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MX356023B - Metodo y aparato para corregir desviaciones de intensidad en un espectrometro. - Google Patents

Metodo y aparato para corregir desviaciones de intensidad en un espectrometro.

Info

Publication number
MX356023B
MX356023B MX2015016602A MX2015016602A MX356023B MX 356023 B MX356023 B MX 356023B MX 2015016602 A MX2015016602 A MX 2015016602A MX 2015016602 A MX2015016602 A MX 2015016602A MX 356023 B MX356023 B MX 356023B
Authority
MX
Mexico
Prior art keywords
wavenumber
determining
spectrometer
correcting
absorption
Prior art date
Application number
MX2015016602A
Other languages
English (en)
Other versions
MX2015016602A (es
Inventor
Waaben Hansen Per
Original Assignee
Foss Analytical As
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Foss Analytical As filed Critical Foss Analytical As
Publication of MX2015016602A publication Critical patent/MX2015016602A/es
Publication of MX356023B publication Critical patent/MX356023B/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0291—Housings; Spectrometer accessories; Spatial arrangement of elements, e.g. folded path arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/45—Interferometric spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N2021/3595—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using FTIR
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/127—Calibration; base line adjustment; drift compensation
    • G01N2201/12746—Calibration values determination

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Optical Measuring Cells (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Spectrometry And Color Measurement (AREA)

Abstract

Un método de determinación de una desviación de la longitud de trayectoria de una muestra (610), comprendiendo el método exponer la muestra (610) a radiación electromagnética con una pluralidad de números de onda, determinar la absorción electromagnética en la muestra (610) a la pluralidad de números de onda, determinar un primer número de onda asociado con un primer nivel de absorción de una banda de absorción y un segundo número de onda asociado con un segundo nivel de absorción de la banda de absorción, en donde el segundo número de onda es diferente del primer número de onda, determinar una diferencia entre el primer número de onda y el segundo número de onda, y determinar la desviación de la longitud de trayectoria en base a esta diferencia.
MX2015016602A 2013-06-04 2013-06-04 Metodo y aparato para corregir desviaciones de intensidad en un espectrometro. MX356023B (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/EP2013/061490 WO2014194935A1 (en) 2013-06-04 2013-06-04 Method of and apparatus for correcting for intensity deviations in a spectrometer

Publications (2)

Publication Number Publication Date
MX2015016602A MX2015016602A (es) 2016-08-12
MX356023B true MX356023B (es) 2018-05-09

Family

ID=48651992

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2015016602A MX356023B (es) 2013-06-04 2013-06-04 Metodo y aparato para corregir desviaciones de intensidad en un espectrometro.

Country Status (17)

Country Link
US (1) US9874515B2 (es)
EP (1) EP3004839B1 (es)
JP (1) JP6209273B2 (es)
CN (1) CN105164513B (es)
AR (1) AR096465A1 (es)
AU (1) AU2013391754B2 (es)
BR (1) BR112015030064B1 (es)
CA (1) CA2910115C (es)
DK (1) DK3004839T3 (es)
ES (1) ES2774227T3 (es)
HU (1) HUE048093T2 (es)
MX (1) MX356023B (es)
NZ (1) NZ713752A (es)
PL (1) PL3004839T3 (es)
PT (1) PT3004839T (es)
RU (1) RU2624337C1 (es)
WO (1) WO2014194935A1 (es)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11226346B2 (en) 2016-07-21 2022-01-18 Siemens Healthcare Diagnostics Inc. Eliminating source lamp intensity drift effect using reference measurement between cuvettes
US9829378B1 (en) 2016-10-13 2017-11-28 Bentley Instruments, Inc. Determining a size of cell of a transmission spectroscopy device
US11774353B2 (en) * 2018-10-30 2023-10-03 The Government Of The United States Of America, As Represented By The Secretary Of The Navy Methods and apparatuses for biomimetic standoff detection of hazardous chemicals
CN109444062B (zh) * 2018-11-29 2021-07-13 西安交通大学 一种无人机载高排典型污染物差分吸收光谱检测方法
BR112021023768A2 (pt) 2019-08-28 2022-03-15 Foss Analytical As Método de correção de uma mudança de amplitude em um espectrômetro
EP4090945A1 (en) * 2020-01-16 2022-11-23 FOSS Analytical A/S Method of determining an optical pathlength through a cuvette
JP2023122114A (ja) * 2022-02-22 2023-09-01 日本分光株式会社 フーリエ変換赤外分光光度計
CN115011739B (zh) * 2022-08-03 2022-11-01 南京邦康生物技术有限公司 一种益生菌的生产控制方法与系统

