KR102412965B1 - 2차원 물질층을 포함하는 전자소자 및 잉크젯 프린팅을 이용한 전자소자의 제조방법 - Google Patents
2차원 물질층을 포함하는 전자소자 및 잉크젯 프린팅을 이용한 전자소자의 제조방법 Download PDFInfo
- Publication number
- KR102412965B1 KR102412965B1 KR1020140194323A KR20140194323A KR102412965B1 KR 102412965 B1 KR102412965 B1 KR 102412965B1 KR 1020140194323 A KR1020140194323 A KR 1020140194323A KR 20140194323 A KR20140194323 A KR 20140194323A KR 102412965 B1 KR102412965 B1 KR 102412965B1
- Authority
- KR
- South Korea
- Prior art keywords
- electronic device
- dimensional
- material layer
- conductive
- nanomaterials
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000000463 material Substances 0.000 title claims abstract description 210
- 238000007641 inkjet printing Methods 0.000 title claims abstract description 64
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 21
- 239000002086 nanomaterial Substances 0.000 claims abstract description 114
- 239000010410 layer Substances 0.000 claims description 244
- 238000000034 method Methods 0.000 claims description 83
- 239000000758 substrate Substances 0.000 claims description 57
- 239000004020 conductor Substances 0.000 claims description 45
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 35
- 239000002245 particle Substances 0.000 claims description 32
- 239000004065 semiconductor Substances 0.000 claims description 30
- 229910021389 graphene Inorganic materials 0.000 claims description 25
- 239000002904 solvent Substances 0.000 claims description 21
- 239000012535 impurity Substances 0.000 claims description 19
- 239000002071 nanotube Substances 0.000 claims description 16
- 239000002070 nanowire Substances 0.000 claims description 16
- 239000002041 carbon nanotube Substances 0.000 claims description 14
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 claims description 12
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 12
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 claims description 12
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 claims description 12
- ATHHXGZTWNVVOU-UHFFFAOYSA-N N-methylformamide Chemical compound CNC=O ATHHXGZTWNVVOU-UHFFFAOYSA-N 0.000 claims description 12
- JFDZBHWFFUWGJE-UHFFFAOYSA-N benzonitrile Chemical compound N#CC1=CC=CC=C1 JFDZBHWFFUWGJE-UHFFFAOYSA-N 0.000 claims description 12
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 10
- 229910021393 carbon nanotube Inorganic materials 0.000 claims description 10
- 238000001035 drying Methods 0.000 claims description 9
- 229910052737 gold Inorganic materials 0.000 claims description 9
- 229910052697 platinum Inorganic materials 0.000 claims description 9
- 229910052709 silver Inorganic materials 0.000 claims description 9
- HEDRZPFGACZZDS-UHFFFAOYSA-N Chloroform Chemical compound ClC(Cl)Cl HEDRZPFGACZZDS-UHFFFAOYSA-N 0.000 claims description 8
- ZHNUHDYFZUAESO-UHFFFAOYSA-N Formamide Chemical compound NC=O ZHNUHDYFZUAESO-UHFFFAOYSA-N 0.000 claims description 8
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 claims description 8
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 claims description 8
- SESFRYSPDFLNCH-UHFFFAOYSA-N benzyl benzoate Chemical compound C=1C=CC=CC=1C(=O)OCC1=CC=CC=C1 SESFRYSPDFLNCH-UHFFFAOYSA-N 0.000 claims description 8
- MVPPADPHJFYWMZ-UHFFFAOYSA-N chlorobenzene Chemical compound ClC1=CC=CC=C1 MVPPADPHJFYWMZ-UHFFFAOYSA-N 0.000 claims description 8
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 claims description 8
- XMWRBQBLMFGWIX-UHFFFAOYSA-N C60 fullerene Chemical compound C12=C3C(C4=C56)=C7C8=C5C5=C9C%10=C6C6=C4C1=C1C4=C6C6=C%10C%10=C9C9=C%11C5=C8C5=C8C7=C3C3=C7C2=C1C1=C2C4=C6C4=C%10C6=C9C9=C%11C5=C5C8=C3C3=C7C1=C1C2=C4C6=C2C9=C5C3=C12 XMWRBQBLMFGWIX-UHFFFAOYSA-N 0.000 claims description 7
