KR102692008B1 - Proprobe pallet - Google Patents

Abstract

The present invention is a method implemented by a probe pallet in which probe blocks can be replaced, comprising the steps of mounting the probe block that matches the type and standard of the performance test of the object to be inspected on a head block; Aligning the probe pallet manually or automatically; Aligning the object to be inspected on the upper part of the pallet base provided on the probe pallet; and the step of bringing the probe block into contact with the object to be inspected by lifting and moving the fastening block fastened to the probe block. According to the present invention, there is an advantage that only the probe block can be replaced and the head block can be used as is, depending on the type and standard of the performance test of the object to be inspected.

Description

Inspection method and probe pallet using it {PROPROBE PALLET}

The present invention relates to an inspection method and a probe pallet using the same, and more specifically, to a probe pallet and inspection method based on an FPCB that can be used by replacing the probe block depending on the specifications of the inspection object and the type of inspection of the inspection object. It's about.

The content presented in this section only provides background information for the present invention and does not constitute prior art.

A probe device refers to a device that inspects the quality and performance of a test subject, for example, an electronic component such as a display panel by inputting a test signal. The probe device is configured to contact the pad of the object to be inspected using a probe pin.

A probe pallet, a type of probe device, is a device that includes a printed circuit board that generates an inspection signal and a probe pin that inputs the inspection signal, and may integrally include a pallet base on which the inspection subject is seated.

The display panel corresponding to the object to be inspected may include an input function in addition to an output function, and a touch screen panel corresponds to this. Performance testing for touch screen panels (TSP) includes pixel inspection (automotive visual inspection, AVI) and touch screen panel (TSP) inspection. AVI stands for pixel inspection, and TSP inspection is a term often used to refer to touch screen panel inspection.

As a technology related to the present invention, a probe device for inspecting a flat display panel disclosed in the Korean Patent Publication includes a probe block having a first contact part, a second contact part, a plurality of needles, and a first guide block and a second guide block. However, in this related technology, a plurality of needles are all in contact with the same terminal to transmit an electrical signal for pixel inspection, and in terms of the purpose, configuration, and effect of the present invention that can be applied to both pixel inspection and touch inspection, are distinct from each other.

Republic of Korea Patent No. 10-0602154 (announced on July 19, 2006)

One problem that the present invention seeks to solve is to provide a probe pallet and inspection method that can be used interchangeably according to the type and standard of the performance test of the inspected object.

One problem that the present invention seeks to solve is to provide a probe pallet and inspection method in which the probe block can be replaced according to the type and standard of the performance test of the inspected object.

One problem that the present invention seeks to solve is to provide a probe pallet and inspection method that maintains the level of the probe block while using elastic force.

One problem that the present invention aims to solve is to provide a probe pallet and inspection method that can stably form electrical contact by seating the second FPCB in the horizontal direction while the first FPCB is fixed at an angle.

The problem to be solved by the present invention is not limited to the problems mentioned above, and other problems not mentioned will be clearly understood by those skilled in the art from the description below.

In order to achieve the above object, according to an embodiment according to the technical idea of the present invention, a method is implemented by a probe pallet capable of replacing the probe block, and the probe suitable for the type and standard of the performance test of the subject to be inspected is used. Mounting the block to the head block; Aligning the probe pallet manually or automatically; Aligning the object to be inspected on an upper part of a pallet base provided on the probe pallet; and a step of lifting and moving a fastening block fastened to the probe block to bring the probe block into contact with the object to be inspected.

In order to achieve the above object, according to an embodiment according to the technical idea of the present invention, a body block; A pallet base that is combined with the body block and on which the object to be inspected is aligned; And a pallet base and a mark plate used to align the object to be inspected, and the body block includes: a head block that controls the vertical (z-axis) elevation of the probe block; and a probe block that inputs a test signal to an object to be inspected, wherein the head block includes a main FPCB that receives an electrical signal, and the probe block includes a sub-FPCB that is in electrical contact with the main FPCB, and the probe The block may be configured to be separated from the head block and replaceable depending on the type and standard of the performance yarn of the object to be inspected.

