KR920003641Y1 - 불량품 판정화상 처리장치 - Google Patents
불량품 판정화상 처리장치 Download PDFInfo
- Publication number
- KR920003641Y1 KR920003641Y1 KR2019890011941U KR890011941U KR920003641Y1 KR 920003641 Y1 KR920003641 Y1 KR 920003641Y1 KR 2019890011941 U KR2019890011941 U KR 2019890011941U KR 890011941 U KR890011941 U KR 890011941U KR 920003641 Y1 KR920003641 Y1 KR 920003641Y1
- Authority
- KR
- South Korea
- Prior art keywords
- inspection
- image processing
- processing apparatus
- camera
- work
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T1/00—General purpose image data processing
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/0006—Industrial image inspection using a design-rule based approach
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10016—Video; Image sequence
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30164—Workpiece; Machine component
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S269/00—Work holders
- Y10S269/903—Work holder for electrical circuit assemblages or wiring systems
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/53—Means to assemble or disassemble
- Y10T29/53022—Means to assemble or disassemble with means to test work or product
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Image Processing (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Analysis (AREA)
Abstract
Description
Claims (5)
- 양품워크에 대하여 상대이동하여 양품워크를 촬영하는 양품용 TV카메라와, 양품용 TV카메라의 촬영시야와 같은 촬영시야를 가지고 양품워크와 양품용 TV카메라와의 상대이동상태와 동일한 상대이동상태로 검사워크에 대하여 상대이동하여 검사워크를 촬영하는 검사용 TV카메라와, 양품용 TV카메라로 부터 보내져오는 화상신호를 양품워크를 나타내는 화소신호와 배경상태를 나타내는 화소신호로 나누는 2치화처리를하고 양품워크를 나타내는 화소수를 카운트하고 한편 검사용 TV카메라로 부터 보내져오는 화상신호를 검사워크를 나타내는 화소신호와 배경상태를 나타내는 화소신호로 분리하는 2치화처리를 하고 검사워크를 나타내는 화소수를 카운트하고 다시 양품워크를 나타내는 화소의 카운트치와 검사워크를 나타내는 화소의 카운트치를 비교하여 그 차가 설정치 보다도 크면 검사워크가 불량이라고 판정하는 화상처리장치를 가지는 것을 특징으로 하는 불량품판정화상 처리장치.
- 제1항에 있어서, 워크를 촬영하는 TV카메라와 TV카메라로 부터의 화상신호를 입력하여 워크가 불량인가 아닌가를 판정하는 화상처리장치와, TV카메라로 부터의 화상신호를 기록하는 녹화장치와, 녹화장치의 재생신호를 입력하여 화상을 표시하는 모니터와, 모니터 화면상의 영역을 지정하는 영역지정장치를 구비하고 또한 화상처리장치는 TV카메라로 부터의 화상신호를 배경의 화소와 워크의 화소로 분리하는 2치화처리부와 영역지정장치에서 지정된 영역내에서의 워크의 화소수를 카운트하고 카운트부와, 판정치를 기억하는 메모리와 카운터부에서 얻은 카운트치를 판정차와 비교하고 그 차가 허용범위를 벗어난 워크를 불량으로 판정하는 판정부를 가지는 것을 특징으로 하는 불량품 판정화상처리장치.
- 제2항에 있어서, 티칭지령이 출력되어 있는 경우에 양품워크의 화소의 카운트치를 입력하여 평균치(u)와 표준편차(ε)를 계산하여 U±ε를 판정치로서 출력하는 통계처리부와, 판정치를 기억하는 메모리와, 검사지령이 출력되어 있는 경우에 검사워크의 화소의 카운트치를 메모리에 기억한 판정치와 비교하여 판정치를 벗어나면 검사워크가 불량이라고 판정하는 판정부를 가지는 것을 특징으로 하는 불량품 판정화상처리장치.
- 제1항에 있어서, 검사 대상물에 대하여 미리 결정한 위치관계를 유지하면서 이간(離間)하여 위치 보정용 마크를 배치함과 동시에 위치보정용 마크의 위치를 검출하는 위치보정용 윈도우와 검사대상물의 양부를 판정하기 위하여 데이터처리하는 영역을 결정하는 검사윈도우를 화상처리장치에 설정하고 1화면내에 있어서 위치보정마크의 위치가 변위했음이 위치보정용 윈도우에 의하여 검출되면 그 변이분만큼 검사윈도우의 위치를 변위시키는 것을 특징으로 하는 위치변위 보정장치를 구비하고 있는 불량품 판정화상처리장치.
- 제1항 또는 제2항에 있어서, 흑색이외의 대판과, 대판의 양측방에 각각 배치한 대판에 대하여 대략 평향하게 상방으로 부터 빛을 조사하는 후드가 부착된 형광등과 대판상에 배치한 형광등의 후드보다 상방의 위치에 대상물을 지지하는 지지구를 구비한 것을 특징으로 하는 의사투과광형 조명장치를 구비한 불량품 판정화상 처리장치.
