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MX2024008980A - Unidad de chispa intercambiable, sistema y metodo de calibracion. - Google Patents

Unidad de chispa intercambiable, sistema y metodo de calibracion.

Info

Publication number
MX2024008980A
MX2024008980A MX2024008980A MX2024008980A MX2024008980A MX 2024008980 A MX2024008980 A MX 2024008980A MX 2024008980 A MX2024008980 A MX 2024008980A MX 2024008980 A MX2024008980 A MX 2024008980A MX 2024008980 A MX2024008980 A MX 2024008980A
Authority
MX
Mexico
Prior art keywords
sample
exchangeable
spark
spark unit
optical emission
Prior art date
Application number
MX2024008980A
Other languages
English (en)
Inventor
Luc Vranckx
Jean-Paul Verhoeven
Vitali Kodach
Original Assignee
Heraeus Electro Nite Int
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Heraeus Electro Nite Int filed Critical Heraeus Electro Nite Int
Publication of MX2024008980A publication Critical patent/MX2024008980A/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/69—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence specially adapted for fluids, e.g. molten metal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/69—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence specially adapted for fluids, e.g. molten metal
    • G01N2021/695—Molten metals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0636—Reflectors

Landscapes

  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

La invención se relaciona con una unidad de chispa intercambiable para un espectrómetro de emisión óptica, un sistema para analizar una muestra usando espectrometría de emisión óptica y un método para calibrar una unidad de chispa intercambiable. Una unidad de chispa intercambiable (10) para un espectrómetro de emisión óptica (12) comprende un portador de muestras (20) que define un plano de muestra (22) para posicionar una muestra a ser analizada, el portador de muestras (20) tiene una abertura (24), y un electrodo (26) dispuesto a una distancia (D) del plano de muestra (22) en la región de la abertura (24) de tal manera que se pueda generar una chispa entre el electrodo (26) y una muestra posicionada en el plano de muestra (22) para emitir luz. La unidad de chispa intercambiable (10) comprende además una interfaz de acoplamiento (30) para acoplar mecánicamente la unidad de chispa intercambiable (10) con el espectrómetro de emisión óptica (12) y un componente óptico (44) para influir en la luz emitida.
MX2024008980A 2022-02-15 2023-01-20 Unidad de chispa intercambiable, sistema y metodo de calibracion. MX2024008980A (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP22156761.3A EP4227669A1 (en) 2022-02-15 2022-02-15 Exchangeable spark unit and calibration method
PCT/EP2023/051368 WO2023156131A1 (en) 2022-02-15 2023-01-20 Exchangeable spark unit, system and calibration method

Publications (1)

Publication Number Publication Date
MX2024008980A true MX2024008980A (es) 2024-07-29

Family

ID=80447448

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2024008980A MX2024008980A (es) 2022-02-15 2023-01-20 Unidad de chispa intercambiable, sistema y metodo de calibracion.

Country Status (8)

Country Link
US (1) US20250146944A1 (es)
EP (2) EP4227669A1 (es)
JP (1) JP2025500668A (es)
KR (1) KR20240127432A (es)
CN (1) CN118647858A (es)
MX (1) MX2024008980A (es)
TW (1) TWI859697B (es)
WO (1) WO2023156131A1 (es)

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3029038C2 (de) 1980-07-31 1982-06-09 Krupp Stahl Ag, 4630 Bochum Gerät zur spektralanalytischen Untersuchung der chemischen Zusammensetzung metallischer Werkstücke
DE3244164A1 (de) 1982-11-29 1984-05-30 A.R.L. Applied Research Laboratories S.A., 1024 Eclubens Verfahren zur bestimmung von elementen in metallen mit optischer emissions-spektralanalyse
DE3344944C2 (de) 1983-12-13 1986-06-05 Knieps & Pöckler, 5828 Ennepetal Verfahren zur Analyse von Stahl während seiner Herstellung und Weiterverarbeitung
JPH0610297Y2 (ja) * 1986-06-13 1994-03-16 株式会社島津製作所 発光分光分析装置
US5285251A (en) 1989-04-29 1994-02-08 Fisons Plc Apparatus and methods for optical emission spectroscopy
JPH09325117A (ja) * 1996-06-05 1997-12-16 Shimadzu Corp 発光分光分析装置
JPH10281995A (ja) * 1997-04-08 1998-10-23 Kawasaki Steel Corp 発光分光分析方法及び装置
JPH11211661A (ja) * 1998-01-30 1999-08-06 Shimadzu Corp 可搬型発光分光分析装置
FI115999B (fi) * 2002-09-18 2005-08-31 Oxford Instr Analytical Oy Menetelmä ja järjestely optisen emissiospektroskopian soveltamiseksi hiilen 193 nm:n spektriviivan havaitsemiseksi
DE102005002292B4 (de) 2005-01-17 2016-02-11 Spectro Analytical Instruments Gmbh & Co. Kg Verfahren zum Betrieb eines optischen Emissionsspektrometers
US9255900B2 (en) * 2012-03-19 2016-02-09 Glenn M. Fishbine Hand held toxicity tester
JP6834303B2 (ja) * 2016-09-28 2021-02-24 株式会社島津製作所 発光分析装置
EP3336511B1 (en) 2016-12-13 2019-06-12 Heraeus Electro-Nite International N.V. Direct analysis sampler
EP3336513B1 (en) 2016-12-13 2021-02-03 Heraeus Electro-Nite International N.V. Sampler for molten metal
ES2726037T3 (es) 2016-12-13 2019-10-01 Heraeus Electro Nite Int Muestreador de análisis directo con disipador térmico
ES2950398T3 (es) 2016-12-13 2023-10-09 Heraeus Electro Nite Int Muestreador de análisis directo
DE102018110767A1 (de) 2018-05-04 2019-11-07 Elementar Analysensysteme Gmbh Funkenemissionsspektrometer mit abtrennbarer Funkenkammer
EP3581914B1 (en) 2018-06-12 2023-06-07 Heraeus Electro-Nite International N.V. Molten metal samplers for high and low oxygen applications
EP3581913B1 (en) 2018-06-12 2023-06-07 Heraeus Electro-Nite International N.V. Improved molten metal sampler
CN109341853B (zh) * 2018-10-11 2022-10-18 烟台荣高数字科技有限公司 一种光谱仪的多向气流冲洗装置
GB2592853B (en) 2019-09-12 2022-04-13 Thermo Fisher Scient Ecublens Sarl A spark stand and method of maintenance

Also Published As

Publication number Publication date
JP2025500668A (ja) 2025-01-09
CN118647858A (zh) 2024-09-13
KR20240127432A (ko) 2024-08-22
US20250146944A1 (en) 2025-05-08
TWI859697B (zh) 2024-10-21
WO2023156131A1 (en) 2023-08-24
EP4479732A1 (en) 2024-12-25
EP4227669A1 (en) 2023-08-16
TW202412463A (zh) 2024-03-16

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