In addition, the probe pallet includes a head block, a fixed block fixed to the pallet base; and a fastening block installed on the upper part of the object to be inspected to be lifted and lowered under the guidance of the fixing block. The fastening block includes a first fastening part, and the probe block can be mechanically fastened to and separated from the first fastening part. It may be configured to include a second fastening portion.

Additionally, the probe pallet may include a head block and a lever assembly having an action point on the fastening block, and the fastening block may be configured to control the raising and lowering of the probe block using external pressure acting on the lever assembly.

In addition, the probe pallet includes a lever assembly including a plurality of levers; A lever plate bar connecting a plurality of levers to each other; And it may be configured to include a fix bracket that fixes the fastening block in the raised position by pressing the lever or the lever plate bar.

In addition, the probe pallet includes a first contact part and a second contact part, and the first contact part includes a main FPCB; and a main FPCB connect supporting the main FPCB, and the second contact portion may be configured to include a sub FPCB.

In addition, the probe pallet further includes a guide part that guides electrical contact between the first contact part and the second contact part, and the guide part includes a sliding slot provided in the fastening block as the first guide part; And the second guide may be configured to include a sliding pin provided on the probe block and coupled to the sliding slot.

Additionally, the probe pallet may be configured such that the first fastening portion includes a first magnet, and the second fastening portion includes a second magnet coupled to the first magnet.

Additionally, the probe pallet may be configured such that the first fastening portion further includes a fastening pin, and the second fastening portion further includes a hook assembly that can be fastened to and released from the fastening pin.

In addition, the probe pallet includes a probe block, a base block on which a second fastening part is installed; A sub-PCB coupled to the base block and on which the second contact part is installed; And it may be configured to include a probe slit that is electrically connected to the second contact portion and inputs a test signal to the test subject.

Specific details of other embodiments are included in “Specific Details for Carrying Out the Invention” and the attached “Drawings.”

The advantages and/or features of the present invention and methods for achieving them will become clear by referring to the various embodiments described in detail below along with the accompanying drawings.

However, the present invention is not limited to the configuration of each embodiment disclosed below, but may also be implemented in various different forms. However, each embodiment disclosed in this specification ensures that the disclosure of the present invention is complete, and the present invention It is provided to fully inform those skilled in the art of the present invention, and it should be noted that the present invention is only defined by the scope of each claim.

According to the present invention, one probe pallet can be used interchangeably by simply replacing the probe block depending on the type and standard of the performance test of the object to be inspected.

In addition, the probe block can be replaced depending on the type and standard of the performance test of the test subject.

Additionally, the level of the probe block can be maintained while using elastic force.

Additionally, while the first FPCB is fixed at an angle, the second FPCB can be seated in the horizontal direction to form a stable electrical contact.

Additionally, the replaced probe block can be stably fixed to the head block through double mechanical fastening.

In addition, it is easy to replace an FPC that has reached the end of its lifespan through one-touch fastening and releasing between the pallet base and body block.

Additionally, by sliding the second FPC in the horizontal direction toward the first FPC fixed at an angle, electrical contact can be made between the FPCs without error.

The effects that can be achieved by the probe pallet according to the technical idea of the present invention are not limited to the effects mentioned above, and other effects not mentioned can be obtained by those skilled in the art from the description below. can be clearly understood.

1 is a flowchart of an inspection method according to an embodiment of the present invention.
Figure 2 is an example diagram of a probe palette executing Figure 1.
Figure 3 is an exemplary diagram of the probe pallet of Figure 2 in a disassembled state.
Figure 4 is an enlarged illustration of the body block of the probe pallet of Figure 2.
FIG. 5 is an exemplary diagram in which the fixed block body is depicted transparently to depict the internal components of the probe pallet of FIG. 2.
Figure 6 is an example diagram depicting the side of the probe pallet of Figure 2.
FIG. 7 is an example diagram in which a portion of the probe pallet of FIG. 6 is depicted transparently.
FIG. 8 is an enlarged illustration of a portion of the probe pallet of FIG. 6.
Figure 9 is an example of a body block with a fixed block body missing from the probe pallet of Figure 2.
FIG. 10 is an exemplary diagram of a first contact portion and a second contact portion formed on the bottom of the body block of the probe pallet of FIG. 2.
FIG. 11 is an exemplary diagram of a hook assembly provided at both ends of the body block of the probe pallet of FIG. 2.
FIG. 12 is an example diagram of a method of maintaining the horizontality of blocks in the probe pallet of FIG. 2.

