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KR970707473A - 측정값의 분석 방법 및 그 방법을 실시하기 위한 측정값 분석기(process for analysing a measurement and measurement analyser for implementing it) - Google Patents

측정값의 분석 방법 및 그 방법을 실시하기 위한 측정값 분석기(process for analysing a measurement and measurement analyser for implementing it)

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Publication number
KR970707473A
KR970707473A KR1019970702718A KR19970702718A KR970707473A KR 970707473 A KR970707473 A KR 970707473A KR 1019970702718 A KR1019970702718 A KR 1019970702718A KR 19970702718 A KR19970702718 A KR 19970702718A KR 970707473 A KR970707473 A KR 970707473A
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KR
South Korea
Prior art keywords
measured value
measurement
value
analyzing
measured
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KR1019970702718A
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KR100485025B1 (ko
Inventor
헤르만 샤일
Original Assignee
디터 크리스트; 게르하르트 퀼
지멘스 악티엔게젤샤프트
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Publication of KR970707473A publication Critical patent/KR970707473A/ko
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Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0221—Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/08—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for safeguarding the apparatus, e.g. against abnormal operation, against breakdown
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B9/00—Safety arrangements
    • G05B9/02—Safety arrangements electric

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)

Abstract

플랜트 프로세스(6)에서 측정 시스템(4)에 의해 측정값(MW)을 검출하여 제1비교점(16)에서 측정 시스템(4)에 대한 특정 특성값(K)에 의해 합리성을 검사하는 방식의 측정값 분석 방법에서는, 측정값(MW) 에러의 모니터링시 매우 높은 신뢰도를 얻기 위해 본 발명에 따라 제2비교점(20)에서 플랜트 프로세스(6)에 대한 특성 규칙에 의해, 측정값(MW)과 무관하게 검출된 측정 파라메터와 측정값(MW)과의 일치성을 검사한다. 바람직하게는 평가 펙터(C)를 측정값(MW)에 할당하는 방식으로 상기 검사의 결과를 웨이팅한다.

Description

측정값의 분석 방법 및 그 방법을 실시하기 위한 측정값 분석기(PROCESS FOR ANALYSING A MEASUREMENT AND MEASUREMENT ANALYSER FOR IMPLEMENTING IT)
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 측정값 분석기의 회로도이고, 제2도는 측정값의 분석 및 처리 플로우 챠트이다.

Claims (4)

  1. 플랜트 프로세스(6)에서 측정 시스템(4)에 의해 측정값(MW)을 검출하여 제1비교점(16)에서 측정 시스템(4)에 대한 특정 특성값(K)에 의해 합리성을 검사하는 방식의 측정값 분석 방법에 있어서, 제2비교점(20)에서 플랜트 프로세스(6)에 대한 특성 규칙에 의해, 측정값(MW)과 무관하게 검출된 측정 파라메터와 측정값(MW)과의 일치성을 검사하고, 상기 검사의 결과를 웨이팅하는 것을 특징으로 하는 측정값 분석 방법.
  2. 제1항에 있어서, 플랜트 프로세스(6)에 대한 특성 규칙(R)이 측정값(MW)에 의해 업데이트되는 것을 특징으로 하는 측정값 분석 방법.
  3. 측정값(MW)을 검출하는 측정 시스템(4)용 특성값 메모리(18)와 연결된 제1비교 모듈(16)을 포함하는, 제1항 또는 2항에 따른 방법을 실시하기 의한 측정값 분석기에 있어서, 제2비교모듈(20)이 제1비교 모듈(16)및 측정값과 무관하게 검출된 측정 파라메터용 데이타 메모리(22)에 연결되며, 플랜트 프로세스(6)를 특성화하는 규칙을 이용해서 상기 측정 파라메터로부터 측정값(MW)용 설정값이 유도되는 것을 것을 특징으로 하는 측정값 분석기.
  4. 제3항에 있어서, 제2비교 모듈(20)이 측정값(MW)의 웨이팅을 위한 평가모듈(24)에 연결되는 것을 특징으로 하는 측정값 분석기.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019970702718A 1994-10-26 1995-10-13 측정값분석방법및그방법을실시하기위한측정값분석기 Expired - Fee Related KR100485025B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DEP4438300.2 1994-10-26
DE4438300 1994-10-26
PCT/DE1995/001420 WO1996013764A1 (de) 1994-10-26 1995-10-13 Verfahren zur analyse eines messwertes sowie messwertanalysator zur durchführung des verfahrens

Publications (2)

Publication Number Publication Date
KR970707473A true KR970707473A (ko) 1997-12-01
KR100485025B1 KR100485025B1 (ko) 2005-06-16

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019970702718A Expired - Fee Related KR100485025B1 (ko) 1994-10-26 1995-10-13 측정값분석방법및그방법을실시하기위한측정값분석기

Country Status (8)

Country Link
US (1) US5835886A (ko)
EP (1) EP0788624B1 (ko)
KR (1) KR100485025B1 (ko)
CN (1) CN1103946C (ko)
AU (1) AU3697295A (ko)
BR (1) BR9509446A (ko)
DE (1) DE59503378D1 (ko)
WO (1) WO1996013764A1 (ko)

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Also Published As

Publication number Publication date
KR100485025B1 (ko) 2005-06-16
WO1996013764A1 (de) 1996-05-09
BR9509446A (pt) 1997-12-23
CN1161091A (zh) 1997-10-01
AU3697295A (en) 1996-05-23
EP0788624B1 (de) 1998-08-26
US5835886A (en) 1998-11-10
EP0788624A1 (de) 1997-08-13
CN1103946C (zh) 2003-03-26
HK1001793A1 (en) 1998-07-10
DE59503378D1 (de) 1998-10-01

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