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SG102546A1 - Device transfer apparatus and device reinspection method for ic handler - Google Patents

Device transfer apparatus and device reinspection method for ic handler

Info

Publication number
SG102546A1
SG102546A1 SG9903596A SG1999003596A SG102546A1 SG 102546 A1 SG102546 A1 SG 102546A1 SG 9903596 A SG9903596 A SG 9903596A SG 1999003596 A SG1999003596 A SG 1999003596A SG 102546 A1 SG102546 A1 SG 102546A1
Authority
SG
Singapore
Prior art keywords
handler
transfer apparatus
reinspection method
reinspection
device transfer
Prior art date
Application number
SG9903596A
Inventor
Nakamura Hiroto
Susuki Katsuhiko
Kobayashi Yoshihito
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of SG102546A1 publication Critical patent/SG102546A1/en

Links

SG9903596A 1995-03-23 1995-10-11 Device transfer apparatus and device reinspection method for ic handler SG102546A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7090376A JPH08262102A (en) 1995-03-23 1995-03-23 Method for reinspecting device in handler for ic tester

Publications (1)

Publication Number Publication Date
SG102546A1 true SG102546A1 (en) 2004-03-26

Family

ID=13996855

Family Applications (2)

Application Number Title Priority Date Filing Date
SG9903596A SG102546A1 (en) 1995-03-23 1995-10-11 Device transfer apparatus and device reinspection method for ic handler
SG1995001534A SG54087A1 (en) 1995-03-23 1995-10-11 Device transfer apparatus and device reinspection method for ic handler

Family Applications After (1)

Application Number Title Priority Date Filing Date
SG1995001534A SG54087A1 (en) 1995-03-23 1995-10-11 Device transfer apparatus and device reinspection method for ic handler

Country Status (4)

Country Link
JP (1) JPH08262102A (en)
CN (1) CN1152754A (en)
MY (1) MY113318A (en)
SG (2) SG102546A1 (en)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3235594B2 (en) 1999-05-10 2001-12-04 日本電気株式会社 Semiconductor device inspection apparatus and semiconductor device inspection method
KR100401932B1 (en) * 2001-12-20 2003-10-17 주식회사 테스트이엔지 Method of testing semiconductor devices on test handler
US7154258B2 (en) * 2002-12-25 2006-12-26 Ricoh Company, Ltd. IC transfer device
JP4537400B2 (en) * 2004-07-23 2010-09-01 株式会社アドバンテスト Electronic component handling device knitting method
KR100705655B1 (en) * 2005-10-19 2007-04-09 (주) 인텍플러스 Classification method of semiconductor package
CN101339146B (en) * 2007-07-05 2011-07-20 京元电子股份有限公司 Automatic Optical Inspection Device
CN101887104B (en) * 2010-04-21 2012-09-19 江阴新基电子设备有限公司 Double-flow channel unit device of QFN (Quad Flat No-lead Package) integrated circuit testing separator
KR101864781B1 (en) * 2010-04-21 2018-06-05 미래산업 주식회사 Method for transferring tray and Test Handler using the same
JP2017067591A (en) * 2015-09-30 2017-04-06 セイコーエプソン株式会社 Electronic component conveying device and electronic component inspection device
KR102391516B1 (en) * 2015-10-08 2022-04-27 삼성전자주식회사 Semiconductor test apparatus
US10782348B2 (en) * 2017-03-10 2020-09-22 Keithley Instruments, Llc Automatic device detection and connection verification

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0214538A (en) * 1988-07-01 1990-01-18 Tokyo Electron Ltd Inspection apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0214538A (en) * 1988-07-01 1990-01-18 Tokyo Electron Ltd Inspection apparatus

Also Published As

Publication number Publication date
MY113318A (en) 2002-01-31
JPH08262102A (en) 1996-10-11
CN1152754A (en) 1997-06-25
SG54087A1 (en) 1998-11-16

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