Before describing the present invention in detail, it should be understood that the terms or words used in this specification should not be interpreted as being unconditionally limited to their usual or dictionary meanings, and that the inventor of the present invention may appropriately define and use the concepts of various terms in order to describe his or her invention in the best possible manner, and further that these terms or words should be interpreted as meanings and concepts that are consistent with the technical idea of the present invention.

That is, the terms used in this specification are only used to describe preferred embodiments of the present invention, and are not used with the intention of specifically limiting the content of the present invention, and these terms refer to various possibilities of the present invention. It is important to note that this is a term defined with consideration in mind.

In addition, it should be noted that in this specification, singular expressions may include plural expressions, unless the context clearly indicates a different meaning, and may include singular meanings even if similarly expressed in plural. .

Throughout this specification, when a component is described as “including” another component, it does not exclude any other component, but includes any other component, unless specifically stated to the contrary. It could mean that you can do it.

Furthermore, if a component is described as being "installed within or connected to" another component, it means that this component may be installed in direct connection or contact with the other component and may be installed in contact with the other component and may be installed in contact with the other component. It may be installed at a certain distance, and in the case where it is installed at a certain distance, there may be a third component or means for fixing or connecting the component to another component. It should be noted that the description of the components or means of 3 may be omitted.

On the other hand, when a component is described as being “directly connected” or “directly connected” to another component, it should be understood that no third component or means is present.

Likewise, other expressions that describe the relationship between each component, such as "between" and "immediately between", or "neighboring" and "directly neighboring", have the same meaning. It should be interpreted as

In addition, in this specification, terms such as "one side", "other side", "one side", "the other side", "first", "second", etc., if used, refer to one component. It is used to clearly distinguish it from other components, and it should be noted that the meaning of the component is not limited by this term.

In addition, in this specification, terms related to position such as "top", "bottom", "left", "right", etc., if used, should be understood as indicating the relative position of the corresponding component in the corresponding drawing. Unless the absolute location is specified, these location-related terms should not be understood as referring to the absolute location.

In addition, in this specification, when specifying the reference numeral for each component in each drawing, the same component has the same reference number even if the component is shown in different drawings, that is, the same reference is made throughout the specification. The symbols indicate the same component.

In the drawings attached to this specification, the size, position, connection relationship, etc. of each component constituting the present invention is exaggerated, reduced, or omitted in order to convey the idea of the present invention sufficiently clearly or for convenience of explanation. It may be described, and therefore its proportions or scale may not be exact.

In addition, hereinafter, in describing the present invention, detailed descriptions of configurations that are judged to unnecessarily obscure the gist of the present invention, for example, known technologies including prior art, may be omitted.

Hereinafter, embodiments of the present invention will be described in detail with reference to the related drawings.

In the XYZ coordinate axes shown in each drawing, the

The probe pallet 100 according to an embodiment of the present invention is used for performance inspection of an inspection object, for example, a display panel to be finally assembled into an electronic device, for example, manual visual inspection (MVI) or automotive visual inspection (AVI). ), it has the function of inputting a test signal to the test terminal of the pin test object through contact with the test object.

1 is a flowchart of an inspection method according to an embodiment of the present invention.

Referring to FIG. 1, the inspection method (S100) can be performed using a probe pallet in which the probe block can be replaced.

The test method (S100) includes the steps of mounting a probe block that matches the type and standard of the performance test of the test object on the head block (S110), aligning the probe pallet manually or automatically (S120), and It may be configured to include the step of aligning the pallet base provided on the probe pallet (S130) and the step of bringing the probe block into contact with the object to be inspected by lifting and moving the fastening block fastened to the probe block (S140).

Figure 2 is an exemplary diagram of a probe pallet according to an embodiment of the present invention.

Figure 3 is an exemplary diagram of the probe pallet of Figure 2 in a disassembled state.

Referring to FIGS. 2 and 3, a probe block 160 that matches the type of performance test of the test object, for example, AVI, MVI or TSP and the standard, for example, size, is selected, and the selected probe block 160 is In the step of mounting on the head block 104 (S110), the first contact part belonging to the probe block 160 and the second contact part belonging to the head block 104 may be electrically contacted. Here, the first guide 146 can guide the guide 165a. And the first fastening part 147 belonging to the probe block 160 and the second fastening part 166 belonging to the head block 104 can be mechanically fastened.

