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KR860001482A - Ic 장치 - Google Patents

Ic 장치

Info

Publication number
KR860001482A
KR860001482A KR1019850002838A KR850002838A KR860001482A KR 860001482 A KR860001482 A KR 860001482A KR 1019850002838 A KR1019850002838 A KR 1019850002838A KR 850002838 A KR850002838 A KR 850002838A KR 860001482 A KR860001482 A KR 860001482A
Authority
KR
South Korea
Prior art keywords
circuit
input terminals
switch circuit
bus interface
switch
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1019850002838A
Other languages
English (en)
Inventor
마사히꼬 모리조노
Original Assignee
오오가 노리오
쏘니 가부시기 가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 오오가 노리오, 쏘니 가부시기 가이샤 filed Critical 오오가 노리오
Publication of KR860001482A publication Critical patent/KR860001482A/ko
Withdrawn legal-status Critical Current

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D17/00—Detergent materials or soaps characterised by their shape or physical properties
    • C11D17/04—Detergent materials or soaps characterised by their shape or physical properties combined with or containing other objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06J—HYBRID COMPUTING ARRANGEMENTS
    • G06J1/00—Hybrid computing arrangements

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Evolutionary Computation (AREA)
  • Chemical & Material Sciences (AREA)
  • Software Systems (AREA)
  • Automation & Control Theory (AREA)
  • Mathematical Physics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Quality & Reliability (AREA)
  • Fuzzy Systems (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Oil, Petroleum & Natural Gas (AREA)
  • Wood Science & Technology (AREA)
  • Organic Chemistry (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Television Systems (AREA)

Abstract

내용 없음

Description

IC 장치
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본원 발명의 실시예를 나타낸 블록도.
제2도는 본원 발명을 텔레비전수상기에 적용했을 경우의 실시예를 나타낸 블록도.
제3도는 복수종류의 상품에 대한 조정시스템의 실시예를 나타낸 도면.

Claims (1)

  1. 복수의 입력단자와, 이 복수의 입력단자에 입력되는 신호의 하나를 선택하는 스위치 회로와, 이 스위치 회로를 제어하는 제어회로와, 상기 스위치회로에서 선택된 신호가 가해지는 A/D 변환회로와, 이 A/D 변환회로의 출력이 가해지는 동시에 상기 제어회로에 구동신호를 보내는 버스인터훼이스회로가 각기 구성되며, 상기 버스인터훼이스회로를 외부 버스라인에 접속하도록 한 것을 특징으로 하는 IC장치.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019850002838A 1984-07-13 1985-04-26 Ic 장치 Withdrawn KR860001482A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP84-145656 1984-07-13
JP14565684A JPS6125229A (ja) 1984-07-13 1984-07-13 Ｉｃ装置

Publications (1)

Publication Number Publication Date
KR860001482A true KR860001482A (ko) 1986-02-26

Family

ID=15390053

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019850002838A Withdrawn KR860001482A (ko) 1984-07-13 1985-04-26 Ic 장치

Country Status (5)

Country Link
US (1) US4701870A (ko)
EP (1) EP0171914A1 (ko)
JP (1) JPS6125229A (ko)
KR (1) KR860001482A (ko)
CA (1) CA1228165A (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100451365B1 (ko) * 1997-12-11 2004-12-03 엘지산전 주식회사 전동기 제어 시스템의 보호장치

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3605431A1 (de) * 1986-02-20 1987-08-27 Vdo Schindling Pruefbares elektronisches geraet und verfahren zum pruefen eines solchen geraets
JPS63128266A (ja) * 1986-11-18 1988-05-31 Toshiba Corp 基板電圧測定方式
US4858006A (en) * 1987-07-28 1989-08-15 Sony Corp. Method and apparatus for establishing a servicing mode of an electronic apparatus
USD312218S (en) 1988-03-17 1990-11-20 International Business Machines Corporation Hand-held port tester for data-processing systems
US4977530A (en) * 1988-05-02 1990-12-11 Mitel Corporation Voltage monitor for in-circuit testing
JPH01320564A (ja) * 1988-06-23 1989-12-26 Hitachi Ltd 並列処理装置
US5416919A (en) * 1989-07-19 1995-05-16 Sharp Kabushiki Kaisha Semiconductor integrated circuit with functional blocks capable of being individually tested externally
US5309352A (en) * 1990-05-18 1994-05-03 Tektronix, Inc. Method and system for optimizing termination in systems of programmable devices
JPH0566959A (ja) * 1991-09-09 1993-03-19 Sony Corp 電子機器
US5359547A (en) * 1992-06-26 1994-10-25 Digital Equipment Corporation Method and apparatus for testing processor-based computer modules
US5638383A (en) * 1992-07-24 1997-06-10 Trw Inc. Advanced integrated avionics testing system
EP0641139B1 (en) * 1993-07-13 2002-09-11 Hewlett-Packard Company, A Delaware Corporation Merging audio and telephone data for a computer
KR0158789B1 (ko) * 1994-05-13 1999-03-20 오까다 마사하루 분산처리장치
US5887001A (en) * 1995-12-13 1999-03-23 Bull Hn Information Systems Inc. Boundary scan architecture analog extension with direct connections
US5938779A (en) * 1997-02-27 1999-08-17 Alcatel Alsthom Compagnie Generale D'electricite Asic control and data retrieval method and apparatus having an internal collateral test interface function
US6013108A (en) * 1997-03-18 2000-01-11 Endevco Corporation Intelligent sensor system with network bus
JPH11203161A (ja) * 1998-01-07 1999-07-30 Mitsubishi Electric Corp マイクロコンピュータ
FR2783111B1 (fr) * 1998-09-08 2000-10-13 St Microelectronics Sa Circuit integre comportant une cellule de test modifiee pour resynchroniser ledit circuit integre
JP6215745B2 (ja) 2014-03-26 2017-10-18 株式会社東海理化電機製作所 レバー装置
CN105843717B (zh) * 2016-04-05 2023-02-28 河北上元智能科技股份有限公司 一种车道控制器接口检测保护电路

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3854125A (en) * 1971-06-15 1974-12-10 Instrumentation Engineering Automated diagnostic testing system
US4162531A (en) * 1977-01-14 1979-07-24 Hewlett-Packard Company Method and apparatus for programmable and remote numeric control and calibration of electronic instrumentation
US4155116A (en) * 1978-01-04 1979-05-15 The Bendix Corporation Digital control system including built in test equipment
US4253148A (en) * 1979-05-08 1981-02-24 Forney Engineering Company Distributed single board computer industrial control system
US4315330A (en) * 1980-03-07 1982-02-09 Ibm Corporation Multiple data rate testing of communication equipment
US4402055A (en) * 1981-01-27 1983-08-30 Westinghouse Electric Corp. Automatic test system utilizing interchangeable test devices
US4371952A (en) * 1981-05-06 1983-02-01 Ncr Corporation Diagnostic circuitry for isolating a faulty subsystem in a data processing system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100451365B1 (ko) * 1997-12-11 2004-12-03 엘지산전 주식회사 전동기 제어 시스템의 보호장치

Also Published As

Publication number Publication date
JPS6125229A (ja) 1986-02-04
US4701870A (en) 1987-10-20
EP0171914A1 (en) 1986-02-19
CA1228165A (en) 1987-10-13
JPH0521245B2 (ko) 1993-03-23

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Legal Events

Date Code Title Description
PA0109 Patent application

Patent event code: PA01091R01D

Comment text: Patent Application

Patent event date: 19850426

PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid