KR970058404A - 신호 교환 기판 - Google Patents
신호 교환 기판 Download PDFInfo
- Publication number
- KR970058404A KR970058404A KR1019950068173A KR19950068173A KR970058404A KR 970058404 A KR970058404 A KR 970058404A KR 1019950068173 A KR1019950068173 A KR 1019950068173A KR 19950068173 A KR19950068173 A KR 19950068173A KR 970058404 A KR970058404 A KR 970058404A
- Authority
- KR
- South Korea
- Prior art keywords
- signal exchange
- exchange board
- signal
- package
- sockets
- Prior art date
Links
- 239000000758 substrate Substances 0.000 claims abstract 4
- 238000007689 inspection Methods 0.000 claims 5
- 238000012544 monitoring process Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/325—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by abutting or pinching, i.e. without alloying process; mechanical auxiliary parts therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2817—Environmental-, stress-, or burn-in tests
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Metallurgy (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Description
Claims (5)
- 패키지가 적어도 하나 이상 실장된 기판의 탭에 각기 대응되어 전기적 연결되도록 설치된 소켓들과, 그 소켓들의 다른 측에 패키지 검사 장치의 소켓에 각기 대응되어 전기적 연결되도록 형성된 탭과, 상기 소켓들과 탭간의 원하는 전기적 연결을 위한 회로 배선부를 갖으며, 상기 기판에 실장된 패키지의 원하는 검사를 할 수 있도록 상기 기판의 탭과 상기 패키지 검사 장치의 소켓의 각 전기적 신호를 메칭하는 것을 특징으로 하는 신호 교환 기판.
- 제1항에 있어서, 상기 기판이 MBT 장치용 기판인 것을 특징으로 하는 신호 교환 기판.
- 제1항에 있어서, 상기 패키지 검사 장치가 패키지의 번인 검사를 하는 동적 챔버인 것을 특징으로 하는 신호 교환 기판.
- 제1항에 있어서, 상기 신호 교환 기판의 소켓이 각기 88핀으로 2개 설치된 것을 특징으로 하는 신호 교환 기판.
- 제1항에 있어서, 상기 신호 교환 기판의 탭이 72핀인 것을 특징으로 하는 신호 교환 기판.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950068173A KR0182507B1 (ko) | 1995-12-30 | 1995-12-30 | 신호 교환 기판 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950068173A KR0182507B1 (ko) | 1995-12-30 | 1995-12-30 | 신호 교환 기판 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR970058404A true KR970058404A (ko) | 1997-07-31 |
KR0182507B1 KR0182507B1 (ko) | 1999-05-15 |
Family
ID=19447957
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019950068173A KR0182507B1 (ko) | 1995-12-30 | 1995-12-30 | 신호 교환 기판 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR0182507B1 (ko) |
-
1995
- 1995-12-30 KR KR1019950068173A patent/KR0182507B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR0182507B1 (ko) | 1999-05-15 |
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