The probe pallet 100 can be moved to the working position and aligned manually or automatically, for example, through a conveyor system (S120). In the step of aligning the probe pallet 100 (S120), a plurality of mark plates 119 attached to the bottom of the pallet base 101 may serve as a standard for alignment. The vision system recognizes the position of the mark plate 119 attached to the bottom of the pallet base 101, and the probe pallet 100 can be aligned based on the position of the mark plate 119 using a jig.

In the step (S130) of aligning the object to be inspected on the upper part of the pallet base 101, the mark plate 119 attached to the bottom of the probe block 160 may serve as a standard for alignment. That is, the vision system recognizes the position of the mark plate 119 attached to the bottom of the probe block 160 through the transparent vision glass 112a on the pallet base 101, and based on the position of the mark plate 119 Objects to be inspected may be aligned on the pallet base 101.

In the step (S140) of contacting the probe block 160 with the object to be inspected, the head block 104 controls the lifting and lowering of the fastening block 140, and the probe is electrically connected to the fastening block 140 and mechanically fastened. Block 160 may attempt to contact the object to be inspected.

Figure 4 is an enlarged illustration of the body block of the probe pallet of Figure 2.

Referring to FIG. 2, the probe pallet 100 according to an embodiment of the present invention is one of the probe devices belonging to the probe system. The probe system is a system that inspects the performance of the display panel ahead of final housing assembly. The probe pallet 100 has the function of inputting a test signal necessary for a performance test by contacting the probe pin to the test terminal of the test object, for example, a connector terminal, with the test object, for example, a display panel, seated on the top. have The probe pallet 100 has a function of attempting to contact the inspected object that is replaced in real time by moving the probe block 160 containing the probe pin up and down from the upper part of the inspected object.

Referring to Figure 3, the probe pallet 100 includes a pallet base 101, a body block 102 installed on the pallet base 101, a PCB assembly 110 installed on the pallet base 101, and a PCB assembly ( It may be configured to include a board assembly 103 electrically connected to 110). And the body block 102 may be configured to include a head block 104 and a probe block 160.

Among the components of the probe pallet 100, the probe block 160 can be used interchangeably depending on the type of performance test and the standard of the inspected object. That is, since the probe block 160 can be replaced depending on the purpose of performance testing of the object to be inspected, it can be configured to be electrically connected to and separated from the head block 104, and to be mechanically fastened and released at the same time.

The pallet base 101 has the function of seating an object to be inspected and fixing various components. The pallet base 101 includes a base body 111, a vision glass 112a installed through the base body 111, a glass bar 112b that secures the vision glass 112a to the base body 111, and a base body. It may be configured to include a handle 113 coupled to the side of (111).

The base body 111 may be made of metal. The top surface of the base body 111 may include regions divided into a region 111a, b region 111b, c region 111c, and d region 111d. An object to be inspected may be seated in area a (111a). Vision glass 112a and vision glass bar 112b may be installed in b area 111b. And the inspection terminal of the object to be inspected may be seated on the top of the vision glass 112a. Various components may be installed in the c area 111c and d area 111d. Various components will be described later.

The vision glass 112a may be made of a transparent material, for example, glass. The vision glass 112a may be installed on the base body 111 to cover the hole formed in the b area 111b of the base body 111. The test terminal of the object to be inspected may be seated on the top of the vision glass 112a. Therefore, when viewed from the bottom of the base body 111 toward the bottom of the base body 111, the test terminal of the test object is visually visible through the vision glass 112a.

The vision glass bar 112b may be made of metal or plastic. The vision glass bar 112b has the function of fixing the vision glass 112b to the base body 111 at both ends of the vision glass 112a.

The handle 113 may be made of metal or plastic. The handles 113 are installed in pairs on both sides of the base body 111, and may be installed in multiple pairs. The handle 113 can be used when the probe pallet 100 is safely transported by a machine or a person.

Referring to Figure 4, the body block 102 installed on the pallet base 101 is depicted. The body block 102 may be configured to include a head block 104 and a probe block 160.

