KR930004970B1 - 테이프주름의 검사방법 및 그 장치 - Google Patents
테이프주름의 검사방법 및 그 장치 Download PDFInfo
- Publication number
- KR930004970B1 KR930004970B1 KR1019900701602A KR900701602A KR930004970B1 KR 930004970 B1 KR930004970 B1 KR 930004970B1 KR 1019900701602 A KR1019900701602 A KR 1019900701602A KR 900701602 A KR900701602 A KR 900701602A KR 930004970 B1 KR930004970 B1 KR 930004970B1
- Authority
- KR
- South Korea
- Prior art keywords
- tape
- image
- wrinkles
- wrinkle
- pattern pitch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B15/00—Driving, starting or stopping record carriers of filamentary or web form; Driving both such record carriers and heads; Guiding such record carriers or containers therefor; Control thereof; Control of operating function
- G11B15/60—Guiding record carrier
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B33/00—Constructional parts, details or accessories not provided for in the other groups of this subclass
- G11B33/10—Indicating arrangements; Warning arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N2021/8927—Defects in a structured web
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/8922—Periodic flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/063—Illuminating optical parts
- G01N2201/0635—Structured illumination, e.g. with grating
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S706/00—Data processing: artificial intelligence
- Y10S706/90—Fuzzy logic
Landscapes
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Treatment Of Fiber Materials (AREA)
- Image Processing (AREA)
Abstract
Description
Claims (3)
- 줄무늬형상패턴의 반사판(14)을 광원으로 조사하여 테이프(15)에 투영하는 공정 ; 테이프(15)에 투영된 줄무늬형상패턴의 화상을 화상촬상장치(16)로 촬상하여 화상처리장치(19)에 도입하는 공정 ; 화상특징량추출부(17) 및 주름상태결정부(18)로 이루어진 화상처리장치(19)에서, 상기 화상특징량추출부(17)에 의해, 화상을 2치화상데이타로 2치화하여 압축하고, 압축된 화상데이타를 기억하고, 화상데이타로부터 줄무늬형상패턴의 검사라인상의 패턴피치를 연산하고, 검사라인의 패턴피치를 기억하고, 기억된 패턴피치로부터 이상패턴피치를 추출하고, 이상패턴피치가 기준치보다 작거나 클경우 이상패턴피치를 기억하고, 이상패턴피치로부터 화상특징량을 계산함으로써 화상특징량을 추출하는 공정과, 상기 주름상태결정부(18)에 의해, 주름상태를 입력하고, 입력된 주름상태의 추론루울에 상응하는 화상특징량히스토그램을 만들고, 히스토그램을 평활화, 정규화하여 멤버쉽함수를 작성하고, 화상특징량을 멤버쉽함수에 참조해서 화상특징량에 대하 멤버쉽함수 적합도를 얻으으로써 주름상태를 결정하는 공정의 화상처리공정으로 이루어진 테이프주름의 검사방법.
- 줄무늬형상패턴의 반사광을 테이프(15)에 투영하기 위한 투광기(13) 및 반사판(14)과 ; 테이프(15)에 투영된 줄무늬형상패턴의 화상을 취입하고 화상처리장치(19)에 도입시키는 촬상장치(16)와 ; 화상을 2치화하고 압축하는 수단(20, 21), 입력된 화상데이타를 기억하는 수단(22), 화상데이타로부터의 줄무늬형상패턴의 검사라인상의 패턴피치를 연산하는 수단(23, 24), 검사라인의 패턴피치를 기억하는 수단(25), 기억된 패턴피치에서 이상패턴피치를 추풀하는 수단(26), 이상패턴피치가 기준치보다 작거나 클 경우 이상패턴피치를 기억하는 수단(27), 이상패턴피치로부터 화상특징량을 계산하는 수단(28)으로 이루어진 화상특징량추출부(17)와, 주름상태를 입력하고, 입력된 주름상태의 추론루울에 상응하는 화상특징량히스토그램을 작성하는 수단(45), 히스토그램을 평활화, 정규화하여 멤버쉽함수를 작성하는 수단(46), 화상특징량을 멤버쉽함수에 참조해서 화상특징량에 대한 멤버쉽함수적합도를 얻는 수단(44)으로 이루어진 주름상태결정부(18)를 포함하는 화상처리장치(19)로 이루어진 테이프주름의 검사장치.
