974-03-26 | Nasa | Apparatus for scanning the surface of a cylindrical body |
US4339745A (en) | 1980-05-14 | 1982-07-13 | General Electric Company | Optical character recognition |
US5390108A (en) | 1991-05-24 | 1995-02-14 | Forensic Technology Wai Inc. | Computer automated bullet analysis apparatus |
RU2084820C1 (ru) * | 1992-04-15 | 1997-07-20 | Волжское объединение по производству легковых автомобилей "АвтоВАЗ" | Способ ориентации инструмента манипулятора относительно поверхности |
US5379106A (en) * | 1992-04-24 | 1995-01-03 | Forensic Technology Wai, Inc. | Method and apparatus for monitoring and adjusting the position of an article under optical observation |
TW283201B (tr) * | 1993-08-13 | 1996-08-11 | Ricoh Kk | |
CA2207454C (en) | 1995-01-03 | 2000-08-01 | Forensic Technology Wai Inc. | Fired cartridge examination method and imaging apparatus |
US5844670A (en) * | 1995-07-28 | 1998-12-01 | Ricoh Co., Ltd. | Method of and systems for measuring eccentricity of an aspherical lens surface |
JP3403875B2 (ja) | 1995-10-16 | 2003-05-06 | 大日本スクリーン製造株式会社 | 三次元計測方法および表示方法、ならびに三次元計測装置 |
US5760906A (en) * | 1995-12-27 | 1998-06-02 | Technology Research Association Of Medical And Welfare Apparatus | Shape measurement apparatus and method |
JP3309743B2 (ja) * | 1996-11-27 | 2002-07-29 | 富士ゼロックス株式会社 | 形状測定方法及び装置 |
JPH1151624A (ja) * | 1997-08-04 | 1999-02-26 | Canon Inc | 面形状測定装置 |
RU2130628C1 (ru) * | 1997-08-06 | 1999-05-20 | Дереновский Михаил Ефимович | Способ получения изображения развертки поверхности пуль и гильз нарезного стрелкового оружия, устройство для получения изображения развертки цилиндрических тел |
CA2370156C (en) * | 1999-04-30 | 2009-02-17 | Christoph Wagner | Method for optically detecting the shape of objects |
IL130465A0 (en) * | 1999-06-14 | 2000-06-01 | Prolaser Ltd | Method and apparatus for measuring power of an optical element for its mapping |
US6505140B1 (en) | 2000-01-18 | 2003-01-07 | Intelligent Automation, Inc. | Computerized system and method for bullet ballistic analysis |
JP4010753B2 (ja) * | 2000-08-08 | 2007-11-21 | 株式会社リコー | 形状計測システムと撮像装置と形状計測方法及び記録媒体 |
DE10159666A1 (de) * | 2000-12-05 | 2002-07-11 | Sankyo Seiki Seisakusho Kk | Vorrichtung und Verfahren zur Messung der Oberflächenform |
BE1014222A3 (fr) * | 2001-06-13 | 2003-06-03 | Ct Rech Metallurgiques Asbl | Procede de caracterisation en ligne d'une surface en mouvement et dispositif pour sa mise en oeuvre. |
JP3999063B2 (ja) * | 2002-07-12 | 2007-10-31 | 株式会社リコー | 三次元測定機、三次元測定機の校正方法及び該方法を実行するためのプログラムを格納したコンピュータ読み取り可能な記憶媒体 |
JP3923945B2 (ja) * | 2004-01-13 | 2007-06-06 | 三鷹光器株式会社 | 非接触表面形状測定方法 |
CN101076833A (zh) * | 2004-12-14 | 2007-11-21 | 阿克佐诺贝尔国际涂料股份有限公司 | 用于测量涂膜的粗糙度的方法和装置 |
GB2422015B (en) * | 2005-02-01 | 2007-02-28 | Taylor Hobson Ltd | A metrological instrument |
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-
2009
- 2009-05-15 TR TR2010/09280T patent/TR201009280T1/tr unknown
- 2009-05-15 RU RU2010151627/28A patent/RU2502953C2/ru active
- 2009-05-15 WO PCT/CA2009/000677 patent/WO2009137937A1/en active Application Filing
- 2009-05-15 BR BRPI0912742-9A patent/BRPI0912742B1/pt active IP Right Grant
- 2009-05-15 EP EP09745352.6A patent/EP2277001B1/en active Active
- 2009-05-15 AU AU2009245974A patent/AU2009245974B2/en active Active
- 2009-05-15 US US12/466,847 patent/US8139230B2/en active Active
- 2009-05-15 MX MX2010012506A patent/MX2010012506A/es active IP Right Grant
- 2009-05-15 CN CN2009801173842A patent/CN102027316B/zh not_active Expired - Fee Related
- 2009-05-15 CA CA2722154A patent/CA2722154C/en active Active
- 2009-05-15 ES ES09745352.6T patent/ES2667032T3/es active Active
-
2010
- 2010-10-29 ZA ZA2010/07750A patent/ZA201007750B/en unknown
Also Published As
Publication number | Publication date |
---|---|
BRPI0912742B1 (pt) | 2019-06-18 |
EP2277001A1 (en) | 2011-01-26 |
EP2277001A4 (en) | 2016-09-21 |
AU2009245974B2 (en) | 2012-04-12 |
WO2009137937A1 (en) | 2009-11-19 |
ZA201007750B (en) | 2012-10-31 |
US8139230B2 (en) | 2012-03-20 |
US20090284756A1 (en) | 2009-11-19 |
ES2667032T3 (es) | 2018-05-09 |
EP2277001B1 (en) | 2018-01-24 |
CN102027316A (zh) | 2011-04-20 |
BRPI0912742A2 (pt) | 2015-10-13 |
MX2010012506A (es) | 2010-12-21 |
RU2010151627A (ru) | 2012-06-27 |
AU2009245974A1 (en) | 2009-11-19 |
CA2722154A1 (en) | 2009-11-19 |
CN102027316B (zh) | 2012-12-12 |
CA2722154C (en) | 2013-06-25 |
RU2502953C2 (ru) | 2013-12-27 |
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