The head block 104 is electrically connected to and separated from the probe block, and has the function of mechanically fastening and disengaging. The head block 104 may be configured to include a fixing block 130 and a fastening block 140.

FIG. 5 is an exemplary diagram in which the fixed block body is depicted transparently to depict the internal components of the probe pallet of FIG. 2.

Referring to FIG. 5, the fixing block 130 is slidingly coupled to the fastening block and has the function of raising and lowering the fastening block. The fixing block 130 may be configured to include a fixing block body 131, a linear module (LM) 132, a first elastic body 133a, a fixing pin 133b, and a fastening part B 134. there is. The pallet base 101 coupled with the fixed block may be configured to include a fastening portion A (114). The first elastic body 133a has the function of alleviating shock so that the linear module operates smoothly between the fixing block body 131 and the T block 141 of the fastening block 140.

The linear module 132 may be configured to include an LM rail (132a) and an LM body (132b). The LM rail (132a) can be combined with the fixed block body (131), and the LM body (132b) can be combined with the T block (141). The LM body (132b) can be moved up and down along the LM rail (132a) using an internal bearing.

The fastening part A (114) and the fastening part B (134) may be implemented as quarter clampers, that is, in a form that allows locking/unlocking through 1/4 rotation. The fastening part A (114) and the fastening part B (134) can be installed in two pairs on the pallet base 101 and the fixed block, respectively.

The fastening block 140 rises and falls along the fixed block, is electrically connected to and separated from the probe block at the bottom, and has the function of mechanically fastening and disengaging. The fastening block 140 may be configured to include a T block 141, a first contact part 143, a first guide part 146, and a first fastening part 147.

The first contact unit 143 has the function of receiving an inspection signal from the main PCB 115 and transmitting it to the second contact unit 163. The first contact portion 143 may be configured to include a main FPCB and a main FPCB connect.

The first fastening part 147 has the function of mechanically fastening or releasing the second fastening part 166 of the probe block. The first fastening portion 147 may be configured to include a first magnet 147a, a first fastening pin 147b, and a second fastening pin 147c.

Referring again to FIG. 5, the head block 104 includes a first guide portion 146, and the probe block 160 includes a second guide portion 165 coupled to the first guide portion 146. It can be configured. That is, the first guide part 146 and the second guide part 165 guide the movement of the probe block 160 when the probe block 160 is electrically connected to the head block 104 to form the second contact part 163. ) has the function of allowing the contact point to contact the contact point of the first contact portion 143.

The first guide portion 146 may be implemented in the form of a sliding slot 146a. And the second guide part 165 may be implemented in the form of a sliding pin 165a. After the sliding pin (165a) is inserted into the sliding slot (146a) and is seated at the end of the sliding slot (146a) after sliding movement, the second contact portion 163 and the first contact portion 143 whose relative positions are adjusted in advance Electrical contact is made between the two. Almost simultaneously with the electrical contact, the probe block 160 may be mechanically fastened to the fastening block 140.

The first fastening part 147 may be configured to include a first magnet 147a, and the second fastening part 166 may be configured to include a second magnet 166a. The first magnet 147a may be inserted into the fastening block 140, and the second magnet 166a may be inserted into the base block 161 of the probe block 160. Since the first magnet 147a and the second magnet 166a have different poles, magnetic force of attraction acts on them. That is, the magnetic force of attraction acts between the bottom surface of the first magnet (147a) and the top surface of the second magnet (166a). However, when looking at the first magnet (147a) and the second magnet (166a) in the Z-axis direction, the first magnet (147a) and the second magnet (166a) are not arranged to overlap 100%, but rather overlap each other in the Y-axis direction. When placed far apart, that is, when the overlap ratio is less than 100%, for example, 70 to 90%, the magnetic force of attraction acts the strongest, and the strength of the mechanical fastening can be higher.

Figure 6 is an example diagram depicting the side of the probe pallet of Figure 2.

Referring to Figure 6, a fixed block 130 is depicted, which is fixed on the pallet base 101. The fastening block 140 is configured to go up and down along the fixed block 130. The probe block 160 can be detached from the bottom of the fastening block 140. That is, the probe block 160 can be replaced with different types depending on the type of performance inspection, for example, manual visual inspection (MVI), automotive visual inspection (AVI), TSP, and the specifications of the inspection object. That is, if only the probe block 160 is replaced, the remaining components, the head block 104, that is, the fixing block 130 and the fastening block 140, are compatible regardless of the type of performance test and the specifications of the test object.

When the lever assembly 150 is pressed, the fastening block 140 rises, and when the lever assembly 150 is released, the fastening block 140 descends, and the probe block 160 makes contact with the object to be audited. The electrical signal is transmitted to the probe block 160 through the board assembly, PCB assembly 110, main FPCB 144, and sub FPCB 164a. When the object to be inspected is placed on the pallet base 101, the probe block that is electrically connected to the fastening block 140 and mechanically fastened descends to contact the test terminal of the object to be inspected.

FIG. 7 is an example diagram in which a portion of the probe pallet of FIG. 6 is depicted transparently.

FIG. 8 is an enlarged illustration of a portion of the probe pallet of FIG. 6.

Referring to FIGS. 7 and 8 together, according to the mechanical fastening and disengagement of the fastening block 140 and the probe block 160, the first contact portion 143 and the second contact portion 163 can be electrically connected and separated. there is.

The first contact portion 143 may be implemented in the form of a main FPCB 144 and a main FPCB connect 145 supporting the main FPCB 144, and the second contact portion 163 may be implemented in the form of an FPCB assembly 164. . The second contact portion 163 may be configured to include a sub-FPCB 164a, a P2K pallet 164B, and an aging pallet 164c.

One side of the sub-FPCB (164a) is in electrical contact with the main FPCB (144), and the other side is electrically connected to the sub-PCB (162), so that it receives an inspection signal from the main FPCB (144) and supports the sub-PCB (144). 162).

The main FPCB 144 and the sub FPCB 164a may be entirely wrapped with a film, but may be configured to include cables exposed in a portion.

As the sliding pin 165a of the probe block 160 is inserted into the sliding slot 146a of the fastening block 140, the sub cable of the sub FPCB 164a comes into contact with the main cable of the main FPCB 144. That is, the sub-FPCB (164a) whose contact surface is arranged parallel to the base block 161 has one end connected to the sub-PCB 162, and the other end is bent at an angle of 180 degrees and coupled to the base block 161 to be fixed. It can be. The middle part between one end and the other end becomes elastic by forming a curved surface. The upper top surface connected to the curved surface of the sub-FPCB 164a may contact the bottom surface of the main FPCB 144, which is obliquely fixed at an angle of θ by the FPCB connect 145, using elastic force. For electrical contact between the two FPCBs 144 and 164a, the cables of the FPCBs are exposed in advance. That is, the plurality of main cables of the main FPCB 144 and the plurality of sub-cables of the sub-FPCB 164a contact each other to form electrical contact (CP, contact point).

The P2K pallet (164B) is a plate with elastic force, and one end is mechanically coupled to the sub-PCB 162, and the other end is mechanically coupled to the probe slit. The P2K pallet 164B has the function of supporting the probe slit on the sub-PCB 162 using elastic force.

The aging pallet 164c has the function of electrically connecting the probe slit and the sub-PCB 162. The electrical connection order of the probe pallet 100 is the same as the board assembly, main PCB 115, main FPCB 144, sub FPCB 164a, sub PCB 162, aging pallet 164c, and probe slit.

The main FPCB 144 and the sub PCB 162 may each include a main cable and a sub cable wrapped in film. Because the film is peeled off in some areas, the exposed main cable and sub cable can contact each other to form a contact surface.

Referring again to FIG. 7, the probe block 160 may be configured to include a base block 161 and a probe slit 168. The probe slit 168 is a part that directly contacts the object to be inspected. Therefore, if the bottom of the probe slit 168 is lowered below the critical height, the probe slit 168 may be damaged. To prevent damage to the probe slit 168, the probe slit 168 should be at the same height as the bottom of the probe slit 168. , the stopper may be installed on the bottom of the base block at a position away from the position of the probe slit 168 in the +Y-axis direction.

Figure 9 is an example of a body block with a fixed block body missing from the probe pallet of Figure 2.

