SG10201913336YA - Device and method for controlling the tightness of a transport enclosure for the conveyance and atmospheric storage of semiconductor substrates - Google Patents
Device and method for controlling the tightness of a transport enclosure for the conveyance and atmospheric storage of semiconductor substratesInfo
- Publication number
- SG10201913336YA SG10201913336YA SG10201913336YA SG10201913336YA SG10201913336YA SG 10201913336Y A SG10201913336Y A SG 10201913336YA SG 10201913336Y A SG10201913336Y A SG 10201913336YA SG 10201913336Y A SG10201913336Y A SG 10201913336YA SG 10201913336Y A SG10201913336Y A SG 10201913336YA
- Authority
- SG
- Singapore
- Prior art keywords
- tightness
- conveyance
- controlling
- semiconductor substrates
- atmospheric storage
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title 1
- 239000000758 substrate Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
- H01L21/6735—Closed carriers
- H01L21/67389—Closed carriers characterised by atmosphere control
- H01L21/67393—Closed carriers characterised by atmosphere control characterised by the presence of atmosphere modifying elements inside or attached to the closed carrierl
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G47/00—Article or material-handling devices associated with conveyors; Methods employing such devices
- B65G47/74—Feeding, transfer, or discharging devices of particular kinds or types
- B65G47/90—Devices for picking-up and depositing articles or materials
- B65G47/91—Devices for picking-up and depositing articles or materials incorporating pneumatic, e.g. suction, grippers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M3/00—Investigating fluid-tightness of structures
- G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
- G01M3/26—Investigating fluid-tightness of structures by using fluid or vacuum by measuring rate of loss or gain of fluid, e.g. by pressure-responsive devices, by flow detectors
- G01M3/32—Investigating fluid-tightness of structures by using fluid or vacuum by measuring rate of loss or gain of fluid, e.g. by pressure-responsive devices, by flow detectors for containers, e.g. radiators
- G01M3/3236—Investigating fluid-tightness of structures by using fluid or vacuum by measuring rate of loss or gain of fluid, e.g. by pressure-responsive devices, by flow detectors for containers, e.g. radiators by monitoring the interior space of the containers
- G01M3/3272—Investigating fluid-tightness of structures by using fluid or vacuum by measuring rate of loss or gain of fluid, e.g. by pressure-responsive devices, by flow detectors for containers, e.g. radiators by monitoring the interior space of the containers for verifying the internal pressure of closed containers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67126—Apparatus for sealing, encapsulating, glassing, decapsulating or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
- H01L21/6735—Closed carriers
- H01L21/67376—Closed carriers characterised by sealing arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
- H01L21/6735—Closed carriers
- H01L21/67379—Closed carriers characterised by coupling elements, kinematic members, handles or elements to be externally gripped
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
- H01L21/6732—Vertical carrier comprising wall type elements whereby the substrates are horizontally supported, e.g. comprising sidewalls
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
- H01L21/6735—Closed carriers
- H01L21/67386—Closed carriers characterised by the construction of the closed carrier
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Packaging Frangible Articles (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1660750A FR3058562B1 (en) | 2016-11-07 | 2016-11-07 | DEVICE AND METHOD FOR CONTROLLING THE SEALING OF A TRANSPORT ENCLOSURE FOR CONVEYING AND ATMOSPHERIC STORAGE OF SEMICONDUCTOR SUBSTRATES |
Publications (1)
Publication Number | Publication Date |
---|---|
SG10201913336YA true SG10201913336YA (en) | 2020-02-27 |
Family
ID=57796603
