KR20030064534A - 금속박막형 압력센서 및 그 제조방법 - Google Patents
금속박막형 압력센서 및 그 제조방법 Download PDFInfo
- Publication number
- KR20030064534A KR20030064534A KR1020020004863A KR20020004863A KR20030064534A KR 20030064534 A KR20030064534 A KR 20030064534A KR 1020020004863 A KR1020020004863 A KR 1020020004863A KR 20020004863 A KR20020004863 A KR 20020004863A KR 20030064534 A KR20030064534 A KR 20030064534A
- Authority
- KR
- South Korea
- Prior art keywords
- thin film
- pressure sensor
- metal thin
- silicon
- strain gauge
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L9/00—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
- G01L9/02—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means by making use of variations in ohmic resistance, e.g. of potentiometers, electric circuits therefor, e.g. bridges, amplifiers or signal conditioning
- G01L9/06—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means by making use of variations in ohmic resistance, e.g. of potentiometers, electric circuits therefor, e.g. bridges, amplifiers or signal conditioning of piezo-resistive devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L9/00—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
- G01L9/02—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means by making use of variations in ohmic resistance, e.g. of potentiometers, electric circuits therefor, e.g. bridges, amplifiers or signal conditioning
- G01L9/04—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means by making use of variations in ohmic resistance, e.g. of potentiometers, electric circuits therefor, e.g. bridges, amplifiers or signal conditioning of resistance-strain gauges
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/02—Sensors
- B81B2201/0264—Pressure sensors
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Fluid Pressure (AREA)
- Pressure Sensors (AREA)
Abstract
Description
| 증착조건 | 증착변수 |
| 타켓 | Cr 2" diameter |
| 파우어 | 140 W |
| 타켓과 기판의 거리 | 6 ㎝ |
| 스퍼터링 가스유입량 | Ar 35 sccm |
| 기판온도 | Room Temp.(27℃) |
| 작업진공 | 9 mTorr |
| 열처리 시간 | 48 hr |
| 열처리 온도 | 300℃ |
Claims (6)
- 금속박막형 압력센서에 있어서,실리콘 박막 멤브레인(11)을 포함한 실리콘기판(10);상기 실리콘 멤브레인(11)상의 일부에 증착 형성된 스트레인지 게이지(12);상기 실리콘기판(10)상의 일부에 형성된 휘스톤 브릿지;상기 박막형 스트레인 게이지와 상기 휘스톤 브릿지가 연결된 연결도체(14); 및상기 휘스톤 브릿지상에 형성된 전극(16); 을 포함하는 금속박막형 압력센서.
- 제 1 항에 있어서,상기 금속박막형 압력센서는, 파이렉스 유리기판(18)을 더 포함하는 것을 특징으로 하는 금속박막형 압력센서.
- 금속박막형 압력센서 제조방법에 있어서,실리콘 박막상에 실리콘 박막 멤브레인을 형성하는 단계;상기 실리콘 박막 멤브레인상에 스트레인 게이지를 형성하는 단계;상기 스트레인 게이지 및 휘스톤 브릿지를 연결도체로 연결하는 단계; 및상기 연결도체상에 전극을 형성하는 단계; 를 포함하는 금속박막형 압력센서 제조방법.
- 제 3 항에 있어서,상기 실리콘 박막 멤브레인 형성 단계는,TMAH 수용액 20~25 wt.%, 70~90℃에서 이방성 식각기술로 크기와 두께가 각각 1.43×1.43 mm2, 35~45 ㎛인 실리콘 박막 멤브레인을 형성하는 단계; 인 것을 특징으로 하는 금속박막형 압력센서 제조방법.
- 제 3 항에 있어서,상기 스트레인 게이지 형성 단계는,스퍼터링법으로 3000~4000Å의 크롬박막을 증착하여 형성하는 단계; 인 것을특징으로 하는 금속박막형 압력센서 제조방법.