Referring to Figure 9, the FPCB connect has the function of fixing the other end of the main FPCB to the fastening block. That is, one end of the main FPCB is connected to the main PCB (115), and the other end is fixed by combining with the bottom of the elastic FPCB connector.

Referring again to FIG. 9, a fix bracket 153 capable of fixing the lever 151 or the lever plate bar 152 constituting the lever assembly 150 may be installed on the fixing block 130. The probe block 160 may be fixed in a state in which the lever 151 is pressed by the fix bracket 153, that is, in a state in which the probe block 160 moves upward.

FIG. 10 is an exemplary diagram of a first contact portion and a second contact portion formed on the bottom of the body block of the probe pallet of FIG. 2.

Referring to Figure 10, the connection state of the components constituting the second contact part is depicted.

One end of the probe slit 168 may be in contact with the object to be inspected, and the other end may be electrically connected to one end of the aging pallet 164c. The other end of the aging pallet 164c may be electrically connected to the sub-PCB 162, and the sub-PCB 162 may be electrically connected to one end of the sub-FPCB 164a.

The P2K pallet 164B has elastic force and mechanically couples the sub-PCB 162 and the probe slit 168 while mitigating the impact transmitted to the probe slit 168. That is, the P2K pallet 164B has the function of supporting the probe slit 168 on the sub-PCB 162 using elastic force.

A plurality of mark plates may be originally attached to the bottom of the pallet base 101, and the mark plate attached to the bottom of the pallet base 101 is used to determine the approximate position and alignment of the probe pallet 100. can be used

Referring again to FIG. 10, a mark plate 119 is additionally attached to the bottom of the probe slit 168, so the vision system detects the probe through the transparent vision glass 112a installed on the pallet base 101. There is an advantage in that the position of the slit 168 can be precisely determined.

FIG. 11 is an exemplary diagram of a hook assembly provided at both ends of the body block of the probe pallet of FIG. 2.

Referring to FIG. 11, another embodiment of the first fastener and the second fastener 166 that can be coupled to the first fastener is depicted. The fastening pin as one of the first fastening parts and the hook assembly as one of the second fastening parts 166 can mechanically fasten and separate the header block and the probe block. The fastening pin and hook assembly can be installed as a pair on both sides of the body block.

The hook assembly may be configured to include a lever, a first hook, a second hook, a rotation axis, and a second elastic body.

When a force is applied to the lever in a direction opposite to the elastic force of the second elastic body, the first hook and the second hook on the opposite side of the lever rotate and are released from the first fastening pin and the second fastening pin, respectively.

The first hook can be fastened to and released from the first fastening pin. The second hook can be fastened to and released from the second fastening pin. Due to the elastic force of the second elastic body, the force applied by the first hook to the first fastening pin and the force applied by the second hook to the second fastening pin are parallel to each other in opposite directions, so the fastening block and the probe block can be stably fixed. You can.

The rotation axis may be provided in the base block. When force is applied to the lever, the first hook and the second hook rotate around the rotation axis, and the fastening of the first hook and the first fastening pin and the fastening of the second hook and the second fastening pin may be released, respectively.

The second elastic body presses the bottom of the lever and prevents rotation of the lever, thereby further strengthening the fastening of the first hook and the first fastening pin and the fastening of the second hook and the second fastening pin.

FIG. 12 is an example diagram of a method of maintaining the horizontality of blocks in the probe pallet of FIG. 2.

Referring to Figure 12, the side of the probe pallet is depicted.

To prepare for the problem of the flatness between blocks being broken during probe block contact, a tension function can be added by installing a rubber on the top of the probe block. In other words, individual tension can be applied to the probe block, also known as the contact block. The rubber is a rubber formed long in the X-axis direction, and between the coupling block and the probe block, it maintains the horizontality of the probe block. This is because the probe block is supported by an elastic PK pallet, so if it deviates from horizontal beyond a threshold, a contact error may occur.

As such, according to one embodiment of the present invention, according to the present invention, one probe pallet can be used interchangeably simply by replacing the probe block depending on the type and standard of the performance test of the object to be inspected.

In addition, the probe block can be replaced depending on the type and standard of the performance test of the test subject.

Additionally, the level of the probe block can be maintained while using elastic force.