- 229910003472 fullerene Inorganic materials 0.000 claims description 7
- 229910021428 silicene Inorganic materials 0.000 claims description 7
- 229910052802 copper Inorganic materials 0.000 claims description 6
- XDTMQSROBMDMFD-UHFFFAOYSA-N Cyclohexane Chemical compound C1CCCCC1 XDTMQSROBMDMFD-UHFFFAOYSA-N 0.000 claims description 4
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 claims description 4
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 claims description 4
- WHNWPMSKXPGLAX-UHFFFAOYSA-N N-Vinyl-2-pyrrolidone Chemical compound C=CN1CCCC1=O WHNWPMSKXPGLAX-UHFFFAOYSA-N 0.000 claims description 4
- 229960002903 benzyl benzoate Drugs 0.000 claims description 4
- CEZGKHORXZGYPZ-UHFFFAOYSA-N bromobenzene phenylmethoxymethylbenzene Chemical compound BrC1=CC=CC=C1.C(C1=CC=CC=C1)OCC1=CC=CC=C1 CEZGKHORXZGYPZ-UHFFFAOYSA-N 0.000 claims description 4
- 229960001760 dimethyl sulfoxide Drugs 0.000 claims description 4
- 239000002019 doping agent Substances 0.000 claims description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 4
- 238000007599 discharging Methods 0.000 claims description 2
- 239000002356 single layer Substances 0.000 claims description 2
- 239000007789 gas Substances 0.000 description 10
- 238000000151 deposition Methods 0.000 description 9
- 229910052581 Si3N4 Inorganic materials 0.000 description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 6
- 239000011810 insulating material Substances 0.000 description 6
- 229910052710 silicon Inorganic materials 0.000 description 6
- 239000010703 silicon Substances 0.000 description 6
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 6
- 229910052814 silicon oxide Inorganic materials 0.000 description 6
- 229910005543 GaSe Inorganic materials 0.000 description 5
- 229910005839 GeS 2 Inorganic materials 0.000 description 5
- 229910005866 GeSe Inorganic materials 0.000 description 5
- 229910016001 MoSe Inorganic materials 0.000 description 5
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 229910052723 transition metal Inorganic materials 0.000 description 5
- 150000003624 transition metals Chemical class 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000009413 insulation Methods 0.000 description 4
- 238000007639 printing Methods 0.000 description 4
- 239000013078 crystal Substances 0.000 description 3
- 229910000449 hafnium oxide Inorganic materials 0.000 description 3
- WIHZLLGSGQNAGK-UHFFFAOYSA-N hafnium(4+);oxygen(2-) Chemical compound [O-2].[O-2].[Hf+4] WIHZLLGSGQNAGK-UHFFFAOYSA-N 0.000 description 3
- 239000002105 nanoparticle Substances 0.000 description 3
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 3
- 229920003023 plastic Polymers 0.000 description 3
- 229920000642 polymer Polymers 0.000 description 3
- NJPQAIBZIHNJDO-UHFFFAOYSA-N 1-dodecylpyrrolidin-2-one Chemical compound CCCCCCCCCCCCN1CCCC1=O NJPQAIBZIHNJDO-UHFFFAOYSA-N 0.000 description 2
- 239000003989 dielectric material Substances 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 125000004432 carbon atom Chemical group C* 0.000 description 1
- 230000002542 deteriorative effect Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02568—Chalcogenide semiconducting materials not being oxides, e.g. ternary compounds
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/40—FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels
- H10D30/47—FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels having 2D charge carrier gas channels, e.g. nanoribbon FETs or high electron mobility transistors [HEMT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02282—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating
- H01L21/02288—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating printing, e.g. ink-jet printing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02587—Structure
- H01L21/0259—Microstructure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/02623—Liquid deposition
- H01L21/02628—Liquid deposition using solutions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/015—Manufacture or treatment of FETs having heterojunction interface channels or heterojunction gate electrodes, e.g. HEMT
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
- H10D30/031—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/674—Thin-film transistors [TFT] characterised by the active materials
- H10D30/6741—Group IV materials, e.g. germanium or silicon carbide
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/674—Thin-film transistors [TFT] characterised by the active materials
- H10D30/6741—Group IV materials, e.g. germanium or silicon carbide
- H10D30/6743—Silicon
- H10D30/6744—Monocrystalline silicon
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/674—Thin-film transistors [TFT] characterised by the active materials
- H10D30/675—Group III-V materials, Group II-VI materials, Group IV-VI materials, selenium or tellurium
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6757—Thin-film transistors [TFT] characterised by the structure of the channel, e.g. transverse or longitudinal shape or doping profile
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/117—Shapes of semiconductor bodies
- H10D62/118—Nanostructure semiconductor bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/117—Shapes of semiconductor bodies
- H10D62/118—Nanostructure semiconductor bodies
- H10D62/119—Nanowire, nanosheet or nanotube semiconductor bodies
- H10D62/121—Nanowire, nanosheet or nanotube semiconductor bodies oriented parallel to substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/17—Semiconductor regions connected to electrodes not carrying current to be rectified, amplified or switched, e.g. channel regions
- H10D62/213—Channel regions of field-effect devices
- H10D62/221—Channel regions of field-effect devices of FETs
- H10D62/235—Channel regions of field-effect devices of FETs of IGFETs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/881—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being a two-dimensional material
- H10D62/882—Graphene
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/60—Electrodes characterised by their materials
- H10D64/64—Electrodes comprising a Schottky barrier to a semiconductor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/60—Electrodes characterised by their materials
- H10D64/64—Electrodes comprising a Schottky barrier to a semiconductor
- H10D64/647—Schottky drain or source electrodes for IGFETs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D99/00—Subject matter not provided for in other groups of this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/20—Electrodes characterised by their shapes, relative sizes or dispositions
- H10D64/205—Nanosized electrodes, e.g. nanowire electrodes
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Thin Film Transistor (AREA)
- Electrodes Of Semiconductors (AREA)
- Electroluminescent Light Sources (AREA)
- Materials Engineering (AREA)
- Nanotechnology (AREA)
Abstract
Description
도 2는 도 1의 Ⅰ-Ⅰ'선을 따라 본 단면도이다.
도 3은 도 2에 도시된 2차원 물질층을 확대하여 도시한 것이다.
도 4는 도 2에 도시된 2차원 물질층의 변형예를 도시한 것이다.
도 5a 내지 도 5d는 다른 예시적인 실시예에 따른 2차원 물질층의 형성방법을 도시한 것이다.
도 6a 내지 도 6d는 다른 예시적인 실시예에 따른 전자소자의 제조방법을 도시한 것이다.
도 7은 다른 예시적인 실시예에 따른 전자소자를 도시한 평면도이다.
도 8은 도 7의 Ⅱ-Ⅱ'선을 따라 본 단면도이다.
도 9는 다른 예시적인 실시예에 따른 전자소자를 도시한 것이다.
도 10은 다른 예시적인 실시예에 따른 전자소자를 도시한 것이다.
도 11은 다른 예시적인 실시예에 따른 전자소자를 도시한 것이다.
