KR20000064617A - 분자, 적층된 매질 및 패턴 형성 방법 - Google Patents
분자, 적층된 매질 및 패턴 형성 방법 Download PDFInfo
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- KR20000064617A KR20000064617A KR1019980707313A KR19980707313A KR20000064617A KR 20000064617 A KR20000064617 A KR 20000064617A KR 1019980707313 A KR1019980707313 A KR 1019980707313A KR 19980707313 A KR19980707313 A KR 19980707313A KR 20000064617 A KR20000064617 A KR 20000064617A
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
- G03F7/164—Coating processes; Apparatus therefor using electric, electrostatic or magnetic means; powder coating
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/40—Treatment after imagewise removal, e.g. baking
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/855—Manufacture, treatment, or detection of nanostructure with scanning probe for manufacture of nanostructure
- Y10S977/858—Manufacture, treatment, or detection of nanostructure with scanning probe for manufacture of nanostructure including positioning/mounting nanostructure
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- Condensed Matter Physics & Semiconductors (AREA)
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- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Nitrogen Condensed Heterocyclic Rings (AREA)
- Micromachines (AREA)
Abstract
Description
Claims (18)
- 하나 이상의 연결부(2)에 의해 서로에 연결되는 둘 이상의 단위체(1,3)를 포함하고 기판(4)에 부착될 수 있고 상기 기판(4) 및/또는 서로에 대해 단위체(1,3)의 상이한 배치로 구별되는 둘 이상의 상이한 안정 형태(18) 또는 준안정 형태 사이에서 외부 영향하에 변화될 수 있으며(switchable), 이때제 1 형태(8)에서 상기 기판(4)에 부착될 때에 상기 단위체(1,3)중 제 2 단위체(3)와 기판(4) 사이의 제 2 인력(5)에 의해 기판(4)쪽으로 끌리며, 상기 단위체(1,3)중 제 1 단위체(1)는 기판(4)에 대해 기판(4)과의 사이에서의 제 1 인력(6)이 제 2 인력(5)과 비교하여 무시될 수 있는 위치를 갖고, 제 2 형태(19)에서 제 1 단위체(1)가 제 1 인력(6)에 의해 기판(4)에 결합되는 위치를 갖는 것을 특징으로 하는 분자.
- 제 1항에 있어서,기판(4)상의 분자 위치가 형태(18,19)중 하나 이상으로 고정되는 것을 특징으로 하는 분자.
- 제 1항 또는 제 2항에 있어서,제 1 형태(18)와 제 2 형태(19) 사이에서 가역적으로 변화될 수 있는 것을 특징으로하는 분자.
- 제 1항 내지 제 3항중 어느 한 항에 있어서,제 1 단위체(1)가 분자에서 중심 위치를 갖고 제 2 단위체(3)가 상기 제 1 단위체(1)에 이동가능하게 연결된 하나 이상의 주변 단위체를 포함하는 분자.
- 기판(4)상에 완전한 단층 또는 불완전한 단층(15) 형상으로 배치된, 제 1항 내지 제 4항중 어느 한 항에 따른 분자 다수를 포함하는 적층된 매질.
- 제 5항에 있어서,분자가 변화하는 동안에도 기판(4)상의 고정된 위치에서 두 형태(18,19) 모두로 유지되는 것을 특징으로하는 적층된 매질.
- 제 5항에 있어서,형태(18,19)중 하나 이상으로 있는 분자가 기판(4)을 따라 이동가능하고 상기 분자가 열 들뜨기(thermal excitation)로 인해 기판(4)을 따라 연속적으로 이동하여 상기 기판(4)의 영역이 일시적으로 덮혀있지 않게 되고 상기 형태(18,19)중 다른 하나 이상으로 존재하는 분자가 기판상의 고정된 위치에 유지되는 것을 특징으로 하는 적층된 매질.
- 제 5항 내지 제 7항중 어느 한 항에 있어서,기판(4)이 전기 전도성이고, 형태(18,19)중 하나에서 분자가 기판(4)의 수용능을 보조하여 인접한 비금속성 매질내로 전자를 방출시키고 형태(18,19)중 다른 하나의 형태에서 전자 방출능이 보다 작은 것을 특징으로하는 적층된 매질.
- 제 8항에 있어서,적층된 매질의 분자 형태(18,19) 사이에서의 변화에 의해 발광능이 다양한 효율 사이에서 변화될 수 있는 유기 발광 다이오드의 전자 방출 전극의 적어도 일부인 것을 특징으로하는 적층된 매질.
- 제 1단계에서 적층된 매질의 일정 영역을 선택하고; 제 2 단계에서 선택된 영역의 분자를 한 형태(18,19)에서 다른 형태(18,19)로 변화시키는 구조화 수단에 상기 선택된 영역을 노출시키는 것을 특징으로하는제 5항 내지 제 9항중 어느 한 항에 따른 적층된 매질에서 미리 결정된 패턴을 형성시키는 방법.
