KR20080027569A - Inspection device and inspection method of display panel - Google Patents

Abstract

The present invention provides an inspection apparatus and an inspection method for a display panel which can improve the detection power of an inspection process.

The inspection apparatus of the display panel according to the present invention outputs a gross test screen to the display panel and outputs a visual test screen to the gross test unit capable of detecting a defect of the display panel. It consists of a visual test unit that can be detected, characterized in that the gross test and the visual test is performed at the same time.

Description

Inspection device and inspection method of display panel {APPARATUS AND METHOD OF TESTING DISPLAY PANEL}

1A is a perspective view illustrating an inspection apparatus of a display panel according to the present invention.

1B is a side view showing a side of an inspection apparatus of a display panel according to the present invention.

2 is a process block diagram for explaining a test method according to an embodiment of the present invention.

3A illustrates a signal pad of a display panel according to the present invention.

3B is an enlarged view of a portion A shown in FIG. 3A.

Figure 3c is a cross-sectional view showing the contact between the test probe and the signal pad according to the present invention.

4 is a graph illustrating a gross test signal and a visual test signal.

<Description of main parts of drawing>

1: frame 2: probe block

3: subframe 4: cylinder

5: Probe for gross test 7: Frame bar

8: Probe housing for gross test 15: Hinge connection member

16: Cylinder connection member 17: Probe pin for visual test

18: probe pin holder 19: probe block connector

20: '-' shaped member 21: TFT substrate

22: spring 23: color filter substrate

24: connecting rod 25: signal pad

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an inspection apparatus and an inspection method of a display panel, and more particularly, to an inspection apparatus and an inspection method of a display panel capable of improving the detection power of an inspection process.

Recently, as the demand for using a portable information medium increases, the flat panel display (FPD), which reduces the weight of electronic products and replaces the conventional display device, the cathode ray tube (CRT), in many applications. The use of is getting active.

Liquid crystal displays are typical of flat panel displays, and TFT-LCDs using thin film transistors (TFTs) as switching elements are mainly used.

The thin film transistor substrate includes a gate line and a data line formed to cross each other on a lower substrate, a thin film transistor formed at an intersection thereof, a pixel electrode connected to the thin film transistor, and a lower alignment layer coated thereon for liquid crystal alignment. A thin film transistor array is formed on the lower substrate.

The manufacturing process for manufacturing the conventional liquid crystal display panel includes a patterning process formed on each of the thin film transistor array and the color filter array, a bonding process in which the thin film transistor substrate and the color filter substrate are bonded together with the liquid crystal interposed therebetween, and a bad liquid crystal display panel. It is divided into the inspection process to detect.

Among these inspection processes, the liquid crystal display panel is inspected for defects before the driving integrated circuit is attached to the liquid crystal display panel.

Specifically, the inspection process moves the liquid crystal display panel to the inspection apparatus formed in the same environment as the liquid crystal display module of the finished product in which the backlight unit and the driving integrated circuits are assembled. The inspection signal, which is the same driving signal as when the liquid crystal display module is driven, is applied to the liquid crystal display panel moved to the inspection apparatus to realize an image. In this case, when a defect occurs in the signal line of the liquid crystal display panel, the pixel connected to the signal line may implement a different image from the pixel connected to the normal signal line, so that the defective state of the liquid crystal display panel may be easily confirmed.

In this inspection process, in order to supply an inspection signal to the signal line, each of the signal pads connected to the signal line is connected one-to-one with the test probe.

However, if there is a foreign substance on the signal pad or damage to the test probe, or if a misalignment occurs between the signal pad and the test probe, the image displayed on the liquid crystal display panel is implemented due to a signal line defect. Since it is the same as the image, the inspector cannot easily determine whether the signal pad is broken or the test probe is defective.

Therefore, the technical problem to be achieved by the present invention is to reduce the detection power due to the problem of contact between the probe pin and the signal pad by shortening the inspection process and simultaneously implementing the gross test and the visual test by combining the gross test unit and the visual test unit It is an object of the present invention to provide an inspection apparatus and an inspection method of a display panel which can improve detection power by improving the detection power.

In order to achieve the above technical problem, an inspection apparatus for a display panel according to the present invention outputs a gross test screen to the display panel and outputs a visual test screen to the gross test unit and the display panel capable of detecting a defect of the display panel. It consists of a visual test unit that can detect the defects of pixels and lines of the panel, characterized in that the gross test and the visual test is performed at the same time.

On the other hand, the visual test unit is a cylinder that is operated through the pneumatic pressure to move the probe block located on the front of the gross test unit, the visual test probe pin located at the end of the probe block and the visual test probe pin up and down; And a subframe that fixes the probe block.

Here, the visual test unit is characterized in that it comprises a visual test means for implementing the data pattern by taking over the signal of the gross test.

And it is characterized in that the moving means is provided so that the visual test unit can be moved up and down.

In addition, the visual test means is characterized in that the probe.

The material of the visual test means is characterized in that the conductive rubber.