110,250,310,410.. 기판
120,320,420.. 게이트 전극
130,330,430.. 게이트 절연층
140,140',240,340,440,540,640,740.. 2차원 물질층
141,241,341,441.. 2차원 나노물질
142.. 도전성 물질
151,351,451,551,651,751.. 제1 전극
152,352,452,552,652,752.. 제2 전극
200.. 잉크젯 프린팅 장치
210.. 잉크젯 헤드
220.. 잉크챔버
230.. 2차원 물질층의 형성을 위한 잉크
230'.. 잉크패턴
242.. 용매
641.. 제1 도전형 물질층
642.. 제2 도전형 물질층
Claims (33)
- 서로 이격되게 마련되는 제1 및 제2 전극;
상기 제1 및 제2 전극을 연결하도록 마련되는 것으로, 그 각각이 적어도 일부가 서로 중첩된 복수의 2차원 나노물질(2D nano material)을 포함하는 2차원 물질층(2D material layer);을 포함하고,
상기 2차원 나노물질은 반도체 특성을 가지며,
상기 2차원 나노물질은 Phosphorene, Germanane 및 Silicene으로 이루어진 그룹에서 선택된 적어도 하나를 포함하는 전자소자. - 삭제
- 제 1 항에 있어서,
상기 2차원 물질층은 도전성 물질을 더 포함하는 전자소자. - 제 3 항에 있어서,
상기 도전성 물질은 그래핀(graphene), 도전성 입자, 도전성 나노튜브 및 도전성 나노와이어 중 적어도 하나를 포함하는 전자소자. - 제 4 항에 있어서,
상기 도전성 입자는 Ag, Au, Pt, Cu 및 플러렌(fullerene)으로 이루어진 그룹에서 선택된 적어도 하나를 포함하는 전자소자. - 제 4 항에 있어서,
상기 도전성 나노튜브는 CNTs(carbon nanotubes)를 포함하는 전자소자. - 제 4 항에 있어서,
상기 도전성 나노와이어는 Ag 나노와이어를 포함하는 전자소자. - 제 3 항에 있어서,
상기 2차원 물질층에서 상기 2차원 나노물질들의 함량은 50 vol% 이상인 전자소자. - 제 1 항에 있어서,
상기 2차원 물질층은 도핑물질(dopant)을 더 포함하는 전자소자. - 제 1 항에 있어서,
상기 2차원 나노물질은 불순물로 도핑되어 있는 전자소자. - 제 1 항에 있어서,
상기 2차원 물질층은 채널층을 포함하는 전자소자. - 제 11 항에 있어서,
상기 2차원 물질층에 마련되는 게이트 절연층 및 상기 게이트 절연층에 마련되는 게이트 전극을 더 포함하는 전자소자. - 제 1 항에 있어서,
상기 제1 및 제2 전극과 상기 2차원 물질층 사이에 쇼트키 접합(Schottky junction)이 형성되는 전자소자. - 제 1 항에 있어서,
상기 2차원 나노물질들 사이에 p-n 접합(p-n junction)이 형성되는 전자소자. - 제 1 항에 있어서,
상기 2차원 나노물질들 각각은 단층 또는 복층 구조를 가지는 전자소자. - 제 15 항에 있어서,
상기 2차원 나노물질을 구성하는 층들 각각은 수nm 이하의 두께 및 수십nm ~ 수백nm의 사이즈를 가지는 전자소자. - 제 1 항에 있어서,
상기 2차원 물질층은 수nm ~ 수백nm의 두께 및 수백nm ~ 수백㎛의 사이즈를 가지는 전자소자. - 삭제
- 삭제
- 제 1 항에 있어서,
