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KR970046790U - 큐에프피용 테스트 소켓 - Google Patents

큐에프피용 테스트 소켓

Info

Publication number
KR970046790U
KR970046790U KR2019950038949U KR19950038949U KR970046790U KR 970046790 U KR970046790 U KR 970046790U KR 2019950038949 U KR2019950038949 U KR 2019950038949U KR 19950038949 U KR19950038949 U KR 19950038949U KR 970046790 U KR970046790 U KR 970046790U
Authority
KR
South Korea
Prior art keywords
test socket
socket
test
Prior art date
Application number
KR2019950038949U
Other languages
English (en)
Other versions
KR200141124Y1 (ko
Inventor
서정윤
Original Assignee
엘지반도체주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 엘지반도체주식회사 filed Critical 엘지반도체주식회사
Priority to KR2019950038949U priority Critical patent/KR200141124Y1/ko
Publication of KR970046790U publication Critical patent/KR970046790U/ko
Application granted granted Critical
Publication of KR200141124Y1 publication Critical patent/KR200141124Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)
KR2019950038949U 1995-12-07 1995-12-07 큐에프피용 테스트 소켓 KR200141124Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019950038949U KR200141124Y1 (ko) 1995-12-07 1995-12-07 큐에프피용 테스트 소켓

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019950038949U KR200141124Y1 (ko) 1995-12-07 1995-12-07 큐에프피용 테스트 소켓

Publications (2)

Publication Number Publication Date
KR970046790U true KR970046790U (ko) 1997-07-31
KR200141124Y1 KR200141124Y1 (ko) 1999-04-15

Family

ID=19432492

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019950038949U KR200141124Y1 (ko) 1995-12-07 1995-12-07 큐에프피용 테스트 소켓

Country Status (1)

Country Link
KR (1) KR200141124Y1 (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100952735B1 (ko) 2007-12-17 2010-04-13 미래산업 주식회사 테스트 소켓

Also Published As

Publication number Publication date
KR200141124Y1 (ko) 1999-04-15

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Legal Events

Date Code Title Description
A201 Request for examination
UA0108 Application for utility model registration

Comment text: Application for Utility Model Registration

Patent event code: UA01011R08D

Patent event date: 19951207

UA0201 Request for examination

Patent event date: 19951207

Patent event code: UA02012R01D

Comment text: Request for Examination of Application

UG1501 Laying open of application
E902 Notification of reason for refusal
UE0902 Notice of grounds for rejection

Comment text: Notification of reason for refusal

Patent event code: UE09021S01D

Patent event date: 19980828

E701 Decision to grant or registration of patent right
UE0701 Decision of registration

Patent event date: 19981130

Comment text: Decision to Grant Registration

Patent event code: UE07011S01D

REGI Registration of establishment
UR0701 Registration of establishment

Patent event date: 19981229

Patent event code: UR07011E01D

Comment text: Registration of Establishment

UR1002 Payment of registration fee

Start annual number: 1

End annual number: 3

Payment date: 19981229

UG1601 Publication of registration
UR1001 Payment of annual fee

Payment date: 20011115

Start annual number: 4

End annual number: 4

UR1001 Payment of annual fee

Payment date: 20021120

Start annual number: 5

End annual number: 5

UR1001 Payment of annual fee

Payment date: 20031119

Start annual number: 6

End annual number: 6

FPAY Annual fee payment

Payment date: 20041119

Year of fee payment: 7

UR1001 Payment of annual fee

Payment date: 20041119

Start annual number: 7

End annual number: 7

LAPS Lapse due to unpaid annual fee