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KR940017905U - 시료 수평계 - Google Patents

시료 수평계

Info

Publication number
KR940017905U
KR940017905U KR2019920028117U KR920028117U KR940017905U KR 940017905 U KR940017905 U KR 940017905U KR 2019920028117 U KR2019920028117 U KR 2019920028117U KR 920028117 U KR920028117 U KR 920028117U KR 940017905 U KR940017905 U KR 940017905U
Authority
KR
South Korea
Prior art keywords
sample level
sample
level
Prior art date
Application number
KR2019920028117U
Other languages
English (en)
Other versions
KR960003262Y1 (ko
Inventor
이희목
이태국
Original Assignee
현대전자산업 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 현대전자산업 주식회사 filed Critical 현대전자산업 주식회사
Priority to KR92028117U priority Critical patent/KR960003262Y1/ko
Publication of KR940017905U publication Critical patent/KR940017905U/ko
Application granted granted Critical
Publication of KR960003262Y1 publication Critical patent/KR960003262Y1/ko

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C15/00Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
    • G01C15/14Artificial horizons
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10Measuring as part of the manufacturing process
    • H01L22/12Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
KR92028117U 1992-12-31 1992-12-31 시료 수평계 KR960003262Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR92028117U KR960003262Y1 (ko) 1992-12-31 1992-12-31 시료 수평계

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR92028117U KR960003262Y1 (ko) 1992-12-31 1992-12-31 시료 수평계

Publications (2)

Publication Number Publication Date
KR940017905U true KR940017905U (ko) 1994-07-28
KR960003262Y1 KR960003262Y1 (ko) 1996-04-19

Family

ID=19349015

Family Applications (1)

Application Number Title Priority Date Filing Date
KR92028117U KR960003262Y1 (ko) 1992-12-31 1992-12-31 시료 수평계

Country Status (1)

Country Link
KR (1) KR960003262Y1 (ko)

Also Published As

Publication number Publication date
KR960003262Y1 (ko) 1996-04-19

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Legal Events

Date Code Title Description
A201 Request for examination
UA0108 Application for utility model registration

Comment text: Application for Utility Model Registration

Patent event code: UA01011R08D

Patent event date: 19921231

UA0201 Request for examination

Patent event date: 19921231

Patent event code: UA02012R01D

Comment text: Request for Examination of Application

UG1501 Laying open of application
UG1604 Publication of application

Patent event code: UG16041S01I

Comment text: Decision on Publication of Application

Patent event date: 19960326

E701 Decision to grant or registration of patent right
UE0701 Decision of registration

Patent event date: 19960718

Comment text: Decision to Grant Registration

Patent event code: UE07011S01D

REGI Registration of establishment
UR0701 Registration of establishment

Patent event date: 19960729

Patent event code: UR07011E01D

Comment text: Registration of Establishment

UR1002 Payment of registration fee

Start annual number: 1

End annual number: 3

Payment date: 19960729

UR1001 Payment of annual fee

Payment date: 19990331

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FPAY Annual fee payment

Payment date: 20030318

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UC1903 Unpaid annual fee