KR20020088589A - 매엽식 반도체 웨이퍼용 약액 분사노즐 - Google Patents
매엽식 반도체 웨이퍼용 약액 분사노즐 Download PDFInfo
- Publication number
- KR20020088589A KR20020088589A KR1020010027338A KR20010027338A KR20020088589A KR 20020088589 A KR20020088589 A KR 20020088589A KR 1020010027338 A KR1020010027338 A KR 1020010027338A KR 20010027338 A KR20010027338 A KR 20010027338A KR 20020088589 A KR20020088589 A KR 20020088589A
- Authority
- KR
- South Korea
- Prior art keywords
- chemical liquid
- chemical
- injection nozzle
- nozzle
- liquid injection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/6715—Apparatus for applying a liquid, a resin, an ink or the like
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
Claims (4)
- 약액이 인입되는 약액인입구(41)(43)와, 질소가스가 통과하는 질소가스관 (46)과, 순수 또는 건조 가스가 공급되는 도트형 분사노즐(45)(47) 및 약액이 분사되는 약액분사구(44)가 구비된 약액 분사노즐에 있어서, 약액인입구(41)(43)와 약액분사구(44) 사이에 트랩(48)이 형성되며, 상기 약액분사구(44)는 띠상인 것을 특징으로 하는 매엽식 반도체 웨이퍼용 약액 분사노즐.
- 제 1항에 있어서, 상기 도트형 분사노즐(45)(47)은 약액 분사노즐(38)의 약액분사구(44) 길이방향에 따라 그 위치를 가변적으로 조절할 수 있도록 노즐가이드(42)와 함께 부착되는 것을 특징으로 하는 매엽식 반도체 웨이퍼용 약액 분사노즐.
- 제 1항에 있어서, 상기 트랩(48)은 약액의 진행방향을 2회 변화시키는 것을 특징으로 하는 매엽식 반도체 웨이퍼용 약액 분사노즐.
- 제 3항에 있어서, 상기 트랩(48)은 약액의 진행방향은 90° 이상 변화되는것을 특징으로 하는 매엽식 반도체 웨이퍼용 약액 분사노즐.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2001-0027338A KR100454637B1 (ko) | 2001-05-18 | 2001-05-18 | 매엽식 반도체 웨이퍼용 약액 분사노즐 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2001-0027338A KR100454637B1 (ko) | 2001-05-18 | 2001-05-18 | 매엽식 반도체 웨이퍼용 약액 분사노즐 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20020088589A true KR20020088589A (ko) | 2002-11-29 |
KR100454637B1 KR100454637B1 (ko) | 2004-11-03 |
Family
ID=27705476
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR10-2001-0027338A Expired - Fee Related KR100454637B1 (ko) | 2001-05-18 | 2001-05-18 | 매엽식 반도체 웨이퍼용 약액 분사노즐 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100454637B1 (ko) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100687579B1 (ko) * | 2006-05-08 | 2007-02-27 | 한국지질자원연구원 | 폐전선 피복으로부터 미립자 구리 제거를 위한 정전선별시스템 |
KR100786332B1 (ko) * | 2006-12-29 | 2007-12-14 | 세메스 주식회사 | 기판 세정 장치 |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102401419B1 (ko) | 2021-08-18 | 2022-05-24 | 김은숙 | 반도체 웨이퍼용 분사 노즐 |
KR102647527B1 (ko) | 2022-12-08 | 2024-03-14 | 주식회사 앤아이윈 | 드롭방지 노즐팁 |
KR102710245B1 (ko) | 2022-12-08 | 2024-09-26 | 주식회사 앤아이윈 | 반도체 웨이퍼 세정장치용 토출 안정화 노즐 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08323106A (ja) * | 1995-06-02 | 1996-12-10 | Hitachi Ltd | 薬液供給装置及び薬液供給方法 |
JP3642892B2 (ja) * | 1996-09-27 | 2005-04-27 | 大日本スクリーン製造株式会社 | 処理液吐出ノズルおよび基板処理装置 |
JP3633775B2 (ja) * | 1998-02-12 | 2005-03-30 | 大日本スクリーン製造株式会社 | 処理液吐出ノズルおよび基板処理装置 |
JP2000124126A (ja) * | 1998-02-17 | 2000-04-28 | Ishikawa Seisakusho Ltd | レジスト現像装置における現像液吐出ノズル |
JP2000058435A (ja) * | 1998-08-07 | 2000-02-25 | Ishikawa Seisakusho Ltd | レジスト現像装置における現像液吐出ノズル及び現像液吐出方法 |
JP3653198B2 (ja) * | 1999-07-16 | 2005-05-25 | アルプス電気株式会社 | 乾燥用ノズルおよびこれを用いた乾燥装置ならびに洗浄装置 |
-
2001
- 2001-05-18 KR KR10-2001-0027338A patent/KR100454637B1/ko not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100687579B1 (ko) * | 2006-05-08 | 2007-02-27 | 한국지질자원연구원 | 폐전선 피복으로부터 미립자 구리 제거를 위한 정전선별시스템 |
KR100786332B1 (ko) * | 2006-12-29 | 2007-12-14 | 세메스 주식회사 | 기판 세정 장치 |
Also Published As
Publication number | Publication date |
---|---|
KR100454637B1 (ko) | 2004-11-03 |
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