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MX2016009200A - Diseños mejorados para elementos informaticos integrados. - Google Patents

Diseños mejorados para elementos informaticos integrados.

Info

Publication number
MX2016009200A
MX2016009200A MX2016009200A MX2016009200A MX2016009200A MX 2016009200 A MX2016009200 A MX 2016009200A MX 2016009200 A MX2016009200 A MX 2016009200A MX 2016009200 A MX2016009200 A MX 2016009200A MX 2016009200 A MX2016009200 A MX 2016009200A
Authority
MX
Mexico
Prior art keywords
thin film
optical
refractive index
integrated computational
film layer
Prior art date
Application number
MX2016009200A
Other languages
English (en)
Other versions
MX359910B (es
Inventor
michael jones Christopher
Paul Freese Robert
Neal Gardner Richard
l perkins David
Original Assignee
Halliburton Energy Services Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Halliburton Energy Services Inc filed Critical Halliburton Energy Services Inc
Publication of MX2016009200A publication Critical patent/MX2016009200A/es
Publication of MX359910B publication Critical patent/MX359910B/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/20—Filters
    • G02B5/28—Interference filters
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/20—Filters
    • G02B5/28—Interference filters
    • G02B5/285—Interference filters comprising deposited thin solid films
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/068—Optics, miscellaneous
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/129—Using chemometrical methods

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Laminated Bodies (AREA)
  • Optical Integrated Circuits (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

Se describen mejores elementos informáticos integrados para uso en dispositivos informático ópticos. Un elemento informático integrado incluye un sustrato óptico, una primera y segunda pluralidad de capas de película óptica fina depositadas de forma alternativa en el sustrato óptico para formar una pila de películas finas, donde cada capa de película óptica fina de la primera pluralidad presenta un primer índice refractario y cada capa de película óptica fina de la segunda pluralidad presenta un segundo índice refractario diferente al primer índice refractario, y al menos una capa de película óptica fina adicional colocada en o sobre la pila de películas finas y en comunicación óptica con al menos una de las capas de película óptica fina de la primera y la segunda pluralidad, donde al menos una capa de película óptica fina adicional presenta un tercer índice refractario diferente al primer y el segundo índice refractario.
MX2016009200A 2014-02-20 2014-02-20 Diseños mejorados para elementos informaticos integrados. MX359910B (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2014/017309 WO2015126396A1 (en) 2014-02-20 2014-02-20 Improved designs for integrated computational elements

Publications (2)

Publication Number Publication Date
MX2016009200A true MX2016009200A (es) 2016-10-03
MX359910B MX359910B (es) 2018-10-16

Family

ID=53878722

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2016009200A MX359910B (es) 2014-02-20 2014-02-20 Diseños mejorados para elementos informaticos integrados.

Country Status (5)

Country Link
US (1) US9733183B2 (es)
EP (1) EP3069121A1 (es)
BR (1) BR112016012481B1 (es)
MX (1) MX359910B (es)
WO (1) WO2015126396A1 (es)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015126396A1 (en) 2014-02-20 2015-08-27 Halliburton Energy Services, Inc. Improved designs for integrated computational elements
US11579013B2 (en) 2018-03-06 2023-02-14 Halliburton Energy Services, Inc. Flexible integrated computational elements for optical analysis
US11668644B2 (en) * 2021-03-30 2023-06-06 Onto Innovation Inc. Opto-acoustic measurement of a transparent film stack
US12079754B2 (en) * 2022-03-01 2024-09-03 Saudi Arabian Oil Company Well completion operations intelligent advisory based on dimension embedding

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0215372A3 (de) * 1985-09-17 1989-01-04 Siemens Aktiengesellschaft Kanten-Interferenzfilter für die optische Nachrichtenübertragung im Wellenlängenmultiplex
US5549953A (en) * 1993-04-29 1996-08-27 National Research Council Of Canada Optical recording media having optically-variable security properties
US6198531B1 (en) * 1997-07-11 2001-03-06 University Of South Carolina Optical computational system
DE19732619C2 (de) * 1997-07-29 1999-08-19 Fraunhofer Ges Forschung Optische Detektoreinrichtung
US7138156B1 (en) 2000-09-26 2006-11-21 Myrick Michael L Filter design algorithm for multi-variate optical computing
US6609795B2 (en) 2001-06-11 2003-08-26 3M Innovative Properties Company Polarizing beam splitter
US7019905B2 (en) * 2003-12-30 2006-03-28 3M Innovative Properties Company Multilayer reflector with suppression of high order reflections
US7901870B1 (en) * 2004-05-12 2011-03-08 Cirrex Systems Llc Adjusting optical properties of optical thin films
US20070201136A1 (en) 2004-09-13 2007-08-30 University Of South Carolina Thin Film Interference Filter and Bootstrap Method for Interference Filter Thin Film Deposition Process Control
US20060055308A1 (en) * 2004-09-16 2006-03-16 Lairson Bruce M Plasma display filter with a dielectric/metallic layer stack of at least eleven layers
US7697141B2 (en) * 2004-12-09 2010-04-13 Halliburton Energy Services, Inc. In situ optical computation fluid analysis system and method
JP5135753B2 (ja) 2006-02-01 2013-02-06 セイコーエプソン株式会社 光学物品
US8645082B2 (en) * 2010-09-13 2014-02-04 Mks Instruments, Inc. Monitoring, detecting and quantifying chemical compounds in a sample
US9206386B2 (en) * 2011-08-05 2015-12-08 Halliburton Energy Services, Inc. Systems and methods for analyzing microbiological substances
US8780352B2 (en) * 2012-04-26 2014-07-15 Halliburton Energy Services, Inc. Methods and devices for optically determining a characteristic of a substance
US9013702B2 (en) * 2012-04-26 2015-04-21 Halliburton Energy Services, Inc. Imaging systems for optical computing devices
WO2015126396A1 (en) 2014-02-20 2015-08-27 Halliburton Energy Services, Inc. Improved designs for integrated computational elements

Also Published As

Publication number Publication date
US9733183B2 (en) 2017-08-15
BR112016012481A2 (es) 2017-08-08
EP3069121A1 (en) 2016-09-21
US20160274027A1 (en) 2016-09-22
BR112016012481B1 (pt) 2022-05-10
MX359910B (es) 2018-10-16
WO2015126396A1 (en) 2015-08-27

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Legal Events

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