In order to achieve the above technical problem, an inspection method of a display panel according to the present invention includes a cell loading step of mounting a display panel on an inspection pad and an inspection unit in which a gross test unit and a visual test unit are formed together on the test pad. The step of seating and gross test by receiving the power and control signal through the test probe of the gross test unit and the visual test by detecting the gross test signal through the test probe pin of the visual test unit Characterized in that made at the same time.

And the gross test unit and the visual test unit is characterized in that the test is in contact with the same signal pad.

Other objects and advantages of the present invention in addition to the above objects will become apparent from the detailed description of the following embodiments with reference to the accompanying drawings.

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings.

1A is a perspective view illustrating an inspection apparatus of a display panel according to the present invention.

Referring to FIGS. 1A and 1B, a gross test probe unit for gross testing a liquid crystal display panel, a visual test probe unit and a gross test for additionally mounted in front of the gross test probe unit to perform a visual test of the liquid crystal display panel. It consists of a frame bar 7 to which the unit is attached.

The gross test probe unit is composed of a frame 1 and a gross test probe housing 8 in which a gross test probe 5 is received at the end of the frame.

 The frame 1 is provided on one side of the inspection apparatus in a predetermined shape, and at the end of the frame 1, a gross test probe housing 8 and a gross test probe housing 8 in the gross test probe housing 8 ) Is located.

 The gross test probe housing 8 is formed with a space such that the gross test probe 5 is seated. In addition, a plurality of blade test probes 5, which are in contact with the signal pads 25, are provided in parallel to transfer electrical signals applied to the probe test probes 5 to the signal pads 25, thereby providing a liquid crystal display panel. Inspect the defect.

The visual test probe unit includes a probe block 2 positioned in front of the gross test probe unit, a visual test probe pin 17 and a hinge member 15 positioned at an end of the probe block 2. It consists of a subframe 3 and a cylinder 4 which is operated via air pressure.

The probe block 2 is coupled to the probe pin holder 18 for fastening the probe pin 17 for visual test and is connected to the cylinder through the probe block connecting member 19. A spring 22 having tension is provided so that the tested probe pin holder 18 can be placed in a position before the inspection.

The probe pin 17 for visual test is formed in the form of a block. In addition, conductive rubber may be used at the end of the visual test probe pin 17 to maintain the shape of the block. Therefore, the visual bar can perform the function of the shorting bar. Therefore, the structure does not require the conventional shorting bar.

The subframe 3 is coupled to a frame bar 7 on which the gross test unit is fixed and has a hinge connecting member 15. The connecting rod 24 is coupled to the hinge connecting member 15 so as to be connected to another subframe spaced at a predetermined distance.

The cylinder 4 operates by the compression of air in response to the application of a visual signal. The cylinder connecting member 16 is coupled to the upper portion of the cylinder 4 and the 'b' shaped member 20 moves through the vertical movement of the cylinder connecting member 16. The 'b' shaped member 20 has a function similar to a lever and the connecting rod 24 connected to the middle of the 'b' shaped member 20 serves as a pedestal to move in accordance with the movement of the cylinder connecting member 16. . Therefore, the other end of the 'b' shaped member 20 in contact with the cylinder connecting member 16 exhibits the opposite movement. In addition, the other end of the 'b'-shaped member 20 in contact with the cylinder connecting member 16 is connected to the probe block connecting member 19 connected to the probe block 2 and the probe pin for visual test located in the probe block 2. (17) enables up and down movement which may come into contact with the signal pad 25 during the visual test.

The frame bar 7 is fastened so that the frame 1, the subframe 3, and the cylinder 4 are separated by a predetermined distance.

In addition, although not shown in the drawing, the visual test probe pin 17 develops and applies a visual test generator for visual test probe pin 17 to enable turn-on detection and inversion driving of a gate signal. Is applied to shorten only the channel portion of the contact portion of the pad.

2 is a process block diagram illustrating a test method according to an exemplary embodiment of the present invention.

 Referring to FIG. 2, an inspection process of a display panel includes a cell loading process of transferring a liquid crystal display panel to a test stand and seating the test pad, and a gross test unit and a visual test unit together with the test pad. The process of seating the formed inspection unit is performed. Thereafter, a power test and a control signal are applied to the signal pad of the channel unit through the test probe of the gross test unit to output a gross test screen to the liquid crystal display panel. In addition, a process of detecting a defective state using the gross test screen and a visual test process of applying a short state signal to all channels at the same time by descending and shorting the visual test probe unit and shorting the signal pads of the channel part are performed.

In detail, in order to inspect the display panel, the panel on which the signal pad 25 having the plurality of contacts connected to the driving IC is provided at regular intervals is transferred to the inspection apparatus. After the cell loading process set at the inspection position, the gross test is performed when the display panel is ready for inspection.

