KR20060127087A - 방사선 검출장치 - Google Patents
방사선 검출장치 Download PDFInfo
- Publication number
- KR20060127087A KR20060127087A KR1020067014996A KR20067014996A KR20060127087A KR 20060127087 A KR20060127087 A KR 20060127087A KR 1020067014996 A KR1020067014996 A KR 1020067014996A KR 20067014996 A KR20067014996 A KR 20067014996A KR 20060127087 A KR20060127087 A KR 20060127087A
- Authority
- KR
- South Korea
- Prior art keywords
- scintillator
- crystal
- bacl
- light
- time
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 230000005855 radiation Effects 0.000 title claims abstract description 19
- 239000013078 crystal Substances 0.000 claims abstract description 41
- WDIHJSXYQDMJHN-UHFFFAOYSA-L barium chloride Chemical compound [Cl-].[Cl-].[Ba+2] WDIHJSXYQDMJHN-UHFFFAOYSA-L 0.000 claims abstract description 13
- 229910001626 barium chloride Inorganic materials 0.000 claims abstract description 13
- 238000001514 detection method Methods 0.000 claims description 14
- 238000013016 damping Methods 0.000 abstract 1
- 238000005259 measurement Methods 0.000 description 21
- 229910016036 BaF 2 Inorganic materials 0.000 description 11
- 238000001816 cooling Methods 0.000 description 6
- 239000000463 material Substances 0.000 description 6
- 230000005251 gamma ray Effects 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 229910052802 copper Inorganic materials 0.000 description 4
- 239000010949 copper Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- OYLGJCQECKOTOL-UHFFFAOYSA-L barium fluoride Chemical compound [F-].[F-].[Ba+2] OYLGJCQECKOTOL-UHFFFAOYSA-L 0.000 description 3
- 229910001632 barium fluoride Inorganic materials 0.000 description 3
- 239000004519 grease Substances 0.000 description 3
- 230000006872 improvement Effects 0.000 description 3
- 238000002600 positron emission tomography Methods 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 239000011261 inert gas Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 238000006862 quantum yield reaction Methods 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 230000002745 absorbent Effects 0.000 description 1
- 239000002250 absorbent Substances 0.000 description 1
- 239000006096 absorbing agent Substances 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 150000008064 anhydrides Chemical class 0.000 description 1
- 230000002238 attenuated effect Effects 0.000 description 1
- 239000005388 borosilicate glass Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000005494 condensation Effects 0.000 description 1
- 238000009833 condensation Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 150000004683 dihydrates Chemical class 0.000 description 1
- 239000003814 drug Substances 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- MYWUZJCMWCOHBA-VIFPVBQESA-N methamphetamine Chemical compound CN[C@@H](C)CC1=CC=CC=C1 MYWUZJCMWCOHBA-VIFPVBQESA-N 0.000 description 1
- 239000003921 oil Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 125000000962 organic group Chemical group 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
- G01T1/2023—Selection of materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/61—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing fluorine, chlorine, bromine, iodine or unspecified halogen elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
Landscapes
- Chemical & Material Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Measurement Of Radiation (AREA)
- Luminescent Compositions (AREA)
Abstract
Description
Claims (3)
- 신틸레이터로서 염화바륨(BaCl2) 결정을 이용하고, 신틸레이터로부터의 수광에 광전자 증배관을 이용한 방사선 검출장치로서, 상기 신틸레이터로부터의 발광으로서 파장이 250~350nm인 광을 이용하고, 상기 신틸레이터를 저습도 분위기에 두는 것을 특징으로 하는 방사선 검출장치.
- 제 1항에 있어서, 상기 신틸레이터 결정이 냉각된 방사선 검출기.
- 제 1항 또는 제 2항에 있어서, 감마선 검출을 위한 방사선 검출장치.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPJP-P-2004-00010449 | 2004-01-19 | ||
JP2004010449 | 2004-01-19 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20060127087A true KR20060127087A (ko) | 2006-12-11 |
Family
ID=34792303
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020067014996A Ceased KR20060127087A (ko) | 2004-01-19 | 2005-01-12 | 방사선 검출장치 |
Country Status (7)
Country | Link |
---|---|
US (1) | US20080099684A1 (ko) |
EP (1) | EP1720042A1 (ko) |
JP (1) | JPWO2005069039A1 (ko) |
KR (1) | KR20060127087A (ko) |
CN (1) | CN1910473A (ko) |
RU (1) | RU2324204C1 (ko) |
WO (1) | WO2005069039A1 (ko) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012141420A3 (ko) * | 2011-04-11 | 2013-01-10 | 한양대학교 산학협력단 | 감마선 검출 장치 및 이를 이용한 감마선 검출 방법 |