상기 제1 및 제2 전극과 상기 2차원 물질층은 기판에 마련되어 있으며, 상기 기판은 유연한(flexible) 재질을 포함하는 전자소자. - 반도체 특성을 가지며 그 각각이 적어도 일부가 서로 중첩된 복수의 2차원 나노물질을 포함하는 2차원 물질층을 잉크젯 프린팅을 이용하여 기판에 형성하는 단계; 및
상기 2차원 물질층에 연결되는 제1 및 제2 전극을 형성하는 단계;를 포함하고,
상기 2차원 나노물질은 반도체 특성을 가지며,
상기 2차원 나노물질은 Phosphorene, Germanane 및 Silicene으로 이루어진 그룹에서 선택된 적어도 하나를 포함하는 전자소자의 제조방법. - 제 21 항에 있어서,
상기 2차원 물질층을 형성하는 단계는,
상기 기판에 용매 및 상기 2차원 나노물질들을 포함하는 잉크를 토출시켜 잉크 패턴을 형성하는 단계; 및
상기 잉크 패턴을 건조시켜 상기 2차원 물질층을 형성하는 단계;를 포함하는 전자소자의 제조방법. - 제 22 항에 있어서,
상기 용매는 Water, Acetone, Methanol, Ethanol, Isopropanol, Cyclohexanone, Cyclohexane, Chlorobenzene, Chloroform, Formamide, N-methyl formamide, N-methyl pyrrolidinone, N-vinyl pyrrolidinone, Dimethylsulphoxide, Benzonitrile, Cyclohecyl-pyrrolidinone, N-dodecyl pyrrolidone, Benzyl Benzoate, Benzyl ether Bromobenzene, Dimethylacetamide 및 Dimethylformamide 으로 이루어진 그룹에서 선택된 적어도 하나를 포함하는 전자소자의 제조방법. - 제 22 항에 있어서,
상기 용매에 대한 상기 2차원 나노물질들의 혼합비율은 1㎍/mL ~ 100mg/mL 인 전자소자의 제조방법. - 제 22 항에 있어서,
상기 잉크는 도전성 물질을 더 포함하는 전자소자의 제조방법. - 제 25 항에 있어서,
상기 도전성 물질은 그래핀, 도전성 입자, 도전성 나노튜브 및 도전성 나노와이어 중 적어도 하나를 포함하는 전자소자의 제조방법. - 제 22 항에 있어서,
상기 잉크는 도핑물질을 더 포함하는 전자소자의 제조방법. - 제 22 항에 있어서,
상기 2차원 나노물질은 불순물로 도핑되어 있는 전자소자의 제조방법. - 제 21 항에 있어서,
상기 제1 및 제2 전극은 잉크젯 프린팅에 의해 형성되는 전자소자의 제조방법. - 제 29 항에 있어서,
상기 제1 및 제2 전극은 그래핀, Ag 입자, Au 입자, Pt 입자, Cu 입자, CNTs(carbon nanotubes) 및 Ag 나노와이어로 이루어진 그룹에서 선택된 적어도 하나를 포함하는 전자소자의 제조방법. - 제 21 항에 있어서,
상기 2차원 물질층에 게이트 절연층을 형성하는 단계; 및
상기 게이트 절연층에 게이트 전극을 형성하는 단계;를 더 포함하는 전자소자의 제조방법. - 제 31 항에 있어서,
상기 게이트 절연층은 잉크젯 프린팅에 의해 형성되는 전자소자의 제조방법. - 제 31 항에 있어서,
상기 게이트 전극은 잉크젯 프린팅에 의해 형성되는 전자소자의 제조방법.
