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KR880002995U - Parts life tester - Google Patents

Parts life tester

Info

Publication number
KR880002995U
KR880002995U KR2019860011545U KR860011545U KR880002995U KR 880002995 U KR880002995 U KR 880002995U KR 2019860011545 U KR2019860011545 U KR 2019860011545U KR 860011545 U KR860011545 U KR 860011545U KR 880002995 U KR880002995 U KR 880002995U
Authority
KR
South Korea
Prior art keywords
life tester
parts life
parts
tester
life
Prior art date
Application number
KR2019860011545U
Other languages
Korean (ko)
Other versions
KR890007782Y1 (en
Inventor
조영덕
Original Assignee
대우전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 대우전자 주식회사 filed Critical 대우전자 주식회사
Priority to KR2019860011545U priority Critical patent/KR890007782Y1/en
Publication of KR880002995U publication Critical patent/KR880002995U/en
Application granted granted Critical
Publication of KR890007782Y1 publication Critical patent/KR890007782Y1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2837—Characterising or performance testing, e.g. of frequency response

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measurement Of Predetermined Time Intervals (AREA)
KR2019860011545U 1986-07-31 1986-07-31 Component Life Tester KR890007782Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019860011545U KR890007782Y1 (en) 1986-07-31 1986-07-31 Component Life Tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019860011545U KR890007782Y1 (en) 1986-07-31 1986-07-31 Component Life Tester

Publications (2)

Publication Number Publication Date
KR880002995U true KR880002995U (en) 1988-04-11
KR890007782Y1 KR890007782Y1 (en) 1989-10-31

Family

ID=19254536

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019860011545U KR890007782Y1 (en) 1986-07-31 1986-07-31 Component Life Tester

Country Status (1)

Country Link
KR (1) KR890007782Y1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100802440B1 (en) * 2006-06-30 2008-02-14 충주대학교 산학협력단 Automatic life measuring device of DC motor and relay

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100802440B1 (en) * 2006-06-30 2008-02-14 충주대학교 산학협력단 Automatic life measuring device of DC motor and relay

Also Published As

Publication number Publication date
KR890007782Y1 (en) 1989-10-31

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Legal Events

Date Code Title Description
A201 Request for examination
UA0108 Application for utility model registration

Comment text: Application for Utility Model Registration

Patent event code: UA01011R08D

Patent event date: 19860731

UA0201 Request for examination

Patent event date: 19860731

Patent event code: UA02012R01D

Comment text: Request for Examination of Application

UG1501 Laying open of application
E902 Notification of reason for refusal
UE0902 Notice of grounds for rejection

Comment text: Notification of reason for refusal

Patent event code: UE09021S01D

Patent event date: 19890612

UG1604 Publication of application

Patent event code: UG16041S01I

Comment text: Decision on Publication of Application

Patent event date: 19891004

E701 Decision to grant or registration of patent right
UE0701 Decision of registration

Patent event date: 19900125

Comment text: Decision to Grant Registration

Patent event code: UE07011S01D

REGI Registration of establishment
UR0701 Registration of establishment

Patent event date: 19900206

Patent event code: UR07011E01D

Comment text: Registration of Establishment

UR1002 Payment of registration fee

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End annual number: 3

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