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KR960025386U - QF's handler - Google Patents

QF's handler

Info

Publication number
KR960025386U
KR960025386U KR2019940034919U KR19940034919U KR960025386U KR 960025386 U KR960025386 U KR 960025386U KR 2019940034919 U KR2019940034919 U KR 2019940034919U KR 19940034919 U KR19940034919 U KR 19940034919U KR 960025386 U KR960025386 U KR 960025386U
Authority
KR
South Korea
Prior art keywords
handler
Prior art date
Application number
KR2019940034919U
Other languages
Korean (ko)
Other versions
KR0119751Y1 (en
Inventor
염기복
Original Assignee
엘지반도체주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 엘지반도체주식회사 filed Critical 엘지반도체주식회사
Priority to KR2019940034919U priority Critical patent/KR0119751Y1/en
Publication of KR960025386U publication Critical patent/KR960025386U/en
Application granted granted Critical
Publication of KR0119751Y1 publication Critical patent/KR0119751Y1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2896—Testing of IC packages; Test features related to IC packages

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR2019940034919U 1994-12-21 1994-12-21 Qfp handler KR0119751Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019940034919U KR0119751Y1 (en) 1994-12-21 1994-12-21 Qfp handler

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019940034919U KR0119751Y1 (en) 1994-12-21 1994-12-21 Qfp handler

Publications (2)

Publication Number Publication Date
KR960025386U true KR960025386U (en) 1996-07-22
KR0119751Y1 KR0119751Y1 (en) 1998-08-01

Family

ID=19402079

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019940034919U KR0119751Y1 (en) 1994-12-21 1994-12-21 Qfp handler

Country Status (1)

Country Link
KR (1) KR0119751Y1 (en)

Also Published As

Publication number Publication date
KR0119751Y1 (en) 1998-08-01

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Legal Events

Date Code Title Description
A201 Request for examination
UA0108 Application for utility model registration

Comment text: Application for Utility Model Registration

Patent event code: UA01011R08D

Patent event date: 19941221

UA0201 Request for examination

Patent event date: 19941221

Patent event code: UA02012R01D

Comment text: Request for Examination of Application

UG1501 Laying open of application
E701 Decision to grant or registration of patent right
UE0701 Decision of registration

Patent event date: 19980131

Comment text: Decision to Grant Registration

Patent event code: UE07011S01D

REGI Registration of establishment
UR0701 Registration of establishment

Patent event date: 19980325

Patent event code: UR07011E01D

Comment text: Registration of Establishment

UR1002 Payment of registration fee

Start annual number: 1

End annual number: 3

Payment date: 19980325

UG1601 Publication of registration
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