KR20070050111A - 균일한 온도제어를 위한 정전척 및 이를 포함하는 플라즈마발생장치 - Google Patents
균일한 온도제어를 위한 정전척 및 이를 포함하는 플라즈마발생장치 Download PDFInfo
- Publication number
- KR20070050111A KR20070050111A KR1020050107265A KR20050107265A KR20070050111A KR 20070050111 A KR20070050111 A KR 20070050111A KR 1020050107265 A KR1020050107265 A KR 1020050107265A KR 20050107265 A KR20050107265 A KR 20050107265A KR 20070050111 A KR20070050111 A KR 20070050111A
- Authority
- KR
- South Korea
- Prior art keywords
- heating plate
- insulating layer
- supply line
- power supply
- electrostatic chuck
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 238000010438 heat treatment Methods 0.000 claims abstract description 114
- 239000000758 substrate Substances 0.000 claims abstract description 40
- 230000002093 peripheral effect Effects 0.000 claims abstract description 11
- 229910052751 metal Inorganic materials 0.000 claims abstract description 3
- 239000002184 metal Substances 0.000 claims abstract description 3
- 238000000034 method Methods 0.000 claims description 16
- 239000002994 raw material Substances 0.000 claims description 7
- 238000009413 insulation Methods 0.000 claims description 2
- 238000001020 plasma etching Methods 0.000 description 9
- 238000009826 distribution Methods 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 7
- 229910010293 ceramic material Inorganic materials 0.000 description 5
- 238000005530 etching Methods 0.000 description 5
- 150000002500 ions Chemical class 0.000 description 5
- 239000000463 material Substances 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 230000005684 electric field Effects 0.000 description 4
- 230000007423 decrease Effects 0.000 description 3
- 239000004973 liquid crystal related substance Substances 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- 238000000427 thin-film deposition Methods 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 229910002113 barium titanate Inorganic materials 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 230000007935 neutral effect Effects 0.000 description 2
- 238000005086 pumping Methods 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 239000010937 tungsten Substances 0.000 description 2
- JRPBQTZRNDNNOP-UHFFFAOYSA-N barium titanate Chemical compound [Ba+2].[Ba+2].[O-][Ti]([O-])([O-])[O-] JRPBQTZRNDNNOP-UHFFFAOYSA-N 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 235000013399 edible fruits Nutrition 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67069—Apparatus for fluid treatment for etching for drying etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67103—Apparatus for thermal treatment mainly by conduction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6831—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
- H01L21/6833—Details of electrostatic chucks
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Drying Of Semiconductors (AREA)
Abstract
Description
Claims (10)
- 금속재질의 몸체;상기 몸체에 연결되는 RF 전력공급라인;상기 몸체의 상면에 적층되는 제 1 절연층;상기 제 1 절연층의 상면에 적층되며, PTC(Positive temperature coefficient) 소자로 제조되는 발열판;상기 발열판에 전력을 공급하는 발열판 전력공급라인;상기 제 1 절연층 상면에 적층되며, 상기 발열판의 상면 및 주변부를 커버하는 제2 절연층;상기 제2 절연층의 상면에 적층되는DC 전극;상기 DC 전극에 연결되는 DC 전력공급라인;상기 제 2 절연층 상부에 적층되고, 상기 DC 전극의 상면 및 주변부를 커버하며, 상부면에는 기판이 안치되는 제 3 절연층을 포함하는 정전척
