KR910017382U - Multibit parallel test circuit - Google Patents

Multibit parallel test circuit

Info

Publication number: KR910017382U
Authority: KR; South Korea
Prior art keywords: test circuit; parallel test; multibit parallel; multibit; circuit
Prior art date: 1990-03-09

Application number

KR2019900002769U

Other languages

Korean (ko)

Other versions

KR960007140Y1 (en

Inventor

정원화

Original Assignee

금성일렉트론 주식회사

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1990-03-09

Filing date

1990-03-09

Publication date

1991-10-28

1990-03-09 Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사

1990-03-09 Priority to KR2019900002769U priority Critical patent/KR960007140Y1/en

1991-10-28 Publication of KR910017382U publication Critical patent/KR910017382U/en

1996-08-22 Application granted granted Critical

1996-08-22 Publication of KR960007140Y1 publication Critical patent/KR960007140Y1/en

Classifications

- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
- G11C29/30—Accessing single arrays
- G11C29/34—Accessing multiple bits simultaneously

KR2019900002769U 1990-03-09 1990-03-09 Multibit parallel test circuit KR960007140Y1 (en)

Priority Applications (1)

Application Number	Priority Date	Filing Date	Title
KR2019900002769U KR960007140Y1 (en)	1990-03-09	1990-03-09	Multibit parallel test circuit

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
KR2019900002769U KR960007140Y1 (en)	1990-03-09	1990-03-09	Multibit parallel test circuit

Publications (2)

Publication Number	Publication Date
KR910017382U true KR910017382U (en)	1991-10-28
KR960007140Y1 KR960007140Y1 (en)	1996-08-22

Family

ID=19296622

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
KR2019900002769U KR960007140Y1 (en)	1990-03-09	1990-03-09	Multibit parallel test circuit

Country Status (1)

Country	Link
KR (1)	KR960007140Y1 (en)

1990
- 1990-03-09 KR KR2019900002769U patent/KR960007140Y1/en not_active IP Right Cessation

Also Published As

Publication number	Publication date
KR960007140Y1 (en)	1996-08-22

Publication	Publication Date	Title
DE69127196D1 (en)	1997-09-11	ANTIOXIDANT TEST
DE68921269D1 (en)	1995-03-30	Integrated test circuit.
DE68926589D1 (en)	1996-07-11	Tester
DE69131531D1 (en)	1999-09-23	Integrating circuit
DE69119152D1 (en)	1996-06-05	Circuit arrangement
DE69031729D1 (en)	1998-01-02	MODULATOR CIRCUIT
DE69025110D1 (en)	1996-03-14	Test device
DE69130755D1 (en)	1999-02-25	Test facility
DE69026551D1 (en)	1996-05-23	Integrator circuit
ATA247090A (en)	1994-05-15	TERMINAL ARRANGEMENT
FI952318L (en)	1995-05-12	Telechannel testing arrangement
DE69029634D1 (en)	1997-02-20	Test latch circuit
ATA258289A (en)	1991-12-15	DRYING DEVICE
DE69029468D1 (en)	1997-01-30	Integrated circuit arrangement
DE69127149D1 (en)	1997-09-11	Circuit test procedure
ATA258189A (en)	1991-07-15	DRYING DEVICE
DE68928600D1 (en)	1998-04-16	Extended test circuit
DE69024711D1 (en)	1996-02-22	Amplifier circuit
DE69024865D1 (en)	1996-02-29	Amplifier circuit
DE69117097D1 (en)	1996-03-28	Test fixtures
KR910017382U (en)	1991-10-28	Multibit parallel test circuit
KR910013424U (en)	1991-07-30	Sensitivity improvement circuit
KR920010235U (en)	1992-06-17	ROM test circuit
FR2648943B1 (en)	1991-10-11	SAMPLE-LOCKER CIRCUIT
DE59010443D1 (en)	1996-09-19	Integrated circuit arrangement

Legal Events

Date	Code	Title	Description
1990-03-09	UA0108	Application for utility model registration	Comment text: Application for Utility Model Registration Patent event code: UA01011R08D Patent event date: 19900309
1991-10-28	UG1501	Laying open of application
1993-03-09	A201	Request for examination
1993-03-09	UA0201	Request for examination	Patent event date: 19930309 Patent event code: UA02012R01D Comment text: Request for Examination of Application Patent event date: 19900309 Patent event code: UA02011R01I Comment text: Application for Utility Model Registration
1996-08-22	UG1604	Publication of application	Patent event code: UG16041S01I Comment text: Decision on Publication of Application Patent event date: 19960729
1996-11-12	E701	Decision to grant or registration of patent right
1996-11-12	UE0701	Decision of registration	Patent event date: 19961112 Comment text: Decision to Grant Registration Patent event code: UE07011S01D
1996-12-06	REGI	Registration of establishment
1996-12-06	UR0701	Registration of establishment	Patent event date: 19961206 Patent event code: UR07011E01D Comment text: Registration of Establishment
1996-12-06	UR1002	Payment of registration fee	Start annual number: 1 End annual number: 3 Payment date: 19961205
1999-07-29	UR1001	Payment of annual fee	Payment date: 19990729 Start annual number: 4 End annual number: 4
2000-07-24	UR1001	Payment of annual fee	Payment date: 20000724 Start annual number: 5 End annual number: 5
2001-07-25	UR1001	Payment of annual fee	Payment date: 20010725 Start annual number: 6 End annual number: 6
2002-07-16	UR1001	Payment of annual fee	Payment date: 20020716 Start annual number: 7 End annual number: 7
2003-07-18	UR1001	Payment of annual fee	Payment date: 20030718 Start annual number: 8 End annual number: 8
2004-07-19	FPAY	Annual fee payment	Payment date: 20040719 Year of fee payment: 9
2004-07-19	UR1001	Payment of annual fee	Payment date: 20040719 Start annual number: 9 End annual number: 9
2005-08-23	LAPS	Lapse due to unpaid annual fee
2005-08-23	UC1903	Unpaid annual fee