Additionally, while the first FPCB is fixed at an angle, the second FPCB can be seated in the horizontal direction to form a stable electrical contact.

Additionally, the replaced probe block can be stably fixed to the head block through double mechanical fastening.

In addition, it is easy to replace an FPC that has reached the end of its lifespan through one-touch fastening and releasing between the pallet base and body block.

Additionally, by sliding the second FPC in the horizontal direction toward the first FPC fixed at an angle, electrical contact can be made between the FPCs without error.

Above, various preferred embodiments of the present invention have been described by giving some examples, but the description of the various embodiments described in the "Detailed Contents for Carrying out the Invention" section is merely illustrative and the present invention Those skilled in the art will understand from the above description that the present invention can be implemented with various modifications or equivalent implementations of the present invention.

In addition, since the present invention can be implemented in various other forms, the present invention is not limited by the above description, and the above description is intended to make the disclosure of the present invention complete and is commonly used in the technical field to which the present invention pertains. It is provided only to fully inform those with knowledge of the scope of the present invention, and it should be noted that the present invention is only defined by each claim in the claims.

100: Probe pallet, 101: Pallet base, 102: Head block, 111: Base body, 130: Fixed block, 140: Fastening block, 160: Probe block

Claims (10)

A method executed by a probe pallet capable of replacing the probe block,
Mounting the probe block that matches the type and standard of the performance test of the object to be inspected on the head block;
Aligning the probe pallet manually or automatically;
Aligning the object to be inspected on an upper part of a pallet base provided on the probe pallet; and
It includes the step of bringing the probe block into contact with the object to be inspected by lifting and moving the fastening block fastened to the probe block,
The probe block is lifted and moved by a lever,
A plurality of levers corresponding to the plurality of probe blocks are connected to each other by a lever plate bar,
When the lever or the lever plate bar is pressed by the fix bracket, the probe block is configured to be fixed in the raised position,
method of inspection. body block;
A pallet base coupled to the body block and on which the object to be inspected is aligned; and
It includes a mark plate used to align the pallet base and the inspection object,
The body block is,
A head block that controls the vertical (z-axis) elevation of the probe block; and
It includes the probe block that inputs a test signal to the test object,
The head block includes a main FPCB that receives electrical signals,
The probe block includes a sub-FPCB capable of electrical contact with the main FPCB,
The probe block can be separated from the head block and replaced depending on the type and standard of the performance test of the object to be inspected,
The head block includes a lever assembly,
The lever assembly is,
a plurality of levers;
A lever plate bar connecting the plurality of levers to each other; and
Configured to include a fix bracket that presses the lever or the lever plate bar to fix the probe block in the raised position,
Probe palette. The method of claim 2, wherein the head block is:
A fixed block fixed to the pallet base; and
It includes a fastening block installed at the top of the object to be inspected to be lifted up and down under the guidance of the fixing block,
The fastening block includes a first fastening part,
The probe block is configured to include a second fastening part that can be mechanically fastened to and separated from the first fastening part,
Probe palette. In claim 3,
The lever assembly has an action point on the fastening block,
The fastening block is configured to control the raising and lowering of the probe block using external pressure acting on the lever assembly,
Probe palette. delete In claim 3,
It includes a first contact part and a second contact part,
The first contact part includes the main FPCB; and
Includes a main FPCB connector supporting the main FPCB,
The second contact portion is configured to include the sub-FPCB,
configured to include,
Probe palette. In claim 6,
It further includes a guide part that guides electrical contact between the first contact part and the second contact part,
The information department said,
A sliding slot provided in the fastening block as a first guide; and
The second guide is provided on the probe block and is configured to include a sliding pin coupled to the sliding slot.
Probe palette. In claim 7,
The first fastening portion includes a first magnet,
The second fastening portion is configured to include a second magnet coupled to the first magnet,
Probe palette. In claim 8,
The first fastening part further includes a fastening pin,
The second fastening portion is configured to further include a hook assembly that can be fastened to and released from the fastening pin,
Probe palette. The method of claim 7, wherein the probe block is:
A base block on which the second fastening part is installed;
A sub-PCB coupled to the base block and on which the second contact part is installed; and
Configured to include a probe slit that is electrically connected to the second contact portion and inputs a test signal to the test subject,
Probe palette.