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KR960009251A - 레이저재료가공시 수반되는 레이저융삭을 경유한 초전도부품의 제작방법 및 장치 - Google Patents

레이저재료가공시 수반되는 레이저융삭을 경유한 초전도부품의 제작방법 및 장치 Download PDF

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Publication number
KR960009251A
KR960009251A KR1019950026697A KR19950026697A KR960009251A KR 960009251 A KR960009251 A KR 960009251A KR 1019950026697 A KR1019950026697 A KR 1019950026697A KR 19950026697 A KR19950026697 A KR 19950026697A KR 960009251 A KR960009251 A KR 960009251A
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KR
South Korea
Prior art keywords
material processing
laser
accompanying
manufacturing superconducting
superconducting parts
Prior art date
Application number
KR1019950026697A
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English (en)
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KR100234850B1 (ko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of KR960009251A publication Critical patent/KR960009251A/ko
Application granted granted Critical
Publication of KR100234850B1 publication Critical patent/KR100234850B1/ko

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Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N60/00Superconducting devices
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/24Vacuum evaporation
    • C23C14/28Vacuum evaporation by wave energy or particle radiation
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N60/00Superconducting devices
    • H10N60/01Manufacture or treatment
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N60/00Superconducting devices
    • H10N60/01Manufacture or treatment
    • H10N60/0268Manufacture or treatment of devices comprising copper oxide
    • H10N60/0296Processes for depositing or forming copper oxide superconductor layers
    • H10N60/0521Processes for depositing or forming copper oxide superconductor layers by pulsed laser deposition, e.g. laser sputtering
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N60/00Superconducting devices
    • H10N60/01Manufacture or treatment
    • H10N60/0268Manufacture or treatment of devices comprising copper oxide
    • H10N60/0661Processes performed after copper oxide formation, e.g. patterning
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S505/00Superconductor technology: apparatus, material, process
    • Y10S505/725Process of making or treating high tc, above 30 k, superconducting shaped material, article, or device
    • Y10S505/73Vacuum treating or coating
    • Y10S505/732Evaporative coating with superconducting material

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Organic Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Toxicology (AREA)
  • Physical Vapour Deposition (AREA)
  • Inorganic Compounds Of Heavy Metals (AREA)
  • Superconductor Devices And Manufacturing Methods Thereof (AREA)
  • Superconductors And Manufacturing Methods Therefor (AREA)
  • Oxygen, Ozone, And Oxides In General (AREA)
KR1019950026697A 1994-08-26 1995-08-26 레이저재료 가공시 수반되는 레이저융삭을 경유한 초전도부품의 제작방법 및 장치 KR100234850B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP6225709A JPH0870144A (ja) 1994-08-26 1994-08-26 超電導部品の作製方法
JP94-225709 1994-08-26

Publications (2)

Publication Number Publication Date
KR960009251A true KR960009251A (ko) 1996-03-22
KR100234850B1 KR100234850B1 (ko) 1999-12-15

Family

ID=16833580

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019950026697A KR100234850B1 (ko) 1994-08-26 1995-08-26 레이저재료 가공시 수반되는 레이저융삭을 경유한 초전도부품의 제작방법 및 장치

Country Status (7)

