NO793899L - Digital tester og pseudotilfeldig generator. - Google Patents

Digital tester og pseudotilfeldig generator.

Info

Publication number: NO793899L
Authority: NO; Norway
Prior art keywords: pseudotic; generator; digital tests; tests; digital
Prior art date: 1978-11-30

Application number

NO793899A

Other languages

English (en)

Other versions

NO152070B (no

NO152070C (no

Inventor

David Stuart Bass

Original Assignee

Sperry Corp

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1978-11-30

Filing date

1979-11-29

Publication date

1980-06-02

1979-11-29 Application filed by Sperry Corp filed Critical Sperry Corp

1980-06-02 Publication of NO793899L publication Critical patent/NO793899L/no

1985-04-15 Publication of NO152070B publication Critical patent/NO152070B/no

1985-07-24 Publication of NO152070C publication Critical patent/NO152070C/no

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/31813—Test pattern generators
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
- G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
- G06F11/277—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response

Landscapes

Engineering & Computer Science (AREA)
General Engineering & Computer Science (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Tests Of Electronic Circuits (AREA)

NO793899A 1978-11-30 1979-11-29 Apparat for testing av en eller flere digitale kretser NO152070C (no)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
US05/965,122 US4222514A (en)	1978-11-30	1978-11-30	Digital tester

Publications (3)

Publication Number	Publication Date
NO793899L true NO793899L (no)	1980-06-02
NO152070B NO152070B (no)	1985-04-15
NO152070C NO152070C (no)	1985-07-24

Family

ID=25509484

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
NO793899A NO152070C (no)	1978-11-30	1979-11-29	Apparat for testing av en eller flere digitale kretser

Country Status (8)

Country	Link
US (1)	US4222514A (no)
EP (1)	EP0020714B1 (no)
BE (1)	BE880263A (no)
DE (1)	DE2966903D1 (no)
GB (2)	GB2100485B (no)
IT (1)	IT1120643B (no)
NO (1)	NO152070C (no)
WO (1)	WO1980001207A1 (no)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US4383312A (en) *	1980-11-28	1983-05-10	The United States Of America As Represented By The Secretary Of The Navy	Multiplex system tester
FR2501867A1 (fr) *	1981-03-11	1982-09-17	Commissariat Energie Atomique	Systeme de test de la defaillance ou du bon fonctionnement d'un circuit a composants logiques
DE3400035A1 (de) *	1983-01-07	1984-07-12	General Electric Co., Schenectady, N.Y.	Simulator fuer statistisches rauschen
FR2563392B1 (fr) *	1984-04-19	1986-06-06	Loire Electronique	Generateur pseudo-aleatoire
US4715034A (en) *	1985-03-04	1987-12-22	John Fluke Mfg. Co., Inc.	Method of and system for fast functional testing of random access memories
US4771429A (en) *	1986-09-18	1988-09-13	Abbott Laboratories	Circuit combining functions of cyclic redundancy check code and pseudo-random number generators
US4855681A (en) *	1987-06-08	1989-08-08	International Business Machines Corporation	Timing generator for generating a multiplicty of timing signals having selectable pulse positions
US4870346A (en) *	1987-09-14	1989-09-26	Texas Instruments Incorporated	Distributed pseudo random sequence control with universal polynomial function generator for LSI/VLSI test systems
US5260950A (en) *	1991-09-17	1993-11-09	Ncr Corporation	Boundary-scan input circuit for a reset pin
US5357523A (en) *	1991-12-18	1994-10-18	International Business Machines Corporation	Memory testing system with algorithmic test data generation
US6185707B1 (en) *	1998-11-13	2001-02-06	Knights Technology, Inc.	IC test software system for mapping logical functional test data of logic integrated circuits to physical representation
GB2362718B (en) *	2000-05-24	2002-04-17	3Com Corp	Method and apparatus for inducing locally elevated temperatures in an application specific integrated circuit
GB2377142A (en) *	2001-06-29	2002-12-31	Motorola Inc	Encoder for generating an error checkword
KR20080019078A (ko) *	2006-08-22	2008-03-03	삼성전자주식회사	순환 중복 검사를 이용한 테스트 방법 및 이를 이용하는디지털 장치
CN114076883B (zh) *	2021-11-10	2023-09-05	北京中电华大电子设计有限责任公司	老化电路、芯片老化测试方法及芯片

