KR102593418B1 - 메모리 제어기와 메모리 사이의 리프레시 타이머 동기화 - Google Patents
메모리 제어기와 메모리 사이의 리프레시 타이머 동기화 Download PDFInfo
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- KR102593418B1 KR102593418B1 KR1020187012415A KR20187012415A KR102593418B1 KR 102593418 B1 KR102593418 B1 KR 102593418B1 KR 1020187012415 A KR1020187012415 A KR 1020187012415A KR 20187012415 A KR20187012415 A KR 20187012415A KR 102593418 B1 KR102593418 B1 KR 102593418B1
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/406—Management or control of the refreshing or charge-regeneration cycles
- G11C11/40615—Internal triggering or timing of refresh, e.g. hidden refresh, self refresh, pseudo-SRAMs
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/14—Handling requests for interconnection or transfer
- G06F13/16—Handling requests for interconnection or transfer for access to memory bus
- G06F13/1605—Handling requests for interconnection or transfer for access to memory bus based on arbitration
- G06F13/161—Handling requests for interconnection or transfer for access to memory bus based on arbitration with latency improvement
- G06F13/1636—Handling requests for interconnection or transfer for access to memory bus based on arbitration with latency improvement using refresh
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/406—Management or control of the refreshing or charge-regeneration cycles
- G11C11/40611—External triggering or timing of internal or partially internal refresh operations, e.g. auto-refresh or CAS-before-RAS triggered refresh
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/406—Management or control of the refreshing or charge-regeneration cycles
- G11C11/40626—Temperature related aspects of refresh operations
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/4076—Timing circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/408—Address circuits
- G11C11/4087—Address decoders, e.g. bit - or word line decoders; Multiple line decoders
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2211/00—Indexing scheme relating to digital stores characterized by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C2211/401—Indexing scheme relating to cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C2211/406—Refreshing of dynamic cells
- G11C2211/4067—Refresh in standby or low power modes
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Dram (AREA)
Abstract
Description
[0011] 도 2는 본 개시내용의 양상에 따른 셀프-리프레시 동작 모드의 탈출 동안 메모리 제어기 및 DRAM을 예시한다.
[0012] 도 3a는 본 개시내용의 양상에 따른 DRAM에 대한 메모리-제어기-제어 리프레시 모드로부터 DRAM에 대한 셀프-리프레시 모드로의 전이에 대한 동작 방법에 대한 흐름도이다.
[0013] 도 3b는 본 개시내용의 양상에 따른 DRAM에 대한 셀프-리프레시 모드로부터 DRAM에 대한 메모리-제어기-제어 리프레시 모드로의 전이에 대한 동작 방법에 대한 흐름도이다.
[0014] 도 4는 본 발명의 양상에 따른 도 1 및 도 2의 메모리 제어기 및 DRAM을 포함하는 디바이스를 예시한다.
[0015] 본 개시내용의 실시예들 및 이들의 장점들은 뒤따르는 상세한 설명을 참조함으로써 가장 잘 이해된다. 유사한 참조 번호들이 도면들 중 하나 또는 그 초과에 예시된 유사한 엘리먼트들을 식별하는데 사용되는 것이 인지되어야 한다.
Claims (20)
- 메모리 제어기에 의해 수행되는 방법으로서,
상기 메모리 제어기를 슬립(sleep) 동작 모드로부터 활성 동작 모드로 전이(transitioning)시키는 단계;
상기 메모리 제어기에서, DRAM의 가장-최근 DRAM-트리거된 셀프(self)-리프레시(refresh) 이후 셀프-리프레시 간격의 남은 부분의 표시를 수신하는 단계 ― 상기 남은 부분은 상기 셀프-리프레시 간격보다 작음 ―;
상기 메모리 제어기에서, 상기 셀프-리프레시 간격의 남은 부분을 타이밍(timing)하는 단계;
상기 메모리 제어기로부터, 상기 셀프-리프레시 간격의 남은 부분의 타이밍에 대한 응답으로 상기 DRAM의 초기 리프레시 사이클을 트리거링하는 단계;
상기 메모리 제어기에 대한 유휴상태 기간을 타이밍하는 단계; 및
