SU945802A1

SU945802A1 - Resistor non-linearity measuring method

Info

Publication number: SU945802A1
Application number: SU802902925A
Authority: SU
Inventors: Жанна Вольфовна Чернова; Анатолий Миронович Чернов
Original assignee: Кишиневский Научно-Исследовательский Институт Электроприборостроения
Priority date: 1980-03-28
Filing date: 1980-03-28
Publication date: 1982-07-23

Description

Изобретение относится к способам измерения параметров нелинейных и линейных резисторов.The invention relates to methods for measuring parameters of non-linear and linear resistors.

Известен способ измерения нелинейности резисторов, основанный на подаче суммы напряжений двух частот ^{1 * * * 5}на исследуемый резистор и измерении уровня напряжения разностной частоты, генерируемого на резисторе вследствие его нелинейности, и отличающийся возможностью измерения нелинейности резисторов с симметричной вольтамперной характеристикой, но обладающей недостаточно высокой разрешающей способностью и малой по ₁₅современным требованиям точностью El).A known method of measuring the non-linearity of resistors, based on the sum of the voltages of two frequencies ^{1 * * * 5} on the studied resistor and measuring the voltage level of the differential frequency generated on the resistor due to its non-linearity, and characterized by the possibility of measuring the non-linearity of resistors with a symmetrical current-voltage characteristic, but not sufficiently high resolution and low accuracy El according to ₁₅ modern requirements).

Наиболее близким по технической сущности к предлагаемому является способ измерения нелинейности сопротивления резисторов, характерный го тем, что, с целью упрощения измерений и повышения их точности, на испытуемый резистор подают нелинейно изменяющееся во времени импуль- .The closest in technical essence to the proposed one is a method of measuring the nonlinearity of the resistance of resistors, which is characterized by the fact that, in order to simplify the measurements and increase their accuracy, a pulse non-linearly changing in time is applied to the tested resistor.

сное напряжение с регулируемым пока’ зателем нелинейности, который изменяют до появления в сопрбтивлении резистора линейно изменяющегося во времени тока, при этом показатель нелинейности сопротивления определяют как величину, обратную показателю нелинейности импульсного напряжения. Получаемый линейный ток создает на нагрузочном сопротивлении, включенном последовательно с нелинейным сопротивлением, падение напряжения, которое поступает на осциллограф. Линейность этого сигнала определяется сравнением с прямой на экране осциллографа (без учета нелинейности нагрузочного сопротивления) [2].a specific voltage with an adjustable non-linearity indicator, which is changed until a current linearly changes in time in the resistor, while the resistance non-linearity index is determined as the reciprocal of the non-linearity of the pulse voltage. The resulting linear current creates on the load resistance, connected in series with non-linear resistance, a voltage drop that is fed to the oscilloscope. The linearity of this signal is determined by comparison with a straight line on the oscilloscope screen (without taking into account the non-linearity of the load resistance) [2].

Недостатками известного способа являются невысокая производительность, малая разрешающая способность и ограниченная точность.The disadvantages of this method are the low productivity, low resolution and limited accuracy.

Цель изобретения - повышение производительности и увеличение точ3 ности измерения нелинейности проводимости (сопротивления) резисторов.The purpose of the invention is to increase productivity and increase the accuracy of measuring non-linearity of the conductivity (resistance) of resistors.

Поставленная цель достигается тем, что для компенсации нелинейно изменяющегося тока в сопротивлении измеряемого резистора формируют напряжениеThis goal is achieved by the fact that to compensate for the non-linearly varying current in the resistance of the measured resistor form a voltage

U--f(€)U_Mi .U - f (€) U _Mi.