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10201913336YA SG10201913336YA (en) | 2016-11-07 | 2017-11-06 | Device and method for controlling the tightness of a transport enclosure for the conveyance and atmospheric storage of semiconductor substrates |
SG11201903413UA SG11201903413UA (en) | 2016-11-07 | 2017-11-06 | Device and method for monitoring the leak-tightness of a transport enclosure for the atmospheric conveyance and storage of semiconductor substrates |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201903413UA SG11201903413UA (en) | 2016-11-07 | 2017-11-06 | Device and method for monitoring the leak-tightness of a transport enclosure for the atmospheric conveyance and storage of semiconductor substrates |
Country Status (9)
Country | Link |
---|---|
US (1) | US11430681B2 (en) |
EP (1) | EP3535780B1 (en) |
JP (1) | JP7041144B2 (en) |
KR (1) | KR102436631B1 (en) |
CN (1) | CN109937473A (en) |
FR (1) | FR3058562B1 (en) |
SG (2) | SG10201913336YA (en) |
TW (1) | TWI753040B (en) |
WO (1) | WO2018083312A1 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7422577B2 (en) * | 2020-03-23 | 2024-01-26 | 平田機工株式会社 | Load port and control method |
CN117425955A (en) * | 2021-06-14 | 2024-01-19 | 恩特格里斯公司 | Substrate container with door liner |
US20230369087A1 (en) * | 2022-05-10 | 2023-11-16 | Entegris, Inc. | Substrate container with door gasket |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003315197A (en) * | 2002-04-26 | 2003-11-06 | Trecenti Technologies Inc | Inspection method and inspection device for wafer storage device, and manufacturing method of semiconductor device |
FR2874744B1 (en) * | 2004-08-30 | 2006-11-24 | Cit Alcatel | VACUUM INTERFACE BETWEEN A MINI-ENVIRONMENT BOX AND EQUIPMENT |
CN101370616B (en) * | 2006-01-11 | 2011-04-27 | 应用材料股份有限公司 | Substrate carrier, loading port and methods for purging a substrate carrier |
JP2007227800A (en) * | 2006-02-24 | 2007-09-06 | Hitachi Kokusai Electric Inc | Substrate storage transport container and substrate storage transport container purge system |
TW201010916A (en) * | 2008-09-12 | 2010-03-16 | Gudeng Prec Industral Co Ltd | Wafer container with roller |
JP5155848B2 (en) * | 2008-12-18 | 2013-03-06 | 日本ケンブリッジフィルター株式会社 | N2 purge device for FOUP |
TWI585892B (en) * | 2010-09-17 | 2017-06-01 | 昕芙旎雅股份有限公司 | Cassette adapter |
JP5815959B2 (en) | 2011-02-08 | 2015-11-17 | 近藤工業株式会社 | Nozzle unit in N2 gas purge device |
JP6131534B2 (en) * | 2012-06-11 | 2017-05-24 | シンフォニアテクノロジー株式会社 | Purge nozzle unit, load port, mounting table, stocker |
TWM456581U (en) * | 2012-11-20 | 2013-07-01 | Ming-Sheng Chen | Inflatable cleanup system of wafer / mask sealed carrier |
KR101822009B1 (en) * | 2014-02-07 | 2018-03-08 | 무라다기카이가부시끼가이샤 | Purge device and purge method |
KR102400424B1 (en) * | 2014-09-05 | 2022-05-19 | 로제 가부시키가이샤 | Loading port and loading port atmoshpere substitution method |
JP6459682B2 (en) * | 2015-03-20 | 2019-01-30 | Tdk株式会社 | Gas purge device, load port device and gas purge method |
-
2016
- 2016-11-07 FR FR1660750A patent/FR3058562B1/en active Active
-
2017
- 2017-10-27 TW TW106137250A patent/TWI753040B/en active
- 2017-11-06 JP JP2019522564A patent/JP7041144B2/en active Active
- 2017-11-06 US US16/338,783 patent/US11430681B2/en active Active
- 2017-11-06 EP EP17797603.2A patent/EP3535780B1/en active Active
- 2017-11-06 WO PCT/EP2017/078367 patent/WO2018083312A1/en unknown
- 2017-11-06 SG SG10201913336YA patent/SG10201913336YA/en unknown
- 2017-11-06 SG SG11201903413UA patent/SG11201903413UA/en unknown
- 2017-11-06 KR KR1020197016260A patent/KR102436631B1/en active Active
- 2017-11-06 CN CN201780068496.8A patent/CN109937473A/en active Pending
Also Published As
Publication number | Publication date |
---|---|
TWI753040B (en) | 2022-01-21 |
US20200051844A1 (en) | 2020-02-13 |
TW201834118A (en) | 2018-09-16 |
WO2018083312A1 (en) | 2018-05-11 |
CN109937473A (en) | 2019-06-25 |
EP3535780B1 (en) | 2024-03-27 |
JP2019533907A (en) | 2019-11-21 |
EP3535780A1 (en) | 2019-09-11 |
KR20190073567A (en) | 2019-06-26 |
JP7041144B2 (en) | 2022-03-23 |
SG11201903413UA (en) | 2019-05-30 |
FR3058562B1 (en) | 2019-05-10 |
US11430681B2 (en) | 2022-08-30 |
FR3058562A1 (en) | 2018-05-11 |
KR102436631B1 (en) | 2022-08-25 |
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