Country Link
US (2) US5672210A (ko)
EP (1) EP0698931B1 (ko)
JP (1) JPH0870144A (ko)
KR (1) KR100234850B1 (ko)
CA (1) CA2156878A1 (ko)
DE (1) DE69506338T2 (ko)
TW (1) TW383512B (ko)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6209203B1 (en) * 1998-01-08 2001-04-03 Lexmark International, Inc. Method for making nozzle array for printhead
US6120857A (en) * 1998-05-18 2000-09-19 The Regents Of The University Of California Low work function surface layers produced by laser ablation using short-wavelength photons
US6265033B1 (en) 1998-09-11 2001-07-24 Donald Bennett Hilliard Method for optically coupled vapor deposition
WO2000031315A1 (en) * 1998-11-20 2000-06-02 Fernandez Felix E Apparatus and method for pulsed laser deposition of materials on wires and pipes
US6335208B1 (en) 1999-05-10 2002-01-01 Intersil Americas Inc. Laser decapsulation method
DE50014083D1 (de) * 1999-11-26 2007-04-05 Europ High Temperature Superco Verfahren zur Erzeugung einer supraleitfähigen Schicht
US6491759B1 (en) * 2000-03-14 2002-12-10 Neocera, Inc. Combinatorial synthesis system
KR100890981B1 (ko) * 2000-10-26 2009-03-27 네오포토닉스 코포레이션 모놀리식 광학 구조체, 이 모놀리식 광학 구조체의 형성 방법, 가요성 광섬유, 광섬유 형성 방법, 및 광섬유 예비 성형체
JP2002235168A (ja) * 2001-02-08 2002-08-23 Sumitomo Electric Ind Ltd 成膜方法および成膜装置
FR2827705B1 (fr) * 2001-07-19 2003-10-24 Commissariat Energie Atomique Transistor et procede de fabrication d'un transistor sur un substrat sige/soi
US20030054105A1 (en) * 2001-08-14 2003-03-20 Hammond Robert H. Film growth at low pressure mediated by liquid flux and induced by activated oxygen
JP2003156858A (ja) * 2001-11-22 2003-05-30 Tokyo Electron Ltd 基板処理方法及び基板処理システム
US20030129396A1 (en) * 2001-12-27 2003-07-10 Gerhard Kiessling Coating composition for metal conductors and coating process involving the use thereof
US7271012B2 (en) * 2003-07-15 2007-09-18 Control Systemation, Inc. Failure analysis methods and systems
US20050067389A1 (en) * 2003-09-25 2005-03-31 Greer James A. Target manipulation for pulsed laser deposition
US7405165B2 (en) * 2004-11-05 2008-07-29 Taiwan Semiconductor Manufacturing Co, Ltd Dual-tank etch method for oxide thickness control
ES2325894B1 (es) * 2006-02-24 2010-10-28 Universidad De Cadiz Metodo y aparato para la fabricacion de elementos opticos difractivos.
ES2299335B2 (es) * 2006-03-09 2010-10-13 Universidad De Cadiz Metodo para la fabricacion de estructuras opticas con funcionalidad puramente refractivas.
US8742282B2 (en) 2007-04-16 2014-06-03 General Electric Company Ablative plasma gun
US9368772B1 (en) 2009-06-15 2016-06-14 Sakti3, Inc. Packaging and termination structure for a solid state battery
JP2011012349A (ja) * 2010-10-01 2011-01-20 Hochiki Corp 薄膜形成装置およびそれを用いた薄膜形成方法
JP2013122065A (ja) * 2011-12-09 2013-06-20 Sumitomo Electric Ind Ltd 機能性薄膜の成膜方法および成膜装置
WO2014024144A1 (en) * 2012-08-08 2014-02-13 Milman Thin Film Systems Pvt. Ltd. Physical vapor deposition station
KR102188372B1 (ko) * 2019-09-19 2020-12-08 주식회사 테토스 기판 양 측면부 증착 장치
KR102188373B1 (ko) * 2019-09-20 2020-12-08 주식회사 테토스 기판 양 측면부 증착 장치
CN115537737B (zh) * 2022-10-13 2023-11-17 西南交通大学 一种薄涂层的制备方法及系统

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4701592A (en) * 1980-11-17 1987-10-20 Rockwell International Corporation Laser assisted deposition and annealing
JPS63250881A (ja) * 1987-04-07 1988-10-18 Semiconductor Energy Lab Co Ltd 超電導体の作製方法
JPS6443915A (en) 1987-08-10 1989-02-16 Univ Tokai Manufacture of superconductive material
JP2822447B2 (ja) * 1989-05-19 1998-11-11 住友電気工業株式会社 酸化物超電導線材の製造方法および装置
JPH03174307A (ja) * 1989-11-30 1991-07-29 Chiyoudendou Hatsuden Kanren Kiki Zairyo Gijutsu Kenkyu Kumiai 酸化物超電導体の製造方法

Also Published As

Publication number Publication date
US5952271A (en) 1999-09-14
JPH0870144A (ja) 1996-03-12
EP0698931B1 (en) 1998-12-02
TW383512B (en) 2000-03-01
EP0698931A1 (en) 1996-02-28
US5672210A (en) 1997-09-30
DE69506338T2 (de) 1999-05-12
KR100234850B1 (ko) 1999-12-15
CA2156878A1 (en) 1996-02-27
DE69506338D1 (de) 1999-01-14

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