In the gross test, the signal pads 25 and the gross test probes 5 of the display panel on which the frame 1 of the gross test unit and the gross test probes 5 positioned at the bottom of the frame are formed at regular intervals are connected one to one. This is followed by a full contact growth test and pattern implementation to apply power and control signals. The display panel receiving the control signal determines whether or not an abnormality exists in each cell by using various patterns such as driving abnormality or afterimage. The visual test probe pin 17 contacts the front side of the signal pad 25 to which the gross test probe 5 is in contact, thereby performing a visual test.

In the visual test, a visual pattern is inserted between various test patterns to detect pixel and line defects. The gross test that performs the full contact test method and the test method that can perform the visual test at the same time is called a full gate visual test (hereinafter referred to as a FGV). The FGV test pattern may be located at the end or somewhere in the middle of the pattern.

3A illustrates a signal pad of a display panel according to the present invention.

Referring to FIG. 3A, a test signal pad 25 of a display panel is connected to a gate line on a TFT substrate. The driver IC is attached to the test signal pad 25 after the defect test.

FIG. 3B is an enlarged view of a portion A shown in FIG. 3A.

3B and 3C, the areas where the gross test probes 5 contact the signal pads 25 and the visual test probe pins 17 contact the signal pads 25.

The size difference between the TFT substrate 21 and the color filter substrate 23 of the display panel is 1.85 mm. This is because most of the recently assembled LCD panels follow this standard. The length of the signal pad 25 located at 0.40 mm apart from the side of the color filter substrate 23 is 1.0 mm. Therefore, the distance between the signal pad 25 and the side of the TFT substrate 21 is 0.45 mm.

 The half of the signal pad 25 is used to contact the gross test probe 5 and the visual test probe pin 17 of the FGV unit capable of performing the full gate visual inspection. And the gross test probe 5 of the gross test unit using the full contact inspection method uses a blade type probe to minimize the area of the contact portion.

The visual test probe unit of the visual test unit performs a visual inspection by moving up and down in a designated pattern. The conductive rubber is finely processed and attached to the portion in contact with the signal pad 25.

In various inspection patterns, inspection is performed using the gross test probe 5 of the gross test unit, and a visual test unit is used in the pixel and line defect detection pattern. The signal pad 25 and the conductive rubber attached to the visual test probe pin 17 contact each other to apply a short signal to all channels.

 When a visual signal is applied to the visual test unit, a separate signal is generated through the visual test probe pin 17 of the visual test unit even if the gross test probe 5 is released from the signal pad and causes a pin miss during the gross test. Since is applied, the line which was not driven by the pin miss is normally driven to detect a substantial defect.

4 is a graph illustrating a gross test signal and a visual test signal.

When the gate pulse signal 41 is applied to the gross test probe 5, an output value is generated according to an abnormal state of each cell of the panel, and it is determined whether the panel is defective. However, if pin miss occurs at the contact between the pin and the pad, the ability to sort out line defects and pixel defects is significantly reduced.

Due to this problem, the visual test is performed simultaneously to accurately check the defects during the gross test.

The visual test probe pin 17 detects the gate pulse signal 41 applied from the gross test probe 5 and applies a signal to the visual test data prober during the gross test. A generator for visual test is developed and applied to drive the data signal up and down inversely based on the reference voltage in one frame section to enable the driving characteristics to the same level as before.

As described above, the inspection apparatus and the inspection method of the display panel according to the present invention by adding a minimum of the mechanical unit and the signal applying device to the existing gross test unit to implement the gross test and the visual test at the same time caused by the contact problem It is possible to improve productivity by reducing the detection problem and reducing the inspection process.

In the detailed description of the invention described above with reference to the preferred embodiment of the present invention, those skilled in the art or those skilled in the art having ordinary knowledge of the present invention described in the claims to be described later It will be understood that various modifications and variations can be made in the present invention without departing from the spirit and scope of the art.

Claims (8)

A gross test unit configured to output a gross test screen to the display panel to detect a failure of the display panel; A visual test unit capable of outputting a visual test screen to the display panel to detect defects of pixels and lines of the display panel; And the gross test and the visual test are performed simultaneously.        The method of claim 1,        The visual test unit;        A probe block located on the front side of the gross test unit;        A probe pin for visual test positioned at an end of the probe block;        A cylinder operated through pneumatic pressure to move the visual test probe pins up and down;  And a subframe which fixes the probe block.         The method of claim 1,  And the visual test unit includes visual test means for receiving a signal of a gross test to implement a data pattern.         The method of claim 1,        A display panel inspection device, characterized in that a moving means is provided so that the visual test unit can be moved up and down.         The method of claim 2,        And the visual test probe pin is a conductive rubber.         The method of claim 3, wherein        And the visual test means is a probe.         A cell loading step of mounting the display panel on the test pad;        Mounting a test unit having a gross test unit and a visual test unit together formed on the test pad;        Gross test receiving power and a control signal through a test probe of the gross test unit;         And detecting a visual test signal through a test probe pin of the visual test unit to perform a visual test.         The method of claim 7, wherein        And the gross test unit and the visual test unit are tested in contact with the same signal pad.

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