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KR950003800A - Light emission intensity measuring device of light emitting device - Google Patents

Light emission intensity measuring device of light emitting device Download PDF

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Publication number
KR950003800A
KR950003800A KR1019930013161A KR930013161A KR950003800A KR 950003800 A KR950003800 A KR 950003800A KR 1019930013161 A KR1019930013161 A KR 1019930013161A KR 930013161 A KR930013161 A KR 930013161A KR 950003800 A KR950003800 A KR 950003800A
Authority
KR
South Korea
Prior art keywords
light emitting
light
emitting device
controlling
chip
Prior art date
Application number
KR1019930013161A
Other languages
Korean (ko)
Inventor
윤현재
이만우
윤정수
Original Assignee
박원근
금성전선 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 박원근, 금성전선 주식회사 filed Critical 박원근
Priority to KR1019930013161A priority Critical patent/KR950003800A/en
Publication of KR950003800A publication Critical patent/KR950003800A/en

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  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

본 발명은 복수개의 발광소자를 직접화한 칩이 고정다이에 안착되어 있을때 상기 각 발광소자에 전원을 공급하는 전원공급부와, 상기 전원 공급부에서 공급되는 전원에 의해 복수개의 발광소자가 발광될때 빛을 수광하는 촬상부와, 상기 촬상부 위치를 제어하여 촬상부와 칩의 거리를 조절하는 위치 제어부와, 주변장치를 전반적으로 제어함과 동시에 촬상부에서 출력된 신호를 데이터화 하여 발광소자의 빛 발광강도는 측정하는 컴퓨터로 구성되어 칩에 집적화되는 각 발광소자의 빛 발광강도를 측정하여 데이터화 하므로 각 발광소자가 균일한 발광강도 하는지 알 수 있는 측정장치에 관한 것이다.The present invention provides a power supply unit for supplying power to each light emitting device when a chip directly directing a plurality of light emitting devices is mounted on a fixed die, and light when the plurality of light emitting devices emit light by power supplied from the power supply. The light receiving intensity of the light emitting device by receiving the image pickup unit, the position control unit controlling the position of the image pickup unit and adjusting the distance between the image pickup unit and the chip, and controlling the peripheral devices as a whole, and simultaneously converting the signals output from the image pickup unit into data. Since the light emitting intensity of each light emitting device integrated in the chip is composed of a computer to measure and data is measured, it relates to a measuring device that can know whether each light emitting device has a uniform light emission intensity.

Description

발광소자의 빛 발광강도 측정장치Light emission intensity measuring device of light emitting device

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제 1 도는 볼 발명에 따른 발광소자의 빛 발광강도 측정장치를 나타낸 도면.1 is a view showing a light emission intensity measuring device of a light emitting device according to the invention.

Claims (2)

복수개의 발광수자를 집접화한 칩(10)이 고정다이(20)에 안착되어 있을때 상기 각 발광소자에 전원을 공급하는 전원 공급부(40)와, 상기 전원 공급부(40)에서 공급되는 전원에 의해 복수개의 발광소자가 발광될 때 빛을 수광하는 촬상부(50)와, 상기 촬상부(50) 위치를 제어하여 촬상부와 칩의 거리를 조정하는 위치 제어부(60)와, 주변장치를 전반적으로 제어함과 동시에 촬상부(50)에서 출력된 신호를 데이터화 하여 발광소자의 빛 발강강도는 측정하는 컴퓨터(30)로 이루어진 것을 특징으로 하는 발광소자의 빛 발광강도 측정장치.When the chip 10 integrating a plurality of light emitting water is seated on the fixed die 20, a power supply unit 40 for supplying power to each of the light emitting elements, and by the power supplied from the power supply unit 40 The imaging unit 50 for receiving light when a plurality of light emitting elements are emitted, the position control unit 60 for controlling the position of the imaging unit 50 to adjust the distance between the imaging unit and the chip, and the peripheral device as a whole. Light emission intensity measuring device of the light emitting device, characterized in that made of a computer 30 for controlling the light output intensity of the light emitting device by controlling the data output from the imaging unit 50 at the same time. 제 1 항에 있어서 상기 촬상부(50)는 주변장치를 제어하는 컴퓨터(30)에서 출력되는 제어신호에 따라 초점이 가변되어 빛을 집속하는 현미경과 전하 결합 디바이스를 결합하여 구성된 것을 특징으로 하는 발광소자의 빛 발광강도 측정장치.The light emitting device according to claim 1, wherein the imaging unit (50) is configured by combining a microscope and a charge coupling device for focusing light by focusing according to a control signal output from a computer 30 for controlling a peripheral device. Light emission intensity measuring device of device. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019930013161A 1993-07-13 1993-07-13 Light emission intensity measuring device of light emitting device KR950003800A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019930013161A KR950003800A (en) 1993-07-13 1993-07-13 Light emission intensity measuring device of light emitting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019930013161A KR950003800A (en) 1993-07-13 1993-07-13 Light emission intensity measuring device of light emitting device

Publications (1)

Publication Number Publication Date
KR950003800A true KR950003800A (en) 1995-02-17

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019930013161A KR950003800A (en) 1993-07-13 1993-07-13 Light emission intensity measuring device of light emitting device

Country Status (1)

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KR (1) KR950003800A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010060939A (en) * 1999-12-28 2001-07-07 이구택 Method of shape control for tandem cold rolling mills
KR100721262B1 (en) * 2006-02-20 2007-05-23 한국전자통신연구원 Measuring device and measuring method of flexible display panel
KR100754010B1 (en) * 2005-11-16 2007-09-03 한국광기술원 Optical and Thermal Characteristics Measurement System of LED Array and Control Method Using the Same
KR100762853B1 (en) * 2006-04-27 2007-10-08 (주)티에스이 Light emitting diode test system
KR100768884B1 (en) * 2007-04-26 2007-10-19 서승환 Light emitting device inspection device of substrate
KR20170059415A (en) * 2015-11-20 2017-05-30 박일홍 the soju and beer mixture rate measuring device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010060939A (en) * 1999-12-28 2001-07-07 이구택 Method of shape control for tandem cold rolling mills
KR100754010B1 (en) * 2005-11-16 2007-09-03 한국광기술원 Optical and Thermal Characteristics Measurement System of LED Array and Control Method Using the Same
KR100721262B1 (en) * 2006-02-20 2007-05-23 한국전자통신연구원 Measuring device and measuring method of flexible display panel
KR100762853B1 (en) * 2006-04-27 2007-10-08 (주)티에스이 Light emitting diode test system
KR100768884B1 (en) * 2007-04-26 2007-10-19 서승환 Light emitting device inspection device of substrate
KR20170059415A (en) * 2015-11-20 2017-05-30 박일홍 the soju and beer mixture rate measuring device

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