Family Cites Families (17)

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JPS58167942A (ja) * 1982-03-29 1983-10-04 Hitachi Ltd キユベツト光路長のばらつき補正法
JPS6182145A (ja) * 1984-09-28 1986-04-25 Shimadzu Corp 自動分析装置
US5121337A (en) * 1990-10-15 1992-06-09 Exxon Research And Engineering Company Method for correcting spectral data for data due to the spectral measurement process itself and estimating unknown property and/or composition data of a sample using such method
CA2146342A1 (en) * 1992-10-07 1994-04-14 Steven M. Maggard Spectroscopic instrument calibration
US5959738A (en) 1994-07-25 1999-09-28 Molecular Devices Corporation Determination of light absorption pathlength in a vertical-beam photometer
NZ300915A (en) * 1995-02-09 1998-12-23 Foss Electric As Method for standardizing a spectrometer generating an optical spectrum from a sample
US6219132B1 (en) * 1997-09-25 2001-04-17 Bayer Corporation Method and apparatus for performing spectroscopic analysis with applicability to samples with turbidity and absorption
US5993792A (en) 1997-11-13 1999-11-30 Tiro Industries Incorporated System for customized hair products containing surfactants
JP2001059772A (ja) * 1999-08-25 2001-03-06 Jasco Corp ベースライン補正方法
US7009180B2 (en) * 2001-12-14 2006-03-07 Optiscan Biomedical Corp. Pathlength-independent methods for optically determining material composition
US6862534B2 (en) * 2001-12-14 2005-03-01 Optiscan Biomedical Corporation Method of determining an analyte concentration in a sample from an absorption spectrum
JP4974042B2 (ja) * 2006-01-16 2012-07-11 横河電機株式会社 スペクトル補正方法
US7582869B2 (en) * 2006-07-20 2009-09-01 Sas Photonics, Llc System and method for optical analysis
JP5572955B2 (ja) * 2009-01-29 2014-08-20 株式会社サタケ 近似式による吸光度の算出方法
JP5955661B2 (ja) * 2011-07-06 2016-07-20 アークレイ株式会社 分光測定装置、分光測定用具、分光測定方法およびプログラム
EP2745085B1 (en) 2011-08-19 2019-04-17 FOSS Analytical A/S Method for compensating amplitude drift in a spectrometer and spectrometer performing said method
GB2494693B (en) 2011-09-16 2018-01-17 Starna Scient Limited Method for determining the path length of a sample and validating the measurement obtained

Also Published As

Publication number Publication date
RU2624337C1 (ru) 2017-07-03
AU2013391754B2 (en) 2017-08-17
EP3004839A1 (en) 2016-04-13
CN105164513B (zh) 2018-02-02
PT3004839T (pt) 2020-03-27
DK3004839T3 (da) 2020-03-23
JP6209273B2 (ja) 2017-10-04
BR112015030064B1 (pt) 2020-10-20
JP2016521848A (ja) 2016-07-25
EP3004839B1 (en) 2020-02-12
PL3004839T3 (pl) 2020-06-01
AU2013391754A1 (en) 2015-11-12
ES2774227T3 (es) 2020-07-17
CN105164513A (zh) 2015-12-16
HUE048093T2 (hu) 2020-05-28
AR096465A1 (es) 2015-12-30
WO2014194935A1 (en) 2014-12-11
CA2910115C (en) 2020-08-18
MX2015016602A (es) 2016-08-12
CA2910115A1 (en) 2014-12-11
US20160123870A1 (en) 2016-05-05
BR112015030064A2 (pt) 2017-07-25
NZ713752A (en) 2019-03-29
US9874515B2 (en) 2018-01-23

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