Applications Claiming Priority (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10599988U JPH0526580Y2 (ko) | 1988-08-12 | 1988-08-12 | |
JP10599888U JPH0232168U (ko) | 1988-08-12 | 1988-08-12 | |
JP63200145A JPH07122615B2 (ja) | 1988-08-12 | 1988-08-12 | 位置ずれ補正方法 |
JP88-200145 | 1988-08-12 | ||
JP89-105999 | 1989-05-02 | ||
JPU88-105999 | 1989-05-02 | ||
JP1111981A JPH0672780B2 (ja) | 1989-05-02 | 1989-05-02 | 不良品判定画像処理装置 |
JPU88-105998 | 1989-05-02 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR900005450U KR900005450U (ko) | 1990-03-08 |
KR920003641Y1 true KR920003641Y1 (ko) | 1992-06-01 |
Family
ID=27469385
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR2019890011941U KR920003641Y1 (ko) | 1988-08-12 | 1989-08-12 | 불량품 판정화상 처리장치 |
Country Status (5)
Country | Link |
---|---|
US (1) | US5121439A (ko) |
EP (1) | EP0354782B1 (ko) |
KR (1) | KR920003641Y1 (ko) |
CA (1) | CA1327636C (ko) |
DE (1) | DE68927489T2 (ko) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5267329A (en) * | 1990-08-10 | 1993-11-30 | Kaman Aerospace Corporation | Process for automatically detecting and locating a target from a plurality of two dimensional images |
US6999614B1 (en) * | 1999-11-29 | 2006-02-14 | Kla-Tencor Corporation | Power assisted automatic supervised classifier creation tool for semiconductor defects |
US7283659B1 (en) | 2002-01-09 | 2007-10-16 | Kla-Tencor Technologies Corporation | Apparatus and methods for searching through and analyzing defect images and wafer maps |
CN100462672C (zh) * | 2005-12-30 | 2009-02-18 | 鸿富锦精密工业(深圳)有限公司 | 影像量测系统及方法 |
US20150032647A1 (en) * | 2013-07-25 | 2015-01-29 | Pleygo, Inc. | Systems and methods for multi-component kit inventory management |
DE102015112722B4 (de) * | 2015-08-03 | 2021-07-08 | Lisa Dräxlmaier GmbH | Vorrichtung und Verfahren zur Herstellung eines Kabelbaumes |
CN111921886B (zh) * | 2020-08-07 | 2022-08-19 | 中集德立物流系统(苏州)有限公司 | 包裹分拣的方法、装置、系统、介质及电子设备 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3909602A (en) * | 1973-09-27 | 1975-09-30 | California Inst Of Techn | Automatic visual inspection system for microelectronics |
US4209830A (en) * | 1976-04-19 | 1980-06-24 | Tokyo Shibaura Electric Co., Ltd. | Fine object having position and direction sensing mark and a system for detecting the position and direction of the sensing mark |
US4337934A (en) * | 1980-10-20 | 1982-07-06 | Panduit Corp. | Assembly post |
US4549087A (en) * | 1982-12-27 | 1985-10-22 | Usm Corporation | Lead sensing system |
US4926489A (en) * | 1983-03-11 | 1990-05-15 | Kla Instruments Corporation | Reticle inspection system |
EP0124113B1 (en) * | 1983-04-28 | 1989-03-01 | Hitachi, Ltd. | Method of detecting pattern defect and its apparatus |
US4578810A (en) * | 1983-08-08 | 1986-03-25 | Itek Corporation | System for printed circuit board defect detection |
JPS61194305A (ja) * | 1985-02-22 | 1986-08-28 | Brother Ind Ltd | 形状検査装置 |
US4783827A (en) * | 1985-05-27 | 1988-11-08 | Fuji Electric Co., Ltd. | Serial data processing apparatus |
DE3540100A1 (de) * | 1985-11-12 | 1987-06-11 | Mania Gmbh | Verfahren zur optischen pruefung von leiterplatten |
US4809308A (en) * | 1986-02-20 | 1989-02-28 | Irt Corporation | Method and apparatus for performing automated circuit board solder quality inspections |
US4805123B1 (en) * | 1986-07-14 | 1998-10-13 | Kla Instr Corp | Automatic photomask and reticle inspection method and apparatus including improved defect detector and alignment sub-systems |
JPS6356076A (ja) * | 1986-08-26 | 1988-03-10 | Omron Tateisi Electronics Co | 物体検査用静止撮像カメラ |
GB2196100B (en) * | 1986-10-01 | 1990-07-04 | Mitsubishi Rayon Co | Light diffusing device |
FR2619038A1 (fr) * | 1987-08-07 | 1989-02-10 | Automatisme Robotique Applique | Pinces, equipant des convoyeurs de machines de cablage automatiques, destinees a tenir un ou plusieurs fils conducteurs |
