SG11202007789UA - Perhydropolysilazane compositions and methods for forming oxide films using same - Google Patents
Perhydropolysilazane compositions and methods for forming oxide films using sameInfo
- Publication number
- SG11202007789UA SG11202007789UA SG11202007789UA SG11202007789UA SG11202007789UA SG 11202007789U A SG11202007789U A SG 11202007789UA SG 11202007789U A SG11202007789U A SG 11202007789UA SG 11202007789U A SG11202007789U A SG 11202007789UA SG 11202007789U A SG11202007789U A SG 11202007789UA
- Authority
- SG
- Singapore
- Prior art keywords
- methods
- same
- oxide films
- forming oxide
- perhydropolysilazane
- Prior art date
Links
- 239000000203 mixture Substances 0.000 title 1
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- B05D3/02—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials by baking
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- C01B21/00—Nitrogen; Compounds thereof
- C01B21/06—Binary compounds of nitrogen with metals, with silicon, or with boron, or with carbon, i.e. nitrides; Compounds of nitrogen with more than one metal, silicon or boron
- C01B21/068—Binary compounds of nitrogen with metals, with silicon, or with boron, or with carbon, i.e. nitrides; Compounds of nitrogen with more than one metal, silicon or boron with silicon
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- C01B33/12—Silica; Hydrates thereof, e.g. lepidoic silicic acid
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- C01B33/181—Preparation of finely divided silica neither in sol nor in gel form; After-treatment thereof by a dry process
- C01B33/182—Preparation of finely divided silica neither in sol nor in gel form; After-treatment thereof by a dry process by reduction of a siliceous material, e.g. with a carbonaceous reducing agent and subsequent oxidation of the silicon monoxide formed
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- C01B33/183—Preparation of finely divided silica neither in sol nor in gel form; After-treatment thereof by a dry process by oxidation or hydrolysis in the vapour phase of silicon compounds such as halides, trichlorosilane, monosilane
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02282—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02296—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer
- H01L21/02318—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment
- H01L21/02321—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment introduction of substances into an already existing insulating layer
- H01L21/02323—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment introduction of substances into an already existing insulating layer introduction of oxygen
- H01L21/02326—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment introduction of substances into an already existing insulating layer introduction of oxygen into a nitride layer, e.g. changing SiN to SiON
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02296—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer
- H01L21/02318—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment
- H01L21/02321—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment introduction of substances into an already existing insulating layer
- H01L21/02329—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment introduction of substances into an already existing insulating layer introduction of nitrogen
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02296—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer
- H01L21/02318—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment
- H01L21/02337—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment treatment by exposure to a gas or vapour
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B21/00—Nitrogen; Compounds thereof
- C01B21/082—Compounds containing nitrogen and non-metals and optionally metals
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G77/00—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
- C08G77/60—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule in which all the silicon atoms are connected by linkages other than oxygen atoms
- C08G77/62—Nitrogen atoms
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
- C23C18/1229—Composition of the substrate
- C23C18/1245—Inorganic substrates other than metallic
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Inorganic Chemistry (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Thermal Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- Wood Science & Technology (AREA)
- Ceramic Engineering (AREA)
- Silicon Polymers (AREA)
- Formation Of Insulating Films (AREA)
- Catalysts (AREA)
- Paints Or Removers (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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US201862633193P | 2018-02-21 | 2018-02-21 | |
PCT/US2019/018985 WO2019165093A1 (en) | 2018-02-21 | 2019-02-21 | Perhydropolysilazane compositions and methods for forming oxide films using same |
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SG11202007789UA true SG11202007789UA (en) | 2020-09-29 |
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SG11202007789UA SG11202007789UA (en) | 2018-02-21 | 2019-02-21 | Perhydropolysilazane compositions and methods for forming oxide films using same |
Country Status (8)
Country | Link |
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US (1) | US11739220B2 (en) |
EP (1) | EP3755658A4 (en) |
JP (1) | JP7033667B2 (en) |
KR (1) | KR20200119852A (en) |
CN (1) | CN111902359A (en) |
SG (1) | SG11202007789UA (en) |
TW (1) | TWI799516B (en) |
WO (1) | WO2019165093A1 (en) |
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TWI793262B (en) * | 2018-02-21 | 2023-02-21 | 法商液態空氣喬治斯克勞帝方法研究開發股份有限公司 | Perhydropolysilazane compositions and methods for forming nitride films using same |
CN115279590A (en) * | 2020-03-16 | 2022-11-01 | 默克专利股份有限公司 | Use of coloured effect pigments for enhancing the infrared absorption capacity of coloured polymers |
CN115605530B (en) * | 2020-05-07 | 2024-09-27 | 默克专利有限公司 | Polycarbosilazanes and compositions comprising the same and methods of making silicon-containing films using the same |
CN113683818B (en) * | 2021-08-27 | 2023-07-04 | 上海材料研究所有限公司 | Core-shell structure modified boron nitride and preparation method thereof |
CN115140714A (en) * | 2022-06-07 | 2022-10-04 | 哈尔滨工业大学 | Si 3 N 4 Aerogel and preparation method thereof |
WO2024190385A1 (en) * | 2023-03-10 | 2024-09-19 | 株式会社Sumco | Method for determining semiconductor wafer-cleaning condition, and method for cleaning semiconductor wafer |
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TWI793262B (en) | 2018-02-21 | 2023-02-21 | 法商液態空氣喬治斯克勞帝方法研究開發股份有限公司 | Perhydropolysilazane compositions and methods for forming nitride films using same |
-
2019
- 2019-02-21 TW TW108105785A patent/TWI799516B/en active
- 2019-02-21 EP EP19757335.5A patent/EP3755658A4/en active Pending
- 2019-02-21 WO PCT/US2019/018985 patent/WO2019165093A1/en unknown
- 2019-02-21 KR KR1020207026121A patent/KR20200119852A/en not_active Ceased
- 2019-02-21 SG SG11202007789UA patent/SG11202007789UA/en unknown
- 2019-02-21 CN CN201980021089.0A patent/CN111902359A/en active Pending
- 2019-02-21 JP JP2020543840A patent/JP7033667B2/en active Active
- 2019-02-21 US US16/971,869 patent/US11739220B2/en active Active
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WO2019165093A1 (en) | 2019-08-29 |
TW201936795A (en) | 2019-09-16 |
EP3755658A1 (en) | 2020-12-30 |
CN111902359A (en) | 2020-11-06 |
JP7033667B2 (en) | 2022-03-10 |
EP3755658A4 (en) | 2022-03-02 |
KR20200119852A (en) | 2020-10-20 |
US20210087406A1 (en) | 2021-03-25 |
US11739220B2 (en) | 2023-08-29 |
TWI799516B (en) | 2023-04-21 |
JP2021514544A (en) | 2021-06-10 |
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