KR102700759B1 - 투광성 필름 결함 검사 장치 - Google Patents
투광성 필름 결함 검사 장치 Download PDFInfo
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- KR102700759B1 KR102700759B1 KR1020230021503A KR20230021503A KR102700759B1 KR 102700759 B1 KR102700759 B1 KR 102700759B1 KR 1020230021503 A KR1020230021503 A KR 1020230021503A KR 20230021503 A KR20230021503 A KR 20230021503A KR 102700759 B1 KR102700759 B1 KR 102700759B1
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- 230000007547 defect Effects 0.000 title claims abstract description 46
- 230000003287 optical effect Effects 0.000 claims abstract description 36
- 238000007689 inspection Methods 0.000 claims description 44
- 230000001154 acute effect Effects 0.000 claims description 3
- 230000005540 biological transmission Effects 0.000 description 9
- 238000001514 detection method Methods 0.000 description 6
- 238000000034 method Methods 0.000 description 6
- 210000001747 pupil Anatomy 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000014509 gene expression Effects 0.000 description 2
- 238000007373 indentation Methods 0.000 description 1
- 210000003141 lower extremity Anatomy 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000001151 other effect Effects 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- Chemical & Material Sciences (AREA)
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- Immunology (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Engineering & Computer Science (AREA)
- Signal Processing (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Description
도 1은 본 발명의 실시예에 따른 투광성 필름 결함 검사 장치를 도시한 도면이다.
도 2 및 도 3은 본 발명의 실시예에 따른 투광성 필름 결함 검사 장치에 의해 캡처 된 필름 검사 이미지와 종래의 투광성 필름 결함 검사 장치에 의해 캡처 된 필름 검사 이미지의 비교 도면이다.
13: 카메라 14: 제2 텔레센트릭 렌즈
100: 투광성 필름
Claims (6)
- 투광성 필름의 표면 결함을 검출하기 위한 장치에 있어서,
상기 투광성 필름에 조사되는 빛을 출력하는 광원부;
상기 광원부에서 출력되는 빛을 광축에 나란하게 정렬시켜 상기 투광성 필름으로 조사하도록 상기 광원부에 결합된 제1 텔레센트릭 렌즈;
상기 제1 텔레센트릭 렌즈에서 조사되는 빛이 상기 투광성 필름을 투과하여 생성되는 이미지를 캡처하는 카메라; 및
상기 투광성 필름의 검사대상 표면측에 배열되고, 상기 투광성 필름을 투과한 빛을 입력 받아 상기 카메라에서 캡처 되는 이미지를 생성하는 제2 텔레센트릭 렌즈;
를 포함하고,
상기 제1 텔레센트릭 렌즈와 상기 제2 텔레센트릭 렌즈는, 서로 광축이 일치하면서 상기 일치된 광축과 상기 투광성 필름의 표면은 사전 설정된 예각의 각도를 형성하도록 배치되되, 상기 사전 설정된 각도는 40° 내지 80°이며,
상기 제2 텔레센트릭 렌즈는, 상기 투광성 필름의 검사대상 표면에 대해 디포커싱 되는 것을 특징으로 하는 투광성 필름 결함 검사 장치. - 삭제
- 삭제
- 청구항 1에 있어서,
상기 사전 설정된 각도는 45° 내지 75°인 것을 특징으로 하는 투광성 필름 결함 검사 장치. - 청구항 4에 있어서,
상기 사전 설정된 각도는 60°인 것을 특징으로 하는 투광성 필름 결함 검사 장치. - 삭제
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020230021503A KR102700759B1 (ko) | 2023-02-17 | 2023-02-17 | 투광성 필름 결함 검사 장치 |
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KR1020230021503A KR102700759B1 (ko) | 2023-02-17 | 2023-02-17 | 투광성 필름 결함 검사 장치 |
Publications (2)
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KR20240128384A KR20240128384A (ko) | 2024-08-26 |
KR102700759B1 true KR102700759B1 (ko) | 2024-08-29 |
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KR1020230021503A Active KR102700759B1 (ko) | 2023-02-17 | 2023-02-17 | 투광성 필름 결함 검사 장치 |
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011027443A (ja) * | 2009-07-21 | 2011-02-10 | Ryuze Inc | 簡易テレセントリックレンズ装置及びこれを用いた平板状透明体の微小凹凸欠陥検査方法、装置 |
JP2011247804A (ja) | 2010-05-28 | 2011-12-08 | Toppan Printing Co Ltd | 周期性パターン検査方法および周期性パターン検査装置 |
JP2012107952A (ja) * | 2010-11-16 | 2012-06-07 | Toppan Printing Co Ltd | 光学ムラ検査装置 |
JP2013205332A (ja) | 2012-03-29 | 2013-10-07 | Toray Ind Inc | 欠点検査装置および欠点検査方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR970002301A (ko) | 1995-06-13 | 1997-01-24 | 안시환 | 필름 표면 검사방법 및 그 장치 |
KR102580389B1 (ko) * | 2018-02-13 | 2023-09-19 | 코닝 인코포레이티드 | 유리 시트 검사 장치 및 방법 |
KR20210106776A (ko) * | 2020-02-21 | 2021-08-31 | 동우 화인켐 주식회사 | 결함 검사 장치 및 방법 |
KR102510618B1 (ko) | 2021-04-13 | 2023-03-16 | 주식회사 디에이피 | 스크래치보호필름부착 외관자동최종검사장치 |
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2023
- 2023-02-17 KR KR1020230021503A patent/KR102700759B1/ko active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011027443A (ja) * | 2009-07-21 | 2011-02-10 | Ryuze Inc | 簡易テレセントリックレンズ装置及びこれを用いた平板状透明体の微小凹凸欠陥検査方法、装置 |
JP2011247804A (ja) | 2010-05-28 | 2011-12-08 | Toppan Printing Co Ltd | 周期性パターン検査方法および周期性パターン検査装置 |
JP2012107952A (ja) * | 2010-11-16 | 2012-06-07 | Toppan Printing Co Ltd | 光学ムラ検査装置 |
JP2013205332A (ja) | 2012-03-29 | 2013-10-07 | Toray Ind Inc | 欠点検査装置および欠点検査方法 |
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