KR20140064524A (ko) * | 2012-11-20 | 2014-05-28 | 삼성전자주식회사 | 방사선이 방출된 위치의 분포를 추정하는 방법 및 장치 |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2009024895A2 (en) * | 2007-08-22 | 2009-02-26 | Koninklijke Philips Electronics N.V. | Reflector and light collimator arrangement for improved light collection in scintillation detectors |
CN102472824B (zh) * | 2009-07-07 | 2015-02-04 | 皇家飞利浦电子股份有限公司 | 具有同位素污染物补偿的动态pet成像装置及方法 |
CN102985848B (zh) * | 2010-07-26 | 2016-03-16 | 富士胶片株式会社 | 放射线检测面板 |
KR101265260B1 (ko) | 2011-03-22 | 2013-05-16 | 한국원자력연구원 | 제논 및 크립톤 흡착용 냉각액 자동충전 장치 |
JP5138104B2 (ja) | 2011-03-30 | 2013-02-06 | キヤノン株式会社 | 多孔質シンチレータ結晶体 |
US9091768B2 (en) * | 2011-06-06 | 2015-07-28 | Canon Kabushiki Kaisha | Scintillator material and radiation detector using same |
US8751039B1 (en) | 2013-02-22 | 2014-06-10 | Remedev, Inc. | Remotely-executed medical therapy device |
CN103235330A (zh) * | 2013-04-25 | 2013-08-07 | 贝谷科技股份有限公司 | 一种小型钢铁厂用放射性检测装置 |
CN103344983B (zh) * | 2013-06-19 | 2015-11-25 | 田志恒 | 核反应堆蒸汽发生器泄漏监测系统及方法 |
US11994427B2 (en) * | 2018-09-27 | 2024-05-28 | Temple University-Of The Commonwealth System Of Higher Education | Silicon photomultiplier imaging system and method for cooling the same |
CN109405926A (zh) * | 2018-12-06 | 2019-03-01 | 北京金德创业测控技术有限公司 | 放射性仪表、利用放射性仪表测量料位、密度的方法 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4658141A (en) * | 1984-04-03 | 1987-04-14 | Harshaw/Filtrol Partnership | Inorganic scintillator crystal having a highly reflective surface |
US4631409A (en) * | 1984-04-03 | 1986-12-23 | Harshaw/Filtrol | Scintillator crystal having a highly reflective surface |
JPH0731370B2 (ja) * | 1986-12-27 | 1995-04-10 | 富士写真フイルム株式会社 | 放射線像変換方法およびそれに用いられる放射線像変換体 |
US5134293A (en) * | 1988-07-12 | 1992-07-28 | Universities Research Association, Inc. | Scintillator material |
US5629515A (en) * | 1994-03-23 | 1997-05-13 | Kabushiki Kaisha Toshiba | Radiation measuring system having scintillation detectors coupled by optical fibers for multipoint measurement |
US5714761A (en) * | 1996-05-01 | 1998-02-03 | Phi Applied Physical Sciences | Scintillator apparatus |
US6534771B1 (en) * | 1999-06-08 | 2003-03-18 | Saint Gobain Industrial Ceramics, Inc. | Gamma camera plate assembly for PET and SPECT imaging |
JP3779596B2 (ja) * | 2001-11-16 | 2006-05-31 | 独立行政法人科学技術振興機構 | ポジトロンエミッショントモグラフィ装置 |
US7041508B2 (en) * | 2002-02-06 | 2006-05-09 | Alerttechsystems, Llc | Positron annihilation monitor and method for detecting hazardous materials |
-
2005
- 2005-01-12 CN CNA2005800027380A patent/CN1910473A/zh active Pending
- 2005-01-12 KR KR1020067014996A patent/KR20060127087A/ko not_active Ceased
- 2005-01-12 JP JP2005517027A patent/JPWO2005069039A1/ja active Pending
- 2005-01-12 RU RU2006129923/28A patent/RU2324204C1/ru not_active IP Right Cessation
- 2005-01-12 EP EP05703449A patent/EP1720042A1/en not_active Withdrawn
- 2005-01-12 WO PCT/JP2005/000210 patent/WO2005069039A1/ja not_active Application Discontinuation
- 2005-01-12 US US10/584,985 patent/US20080099684A1/en not_active Abandoned
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012141420A3 (ko) * | 2011-04-11 | 2013-01-10 | 한양대학교 산학협력단 | 감마선 검출 장치 및 이를 이용한 감마선 검출 방법 |
US8993975B2 (en) | 2011-04-11 | 2015-03-31 | Industry-University Cooperation Foundation Hanyang University | Gamma ray detecting apparatus and method for detecting gamma ray using the same |
KR20140064524A (ko) * | 2012-11-20 | 2014-05-28 | 삼성전자주식회사 | 방사선이 방출된 위치의 분포를 추정하는 방법 및 장치 |
Also Published As
Publication number | Publication date |
---|---|
CN1910473A (zh) | 2007-02-07 |
RU2324204C1 (ru) | 2008-05-10 |
US20080099684A1 (en) | 2008-05-01 |
WO2005069039A1 (ja) | 2005-07-28 |
EP1720042A1 (en) | 2006-11-08 |
JPWO2005069039A1 (ja) | 2007-12-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
PA0105 | International application |
Patent event date: 20060725 Patent event code: PA01051R01D Comment text: International Patent Application |
|
PA0201 | Request for examination | ||
PG1501 | Laying open of application | ||
E902 | Notification of reason for refusal | ||
PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20070726 Patent event code: PE09021S01D |
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E601 | Decision to refuse application | ||
PE0601 | Decision on rejection of patent |
Patent event date: 20080325 Comment text: Decision to Refuse Application Patent event code: PE06012S01D Patent event date: 20070726 Comment text: Notification of reason for refusal Patent event code: PE06011S01I |