KR102716921B1 - 반도체 제조장비용 캐니스터 - Google Patents
반도체 제조장비용 캐니스터 Download PDFInfo
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- KR102716921B1 KR102716921B1 KR1020210142539A KR20210142539A KR102716921B1 KR 102716921 B1 KR102716921 B1 KR 102716921B1 KR 1020210142539 A KR1020210142539 A KR 1020210142539A KR 20210142539 A KR20210142539 A KR 20210142539A KR 102716921 B1 KR102716921 B1 KR 102716921B1
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 20
- 239000012159 carrier gas Substances 0.000 claims abstract description 56
- 239000002243 precursor Substances 0.000 claims abstract description 39
- 238000004519 manufacturing process Methods 0.000 claims abstract description 16
- 238000000427 thin-film deposition Methods 0.000 claims abstract description 10
- 239000000463 material Substances 0.000 claims description 11
- 238000000034 method Methods 0.000 claims description 9
- 239000002184 metal Substances 0.000 claims description 5
- 238000007789 sealing Methods 0.000 claims description 2
- 238000005245 sintering Methods 0.000 claims description 2
- 238000000231 atomic layer deposition Methods 0.000 description 7
- 238000005229 chemical vapour deposition Methods 0.000 description 7
- 238000009792 diffusion process Methods 0.000 description 7
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 6
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 6
- 239000007787 solid Substances 0.000 description 5
- 239000012535 impurity Substances 0.000 description 4
- 239000007788 liquid Substances 0.000 description 4
- 229910052786 argon Inorganic materials 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 229910052757 nitrogen Inorganic materials 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- 238000013459 approach Methods 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 239000011261 inert gas Substances 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 150000002736 metal compounds Chemical class 0.000 description 2
- 230000008016 vaporization Effects 0.000 description 2
- 230000005856 abnormality Effects 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000009833 condensation Methods 0.000 description 1
- 239000000356 contaminant Substances 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 239000012776 electronic material Substances 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 239000012705 liquid precursor Substances 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- -1 moisture Substances 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000009834 vaporization Methods 0.000 description 1
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/4481—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by evaporation using carrier gas in contact with the source material
- C23C16/4482—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by evaporation using carrier gas in contact with the source material by bubbling of carrier gas through liquid source material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/4481—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by evaporation using carrier gas in contact with the source material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
- C23C14/243—Crucibles for source material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/4481—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by evaporation using carrier gas in contact with the source material
- C23C16/4483—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by evaporation using carrier gas in contact with the source material using a porous body
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45544—Atomic layer deposition [ALD] characterized by the apparatus
- C23C16/45548—Atomic layer deposition [ALD] characterized by the apparatus having arrangements for gas injection at different locations of the reactor for each ALD half-reaction
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76841—Barrier, adhesion or liner layers
- H01L21/76843—Barrier, adhesion or liner layers formed in openings in a dielectric
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
도 2는 도 1의 A-A 라인을 따라 절단한 단면도이다.
120: 커버 121: 체결수단
123: 전구물질 투입구 125: 캐리어 가스 투입구
127: 토출구 129: 긴급 배출구
130: 다공성 용기 131: 홀
140: 딥튜브 141: 소결필터
150: 가스켓
Claims (6)
