KR940017905U - 시료 수평계 - Google Patents
시료 수평계Info
- Publication number
- KR940017905U KR940017905U KR2019920028117U KR920028117U KR940017905U KR 940017905 U KR940017905 U KR 940017905U KR 2019920028117 U KR2019920028117 U KR 2019920028117U KR 920028117 U KR920028117 U KR 920028117U KR 940017905 U KR940017905 U KR 940017905U
- Authority
- KR
- South Korea
- Prior art keywords
- sample level
- sample
- level
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C15/00—Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
- G01C15/14—Artificial horizons
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR92028117U KR960003262Y1 (ko) | 1992-12-31 | 1992-12-31 | 시료 수평계 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR92028117U KR960003262Y1 (ko) | 1992-12-31 | 1992-12-31 | 시료 수평계 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR940017905U true KR940017905U (ko) | 1994-07-28 |
KR960003262Y1 KR960003262Y1 (ko) | 1996-04-19 |
Family
ID=19349015
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR92028117U KR960003262Y1 (ko) | 1992-12-31 | 1992-12-31 | 시료 수평계 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR960003262Y1 (ko) |
-
1992
- 1992-12-31 KR KR92028117U patent/KR960003262Y1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR960003262Y1 (ko) | 1996-04-19 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
UA0108 | Application for utility model registration |
Comment text: Application for Utility Model Registration Patent event code: UA01011R08D Patent event date: 19921231 |
|
UA0201 | Request for examination |
Patent event date: 19921231 Patent event code: UA02012R01D Comment text: Request for Examination of Application |
|
UG1501 | Laying open of application | ||
UG1604 | Publication of application |
Patent event code: UG16041S01I Comment text: Decision on Publication of Application Patent event date: 19960326 |
|
E701 | Decision to grant or registration of patent right | ||
UE0701 | Decision of registration |
Patent event date: 19960718 Comment text: Decision to Grant Registration Patent event code: UE07011S01D |
|
REGI | Registration of establishment | ||
UR0701 | Registration of establishment |
Patent event date: 19960729 Patent event code: UR07011E01D Comment text: Registration of Establishment |
|
UR1002 | Payment of registration fee |
Start annual number: 1 End annual number: 3 Payment date: 19960729 |
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UR1001 | Payment of annual fee |
Payment date: 19990331 Start annual number: 4 End annual number: 4 |
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UR1001 | Payment of annual fee |
Payment date: 20000323 Start annual number: 5 End annual number: 5 |
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UR1001 | Payment of annual fee |
Payment date: 20010316 Start annual number: 6 End annual number: 6 |
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UR1001 | Payment of annual fee |
Payment date: 20020315 Start annual number: 7 End annual number: 7 |
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FPAY | Annual fee payment |
Payment date: 20030318 Year of fee payment: 8 |
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UR1001 | Payment of annual fee |
Payment date: 20030318 Start annual number: 8 End annual number: 8 |
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LAPS | Lapse due to unpaid annual fee | ||
UC1903 | Unpaid annual fee |