SU846987A1 - Apparatus for measuring elliptical hole parameters - Google Patents

Description

(54) DEVICE. FOR MEASUREMENT OF PARAMETERS OF ELLIPSE HOLES

one

The invention relates to a measurement technique, in particular, to devices for monitoring deviations from the cylindrical shape of the measured surfaces, and can be used, for example, in systems of automated monitoring and control of technological processes.

A device for measuring hole diameters is known, comprising a housing with a fixed measuring tip and an axis, a lever with a movable measuring tip, and an indicator 1.

The drawback of the device is the long duration of control and lack of accuracy.

The closest tso technical; The solution to the invention is a device for measuring parameters of an elliptical orifice containing a probe with two pairs of displacement sensors located in mutually perpendicular planes, an analog-to-digital converter connected by inputs to the corresponding outputs of the sensors, a recording unit 2.

However, the need to center the probe with respect to the axis of the hole being measured and to rotate it to search for maximum dimensions increases the measurement time. The purpose of the invention is to reduce the measurement time.

The goal is achieved by the fact that

 The device is equipped with a fifth displacement transducer located on the probe on the bisector of the angle between the axes of two pairs of transducers, a computing unit connected between an analog-digital converter and a recording unit, a correction unit,

10 input connected to the second output of the computing unit, and output - to the second input of the computing unit, the output of the fifth sensor is connected to the corresponding input of the analog-digital converter. ,

FIG. 1 shows a block diagram of the device; in fig. 2 - location of the sensors in the perpendicular section of the probe.

The device contains sensors 1-5 radial displacements, installed 1 in the probe 6, connected to them analog-digital

20 a converter 7, a computational unit 8 and a registration unit 9 associated with it, a correction unit 10.

The device works as follows.

When conducting control, it has two modes of operation: correction mode and measurement mode. In correction mode, a probe 6 with sensors 1-5 is placed in a calibrated orifice of known diameter. Analog-to-digital converter 7 converts the sensor movement signals to digital form, after which, in computing unit 8, the differences between the i-ro sensor readings are calculated when measuring the calibrated orifice and the actual size of the calibrating orifice in the selected cross section. The resulting corrections are stored in correction block 10.

In the measurement mode, the probe 6 is inserted into the measuring opening. At the same time, signals from sensors 1-5 through analog-to-digital converter 7 are fed to computing unit 8, which calculates the values of the axes of the ellipse using the ellipse equation Ax + + 2Вх + CY + 2Dx + 2Еу + 1 О, according to the coordinates of five points elliptical surface. Corrections are entered into the calculated data from correction block 10, taking into account the errors of the sensors.

Thus, the need for centering the probe relative to the measured surface is eliminated and, thus, the monitoring time is reduced.

Claims (2)

1. USSR author's certificate No. 426128, cl. G 01 B 5/12, 1974. 2. Patent of France No. 2202586,. cl. G OGV 7/00, L974 (prototype).