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KR950703143A - 레이져-생성된 플라스마상의 광학적 방출 분광법에 의한 동위원소 분석 공정 - Google Patents

레이져-생성된 플라스마상의 광학적 방출 분광법에 의한 동위원소 분석 공정 Download PDF

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Publication number
KR950703143A
KR950703143A KR1019950700533A KR19950700533A KR950703143A KR 950703143 A KR950703143 A KR 950703143A KR 1019950700533 A KR1019950700533 A KR 1019950700533A KR 19950700533 A KR19950700533 A KR 19950700533A KR 950703143 A KR950703143 A KR 950703143A
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South Korea
Prior art keywords
sample
analysis process
analysis
plasma
laser
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KR1019950700533A
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KR100326286B1 (ko
Inventor
파트리끄 모쉬엥
발테르 피에슈
알랭 쁘띠
알랭 브리앙
Original Assignee
쇼뮈조 피에르
코미세리아 아 렝에르지에 아또미끄
필립 가렛
콤파니 제네랄 데 마띠에르 니클레르
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Publication of KR950703143A publication Critical patent/KR950703143A/ko
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited

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  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Plasma & Fusion (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

레이져-생성된 플라스마상의 광학적 방출 분광법에 의한 동위원소 분석공정 본 발명에 따르면, 분석되어야할 시료(10)는 플라스마(13)를 생성하는 레이져빔(20)에 의해서 방사되고, 상기플라스마에 의해서 방출되는 빛을 분석하여 그것으로부터 시료의 동위원소 성분을 도출한다.
동위원소 분석의 적용은 원자력 산업이다

Description

레이져-생성된 플라스마상의 광학적 방출 분광법에 의한 동위원소 분석 공정
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명에 의한 고정을 수행하는 장치의 기본도이다,
제2도는 농축 우라늄에서 얻어지는 OES/LPP 스펙트럼 이다.

Claims (6)

  1. 다음으로 이루어진 시료 분석을 위한 공정 : -그 표면에 플라스마(13)를 생성하는 펄스-타입 레이져빔(20)에 의하여 분석되어야할 시료(10)를 방사시킴, -상기 플라스마(13)에 의하여 방출되는 빛의 스펙트럼(30)을 분석 -그로부터 시료(10)의 성분을 도출함, 그 분석이 동위원소 분석인 것임을 특징으로 하는 시료 분석 공정.
  2. 제1항에 있어서, 상기 레이져빔(20)의 펄스는 cm2당 수 mJ이하의 에너지를 가지는 것임을 특징으로 하는 시료 분석 공정.
  3. 제1항에 있어서, 상기 스펙트럼의 분석은 레이져 펄스에 비해서 일정한 시간지연을 가지고 수행되는 것임을 특징으로 하는 시료 분석 공정.
  4. 제3항에 있어서, 상기 시간지연은 최소한 약200 ns인 것임을 특징으로 하는 시료 분석 공정.
  5. 제1항에 있어서, 플라스마에 의하여 방출된 빛의 상기 분석은 시료 표면으로부터 적어도 0.5 mm 거리의 플라스마 부피와 관련된 것임을 특징으로 하는 시료 분석 공정.
  6. 제1항 내지 제5항의 어느 한 항에 있어서, 상기 시료는 우라늄이나 플루토늄인 것임을 특징으로 하는 시료 분석 공정.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019950700533A 1993-06-15 1994-06-14 레이져-생성된플라스마상의광학적방출분광법에의한동위원소분석공정 KR100326286B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR93/07179 1993-06-15
FR9307179A FR2706614B1 (fr) 1993-06-15 1993-06-15 Procédé d'analyse isotopique par spectrométrie d'émission optique sur plasma produit par laser.
PCT/FR1994/000708 WO1994029699A1 (fr) 1993-06-15 1994-06-14 Procede d'analyse isotopique par spectrometrie d'emission optique sur plasma produit par laser

Publications (2)