где f(t) - временная функция,* и_и - исходное напряжение, и одновременно формируют ток, противоположный по направлению току через измеряемый резистор где G_H - проводимость резистора при исходном напряжении Un; формируют дополнительное напряжение и_ДоП, компенсирующее в нулевом органе разность токов, вызываемую нелинейностью исследуемого резистора, при этом значение нелинейности η(0) определяют как величину 4<^U’^=lJA0n^;u’^UAon^;tftt>UM3.where f (t) is the time function, * and _and are the initial voltage, and at the same time form a current opposite in direction to the current through the measured resistor where G _H is the resistor conductivity at the initial voltage Un; forming additional stress and _additional compensating body in a zero difference of the currents caused by the nonlinearity of the test resistor, the value of nonlinearity η (0) is defined as the value 4 ^{^{^{<U '= lJ A0n; u}}} ' U Aon; tftt> UM3.

На фиг. 1 и 2 показано устройство, реализующее предлагаемый способ.In FIG. 1 and 2 show a device that implements the proposed method.

Способ осуществляется следующим образом.The method is as follows.

На исследуемый резистор 1 через нулевой орган 2 от задающего источника 3 подается исходное испытательное напряжение и_и, в то же время через нулевой индикатор пропускают от · источника тока Д с определенной функциональной зависимостью от формирователя 5 ток ₍ U--G,_w£(t)U_Mi (j) где Сц - проводимость исследуемого резистора при напряжении U^, равный по модулю, но противоположный по направлению току через измеряемый резистор, а именноAn initial test voltage is supplied to the studied resistor 1 through the zero organ 2 from the master source 3 _and , at the same time, a current is passed through the zero indicator from the current source D with a certain functional dependence on the former 5 ₍ U - G, _w £ (t ) U _Mi (j) where Сс is the conductivity of the investigated resistor at a voltage U ^, equal in magnitude, but opposite in direction to the current through the measured resistor, namely

В результате компенсации токов (1) и (2) падение напряжения ли на входном сопротивлении нулевого opra^Jна 2 (R_H0) будет равно нулю, т.е.As a result of compensation of the currents (1) and (2), the voltage drop at the input resistance of the zero opra ^J by 2 (R _H0 ) will be zero, i.e.

йиЧ1-Э)Яно’-°%о·-⁰·yiCh1-E) Yano'- °% o · - ⁰ ·

Следовательно, к измеряемому резистору будет приложено все исходное испытательное напряжение U^.Consequently, the entire initial test voltage U ^ will be applied to the measured resistor.

Показателем нелинейности исследуемого резистора в любой точке U егоAn indicator of the nonlinearity of the investigated resistor at any point U of its

9*45802 ' 4 вольтамперной характеристики является коэффициент η (и)в уравнении .связи между действительным значением проводимости G(U) с значением проводимости резистора G при напряжении U_M, а именно с,(и)--£*1*и(и)1а_и (4)9 * 45802 '4 current-voltage characteristics is the coefficient η (s) in the equation. The relationship between the actual conductivity G (U) and the conductivity of the resistor G at a voltage U _M , namely, c, (s) - £ * 1 * and ( i) 1a _and (4)

Если на всем участке вольтамперной характеристики показатель нелинейности η (0)--0,(5) «ОIf the nonlinearity parameter η (0) - 0, (5) “О

т.е. резистор линеен, то условие (3) выполняется'в любой точке вольтамперной характеристики, в частности при синхронном изменении испытательного напряжения и компенсирующего тока.those. Since the resistor is linear, then condition (3) is satisfied at any point of the current-voltage characteristic, in particular with a synchronous change in the test voltage and the compensating current.