-
1989
- 1989-08-09 EP EP89308100A patent/EP0354782B1/en not_active Expired - Lifetime
- 1989-08-09 DE DE68927489T patent/DE68927489T2/de not_active Expired - Fee Related
- 1989-08-10 CA CA000608044A patent/CA1327636C/en not_active Expired - Fee Related
- 1989-08-12 KR KR2019890011941U patent/KR920003641Y1/ko not_active IP Right Cessation
- 1989-08-14 US US07/393,763 patent/US5121439A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0354782A3 (en) | 1991-09-04 |
CA1327636C (en) | 1994-03-08 |
US5121439A (en) | 1992-06-09 |
EP0354782A2 (en) | 1990-02-14 |
DE68927489T2 (de) | 1997-03-27 |
EP0354782B1 (en) | 1996-11-27 |
DE68927489D1 (de) | 1997-01-09 |
KR900005450U (ko) | 1990-03-08 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US6198529B1 (en) | Automated inspection system for metallic surfaces | |
US6084663A (en) | Method and an apparatus for inspection of a printed circuit board assembly | |
EP0728399B1 (en) | Method and apparatus for inspecting printed circuit boards at different magnifications | |
JPH0599861A (ja) | 透明容器の検査方法及び装置 | |
KR960001824B1 (ko) | 와이어 본딩 검사 장치 | |
KR920003641Y1 (ko) | 불량품 판정화상 처리장치 | |
KR101522312B1 (ko) | Pcb 제품 검사 장치 및 이를 이용한 pcb 제품 검사 방법 | |
EP0871027A2 (en) | Inspection of print circuit board assembly | |
JP2001004339A (ja) | 画像認識検査システムの照明むら測定方法および画像認識検査方法 | |
JPH082601Y2 (ja) | ワイヤハーネスの外観検査装置 | |
JPH0666528A (ja) | 外観検査方法及び装置 | |
KR19990046434A (ko) | 콘덴서검사장치 | |
JPH0672780B2 (ja) | 不良品判定画像処理装置 | |
JPH03154173A (ja) | 不良品判定画像処理装置 | |
JP2701872B2 (ja) | 面付パターンの欠陥検査装置 | |
JPH0731131B2 (ja) | 周期性パタ−ンの斑検査方法 | |
KR19990071338A (ko) | 프린트 배선판 어셈블리의 검사 | |
JPH0651014A (ja) | 欠陥検査装置 | |
JPH01307875A (ja) | 長尺シートの欠陥検査装置 | |
KR910007497B1 (ko) | 영상처리를 이용한 섀도우 마스크 자동검사장치 | |
JP2981510B2 (ja) | リード部品検査装置 | |
JP3029723B2 (ja) | 半田付け工程でのリード浮きの検出方法 | |
JPS58200141A (ja) | 基板検査方式 | |
JPS60210745A (ja) | 視覚センサシステム | |
JPH01297538A (ja) | 厚膜回路基板の微小欠陥検出方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
UA0108 | Application for utility model registration |
Comment text: Application for Utility Model Registration Patent event code: UA01011R08D Patent event date: 19890812 |
|
UA0201 | Request for examination |
Patent event date: 19890812 Patent event code: UA02012R01D Comment text: Request for Examination of Application |
|
UG1501 | Laying open of application | ||
UG1604 | Publication of application |
Patent event code: UG16041S01I Comment text: Decision on Publication of Application Patent event date: 19920429 |
|
E701 | Decision to grant or registration of patent right | ||
UE0701 | Decision of registration |
Patent event date: 19920825 Comment text: Decision to Grant Registration Patent event code: UE07011S01D |
|
REGI | Registration of establishment | ||
UR0701 | Registration of establishment |
Patent event date: 19921021 Patent event code: UR07011E01D Comment text: Registration of Establishment |
|
UR1002 | Payment of registration fee |
Start annual number: 1 End annual number: 3 Payment date: 19921021 |
|
UR1001 | Payment of annual fee |
Payment date: 19950510 Start annual number: 4 End annual number: 4 |
|
UR1001 | Payment of annual fee |
Payment date: 19960517 Start annual number: 5 End annual number: 5 |
|
UR1001 | Payment of annual fee |
Payment date: 19970527 Start annual number: 6 End annual number: 6 |
|
UR1001 | Payment of annual fee |
Payment date: 19980526 Start annual number: 7 End annual number: 7 |
|
UR1001 | Payment of annual fee |
Payment date: 19990518 Start annual number: 8 End annual number: 8 |
|
UR1001 | Payment of annual fee |
Payment date: 20000524 Start annual number: 9 End annual number: 9 |
|
FPAY | Annual fee payment |
Payment date: 20010524 Year of fee payment: 10 |
|
UR1001 | Payment of annual fee |
Payment date: 20010524 Start annual number: 10 End annual number: 10 |
|
LAPS | Lapse due to unpaid annual fee | ||
UC1903 | Unpaid annual fee |