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SG11201801176SA - Photodetector - Google Patents

Photodetector

Info

Publication number
SG11201801176SA
SG11201801176SA SG11201801176SA SG11201801176SA SG11201801176SA SG 11201801176S A SG11201801176S A SG 11201801176SA SG 11201801176S A SG11201801176S A SG 11201801176SA SG 11201801176S A SG11201801176S A SG 11201801176SA SG 11201801176S A SG11201801176S A SG 11201801176SA
Authority
SG
Singapore
Prior art keywords
photodetector
Prior art date
Application number
SG11201801176SA
Inventor
Hiroshi Fukuda
Shin Kamei
Ken Tsuzuki
Makoto Jizodo
Kiyofumi Kikuchi
Original Assignee
Nippon Telegraph & Telephone
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph & Telephone filed Critical Nippon Telegraph & Telephone
Publication of SG11201801176SA publication Critical patent/SG11201801176SA/en

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/21Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
    • H10F30/22Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/21Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
    • H10F30/22Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes
    • H10F30/223Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes the potential barrier being a PIN barrier
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/10Semiconductor bodies
    • H10F77/12Active materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/10Semiconductor bodies
    • H10F77/12Active materials
    • H10F77/122Active materials comprising only Group IV materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/10Semiconductor bodies
    • H10F77/14Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies
    • H10F77/147Shapes of bodies
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/20Electrodes
    • H10F77/206Electrodes for devices having potential barriers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/40Optical elements or arrangements
    • H10F77/413Optical elements or arrangements directly associated or integrated with the devices, e.g. back reflectors
SG11201801176SA 2015-08-28 2016-08-26 Photodetector SG11201801176SA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2015169779 2015-08-28
PCT/JP2016/003907 WO2017038072A1 (en) 2015-08-28 2016-08-26 Photodetector

Publications (1)

Publication Number Publication Date
SG11201801176SA true SG11201801176SA (en) 2018-03-28

Family

ID=58186920

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201801176SA SG11201801176SA (en) 2015-08-28 2016-08-26 Photodetector

Country Status (7)

Country Link
US (1) US10720543B2 (en)
EP (1) EP3343641B1 (en)
JP (2) JPWO2017038072A1 (en)
CN (1) CN107924961B (en)
CA (1) CA2995668C (en)
SG (1) SG11201801176SA (en)
WO (1) WO2017038072A1 (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6867868B2 (en) * 2017-05-15 2021-05-12 日本電信電話株式会社 Photodetector
JP7087308B2 (en) * 2017-09-13 2022-06-21 富士通株式会社 Manufacturing method of photoreceiver, balanced photoreceiver, and photoreceiver
JP2019078908A (en) * 2017-10-25 2019-05-23 日本電信電話株式会社 Light monitor circuit
CN108447938B (en) * 2018-02-27 2019-12-20 中国科学院微电子研究所 Photoelectric detector
JP7062276B2 (en) * 2018-04-04 2022-05-06 国立研究開発法人産業技術総合研究所 Optical waveguide type light receiving element structure
JP6981365B2 (en) * 2018-05-17 2021-12-15 日本電信電話株式会社 Photodetector
JP7125822B2 (en) * 2018-06-06 2022-08-25 富士通オプティカルコンポーネンツ株式会社 Optical semiconductor device and optical transmission device
JP7212254B2 (en) 2019-01-16 2023-01-25 日本電信電話株式会社 photodetector
WO2023248369A1 (en) * 2022-06-22 2023-12-28 日本電信電話株式会社 Photodetector

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001068717A (en) * 1999-08-25 2001-03-16 Nippon Telegr & Teleph Corp <Ntt> Traveling wave semiconductor photodetector
US6576532B1 (en) * 2001-11-30 2003-06-10 Motorola Inc. Semiconductor device and method therefor
US7453132B1 (en) * 2002-06-19 2008-11-18 Luxtera Inc. Waveguide photodetector with integrated electronics
JP5232981B2 (en) 2008-03-07 2013-07-10 日本電気株式会社 SiGe photodiode
US8330242B2 (en) * 2008-03-28 2012-12-11 Nec Corporation Semiconductor light-receiving element
US8346025B2 (en) * 2009-05-18 2013-01-01 Alcatel Lucent Compact electrooptic modulator
JP5370857B2 (en) * 2010-03-04 2013-12-18 日本電信電話株式会社 GERMANIUM RECEIVER AND MANUFACTURING METHOD THEREOF
EP2736084B1 (en) * 2012-11-22 2018-09-19 IMEC vzw Avalanche photodetector element with increased electric field strength
US9666736B2 (en) * 2013-01-30 2017-05-30 Agency For Science, Technology And Research Photodetector arrangement
JP6020295B2 (en) * 2013-03-28 2016-11-02 富士通株式会社 Si optical integrated circuit device and manufacturing method thereof
CN105810774B (en) * 2016-03-30 2018-05-22 华中科技大学 A kind of big bandwidth germanium silicon photodetector of high power

Also Published As

Publication number Publication date
CA2995668A1 (en) 2017-03-09
CN107924961B (en) 2020-03-03
EP3343641A4 (en) 2019-05-15
JPWO2017038072A1 (en) 2017-12-14
CN107924961A (en) 2018-04-17
US10720543B2 (en) 2020-07-21
EP3343641B1 (en) 2021-03-17
CA2995668C (en) 2020-12-01
WO2017038072A1 (en) 2017-03-09
JP2018142751A (en) 2018-09-13
JP6560795B2 (en) 2019-08-14
US20180233618A1 (en) 2018-08-16
EP3343641A1 (en) 2018-07-04

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