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US3651315A (en) *	1970-05-14	1972-03-21	Collins Radio Co	Digital products inspection system
US3832535A (en) *	1972-10-25	1974-08-27	Instrumentation Engineering	Digital word generating and receiving apparatus
US3924181A (en) *	1973-10-16	1975-12-02	Hughes Aircraft Co	Test circuitry employing a cyclic code generator
US3976864A (en) *	1974-09-03	1976-08-24	Hewlett-Packard Company	Apparatus and method for testing digital circuits
NO141294C (no) *	1974-10-31	1980-02-06	Licentia Gmbh	Fremgangsmaate ved frembringelse av slumpartede binaertegnfoelger
US4045662A (en) *	1976-03-29	1977-08-30	The Bendix Corporation	Self testing monitoring apparatus for multiplexed digital input signals
US4070565A (en) *	1976-08-18	1978-01-24	Zehntel, Inc.	Programmable tester method and apparatus
US4142239A (en) *	1977-06-29	1979-02-27	The United States Of America As Represented By The Secretary Of The Army	Apparatus for generating digital streams having variable probabilities of error
US4125763A (en) *	1977-07-15	1978-11-14	Fluke Trendar Corporation	Automatic tester for microprocessor board

1978
- 1978-11-30 US US05/965,122 patent/US4222514A/en not_active Expired - Lifetime
1979
- 1979-11-26 GB GB8212278A patent/GB2100485B/en not_active Expired
- 1979-11-26 GB GB8023687A patent/GB2047413B/en not_active Expired
- 1979-11-26 WO PCT/US1979/001061 patent/WO1980001207A1/en active IP Right Grant
- 1979-11-26 DE DE8080900111T patent/DE2966903D1/de not_active Expired
- 1979-11-27 BE BE0/198288A patent/BE880263A/fr not_active IP Right Cessation
- 1979-11-28 IT IT50932/79A patent/IT1120643B/it active
- 1979-11-29 NO NO793899A patent/NO152070C/no unknown
1980
- 1980-06-17 EP EP80900111A patent/EP0020714B1/en not_active Expired

Also Published As

Publication number	Publication date
IT1120643B (it)	1986-03-26
NO152070B (no)	1985-04-15
EP0020714B1 (en)	1984-04-11
IT7950932A0 (it)	1979-11-28
GB2047413A (en)	1980-11-26
DE2966903D1 (en)	1984-05-17
BE880263A (fr)	1980-03-17
EP0020714A4 (en)	1981-08-31
US4222514A (en)	1980-09-16
GB2100485B (en)	1983-06-08
NO152070C (no)	1985-07-24
GB2047413B (en)	1983-03-09
GB2100485A (en)	1982-12-22
EP0020714A1 (en)	1981-01-07
WO1980001207A1 (en)	1980-06-12

Publication	Publication Date	Title
JPS5347894A (en)	1978-04-28	Testing instruments and method
JPS5319737A (en)	1978-02-23	Tester
JPS533775A (en)	1978-01-13	Testing structure
DK197178A (da)	1978-11-07	Forbindelse og midler
ATA464177A (de)	1979-03-15	Prpuefvorrichtung
DK498377A (da)	1978-05-11	Immunolisk testmetode
NO793899L (no)	1980-06-02	Digital tester og pseudotilfeldig generator.
DK11877A (da)	1977-07-17	Antracyklinglykosider og fremgangsmade til fremstilling deraf
NL7612746A (nl)	1977-05-20	Testapparaat.
IT8026930A0 (it)	1980-12-23	Dispositivo di verifica di continuita'.
NL7714067A (nl)	1978-06-29	Elektrofotografische werkwijze en inrichting.
SE7714295L (sv)	1978-06-17	Undervattensinspektion och -kommunikation
NL7702534A (nl)	1977-09-16	Benzoylpiperidylalkylindolen en werkwijzen ter bereiding daarvan.
IT1075811B (it)	1985-04-22	Analizzatore meccanico dinamico
DK154347C (da)	1989-04-10	Vaskemiddel og fremgangsmaade til fremstilling deraf
NO153818C (no)	1986-06-04	Anordning og fremgangsmaate for testing av en broenn.
DK177677A (da)	1977-10-23	Vaskemiddel og fremgangsmade til fremstilling deraf
IT1115516B (it)	1986-02-03	Pertacampioni da saggio tipo vetrino
DK144288C (da)	1982-07-05	Faldproeveapparat
NO800711L (no)	1980-09-22	Digitalt simulerings-apparat.
IT7919375A0 (it)	1979-01-17	Procedimento e dispositivo per prova di ermeticida.
FI790798A (fi)	1980-09-09	Anordning foer testning av absorptionssaerskiljningsfoermaogan
DK110579A (da)	1979-09-18	Fremgangsmaade til testning af motorer og apparat til testning af motorer
DK532077A (da)	1978-06-02	Phthalocyaninpignenter og fremgangsmaade til fremstilling deraf
NL7602422A (nl)	1977-09-12	Trombosetest.