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NL7808111A - Halfgeleiderinrichting met een mos-capaciteit. - Google Patents

Halfgeleiderinrichting met een mos-capaciteit.

Info

Publication number
NL7808111A
NL7808111A NL787808111A NL7808111A NL7808111A NL 7808111 A NL7808111 A NL 7808111A NL 787808111 A NL787808111 A NL 787808111A NL 7808111 A NL7808111 A NL 7808111A NL 7808111 A NL7808111 A NL 7808111A
Authority
NL
Netherlands
Prior art keywords
semi
conductor device
mos capacity
mos
capacity
Prior art date
Application number
NL787808111A
Other languages
English (en)
Other versions
NL185592C (nl
NL185592B (nl
Original Assignee
Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE19772735529 external-priority patent/DE2735529A1/de
Priority claimed from DE2826192A external-priority patent/DE2826192C2/de
Application filed by Philips Nv filed Critical Philips Nv
Publication of NL7808111A publication Critical patent/NL7808111A/nl
Publication of NL185592B publication Critical patent/NL185592B/nl
Application granted granted Critical
Publication of NL185592C publication Critical patent/NL185592C/nl

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03BGENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
    • H03B5/00Generation of oscillations using amplifier with regenerative feedback from output to input
    • H03B5/30Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator
    • H03B5/32Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator being a piezoelectric resonator
    • H03B5/36Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator being a piezoelectric resonator active element in amplifier being semiconductor device
    • H03B5/366Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator being a piezoelectric resonator active element in amplifier being semiconductor device and comprising means for varying the frequency by a variable voltage or current
    • H03B5/368Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator being a piezoelectric resonator active element in amplifier being semiconductor device and comprising means for varying the frequency by a variable voltage or current the means being voltage variable capacitance diodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76Making of isolation regions between components
    • H01L21/761PN junctions
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03JTUNING RESONANT CIRCUITS; SELECTING RESONANT CIRCUITS
    • H03J3/00Continuous tuning
    • H03J3/02Details
    • H03J3/16Tuning without displacement of reactive element, e.g. by varying permeability
    • H03J3/18Tuning without displacement of reactive element, e.g. by varying permeability by discharge tube or semiconductor device simulating variable reactance
    • H03J3/185Tuning without displacement of reactive element, e.g. by varying permeability by discharge tube or semiconductor device simulating variable reactance with varactors, i.e. voltage variable reactive diodes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D1/00Resistors, capacitors or inductors
    • H10D1/60Capacitors
    • H10D1/62Capacitors having potential barriers
    • H10D1/66Conductor-insulator-semiconductor capacitors, e.g. MOS capacitors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/201Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of only components covered by H10D1/00 or H10D8/00, e.g. RLC circuits
    • H10D84/204Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of only components covered by H10D1/00 or H10D8/00, e.g. RLC circuits of combinations of diodes or capacitors or resistors
    • H10D84/212Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of only components covered by H10D1/00 or H10D8/00, e.g. RLC circuits of combinations of diodes or capacitors or resistors of only capacitors
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03BGENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
    • H03B2200/00Indexing scheme relating to details of oscillators covered by H03B
    • H03B2200/003Circuit elements of oscillators
    • H03B2200/004Circuit elements of oscillators including a variable capacitance, e.g. a varicap, a varactor or a variable capacitance of a diode or transistor

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
  • Amplifiers (AREA)
NLAANVRAGE7808111,A 1977-08-06 1978-08-02 Halfgeleiderinrichting voorzien van een capaciteit. NL185592C (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19772735529 DE2735529A1 (de) 1977-08-06 1977-08-06 Halbleiterbauelement mit einer mos-kapazitaet
DE2826192A DE2826192C2 (de) 1978-06-15 1978-06-15 Schaltungsanordnung mit einem Halbleiterbauelement mit einer MOS-Kapazität

Publications (3)

Publication Number Publication Date
NL7808111A true NL7808111A (nl) 1979-02-08
NL185592B NL185592B (nl) 1989-12-18
NL185592C NL185592C (nl) 1990-05-16

Family

ID=25772483

Family Applications (1)

Application Number Title Priority Date Filing Date
NLAANVRAGE7808111,A NL185592C (nl) 1977-08-06 1978-08-02 Halfgeleiderinrichting voorzien van een capaciteit.

