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Application filed by Томский политехнический институт им.С.М.КироваfiledCriticalТомский политехнический институт им.С.М.Кирова
Priority to SU4134929/25ApriorityCriticalpatent/SU1403783A1/en
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Publication of SU1403783A1publicationCriticalpatent/SU1403783A1/en
Investigating Or Analysing Materials By Optical Means
(AREA)
Abstract
FIELD: gas analysis; determination of concentration of gases and vapors of substances absorbing infra-red radiation. SUBSTANCE: one-beam two-channel gas analyzer has an auxiliary source and radiation detector for monitoring parameters of an optic circuit, signal processing circuit which is characterized in that dependence of an output signal on parameters of optic path is excluded. EFFECT: enhanced measurement accuracy. 1 dwg
SU4134929/25A1986-10-161986-10-16Infra-red gas analyzer
SU1403783A1
(en)