Publication Number Publication Date
KR950703143A true KR950703143A (ko) 1995-08-23
KR100326286B1 KR100326286B1 (ko) 2002-11-07

Family

ID=9448132

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019950700533A KR100326286B1 (ko) 1993-06-15 1994-06-14 레이져-생성된플라스마상의광학적방출분광법에의한동위원소분석공정

Country Status (9)

Country Link
US (1) US5627641A (ko)
EP (1) EP0657026B1 (ko)
JP (1) JPH08503779A (ko)
KR (1) KR100326286B1 (ko)
CA (1) CA2142351A1 (ko)
DE (1) DE69415287T2 (ko)
ES (1) ES2127400T3 (ko)
FR (1) FR2706614B1 (ko)
WO (1) WO1994029699A1 (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100433684B1 (ko) * 2001-11-21 2004-06-02 한국수력원자력 주식회사 레이저 동위원소 분리과정에서 생성물의 질량성분신호를이용한 파장가변 레이저 파장의 실시간 궤환제어 방법

Families Citing this family (10)

* Cited by examiner, † Cited by third party
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DE19531988A1 (de) * 1995-08-30 1997-03-06 Europaeische Kommission Fernmessung von U (Pu) in Gläsern
SE512313E (sv) 1998-06-03 2004-03-16 Valinge Aluminium Ab Låssystem samt golvskiva
US6400787B2 (en) * 1998-07-06 2002-06-04 Euratom Telemetering of uranium of plutonium in glass
GB2359886A (en) * 2000-03-04 2001-09-05 Applied Photonics Ltd Laser spectroscopic remote detection of surface contamination
US7113277B2 (en) * 2003-05-14 2006-09-26 Lockheed Martin Corporation System and method of aerosolized agent capture and detection
US10222337B1 (en) 2008-05-05 2019-03-05 Applied Spectra, Inc. Laser ablation analysis techniques
US9997325B2 (en) * 2008-07-17 2018-06-12 Verity Instruments, Inc. Electron beam exciter for use in chemical analysis in processing systems
CN103822810A (zh) * 2014-02-24 2014-05-28 攀钢集团成都钢钒有限公司 一种光电直读光谱分析仪用试样的制备方法
CN104297170A (zh) * 2014-10-22 2015-01-21 合肥卓越分析仪器有限责任公司 一种光电直读光谱分析仪的废气处理装置
KR102765261B1 (ko) * 2023-02-09 2025-02-06 한국핵융합에너지연구원 불연속파장 이용 스펙트럼 분석 방법 및 불연속파장 이용 스펙트럼 분석 장치

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GB1024687A (en) * 1965-02-13 1966-03-30 Ford Motor Co Laser excitation of atomic spectra
US4794230A (en) * 1984-02-16 1988-12-27 The United States Of America As Represented By The United States Department Of Energy Low-pressure water-cooled inductively coupled plasma torch
JPH06100544B2 (ja) * 1986-07-10 1994-12-12 川崎製鉄株式会社 レーザ発光分光分析装置
US5133901A (en) * 1991-03-01 1992-07-28 Westinghouse Electric Corp. System and method for on-line monitoring and control of heavy metal contamination in soil washing process

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100433684B1 (ko) * 2001-11-21 2004-06-02 한국수력원자력 주식회사 레이저 동위원소 분리과정에서 생성물의 질량성분신호를이용한 파장가변 레이저 파장의 실시간 궤환제어 방법

Also Published As

Publication number Publication date
KR100326286B1 (ko) 2002-11-07
ES2127400T3 (es) 1999-04-16
DE69415287T2 (de) 1999-06-24
US5627641A (en) 1997-05-06
JPH08503779A (ja) 1996-04-23
DE69415287D1 (de) 1999-01-28
WO1994029699A1 (fr) 1994-12-22
FR2706614B1 (fr) 1995-07-13
FR2706614A1 (fr) 1994-12-23
CA2142351A1 (en) 1994-12-22
EP0657026A1 (fr) 1995-06-14
EP0657026B1 (fr) 1998-12-16

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