[go: up one dir, main page]

SG108251A1 - Innovative bypass circuit for circuit testing and modification - Google Patents

Innovative bypass circuit for circuit testing and modification

Info

Publication number
SG108251A1
SG108251A1 SG200102623A SG200102623A SG108251A1 SG 108251 A1 SG108251 A1 SG 108251A1 SG 200102623 A SG200102623 A SG 200102623A SG 200102623 A SG200102623 A SG 200102623A SG 108251 A1 SG108251 A1 SG 108251A1
Authority
SG
Singapore
Prior art keywords
circuit
innovative
modification
testing
bypass
Prior art date
Application number
SG200102623A
Inventor
Leeroy Tretter Larry
Ernest Malmberg James
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Priority to SG200102623A priority Critical patent/SG108251A1/en
Publication of SG108251A1 publication Critical patent/SG108251A1/en

Links

SG200102623A 2001-05-03 2001-05-03 Innovative bypass circuit for circuit testing and modification SG108251A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SG200102623A SG108251A1 (en) 2001-05-03 2001-05-03 Innovative bypass circuit for circuit testing and modification

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SG200102623A SG108251A1 (en) 2001-05-03 2001-05-03 Innovative bypass circuit for circuit testing and modification

Publications (1)

Publication Number Publication Date
SG108251A1 true SG108251A1 (en) 2005-01-28

Family

ID=34568071

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200102623A SG108251A1 (en) 2001-05-03 2001-05-03 Innovative bypass circuit for circuit testing and modification

Country Status (1)

Country Link
SG (1) SG108251A1 (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5254940A (en) * 1990-12-13 1993-10-19 Lsi Logic Corporation Testable embedded microprocessor and method of testing same
EP0596435A1 (en) * 1992-11-03 1994-05-11 Thomson Consumer Electronics, Inc. Automatic test clock selection apparatus
US20010048317A1 (en) * 2000-06-05 2001-12-06 Lambert Craig J. Compare path bandwidth control for high performance automatic test systems
US20020053913A1 (en) * 2000-10-14 2002-05-09 Dirk Rautmann Integrated semiconductor module with a bridgeable input low-pass filter

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5254940A (en) * 1990-12-13 1993-10-19 Lsi Logic Corporation Testable embedded microprocessor and method of testing same
EP0596435A1 (en) * 1992-11-03 1994-05-11 Thomson Consumer Electronics, Inc. Automatic test clock selection apparatus
US20010048317A1 (en) * 2000-06-05 2001-12-06 Lambert Craig J. Compare path bandwidth control for high performance automatic test systems
US20020053913A1 (en) * 2000-10-14 2002-05-09 Dirk Rautmann Integrated semiconductor module with a bridgeable input low-pass filter

Similar Documents

Publication Publication Date Title
GB2381990B (en) Foldable electronic device
GB0127322D0 (en) Test device
EP1391991A4 (en) Integrated circuit device
AU8433901A (en) An electronic publication and methods and components thereof
AU2002339624A1 (en) Preconditioning integrated circuit for integrated circuit testing
GB0106923D0 (en) Liver function test
GB0111108D0 (en) Testing apparatus
GB2370364B (en) Testing integrated circuits
DE60204749D1 (en) Sample and hold circuit
EP1431756A4 (en) Sulfur component sensor and sulfur component detector
HK1059990A1 (en) Sampler/filter circuit and method for demodulatinginput signal with the same
DE60231784D1 (en) Bypass chip component and mounting arrangement therefor
EP1392317A4 (en) Substituted 1-benzazepines and derivatives thereof
GB0308070D0 (en) Integrated circuit design and testing
GB0128310D0 (en) Test
HK1051896A1 (en) BGA on-board tester
SG108251A1 (en) Innovative bypass circuit for circuit testing and modification
GB0002326D0 (en) Circuit board component testing
GB0122779D0 (en) An osteoprosthesis component
GB0115763D0 (en) Testing apparatus
GB0125616D0 (en) Imapct testing apparatus
AU2003280128A8 (en) Sample and hold circuit
TW492435U (en) Testing lifting-and-decending stage
EP1405069A4 (en) See through testing device
GB0110720D0 (en) Particulate matter analyzer