Если показатель нелинейности 7)(0)+0,(6) то условие (3) для фиг. 1 не выполняется. Как показано далее на фиг„ 2, в последнем случае для реализации (3) необходимо организовать со стороны нулевого органа 2 дополнительный канал управления 6 зависимым источником 7 напряжения 11д_оЛ,компенсирующим в нулевом органе через отрицательную обратную связь 8 с проводимостью разность токов 1 и J, вызываемую нелинейностью исследуемого резистор8 ·If the nonlinearity index 7) (0) +0, (6) then condition (3) for FIG. 1 is not executed. As shown further in FIG. 2, in the latter case, to implement (3), it is necessary to organize from the side of the zero organ 2 an additional control channel 6 of a dependent source 7 of voltage 11d _oL , compensating in the zero organ through negative feedback 8 with conductivity the difference of currents 1 and J caused by the nonlinearity of the investigated resistor8

В результате перехода от измерительной цепи согласно фиг. 1 к цепи согласно фиг. 2 в предлагаемом устройстве реализуются два эффекта: во-первых, на выходе источника 7 появляется напряжение и_Д0П)содержащее информацию о нелинейности резистора, во-вторых, реализуется условие (3) при Ϊ) (lt>) t-O.As a result of the transition from the measuring circuit according to FIG. 1 to the circuit of FIG. 2, two effects are realized in the proposed device: firstly, the voltage and _{Д0П) appearing} at the output of source 7 containing information on the nonlinearity of the resistor, and secondly, condition (3) is realized for при) (lt>) tO.

При реализации (3) для фиг. 2 между указанными токами I И J устанавливается зависимостьWhen implementing (3) for FIG. 2, between the indicated currents I and J, the dependence

1“3-ид_ОпС1_и (7)1 “3-id _Op C1 _and (7)

Так как измерительный ток а компенсирующий ток (9) то с учетом (8) и (9) уравнение (7) можно представить в видеSince the measuring current a and the compensating current (9), taking into account (8) and (9), equation (7) can be represented as

ΟΟμ (j+Ц (U) 1 “()G - Одол G и > (JO) откуда искомый показатель нелинейностиΟΟμ (j + C (U) 1 “() G - Gross G and> (JO) whence the sought indicator of nonlinearity

Как следует из (11), определение 5 показателя нелинейности исследуемого резистора производится путем логометрирования двух напряжений, измеряемого резистора формируют напряжение где f(t) - временная функция;As follows from (11), the determination of the 5th non-linearity index of the studied resistor is made by logometry of two voltages, the measured resistor is formed by the voltage where f (t) is the time function;

- исходное напряжение',* и одновременно формируют ток, противоположный по направлению току через измеряемы резистор что при помощи современной аппаратуры можно делать с высокой производительностью и разрешающей способностью, а также с высокой точностью. ₁₅ - the initial voltage ', * and at the same time generate a current opposite in direction to the current through the measured resistor, which with modern equipment can be done with high performance and resolution, as well as with high accuracy. _fifteen