Country Status (7)

Country Link
US (2) US4214252A (nl)
JP (1) JPS5448490A (nl)
CA (1) CA1128670A (nl)
FR (1) FR2399738A1 (nl)
GB (1) GB2002580B (nl)
IT (1) IT1097683B (nl)
NL (1) NL185592C (nl)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4633291A (en) * 1983-03-01 1986-12-30 Tokyo Shibaura Denki Kabushiki Kaisha High-gain semiconductor device with capacitive coupling

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56129423A (en) * 1980-03-14 1981-10-09 Sony Corp Triangle wave generating circuit
JPS5771165A (en) * 1980-10-22 1982-05-01 Toshiba Corp Semiconductor device
DE3174824D1 (en) * 1980-12-17 1986-07-17 Matsushita Electric Ind Co Ltd Semiconductor integrated circuit
FR2502864B1 (fr) * 1981-03-24 1986-09-05 Asulab Sa Circuit integre pour oscillateur a frequence reglable
JPS58107703A (ja) * 1981-12-21 1983-06-27 Matsushita Electric Ind Co Ltd 電圧制御発振器
JPS5985104A (ja) * 1982-11-05 1984-05-17 Toshiba Corp 発振装置
JPS6068662U (ja) * 1983-10-17 1985-05-15 三洋電機株式会社 集積化コンデンサ
JPS60170964A (ja) * 1984-02-15 1985-09-04 Rohm Co Ltd 容量素子
US4786828A (en) * 1987-05-15 1988-11-22 Hoffman Charles R Bias scheme for achieving voltage independent capacitance
JP2623692B2 (ja) * 1988-01-22 1997-06-25 ソニー株式会社 半導体回路装置
US5006480A (en) * 1988-08-08 1991-04-09 Hughes Aircraft Company Metal gate capacitor fabricated with a silicon gate MOS process
US5136357A (en) * 1989-06-26 1992-08-04 Micron Technology, Inc. Low-noise, area-efficient, high-frequency clock signal distribution line structure
JP2761961B2 (ja) * 1990-04-06 1998-06-04 健一 上山 半導体可変容量素子
US5113153A (en) * 1991-05-20 1992-05-12 International Business Machines Corporation High-frequency monolithic oscillator structure for third-overtone crystals
US5602052A (en) * 1995-04-24 1997-02-11 Harris Corporation Method of forming dummy island capacitor
US6014064A (en) * 1996-07-28 2000-01-11 The Whitaker Corporation Heterolithic voltage controlled oscillator
US6420747B2 (en) 1999-02-10 2002-07-16 International Business Machines Corporation MOSCAP design for improved reliability
US7098753B1 (en) 2003-06-13 2006-08-29 Silicon Clocks, Inc. Oscillator with variable reference
US7324561B1 (en) 2003-06-13 2008-01-29 Silicon Clocks Inc. Systems and methods for generating an output oscillation signal with low jitter
JP5927882B2 (ja) * 2011-12-08 2016-06-01 セイコーエプソン株式会社 発振回路、及び電子機器
KR101607764B1 (ko) * 2014-08-27 2016-03-31 숭실대학교산학협력단 차동 구조의 발진기

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5314113Y2 (nl) * 1971-12-28 1978-04-15
JPS5524264B2 (nl) * 1972-02-08 1980-06-27
US3886458A (en) * 1972-12-12 1975-05-27 Sony Corp Frequency converter circuit with integrated injection capacitor
US3893146A (en) * 1973-12-26 1975-07-01 Teletype Corp Semiconductor capacitor structure and memory cell, and method of making
US3953875A (en) * 1974-01-02 1976-04-27 Motorola, Inc. Capacitor structure and circuit facilitating increased frequency stability of integrated circuits
US3973221A (en) * 1975-04-07 1976-08-03 Motorola, Inc. Voltage controlled crystal oscillator apparatus
US4081766A (en) * 1977-01-24 1978-03-28 Motorola, Inc. Crystal tuned voltage controlled oscillator

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4633291A (en) * 1983-03-01 1986-12-30 Tokyo Shibaura Denki Kabushiki Kaisha High-gain semiconductor device with capacitive coupling

Also Published As

Publication number Publication date
US4214252A (en) 1980-07-22
GB2002580A (en) 1979-02-21
FR2399738A1 (fr) 1979-03-02
IT1097683B (it) 1985-08-31
JPS6124824B2 (nl) 1986-06-12
US4297654A (en) 1981-10-27
NL185592C (nl) 1990-05-16
FR2399738B1 (nl) 1984-06-01
IT7826454A0 (it) 1978-08-03
NL185592B (nl) 1989-12-18
JPS5448490A (en) 1979-04-17
GB2002580B (en) 1982-01-27
CA1128670A (en) 1982-07-27

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Legal Events

Date Code Title Description
BB A search report has been drawn up
BC A request for examination has been filed
A85 Still pending on 85-01-01
V1 Lapsed because of non-payment of the annual fee