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MX2020008158A - Sistema y kit para formación de imágenes de retrodispersión de rayos x con detector retirable. - Google Patents

Sistema y kit para formación de imágenes de retrodispersión de rayos x con detector retirable.

Info

Publication number
MX2020008158A
MX2020008158A MX2020008158A MX2020008158A MX2020008158A MX 2020008158 A MX2020008158 A MX 2020008158A MX 2020008158 A MX2020008158 A MX 2020008158A MX 2020008158 A MX2020008158 A MX 2020008158A MX 2020008158 A MX2020008158 A MX 2020008158A
Authority
MX
Mexico
Prior art keywords
ray
backscatter
kit
movable
ray backscatter
Prior art date
Application number
MX2020008158A
Other languages
English (en)
Inventor
Peter J Rothschild
Howard D Kellogg
Original Assignee
Viken Detection Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Viken Detection Corp filed Critical Viken Detection Corp
Publication of MX2020008158A publication Critical patent/MX2020008158A/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/043—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/053—Investigating materials by wave or particle radiation by diffraction, scatter or reflection back scatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/301—Accessories, mechanical or electrical features portable apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3301—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts beam is modified for scan, e.g. moving collimator
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/401—Imaging image processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/421—Imaging digitised image, analysed in real time (recognition algorithms)

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Multimedia (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

Un generador de imágenes de rayos x movible incluye un primer conjunto de detector de rayos x de retrodispersión. El sistema también incluye un segundo conjunto de detector de rayos x de retrodispersión que es fijable de manera retirable con el generador de imágenes de rayos x movible. El generador de imágenes de rayos x movible y el segundo detector de rayos x de retrodispersión incluyen características de fijación complementarias configuradas para asegurar, de manera retirable, el segundo detector de rayos x de retrodispersión con el generador de imágenes de rayos x movible en una disposición que tiene el segundo y primer detectores de rayos x de retrodispersión orientados de manera fija con respecto entre sí.
MX2020008158A 2018-02-02 2019-02-01 Sistema y kit para formación de imágenes de retrodispersión de rayos x con detector retirable. MX2020008158A (es)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201862625526P 2018-02-02 2018-02-02
US201962796351P 2019-01-24 2019-01-24
PCT/US2019/016436 WO2019152900A1 (en) 2018-02-02 2019-02-01 System and kit for x-ray backscatter imaging with removable detector

Publications (1)

Publication Number Publication Date
MX2020008158A true MX2020008158A (es) 2020-11-24

Family

ID=65494541

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2020008158A MX2020008158A (es) 2018-02-02 2019-02-01 Sistema y kit para formación de imágenes de retrodispersión de rayos x con detector retirable.

Country Status (9)

Country Link
US (3) US10794843B2 (es)
EP (1) EP3746816A1 (es)
KR (1) KR20200110807A (es)
CN (1) CN111699413A (es)
AU (1) AU2019215207A1 (es)
CA (1) CA3089726A1 (es)
MX (1) MX2020008158A (es)
SA (1) SA520412541B1 (es)
WO (1) WO2019152900A1 (es)

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US10670740B2 (en) * 2012-02-14 2020-06-02 American Science And Engineering, Inc. Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors
EP3221722A1 (en) 2014-11-20 2017-09-27 Heuresis Corporation X-ray scanning system
PL3271709T3 (pl) 2015-03-20 2023-02-20 Rapiscan Systems, Inc. Ręczny przenośny system kontroli rozpraszania wstecznego
KR102056090B1 (ko) 2015-06-30 2019-12-16 주식회사 바텍 전계방출 엑스선 소스를 갖는 포터블 엑스선 발생 장치
US10770195B2 (en) 2017-04-05 2020-09-08 Viken Detection Corporation X-ray chopper wheel assembly
CN111699413A (zh) 2018-02-02 2020-09-22 维肯检测公司 用于x射线反向散射成像的具有可移除检测器的系统和套件
US10830911B2 (en) 2018-06-20 2020-11-10 American Science And Engineering, Inc. Wavelength-shifting sheet-coupled scintillation detectors
BR112022001635A2 (pt) * 2019-08-02 2022-07-12 Videray Tech Inc Roda de corte de raio x fechada
SE544422C2 (en) * 2020-05-25 2022-05-17 RTI Group AB X-ray sensing detector assembly
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US11175245B1 (en) 2020-06-15 2021-11-16 American Science And Engineering, Inc. Scatter X-ray imaging with adaptive scanning beam intensity
CN114166874A (zh) * 2020-09-11 2022-03-11 同方威视技术股份有限公司 背散射检查系统和方法
CN114166875B (zh) * 2020-09-11 2024-01-12 同方威视技术股份有限公司 背散射检查系统
WO2022094616A1 (en) * 2020-10-30 2022-05-05 Viken Detection Corporation X-ray pipe inspection system
US11340361B1 (en) 2020-11-23 2022-05-24 American Science And Engineering, Inc. Wireless transmission detector panel for an X-ray scanner
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WO2024011247A2 (en) 2022-07-07 2024-01-11 Viken Detection Corporation Rotating hoop chopper wheel for x-ray imagers
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CN201340400Y (zh) 2009-01-20 2009-11-04 江苏天瑞仪器股份有限公司 带有一体化散热装置的手持式x射线荧光光谱仪
CN102448376B (zh) 2009-05-28 2014-07-23 皇家飞利浦电子股份有限公司 多探测器阵列成像系统
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PE20150233Z (es) 2012-01-27 2015-02-12 American Science & Eng Inc Dispositivo manual de formacion de imagenes de retrodispersion de rayos x
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Also Published As

Publication number Publication date
WO2019152900A1 (en) 2019-08-08
US11448606B2 (en) 2022-09-20
CN111699413A (zh) 2020-09-22
US20190242834A1 (en) 2019-08-08
KR20200110807A (ko) 2020-09-25
US20200326291A1 (en) 2020-10-15
AU2019215207A1 (en) 2020-08-20
SA520412541B1 (ar) 2022-12-11
US20220091054A1 (en) 2022-03-24
US10794843B2 (en) 2020-10-06
CA3089726A1 (en) 2019-08-08
EP3746816A1 (en) 2020-12-09

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