상기 유휴상태 기간의 타이밍이 임계치를 초과하는 것에 대한 응답으로, 상기 메모리 제어기를 상기 활성 동작 모드로부터 다시 상기 슬립 동작 모드로 전이시키는 단계
를 포함하는,
메모리 제어기에 의해 수행되는 방법. - 제1 항에 있어서,
상기 메모리 제어기에서 상기 셀프-리프레시 간격의 남은 부분을 수신하는 것은 상기 DRAM의 레지스터로부터 상기 표시를 판독하는 것을 포함하는,
메모리 제어기에 의해 수행되는 방법. - 제1 항에 있어서,
상기 초기 리프레시 사이클의 트리거링 이후, 리프레시 간격에 따라 주기적으로 상기 DRAM의 부가적인 메모리-제어기-트리거된 리프레시 사이클들을 트리거링하는 단계를 더 포함하는,
메모리 제어기에 의해 수행되는 방법. - 제3 항에 있어서,
상기 리프레시 간격은 상기 셀프-리프레시 간격과 동일한,
메모리 제어기에 의해 수행되는 방법. - 제1 항에 있어서,
상기 DRAM의 온도 표시에 대한 응답으로 상기 셀프-리프레시 간격의 남은 부분을 감소시키는 단계를 더 포함하는,
메모리 제어기에 의해 수행되는 방법. - 메모리 제어기로서,
DRAM(dynamic random access memory)에 의해 트리거된 가장-최근 셀프-리프레시 사이클이 발생한 때에 대한 상기 DRAM으로부터의 표시에 대한 응답으로 셀프-리프레시 간격의 부분을 타이밍하도록 구성된 리프레시 타이머 ― 상기 셀프-리프레시 간격의 부분은 상기 셀프-리프레시 간격보다 작음 ―; 및
상기 리프레시 타이머에 의한 상기 셀프-리프레시 간격의 부분의 타이밍에 대한 응답으로 상기 DRAM의 초기 메모리-제어기-트리거된 리프레시 사이클을 트리거하도록 구성된 커맨드 스케줄러(command scheduler)
를 포함하고,
상기 리프레시 타이머는, 상기 메모리 제어기가 슬립 모드에 진입하여야 한다는 결정에 대한 응답으로 현재 리프레시 간격의 남은 부분을 상기 DRAM의 모드 레지스터에 기록하도록 추가로 구성되는,
메모리 제어기. - 제6 항에 있어서,
상기 리프레시 타이머는 상기 DRAM의 레지스터로부터의 표시를 판독하도록 구성되는,
메모리 제어기. - 제6 항에 있어서,
상기 리프레시 타이머는 상기 초기 메모리-제어기-트리거된 리프레시 사이클의 트리거링 이후 리프레시 간격에 따라 주기적으로 부가적인 메모리-제어기-트리거된 리프레시 사이클들을 트리거하도록 추가로 구성되는,
메모리 제어기. - 제6 항에 있어서,
상기 리프레시 타이머는 상기 DRAM의 온도 표시에 대한 응답으로 상기 셀프-리프레시 간격의 부분을 감소시키도록 추가로 구성되는,
메모리 제어기. - 삭제
- 삭제
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- 삭제
- 삭제
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Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201562236008P | 2015-10-01 | 2015-10-01 | |
US62/236,008 | 2015-10-01 | ||
US15/246,371 | 2016-08-24 | ||
US15/246,371 US9875785B2 (en) | 2015-10-01 | 2016-08-24 | Refresh timer synchronization between memory controller and memory |
PCT/US2016/048771 WO2017058417A1 (en) | 2015-10-01 | 2016-08-25 | Refresh timer synchronization between memory controller and memory |
Publications (2)
Publication Number | Publication Date |
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KR20180063230A KR20180063230A (ko) | 2018-06-11 |
KR102593418B1 true KR102593418B1 (ko) | 2023-10-23 |
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KR1020187012415A Active KR102593418B1 (ko) | 2015-10-01 | 2016-08-25 | 메모리 제어기와 메모리 사이의 리프레시 타이머 동기화 |
Country Status (7)
Country | Link |
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US (1) | US9875785B2 (ko) |
EP (1) | EP3357065B1 (ko) |
JP (1) | JP2018530098A (ko) |
KR (1) | KR102593418B1 (ko) |
CN (1) | CN108140406B (ko) |
BR (1) | BR112018006477B1 (ko) |
WO (1) | WO2017058417A1 (ko) |
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2016
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US20060159156A1 (en) * | 2005-01-20 | 2006-07-20 | Seung-Hoon Lee | Method for outputting internal temperature data in semiconductor memory device and circuit of outputting internal temperature data thereby |
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KR20180063230A (ko) | 2018-06-11 |
US9875785B2 (en) | 2018-01-23 |
EP3357065B1 (en) | 2019-06-26 |
WO2017058417A1 (en) | 2017-04-06 |
CN108140406A (zh) | 2018-06-08 |
US20170098470A1 (en) | 2017-04-06 |
JP2018530098A (ja) | 2018-10-11 |
CN108140406B (zh) | 2022-03-22 |
BR112018006477B1 (pt) | 2023-03-14 |
EP3357065A1 (en) | 2018-08-08 |
BR112018006477A2 (pt) | 2018-10-09 |
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