Claims

The invention relates to methods for measuring parameters of non-linear and linear resistors. A known method for measuring the nonlinearity of resistors is based on applying the sum of two voltage voltages to the resistor under study and measuring the voltage level of the difference frequency generated on the resistor due to its nonlinearity and differing in measuring the nonlinearity of resistors with a symmetric current-voltage characteristic but not sufficiently high resolution and the smallest accuracy of modern requirements. The closest in technical essence to the proposed method is to measure linearity of resistance of resistors, characteristic of the fact that, in order to simplify the measurements and increase their accuracy, the test resistor is supplied with a nonlinearly varying time pulse voltage with an adjustable nonlinearity indicator, which changes to a linearly varying resistance current, the nonlinearity of the resistance is defined as the reciprocal of the nonlinearity of the pulse voltage. The resulting linear current creates on the load resistance, connected in series with the nonlinear resistance, the voltage drop, which goes to the oscilloscope. The linearity of this signal is determined by comparing with the direct on the oscilloscope screen (without taking into account the nonlinearity of the load resistance) 2. The disadvantages of this method are low productivity, low resolution and limited accuracy. The purpose of the invention is to increase productivity and increase the accuracy. ability to measure the non-linearity of the conductivity (soprotyaphenia) of the regis tors. This goal is achieved by the fact that a voltage is formed in order to compensate for a nonlinearly varying current in the resistance of the measured resistor. where f (tj is a time function, and is the initial voltage, and simultaneously form a current opposite in direction to the current through the measured resistor D is f (-b) Uv, 4 is UG, where GH is the conductivity of the resistor at the initial voltage Un; they form an additional voltage DCrp, which compensates in the zero organ the current difference caused by the nonlinearity of the resistor under investigation, the value of the nonlinearity (y) is determined as 1 and id „: and - ids, (H. In FIG. 1 and 2 shows a device for implementing the proposed method. The method is carried out as follows. The inspected resistor 1 through the zero organ 2 from the master source 3 supplies the initial test voltage U, while the zero indicator passes the current source i with a certain functional dependence on the forwarder 5 to the current 3 - C,) and Ct) where GM is the conductivity of the resistor under study at a voltage U |, equal in magnitude but opposite in direction to the current through the measured reactor, namely, GV. L As a result of the compensation of currents (1) and (2), the voltage drop at the input resistance of the zero org by 2 () will be zero, i.e. Li-CH1-3) Yat-o% o-0- t- Consequently, the entire initial test voltage Vc will be applied to the measured resistor. An indicator of the nonlinearity of the resistor under study at any point U of its current-voltage characteristic is the coefficient (s) in the equation. The relation between the actual value of conductivity G (U) with the value of conductivity of resistor G at voltage Uj, namely G, (U) - i: uil (U) lC, v, (4) If on the whole section of the current-voltage characteristic the nonlinearity indicator is V | (W) - 0, (5) t, e. If the resistor is linear, then condition (3) is fulfilled at any point of the current-voltage characteristic, in particular, with a synchronous change of the test voltage and the compensating current. If the nonlinearity exponent is Vj (0) tO, C6, then condition (3) for FIG. 1 is not fulfilled. As shown in Fig. 2 below, in the latter case, for realization (3), it is necessary to arrange from the zero organ 2 an additional control channel 6 dependent source 7 of the voltage UAQJ, which compensates in the zero organ via negative feedback 8 with conductivity G current difference 1 and J, caused by the nonlinearity of the resistor under study. As a result of the transition from the measuring circuit according to FIG. 1 to the circuit according to FIG. 2, the proposed device implements two; effect: first, a voltage appears at the output of source 7 containing information about the non-linearity of the resistor, secondly, the condition (3 with Vj (and) is realized. When implemented for Fig. 2 between the indicated currents I and 3 establishes the dependence 1-з —opdc, y (7; Since the measuring current I is U, Ct) & ,, - “vv) (u) UG, v,), (%) and the compensation current e - and "iUs, c" -s ", (At that, taking into account (8) and (9), equation (7) can be represented as UC, v,) l-UC, vi-- yAonGH,) from where the desired nonlinearity indicator is -ndopi. As follows from (11), the definition of The linearity of the resistor under study is produced by metering two voltages, which can be done with high performance and resolution, as well as high accuracy with the help of modern equipment. Invention Method for measuring the nonlinearity of resistors, which consists in compensating the nonlinearly changing current in the resistance of the measured a resistor, characterized in that, in order to increase productivity and increase measurement accuracy, to compensate for non-linearly varying current in the resistance The measured resistor is formed by a voltage, where f (t) is a time function; Uj, is the initial voltage, and at the same time they form a current opposite in direction to the current through the resistor 3 --- € tt) Uv, 4-U4, where the conductivity of the resistor at the initial voltage forms an additional voltage, iodop, compensating in zero organ the difference between the currents caused by the nonlinearity of the resistor under investigation, the value of the nonlinearity y ()) is defined as the value of P CU) - idop-i and - itop - 1 € a) and „1 Sources of information taken into account during the examination 1. USSR author's certificate number 362260, cl. G 01 R 27/08 1971.

2. USSR Author's Certificate No. 269293, KD. G 01 R 27/08, 1968..