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LU92695B1 - Verfahren und vorrichtung zur spim-untersuchung einer probe - Google Patents

Verfahren und vorrichtung zur spim-untersuchung einer probe

Info

Publication number
LU92695B1
LU92695B1 LU92695A LU92695A LU92695B1 LU 92695 B1 LU92695 B1 LU 92695B1 LU 92695 A LU92695 A LU 92695A LU 92695 A LU92695 A LU 92695A LU 92695 B1 LU92695 B1 LU 92695B1
Authority
LU
Luxembourg
Prior art keywords
sample
spim
examination
spim examination
Prior art date
Application number
LU92695A
Other languages
English (en)
Inventor
Werner Knebel
Frank Sieckmann
Florian Fahrbach
Original Assignee
Leica Microsystems
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Leica Microsystems filed Critical Leica Microsystems
Priority to LU92695A priority Critical patent/LU92695B1/de
Priority to PCT/EP2016/058564 priority patent/WO2016166374A1/de
Priority to US15/566,728 priority patent/US10495865B2/en
Priority to EP16716886.3A priority patent/EP3283918A1/de
Application granted granted Critical
Publication of LU92695B1 publication Critical patent/LU92695B1/de

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/18—Arrangements with more than one light path, e.g. for comparing two specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
    • G01J3/36—Investigating two or more bands of a spectrum by separate detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0064—Optical details of the image generation multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/10—Condensers affording dark-field illumination
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/362—Mechanical details, e.g. mountings for the camera or image sensor, housings
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2823—Imaging spectrometer
    • G01J2003/2826—Multispectral imaging, e.g. filter imaging
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Multimedia (AREA)
  • Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
LU92695A 2015-04-17 2015-04-17 Verfahren und vorrichtung zur spim-untersuchung einer probe LU92695B1 (de)

Priority Applications (4)

Application Number Priority Date Filing Date Title
LU92695A LU92695B1 (de) 2015-04-17 2015-04-17 Verfahren und vorrichtung zur spim-untersuchung einer probe
PCT/EP2016/058564 WO2016166374A1 (de) 2015-04-17 2016-04-18 Verfahren und vorrichtung zur spim-untersuchung einer probe
US15/566,728 US10495865B2 (en) 2015-04-17 2016-04-18 Method and device for the SPIM analysis of a sample
EP16716886.3A EP3283918A1 (de) 2015-04-17 2016-04-18 Verfahren und vorrichtung zur spim-untersuchung einer probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
LU92695A LU92695B1 (de) 2015-04-17 2015-04-17 Verfahren und vorrichtung zur spim-untersuchung einer probe

Publications (1)

Publication Number Publication Date
LU92695B1 true LU92695B1 (de) 2016-10-18

Family

ID=53177340

Family Applications (1)

Application Number Title Priority Date Filing Date
LU92695A LU92695B1 (de) 2015-04-17 2015-04-17 Verfahren und vorrichtung zur spim-untersuchung einer probe

Country Status (4)

Country Link
US (1) US10495865B2 (de)
EP (1) EP3283918A1 (de)
LU (1) LU92695B1 (de)
WO (1) WO2016166374A1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102018129833B4 (de) 2017-12-04 2020-01-02 Leica Microsystems Cms Gmbh Mikroskopsystem, Detektionseinheit für Mikroskopsystem und Verfahren zur mikroskopischen Abbildung einer Probe
DE102018129832B4 (de) 2017-12-04 2020-08-27 Leica Microsystems Cms Gmbh Mikroskopsystem und Verfahren zur mikroskopischen Abbildung
DE102018124129A1 (de) 2017-12-04 2019-06-06 Leica Microsystems Cms Gmbh Mikroskopsystem und Verfahren zur mikroskopischen Abbildung mit einem solchen Mikroskopsystem
DE102020120198B4 (de) 2020-07-30 2022-07-14 Leica Microsystems Cms Gmbh Verfahren zur Montage einer Detektionsanordnung für ein Mikroskopsystem

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013017855A1 (en) * 2011-07-29 2013-02-07 Ffei Limited Method and apparatus for image scanning
WO2014147261A1 (de) * 2013-03-22 2014-09-25 Leica Microsystems Cms Gmbh Spim-anordnung

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3877788A (en) * 1973-03-30 1975-04-15 Itek Corp Method and apparatus for testing lenses
DE10257423A1 (de) 2002-12-09 2004-06-24 Europäisches Laboratorium für Molekularbiologie (EMBL) Mikroskop
DE102004034957A1 (de) 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Anordnung zur mikroskopischen Beobachtung und/oder Detektion und Verwendung
DE102009044986A1 (de) * 2009-09-24 2011-03-31 Carl Zeiss Microimaging Gmbh Mikroskop
DE102010049751B4 (de) * 2010-10-29 2020-11-05 "Stiftung Caesar" (Center Of Advanced European Studies And Research) Optischer Strahlteiler zur simultanen Aufnahme eines Z-Stapels auf einem Halbleiterchip, Bausatz zum Aufbau eines optischen Strahlteilers und Lichtmikroskop
DE202011110077U1 (de) 2011-10-28 2012-11-29 Leica Microsystems Cms Gmbh Anordnung zur Beleuchtung einer Probe

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013017855A1 (en) * 2011-07-29 2013-02-07 Ffei Limited Method and apparatus for image scanning
WO2014147261A1 (de) * 2013-03-22 2014-09-25 Leica Microsystems Cms Gmbh Spim-anordnung

Also Published As

Publication number Publication date
US20180149851A1 (en) 2018-05-31
US10495865B2 (en) 2019-12-03
WO2016166374A1 (de) 2016-10-20
EP3283918A1 (de) 2018-02-21

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