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SE0003904L - Ways of measuring surface roughness - Google Patents

Ways of measuring surface roughness

Info

Publication number
SE0003904L
SE0003904L SE0003904A SE0003904A SE0003904L SE 0003904 L SE0003904 L SE 0003904L SE 0003904 A SE0003904 A SE 0003904A SE 0003904 A SE0003904 A SE 0003904A SE 0003904 L SE0003904 L SE 0003904L
Authority
SE
Sweden
Prior art keywords
spectrum
ways
surface roughness
measuring surface
carried out
Prior art date
Application number
SE0003904A
Other languages
Unknown language ( )
Swedish (sv)
Other versions
SE0003904D0 (en
Inventor
Roger Tuomas
Matti Rantatalo
Original Assignee
Roger Tuomas
Matti Rantatalo
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from SE0001638A external-priority patent/SE516999C2/en
Application filed by Roger Tuomas, Matti Rantatalo filed Critical Roger Tuomas
Priority to SE0003904A priority Critical patent/SE0003904L/en
Publication of SE0003904D0 publication Critical patent/SE0003904D0/en
Priority to AU58962/01A priority patent/AU5896201A/en
Priority to PCT/SE2001/000974 priority patent/WO2001086228A1/en
Publication of SE0003904L publication Critical patent/SE0003904L/en
Priority to SE0203217A priority patent/SE523302C2/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

For measuring a surface structure, one takes two or more pictures with a progressive-scan CCD camera (15) and drag light from different directions for different pictures. A two-dimensional Fourier transform is then carried out for each picture and the two spectra are added to form a spectrum that is an approximation of the correct spectrum for the surface that is photographed. This spectrum illustrates the surface structure. The method can be carried out on-line in a paper machine and the result will be as good as the result of conventional laboratory tests.
SE0003904A 2000-05-05 2000-10-25 Ways of measuring surface roughness SE0003904L (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
SE0003904A SE0003904L (en) 2000-05-05 2000-10-25 Ways of measuring surface roughness
AU58962/01A AU5896201A (en) 2000-05-05 2001-05-04 A method to measure surface structure
PCT/SE2001/000974 WO2001086228A1 (en) 2000-05-05 2001-05-04 A method to measure surface structure
SE0203217A SE523302C2 (en) 2000-05-05 2002-11-01 Measuring method for a surface structure of a material by lighting up the surface with drag light and photographing it electronically with a CCD-camera

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SE0001638A SE516999C2 (en) 2000-05-05 2000-05-05 Measuring method for a surface structure of a material by lighting up the surface with drag light and photographing it electronically with a CCD-camera
SE0003904A SE0003904L (en) 2000-05-05 2000-10-25 Ways of measuring surface roughness

Publications (2)

Publication Number Publication Date
SE0003904D0 SE0003904D0 (en) 2000-10-25
SE0003904L true SE0003904L (en) 2001-11-06

Family

ID=26655094

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0003904A SE0003904L (en) 2000-05-05 2000-10-25 Ways of measuring surface roughness

Country Status (3)

Country Link
AU (1) AU5896201A (en)
SE (1) SE0003904L (en)
WO (1) WO2001086228A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
PT102849B (en) * 2002-10-08 2005-02-28 Soporcel Sociedade Portuguesa AUTOMATIC METHOD AND INSTALLATION OF OPTICAL ASSESSMENT OF THE ASPECT OF THE PAPER SURFACE
EP1898207A1 (en) * 2006-09-06 2008-03-12 ABB Oy Method and apparatus for measuring intensity of laid lines in a strip-like product
DE102007036432A1 (en) * 2007-08-02 2009-02-05 Voith Patent Gmbh Method and device for detecting structures in a fibrous web or in a pulp suspension jet

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL9200071A (en) * 1992-01-15 1993-08-02 Stichting Science Park Maastri DEVICE FOR DETERMINING THE TOPOGRAPHY OF A CURVED SURFACE.
DE4230068A1 (en) * 1992-09-09 1994-03-10 Tzn Forschung & Entwicklung Method and device for contactless checking of the surface roughness of materials
JP3312849B2 (en) * 1996-06-25 2002-08-12 松下電工株式会社 Defect detection method for object surface
SE508822C2 (en) * 1997-02-17 1998-11-09 Volvo Ab Method and apparatus for measuring and quantifying surface defects on a test surface
SE511985C2 (en) * 1999-01-28 2000-01-10 Skogsind Tekn Foskningsinst Topographic determination of a surface illuminated by incident light

Also Published As

Publication number Publication date
WO2001086228A1 (en) 2001-11-15
AU5896201A (en) 2001-11-20
SE0003904D0 (en) 2000-10-25

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