- 반도체 박막 증착공정에 사용되는 전구 물질이 저장되어 기화되는 용기;
상기 전구 물질이 투입될 수 있는 전구 물질 투입구 및 캐리어 가스가 투입되는 캐리어 가스 투입구가 구비되며, 상기 용기를 밀폐시키는 커버;
상기 용기의 내부에 구비된 상부 개방형의 다공성 용기; 및
상기 다공성 용기의 내부를 통과하도록 설치되며, 상기 캐리어 가스 투입구를 통해 투입된 캐리어 가스를 상기 용기의 바닥까지 전달하는 딥튜브를 포함하며,
상기 딥튜브는 상기 캐리어 가스 투입구에 연결되는 제 1부위, 상기 제 1부위를 통과한 캐리어 가스가 아래로 비스듬하게 이동하도록 형성된 제 2부위, 및 상기 제 2부위를 통과한 캐리어 가스를 상기 용기의 바닥까지 전달하는 제 3부위를 포함하며,
상기 제 1부위 및 제 3부위에서 캐리어 가스가 수직 하방으로 이동하고 상기 제 2부위에서는 아래로 비스듬하게 이동하도록 상기 딥튜브는 절곡된 형태로 형성되며,
상기 딥튜브의 제 3부위의 말단에는 상기 딥튜브에서 배출되는 캐리어 가스를 상기 용기의 내부에 확산시키기 위한 소결필터가 구비되며,
상기 소결필터를 통해 확산된 캐리어 가스가 기화된 전구 물질과 함께 상기 다공성 용기의 내부로 확산되도록 상기 다공성 용기의 측벽부 및 저면부를 포함한 전체 면에 다수의 홀이 형성되고, 상기 다공성 용기의 내부는 비어 있는 것을 특징으로 하는 반도체 제조장비용 캐니스터. - 삭제
- 제 1항에 있어서,
상기 딥튜브의 제 3부위의 말단은 상기 다공성 용기의 바닥면을 관통하여 상기 다공성 용기의 바닥면과 상기 용기의 바닥면 사이에 위치하는 것을 특징으로 하는 반도체 제조장비용 캐니스터. - 제 1항에 있어서,
상기 다공성 용기는 금속으로 형성되는 것을 특징으로 하는 반도체 제조장비용 캐니스터. - 제 1항에 있어서,
상기 다공성 용기는 상기 용기의 형상과 동일한 것을 특징으로 하는 반도체 제조장비용 캐니스터. - 삭제
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020210142539A KR102716921B1 (ko) | 2021-10-25 | 2021-10-25 | 반도체 제조장비용 캐니스터 |
JP2022009350A JP2023064027A (ja) | 2021-10-25 | 2022-01-25 | 半導体製造装置用キャニスタ |
US17/666,775 US20230128048A1 (en) | 2021-10-25 | 2022-02-08 | Canister of semiconductor product device |
Applications Claiming Priority (1)
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KR1020210142539A KR102716921B1 (ko) | 2021-10-25 | 2021-10-25 | 반도체 제조장비용 캐니스터 |
Publications (2)
Publication Number | Publication Date |
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KR20230058843A KR20230058843A (ko) | 2023-05-03 |
KR102716921B1 true KR102716921B1 (ko) | 2024-10-14 |
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KR1020210142539A Active KR102716921B1 (ko) | 2021-10-25 | 2021-10-25 | 반도체 제조장비용 캐니스터 |
Country Status (3)
Country | Link |
---|---|
US (1) | US20230128048A1 (ko) |
JP (1) | JP2023064027A (ko) |
KR (1) | KR102716921B1 (ko) |
Families Citing this family (1)
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KR20250011356A (ko) | 2023-07-14 | 2025-01-21 | (주)지오엘리먼트 | 열전달 모듈 및 이를 구비한 캐니스터 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH1066823A (ja) * | 1996-08-27 | 1998-03-10 | Mitsui Petrochem Ind Ltd | 気相化学蒸着装置 |
EP1160355B1 (en) * | 2000-05-31 | 2004-10-27 | Shipley Company LLC | Bubbler |
US7300038B2 (en) * | 2002-07-23 | 2007-11-27 | Advanced Technology Materials, Inc. | Method and apparatus to help promote contact of gas with vaporized material |
JP5209899B2 (ja) * | 2006-05-22 | 2013-06-12 | ローム・アンド・ハース・エレクトロニック・マテリアルズ,エル.エル.シー. | デリバリーデバイス |
US20080241805A1 (en) * | 2006-08-31 | 2008-10-02 | Q-Track Corporation | System and method for simulated dosimetry using a real time locating system |
US9109287B2 (en) * | 2006-10-19 | 2015-08-18 | Air Products And Chemicals, Inc. | Solid source container with inlet plenum |
US8708320B2 (en) * | 2006-12-15 | 2014-04-29 | Air Products And Chemicals, Inc. | Splashguard and inlet diffuser for high vacuum, high flow bubbler vessel |
JP5728772B2 (ja) * | 2011-05-31 | 2015-06-03 | 株式会社ブイ・テクノロジー | 原料ガス発生装置 |
JP2013044043A (ja) * | 2011-08-26 | 2013-03-04 | Hitachi Kokusai Electric Inc | 基板処理装置 |
JP3190913U (ja) * | 2014-03-13 | 2014-06-05 | 日本エア・リキード株式会社 | 材料充填用グローブボックス |
US10392700B2 (en) * | 2014-04-21 | 2019-08-27 | Entegris, Inc. | Solid vaporizer |
KR20150143158A (ko) * | 2014-06-13 | 2015-12-23 | 이현식 | 고체 전구체용 버블러 |
JP6324609B1 (ja) * | 2017-06-21 | 2018-05-16 | 日本エア・リキード株式会社 | 固体材料容器およびその固体材料容器に固体材料が充填されている固体材料製品 |
US11104993B2 (en) * | 2017-07-28 | 2021-08-31 | Entegris, Inc. | Modular tray ampoule |
JP7093847B2 (ja) * | 2018-09-27 | 2022-06-30 | レール・リキード-ソシエテ・アノニム・プール・レテュード・エ・レクスプロワタシオン・デ・プロセデ・ジョルジュ・クロード | 五塩化タングステンコンディショニング及び結晶相マニピュレーション |
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2021
- 2021-10-25 KR KR1020210142539A patent/KR102716921B1/ko active Active
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2022
- 2022-01-25 JP JP2022009350A patent/JP2023064027A/ja active Pending
- 2022-02-08 US US17/666,775 patent/US20230128048A1/en not_active Abandoned
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JP2023064027A (ja) | 2023-05-10 |
KR20230058843A (ko) | 2023-05-03 |
US20230128048A1 (en) | 2023-04-27 |
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