- 제 10항에 있어서,제 3단계에서 한 형태(18,19)의 분자를 제 1 분자-제거 수단으로 제거시키는 것을 특징으로하는, 미리 결정된 패턴의 형성 방법.
- 제 10항 또는 제 11항에 있어서,이전 단계후에 패턴화 마스크로서 기판(4)상의 고정 위치에 유지되는 분자를 사용하여 다음 단계에서 기판(4)을 패턴화시키는 것을 특징으로하는, 미리 결정된 패턴의 형성 방법.
- 제 10항 내지 제 12항중 어느 한 항에 있어서,마지막 단계에서 제 2 분자-제거 수단을 사용하여 기판(4)으로부터 분자를 제거시키는 것을 특징으로하는, 미리 결정된 패턴의 형성 방법.
- 제 10항 내지 제 13항중 어느 한 항에 있어서,분자 형태의 변화 기능을 수행하고, 형성시킬 패턴 형상에 상응하는 경로에서 적층된 매질을 따라 이동할 수 있는 하나 이상의 철필(7)을 구조화 수단으로서 사용하는 것을 특징으로하는, 미리 결정된 패턴의 형성 방법.
- 제 10항 내지 제 14항중 어느 한 항에 있어서,분자 형태의 변화 기능을 수행하고, 형성시킬 패턴에 따라 구조화되는 돌출부(21)를 포함하는 하나 이상의 스탬프(20)를 구조화 수단으로서 사용하는 것을 특징으로 하는, 미리 결정된 패턴의 형성 방법.
- 제 10항 내지 제 15항중 어느 한 항에 있어서,분자 형태의 변화 기능을 수행하고, 패턴을 형성시키기 위해 적층된 매질 주위에 또는 적층된 매질과 접촉하도록 배치되며 개별적으로 활성화되는 하나 이상의 작동기 어레이(30)를 구조화 수단으로서 사용하는 것을 특징으로하는, 미리 결정된 패턴의 형성 방법.
- 제 10항 내지 제 16항중 어느 한 항에 있어서,하나 이상의 조명 장치 또는 입자빔 장치를 구조화 수단으로서 사용하는 것을 특징으로하는, 미리 결정된 패턴의 형성 방법.
- 제 14항 내지 제 17항중 어느 한 항에 따른 구조화 수단을 검색 수단으로서 사용하는 것을 특징으로하는,제 5항 내지 제 9항중 어느 한 항에 따른 적층된 매질, 또는 기판에서 패턴을 검색하는 방법.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/IB1997/000083 WO1998035271A1 (en) | 1997-02-06 | 1997-02-06 | Molecule, layered medium and method for creating a pattern |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20000064617A true KR20000064617A (ko) | 2000-11-06 |
KR100296613B1 KR100296613B1 (ko) | 2001-09-22 |
Family
ID=11004527
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR1019980707313A Expired - Fee Related KR100296613B1 (ko) | 1997-02-06 | 1997-02-06 | 분자,이를포함하는적층매질,상기적층매질에패턴을형성하는방법및상기적층매질에서패턴을검색하는방법 |
Country Status (6)
Country | Link |
---|---|
US (1) | US6031756A (ko) |
EP (1) | EP0892942B1 (ko) |
JP (1) | JP3525934B2 (ko) |
KR (1) | KR100296613B1 (ko) |
DE (1) | DE69713500T2 (ko) |
WO (1) | WO1998035271A1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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KR100910276B1 (ko) * | 2001-03-29 | 2009-08-03 | 휴렛-팩커드 컴퍼니(델라웨어주법인) | 전자적 스위칭, 게이팅 및 메모리 용도를 위한, 전기장에의해 활성화되는 밴드 갭 변화를 갖는 쌍안정성 분자기계적 소자 |
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EP0551966B1 (en) * | 1986-12-24 | 1999-04-14 | Canon Kabushiki Kaisha | Recording device and reproducing device |
US5314725A (en) * | 1992-02-17 | 1994-05-24 | Kabushiki Kaisha Toyota Chuo Kenkyusho | Photo-plating process |
US5751629A (en) * | 1995-04-25 | 1998-05-12 | Irori | Remotely programmable matrices with memories |
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- 1997-02-06 US US09/155,915 patent/US6031756A/en not_active Expired - Lifetime
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KR100910276B1 (ko) * | 2001-03-29 | 2009-08-03 | 휴렛-팩커드 컴퍼니(델라웨어주법인) | 전자적 스위칭, 게이팅 및 메모리 용도를 위한, 전기장에의해 활성화되는 밴드 갭 변화를 갖는 쌍안정성 분자기계적 소자 |
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EP0892942B1 (en) | 2002-06-19 |
WO1998035271A1 (en) | 1998-08-13 |
EP0892942A1 (en) | 1999-01-27 |
KR100296613B1 (ko) | 2001-09-22 |
JP3525934B2 (ja) | 2004-05-10 |
JPH11509271A (ja) | 1999-08-17 |
US6031756A (en) | 2000-02-29 |
DE69713500T2 (de) | 2003-02-20 |
DE69713500D1 (de) | 2002-07-25 |
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