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KR960025402U - Gas flow inspection device - Google Patents

Gas flow inspection device

Info

Publication number
KR960025402U
KR960025402U KR2019940037081U KR19940037081U KR960025402U KR 960025402 U KR960025402 U KR 960025402U KR 2019940037081 U KR2019940037081 U KR 2019940037081U KR 19940037081 U KR19940037081 U KR 19940037081U KR 960025402 U KR960025402 U KR 960025402U
Authority
KR
South Korea
Prior art keywords
gas flow
inspection device
flow inspection
gas
inspection
Prior art date
Application number
KR2019940037081U
Other languages
Korean (ko)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to KR2019940037081U priority Critical patent/KR960025402U/en
Publication of KR960025402U publication Critical patent/KR960025402U/en

Links

KR2019940037081U 1994-12-29 1994-12-29 Gas flow inspection device KR960025402U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019940037081U KR960025402U (en) 1994-12-29 1994-12-29 Gas flow inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019940037081U KR960025402U (en) 1994-12-29 1994-12-29 Gas flow inspection device

Publications (1)

Publication Number Publication Date
KR960025402U true KR960025402U (en) 1996-07-22

Family

ID=60853220

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019940037081U KR960025402U (en) 1994-12-29 1994-12-29 Gas flow inspection device

Country Status (1)

Country Link
KR (1) KR960025402U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100246966B1 (en) * 1996-12-06 2000-03-15 윤종용 Correction instrument of pressure measuring instrument in the facility for manufacturing semiconductor device and correction method of pressure measuring instrument thereby

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100246966B1 (en) * 1996-12-06 2000-03-15 윤종용 Correction instrument of pressure measuring instrument in the facility for manufacturing semiconductor device and correction method of pressure measuring instrument thereby

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Legal Events

Date Code Title Description
UA0108 Application for utility model registration

Comment text: Application for Utility Model Registration

Patent event code: UA01011R08D

Patent event date: 19941229

UG1501 Laying open of application
UC1204 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid