KR200456967Y1 - Bga패키지 테스트 소켓용 유니버셜 어댑터 - Google Patents
Bga패키지 테스트 소켓용 유니버셜 어댑터 Download PDFInfo
- Publication number
- KR200456967Y1 KR200456967Y1 KR2020080015403U KR20080015403U KR200456967Y1 KR 200456967 Y1 KR200456967 Y1 KR 200456967Y1 KR 2020080015403 U KR2020080015403 U KR 2020080015403U KR 20080015403 U KR20080015403 U KR 20080015403U KR 200456967 Y1 KR200456967 Y1 KR 200456967Y1
- Authority
- KR
- South Korea
- Prior art keywords
- bga package
- test socket
- universal adapter
- ball
- slit holes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 41
- 238000005192 partition Methods 0.000 claims abstract description 15
- 230000000149 penetrating effect Effects 0.000 claims abstract description 11
- 238000000034 method Methods 0.000 claims description 3
- 238000004519 manufacturing process Methods 0.000 description 4
- 230000009471 action Effects 0.000 description 3
- 238000007689 inspection Methods 0.000 description 3
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000002860 competitive effect Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
- H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
- H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0483—Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Connecting Device With Holders (AREA)
Abstract
Description
Claims (5)
- BGA패키지 테스트 소켓을 구성하는 정방형 고정몸체의 상부에 평면슬라이딩 가능하게 조립되고, 그 상면에 상기 BGA패키지가 장착 또는 탈착되는 BGA패키지 테스트 소켓용 유니버셜 어댑터에 있어서,상기 정방형 고정몸체의 상부에 평면슬라이딩 가능하게 조립되는 슬라이딩부 및 상기 슬라이딩부의 상면 일부에서 일체로 돌설된 볼안착부를 포함하되,상기 슬라이딩부는, 사선방향으로 등간격을 갖도록 상하면을 관통하는 다수의 관통슬릿홀과, 상기 관통슬릿홀의 내측에 등간격으로 배열되어 일체로 형성된 다수의 격벽을 포함하여 구성되고,상기 볼안착부는, 상기 관통슬릿홀의 관통방향으로 연장형성된 다수의 연장슬릿홀과, 상기 격벽과 대응되는 상기 연장슬릿홀의 대응위치마다 구형홈을 형성하고,상기 볼안착부는, 중앙 길이방향으로 형성된 저접촉면과, 상기 저접촉면의 양측에서 상기 저접촉면과 단차를 두고 형성된 고접촉면을 포함하면서, 상기 저접촉면에 형성된 구형홈의 크기는 상기 고접촉면에 형성된 구형홈의 크기보다 작은 것을 특징으로 하는 BGA패키지 테스트 소켓용 유니버셜 어댑터.
- 삭제
- 삭제
- 제1항에 있어서,상기 볼안착부의 일측 코너에는,상기 BGA패키지가 정위치 및 정방향으로 상기 볼안착부에 장착될 수 있도록 장착위치 및 장착방향을 맞추기 위한 맞춤홈이 형성된 것을 특징으로 하는 BGA패키지 테스트 소켓용 유니버셜 어댑터.
- 제1항에 있어서,상기 볼안착부의 타측 코너에는,상기 볼안착부 및 상기 슬라이딩부를 일체로 관통하는 가이드홀이 형성된 것을 특징으로 하는 BGA패키지 테스트 소켓용 유니버셜 어댑터.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2020080015403U KR200456967Y1 (ko) | 2008-11-19 | 2008-11-19 | Bga패키지 테스트 소켓용 유니버셜 어댑터 |
CN2009202792635U CN201656204U (zh) | 2008-11-19 | 2009-11-18 | Bga封装测试插座用万能适配器 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2020080015403U KR200456967Y1 (ko) | 2008-11-19 | 2008-11-19 | Bga패키지 테스트 소켓용 유니버셜 어댑터 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20100005458U KR20100005458U (ko) | 2010-05-27 |
KR200456967Y1 true KR200456967Y1 (ko) | 2011-11-30 |
Family
ID=43121444
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR2020080015403U Expired - Lifetime KR200456967Y1 (ko) | 2008-11-19 | 2008-11-19 | Bga패키지 테스트 소켓용 유니버셜 어댑터 |
Country Status (2)
Country | Link |
---|---|
KR (1) | KR200456967Y1 (ko) |
CN (1) | CN201656204U (ko) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101197168B1 (ko) | 2010-11-23 | 2012-11-02 | (주)마이크로컨텍솔루션 | 구조가 개선된 비지에이 소켓 |
US20220283221A1 (en) * | 2013-03-14 | 2022-09-08 | Taiwan Semiconductor Manufacturing Company, Ltd. | Testing holders for chip unit and die package |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103336152A (zh) * | 2013-06-26 | 2013-10-02 | 上海华力微电子有限公司 | 可外接元器件的插座 |
KR101944693B1 (ko) * | 2018-12-04 | 2019-02-01 | 황동원 | 반도체 소자 테스트용 bga 소켓장치 |
KR102146290B1 (ko) | 2019-04-04 | 2020-08-21 | 황동원 | 반도체 소자 테스트용 lidless BGA 소켓장치 |
KR102339111B1 (ko) * | 2020-06-15 | 2021-12-15 | 배명철 | 반도체 패키지 테스트용 소켓 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002008808A (ja) | 2000-06-19 | 2002-01-11 | Enplas Corp | 電気部品用ソケット |
JP2002141462A (ja) * | 2000-11-07 | 2002-05-17 | Toshiba Corp | 3次元実装装置および3次元実装システム |
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2008
- 2008-11-19 KR KR2020080015403U patent/KR200456967Y1/ko not_active Expired - Lifetime
-
2009
- 2009-11-18 CN CN2009202792635U patent/CN201656204U/zh not_active Expired - Lifetime
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002008808A (ja) | 2000-06-19 | 2002-01-11 | Enplas Corp | 電気部品用ソケット |
JP2002141462A (ja) * | 2000-11-07 | 2002-05-17 | Toshiba Corp | 3次元実装装置および3次元実装システム |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101197168B1 (ko) | 2010-11-23 | 2012-11-02 | (주)마이크로컨텍솔루션 | 구조가 개선된 비지에이 소켓 |
US20220283221A1 (en) * | 2013-03-14 | 2022-09-08 | Taiwan Semiconductor Manufacturing Company, Ltd. | Testing holders for chip unit and die package |
US11579190B2 (en) * | 2013-03-14 | 2023-02-14 | Taiwan Semiconductor Manufacturing Co., Ltd. | Testing holders for chip unit and die package |
Also Published As
Publication number | Publication date |
---|---|
KR20100005458U (ko) | 2010-05-27 |
CN201656204U (zh) | 2010-11-24 |
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