- 제 3 항에 있어서,상기 연결도체상에 전극을 형성하는 단계 이후에,전기화학적 방전가공을 이용하여 파이렉스 유리기판에 압력인가용 홀을 형성하는 단계; 및상기 압력인가용 홀을 형성한 파이렉스 유리기판을 상기 실리콘기판과 양극접합하는 단계; 를 더 포함하는 것을 특징으로 하는 금속박막형 압력센서 제조방법.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2002-0004863A KR100427430B1 (ko) | 2002-01-28 | 2002-01-28 | 금속박막형 압력센서 및 그 제조방법 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2002-0004863A KR100427430B1 (ko) | 2002-01-28 | 2002-01-28 | 금속박막형 압력센서 및 그 제조방법 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20030064534A true KR20030064534A (ko) | 2003-08-02 |
| KR100427430B1 KR100427430B1 (ko) | 2004-04-13 |
Family
ID=32219613
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR10-2002-0004863A Expired - Fee Related KR100427430B1 (ko) | 2002-01-28 | 2002-01-28 | 금속박막형 압력센서 및 그 제조방법 |
Country Status (1)
| Country | Link |
|---|---|
| KR (1) | KR100427430B1 (ko) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2009072704A1 (en) * | 2007-12-05 | 2009-06-11 | Electronics And Telecommunications Research Institute | Micro piezoresistive pressure sensor and manufacturing method thereof |
| KR101038197B1 (ko) * | 2009-01-19 | 2011-05-31 | 최이광 | 치즐 고정구조를 갖는 유압브레이커 |
| RU2430343C1 (ru) * | 2010-08-16 | 2011-09-27 | Евгений Михайлович Белозубов | Датчик давления на основе тонкопленочной нано- и микроэлектромеханической системы |
| KR20180044694A (ko) | 2016-10-24 | 2018-05-03 | 한국항공우주연구원 | 구조 손상 모니터링 센서 및 그 제조 방법 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4821011B1 (ko) * | 1970-07-24 | 1973-06-26 | ||
| JPS54131892A (en) * | 1978-04-05 | 1979-10-13 | Hitachi Ltd | Semiconductor pressure converter |
| JPS55134526A (en) * | 1979-04-06 | 1980-10-20 | Nippon Hoso Kyokai <Nhk> | Waveform equalizer |
| JPS60253279A (ja) * | 1984-05-29 | 1985-12-13 | Toyota Central Res & Dev Lab Inc | 半導体歪み測定器 |
| JP2615887B2 (ja) * | 1988-07-29 | 1997-06-04 | 株式会社デンソー | 半導体圧力センサ |
| JPH07162018A (ja) * | 1993-12-13 | 1995-06-23 | Nagano Keiki Seisakusho Ltd | 半導体圧力センサ |
| JPH1164137A (ja) * | 1997-08-25 | 1999-03-05 | Hitachi Ltd | 半導体圧力センサ |
-
2002
- 2002-01-28 KR KR10-2002-0004863A patent/KR100427430B1/ko not_active Expired - Fee Related
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2009072704A1 (en) * | 2007-12-05 | 2009-06-11 | Electronics And Telecommunications Research Institute | Micro piezoresistive pressure sensor and manufacturing method thereof |
| US8261617B2 (en) | 2007-12-05 | 2012-09-11 | Electronics And Telecomunications Research Institute | Micro piezoresistive pressure sensor and manufacturing method thereof |
| KR101038197B1 (ko) * | 2009-01-19 | 2011-05-31 | 최이광 | 치즐 고정구조를 갖는 유압브레이커 |
| RU2430343C1 (ru) * | 2010-08-16 | 2011-09-27 | Евгений Михайлович Белозубов | Датчик давления на основе тонкопленочной нано- и микроэлектромеханической системы |
| KR20180044694A (ko) | 2016-10-24 | 2018-05-03 | 한국항공우주연구원 | 구조 손상 모니터링 센서 및 그 제조 방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR100427430B1 (ko) | 2004-04-13 |
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