- 제1항에 있어서,상기 발열판은 60도 내지 120도 범위에서 소정 온도를 유지하는 정전척
- 제1항에 있어서,상기 발열판 전력공급라인은, 접지된 발열판 전원으로부터 2차 유도된 전력을 공급하는 것을 특징으로 하는 정전척
- 제3항에 있어서,상기 발열판 전력공급라인에는 상기 발열판 전원의 주파수만 통과시키는 필터가 더 설치되는 것을 특징으로하는 정전척
- 제1항에 있어서,상기 발열판은 상기 제 1 절연층의 상면 중심부에 적층되는 제 1 발열판과 상기 제 1 발열판의 외곽에 적층되는 제 2 발열판을 포함하며,상기 발열판 전력공급라인은 상기 제 1 발열판에 전력을 공급하는 제 1 발열판 전력공급라인과 상기 제2 발열판에 전력을 공급하는 제 2 발열판 전력공급라인을 포함하며,상기 제2 절연층은 상기 제 1 발열판과 상기 제 2 발열판의 상면 및 주변부를 커버하는 것을 특징으로 하는 정전척
- 제5항에 있어서,상기 제1 발열판과 상기 제2 발열판은 60도 내지 120도 범위에서 소정 온도를 유지하는 정전척
- 제5항에 있어서,상기 제1 발열판 전력공급라인은 접지된 제 1 발열판 전원으로부터 2차유도된 전력을 공급하고,상기 제2 발열판 전력공급라인은 접지된 제2 발열판 전원으로부터 2차 유도된 전력을 공급하는 것을 특징으로 하는 정전척
- 제7항에 있어서,상기 제 1 발열판 전력공급라인과 상기 제 2 발열판 전력공급라인에는 각각 상기 제 1 발열판 전원과 상기 제 2 발열판 전원의 주파수만 통과시키는 필터가 더 설치되는 것을 특징으로 하는 정전척
- 제5항에 있어서,상기 정전척은,상기 제 1 절연층의 상면과 상기 제 2 발열판의 외곽에 적층되며 PTC 소자로 제조되는 제 3 발열판;상기 제 3 발열판에 전력을 공급하는 제 3 발열판 전력공급라인을 더 포함하며,상기 제2 절연층은 상기 제 1 발열판, 상기 제 2 발열판 및 상기 제 3 발열판의 상면 및 주변부를 커버하는 것을 특징으로 하는 정전척
- 내부에 반응공간을 형성하는 챔버;상기 챔버의 내부에 위치하며, 내부에 DC 전극과 PTC 소자로 이루어진 발열수단을 가지는 기판안치수단;상기 DC 전극에 연결되는 DC 전원;상기 발열수단에 연결되는 발열수단 전원;상기 기판안치수단에 연결되는 RF 전원;상기 기판안치수단의 상부로 원료물질을 공급하는 가스공급수단을 포함하는 플라즈마 발생장치
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020050107265A KR20070050111A (ko) | 2005-11-10 | 2005-11-10 | 균일한 온도제어를 위한 정전척 및 이를 포함하는 플라즈마발생장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020050107265A KR20070050111A (ko) | 2005-11-10 | 2005-11-10 | 균일한 온도제어를 위한 정전척 및 이를 포함하는 플라즈마발생장치 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20070050111A true KR20070050111A (ko) | 2007-05-15 |
Family
ID=38273780
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR1020050107265A Ceased KR20070050111A (ko) | 2005-11-10 | 2005-11-10 | 균일한 온도제어를 위한 정전척 및 이를 포함하는 플라즈마발생장치 |
Country Status (1)
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KR (1) | KR20070050111A (ko) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2013163220A1 (en) * | 2012-04-24 | 2013-10-31 | Applied Materials, Inc. | Electrostatic chuck with advanced rf and temperature uniformity |
CN104681462A (zh) * | 2013-11-29 | 2015-06-03 | 中微半导体设备(上海)有限公司 | 静电卡盘加热测温电路及等离子体反应装置 |
US11322336B2 (en) | 2018-10-05 | 2022-05-03 | Semes Co., Ltd. | Apparatus and method for treating substrate |
US11688590B2 (en) | 2018-03-26 | 2023-06-27 | Ngk Insulators, Ltd. | Electrostatic-chuck heater |
-
2005
- 2005-11-10 KR KR1020050107265A patent/KR20070050111A/ko not_active Ceased
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2013163220A1 (en) * | 2012-04-24 | 2013-10-31 | Applied Materials, Inc. | Electrostatic chuck with advanced rf and temperature uniformity |
US8937800B2 (en) | 2012-04-24 | 2015-01-20 | Applied Materials, Inc. | Electrostatic chuck with advanced RF and temperature uniformity |
TWI509732B (zh) * | 2012-04-24 | 2015-11-21 | Applied Materials Inc | 具有增強射頻及溫度均勻性的靜電夾盤 |
CN104681462A (zh) * | 2013-11-29 | 2015-06-03 | 中微半导体设备(上海)有限公司 | 静电卡盘加热测温电路及等离子体反应装置 |
US11688590B2 (en) | 2018-03-26 | 2023-06-27 | Ngk Insulators, Ltd. | Electrostatic-chuck heater |
US11322336B2 (en) | 2018-10-05 | 2022-05-03 | Semes Co., Ltd. | Apparatus and method for treating substrate |
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