SU1635028A1 - Device for measuring metal structure residual life span - Google Patents

Abstract

The invention relates to instrumentation engineering and to devices for measuring the residual life of metal structures, and can be used to monitor the technical condition of objects. The purpose of the invention is to improve the accuracy of measurement of the residual resource. The residual life is measured in accordance with the expression: Tor T d (1-Jgltfkn S), where S is the rms value of the voltage of the structure; - coefficient of proportionality; n Q - counter code; i is the sequence number of the cycle; k is the division factor of the frequency divider; m-index of the degree of endurance curve; the specified resource of a metal construction. 1 il. §

Description

The invention relates to instrumentation engineering, in particular, to devices for measuring the residual life of metal structures, i.e. it can be used to monitor the technical condition of objects.

The purpose of the invention is to improve the accuracy of measuring the residual life of metal structures.

The drawing shows a block diagram of the device.

The device for measuring the residual life contains a serially connected deformation converter 1 into an electrical signal, amplifier 2, unit 3 of the measurement of the root-mean-square value, the first 4 and second 5 blocks, respectively, of a nonlinear transformation, connected in series to the zero-organ 6, whose input is connected to the amplifier 2, frequency divider 7 and the first counter 8, the outputs of which are connected to the inputs of the second non-linear conversion unit 5, the source 9 of the reference signals, the driver 10 pulses, the first and second paragraph Converters 11 and 12, respectively, of the levels, outputs connected to the inputs of the calculation and display unit 13, the analog output of the second nonlinear conversion unit 5, the reversible counter 14, the OR 15 logic element and the second counter 16 are connected to the input. The output outputs of the reversible counter 14 through the first converter 11 is connected to the bit inputs of block 13

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The output of the pulse former 10 is connected via the second converter 12 to the input of the block 13. The discharge outputs of the counter 14 are also connected to the corresponding inputs of the frequency divider 7, the common outputs of the first

8 and the second 16 counters are respectively connected via an OR 15 gate to the input 1 of the first zero set 8, the second input of the RMS measurement unit 3, the counting input of the reversing counter 14, and the input of the driver 10 pulses. A source

9 support signals connected to the input of the second counter 16, the output of which is also connected to the subtractive input of the reversing counter 14, the summing input of which is connected to the common output of the first counter 8.

The device works as follows.

The input of amplifier 2 from converter 1 receives a signal corresponding to the dynamic voltage of the structure. From the output of amplifier 2, the signal goes through the unit 3 of measurement of the mean square value S of the voltage to the input of the first nonlinear conversion unit 4, at the output of which a signal is generated, proportional to S, where m is an indicator of the degree of the endurance curve. The signal from the output of amplifier 2 is also fed to the input of the zero-organ 6, at the output of which pulses are formed when the signal passes through zero. The pulses from the output of the null organ 6 are fed through a frequency divider 7 to the counting output of the first counter 8, in which the deformation signal transitions through zero are counted. The binary code from the bit outputs of the counter 8 changes the conductivity coefficient of the second non-linear conversion unit 5 in proportion to the number of zero-distortion signal transitions. Thus, at the output of the second nonlinear conversion unit 5, a signal is formed equal to o (knc S, where o (- proportionality factor; pS1 - counter code; d is the sequence number of the measurement cycle; k - division factor of the frequency divider 7). load cycle is entered by the source 9 of the reference signals, the base time depending on the program from

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the measurement of a particular object. When conducting a test, the measurement time is set by pouring IC.KHM in a way that it corresponds to the baseline. Due to this, the accuracy of determining the resource is improved, since the code at the output of the divider 7 and, accordingly, the conductivity coefficient of the second block 5 of the nonlinear charge, slightly change from measurement to measurement.

A slight change in the code at the output of the divider 7 is achieved by the fact that the commands of the reversing counter 14 change the division ratio of the divider 7. Thus, when the first counter 8 overflows, the base time is even more and the counter 16 is not filled with the total output of the counter 8 overflow pulse goes to the summing input of the reversible counter 14 and through the first input of the element OR 15 to the reset of the first counter 8, the control input of the measuring unit 3 and through the driver 10 of the pulses and convert 12 levels to the input of the block 13 Calculations From the discharge outputs of the reversible counter 14, the code, increased by one, goes to the control inputs of the frequency divider 7, increasing the division factor and the measurement time. If the measurement time reaches the base, then the overflow pulse of the second counter 16 goes to the subtracting input of the reverse counter 14 and decreases the ratio division, reducing the measurement time. The code from the outputs of the reversible counter i4 also goes through the first converter 11 to the calculating unit 13, in which the signal from the output of the unit 5 1pps is multiplied; 8Ma division coefficient and summation with the previous result, then the residual resource is calculated according to the expression:

  TWA (1- knc; Sm), where T} „d is the given resource; T0r - the remainder (nny resource.

Claims (1)

The formula of the invention of the IC Device for measuring the residual life of the metal oKOHcrrpvKTjH4, containing a serially connected strain converter into an electrical signal, an amplifier, a rms value of the unit, the first and second blocks of a linear linear transform, sequentially connected zero-input, whose input is connected to the amplifier, the frequency divider and the first counter, the outputs of which are connected to the inputs of the second nonlinear conversion unit, the source of reference signals, the second counter, characterized in that In order to improve measurement accuracy, it is equipped with a pulse shaper, first and second level converters, a reversible counter, an OR logic unit, a calculation and indication unit, whose information inputs are connected through the first level converter to the discharge outputs of the reversible counter, other inputs the computing unit is connected with the corresponding corresponding to the output of the second block, the nonlinear conversion and the output of the second level converter, the summing input of the reversible counter is connected to the common output of the first counter, and the subtractive input is connected to the common output of the second counter, the outputs of the first and second counters are connected to the zero input of the first through the output element OR the counter, the second input of the measurement unit of the mean square value, with the counting input of the reversible counter, the discharge outputs of which are also connected to the inputs l of frequency, and the input of the formi-optel pulses, the output of which is connected to the input of the second level converter,