- 제2항에 있어서, 식별된 테이프주름의 상태에 따라 테이프의 주름을 조정하기 위한 작동기제어장치(64)와 조정작동기(65)를 구비한 것을 특징으로하는 테이프주름의 검사장치.
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63-299803 | 1988-11-28 | ||
JP??63-299803 | 1988-11-28 | ||
JP29980388 | 1988-11-28 | ||
PCT/JP1989/001199 WO1990006505A1 (en) | 1988-11-28 | 1989-11-28 | Method of and apparatus for detecting wrinkles in tapes |
Publications (2)
Publication Number | Publication Date |
---|---|
KR900702357A KR900702357A (ko) | 1990-12-06 |
KR930004970B1 true KR930004970B1 (ko) | 1993-06-11 |
Family
ID=17877121
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019900701602A Expired - Fee Related KR930004970B1 (ko) | 1988-11-28 | 1989-11-28 | 테이프주름의 검사방법 및 그 장치 |
Country Status (3)
Country | Link |
---|---|
US (1) | US5130555A (ko) |
KR (1) | KR930004970B1 (ko) |
WO (1) | WO1990006505A1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100707716B1 (ko) * | 2000-04-29 | 2007-04-16 | 디엔엠에프티 (주) | 천의 드레이프 평가 방법 및 시스템과 이를 구축한 전자 기록 매체 |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL9001164A (nl) * | 1990-05-18 | 1991-12-16 | Hoogovens Groep Bv | Werkwijze en inrichting ter bepaling van de beeldhelderheid van een oppervlak. |
JPH0833293B2 (ja) * | 1991-04-15 | 1996-03-29 | 松下電器産業株式会社 | 半田の形状検査方法 |
US5461481A (en) * | 1992-12-29 | 1995-10-24 | Research Technology International Company | System, apparatus and/or method for analyzing light intensities of light reflected from a surface of a sample |
AU696606B2 (en) * | 1994-09-19 | 1998-09-17 | Amcor Limited | Washboard measuring apparatus |
AUPM821994A0 (en) * | 1994-09-19 | 1994-10-13 | Amcor Limited | Washboard measuring apparatus |
DE19607793A1 (de) * | 1996-03-01 | 1997-09-04 | Basf Magnetics Gmbh | Optische Oberflächenprüfeinrichtung für linear bewegte, bandförmige Materialien |
FR2830079B1 (fr) * | 2001-09-26 | 2004-04-30 | Holo 3 | Procede et dispositif de mesure d'au moins une grandeur geometrique d'une surface optiquement reflechissante |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5676004A (en) * | 1979-11-26 | 1981-06-23 | Toyota Central Res & Dev Lab Inc | Measuring device of flatness |
JPS6061936A (ja) * | 1983-09-14 | 1985-04-09 | Clarion Co Ltd | テ−プ走行監視装置 |
JPS6175236A (ja) * | 1984-09-20 | 1986-04-17 | Nippon Soken Inc | 塗装面測定装置 |
JPH0675322B2 (ja) * | 1985-06-26 | 1994-09-21 | 株式会社日立製作所 | ビデオテ−プレコ−ダのテ−プ走行系調整方法及びその装置 |
JPH0615968B2 (ja) * | 1986-08-11 | 1994-03-02 | 伍良 松本 | 立体形状測定装置 |
US4794550A (en) * | 1986-10-15 | 1988-12-27 | Eastman Kodak Company | Extended-range moire contouring |
DE3817559C1 (ko) * | 1988-05-24 | 1989-12-07 | Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung Ev, 8000 Muenchen, De |
-
1989
- 1989-11-28 KR KR1019900701602A patent/KR930004970B1/ko not_active Expired - Fee Related
- 1989-11-28 US US07/548,878 patent/US5130555A/en not_active Expired - Lifetime
- 1989-11-28 WO PCT/JP1989/001199 patent/WO1990006505A1/ja unknown
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100707716B1 (ko) * | 2000-04-29 | 2007-04-16 | 디엔엠에프티 (주) | 천의 드레이프 평가 방법 및 시스템과 이를 구축한 전자 기록 매체 |
Also Published As
Publication number | Publication date |
---|---|
WO1990006505A1 (en) | 1990-06-14 |
US5130555A (en) | 1992-07-14 |
KR900702357A (ko) | 1990-12-06 |
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