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020140194323A KR102412965B1 (ko) | 2014-12-30 | 2014-12-30 | 2차원 물질층을 포함하는 전자소자 및 잉크젯 프린팅을 이용한 전자소자의 제조방법 |
US14/728,583 US9922825B2 (en) | 2014-12-30 | 2015-06-02 | Electronics device having two-dimensional (2D) material layer and method of manufacturing the electronic device by inkjet printing |
JP2015215581A JP6727790B2 (ja) | 2014-12-30 | 2015-11-02 | 二次元物質層を含む電子素子、及びインクジェットプリンティングを利用した電子素子の製造方法 |
CN201510765524.4A CN105742358B (zh) | 2014-12-30 | 2015-11-11 | 电子器件及其制造方法 |
US15/817,979 US10460935B2 (en) | 2014-12-30 | 2017-11-20 | Electronic device having two-dimensional (2D) material layer and method of manufacturing the electronic device by inkjet printing |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020140194323A KR102412965B1 (ko) | 2014-12-30 | 2014-12-30 | 2차원 물질층을 포함하는 전자소자 및 잉크젯 프린팅을 이용한 전자소자의 제조방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20160081102A KR20160081102A (ko) | 2016-07-08 |
KR102412965B1 true KR102412965B1 (ko) | 2022-06-24 |
Family
ID=56165172
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020140194323A Active KR102412965B1 (ko) | 2014-12-30 | 2014-12-30 | 2차원 물질층을 포함하는 전자소자 및 잉크젯 프린팅을 이용한 전자소자의 제조방법 |
Country Status (4)
Country | Link |
---|---|
US (2) | US9922825B2 (ko) |
JP (1) | JP6727790B2 (ko) |
KR (1) | KR102412965B1 (ko) |
CN (1) | CN105742358B (ko) |
Families Citing this family (43)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102412965B1 (ko) * | 2014-12-30 | 2022-06-24 | 삼성전자주식회사 | 2차원 물질층을 포함하는 전자소자 및 잉크젯 프린팅을 이용한 전자소자의 제조방법 |
CN104576758A (zh) * | 2015-01-22 | 2015-04-29 | 合肥京东方光电科技有限公司 | 薄膜晶体管、阵列基板及其制作方法 |
US10269791B2 (en) * | 2015-03-16 | 2019-04-23 | Taiwan Semiconductor Manufacturing Company, Ltd. | Field-effect transistors having transition metal dichalcogenide channels and methods of manufacture |
US10217819B2 (en) * | 2015-05-20 | 2019-02-26 | Samsung Electronics Co., Ltd. | Semiconductor device including metal-2 dimensional material-semiconductor contact |
US20170117417A1 (en) * | 2015-07-13 | 2017-04-27 | Board Of Regents, The University Of Texas System | Integration of air-sensitive two-dimensional materials on arbitrary substrates for the manufacturing of electronic devices |
US20170045473A1 (en) * | 2015-08-11 | 2017-02-16 | Electronics And Telecommunications Research Institute | Gas sensor and method of manufacturing the same |
KR102465353B1 (ko) | 2015-12-02 | 2022-11-10 | 삼성전자주식회사 | 전계 효과 트랜지스터 및 이를 포함하는 반도체 소자 |
US10648959B2 (en) * | 2016-05-05 | 2020-05-12 | University Of Southern California | Black phosphorus gas sensor |
KR101792953B1 (ko) | 2016-07-01 | 2017-11-20 | 건국대학교 산학협력단 | 2차원 반도체, 이의 제조 방법, 및 이를 포함하는 반도체 소자 |
US9991122B2 (en) * | 2016-08-31 | 2018-06-05 | Micron Technology, Inc. | Methods of forming semiconductor device structures including two-dimensional material structures |
CN106293253B (zh) * | 2016-09-23 | 2019-05-28 | 京东方科技集团股份有限公司 | 触控传感器及其制作方法和触控传感器单元 |
US9704965B1 (en) * | 2016-09-27 | 2017-07-11 | International Business Machines Corporation | Semiconductor device with self-aligned carbon nanotube gate |
CN106449918B (zh) * | 2016-11-10 | 2019-02-01 | 同济大学 | 半导体异质结构光电子器件的逻辑应用方法 |
CN108336142B (zh) * | 2017-01-20 | 2020-09-25 | 清华大学 | 薄膜晶体管 |
CN108336151B (zh) * | 2017-01-20 | 2020-12-04 | 清华大学 | 肖特基二极管、肖特基二极管阵列及肖特基二极管的制备方法 |
CN108336128B (zh) | 2017-01-20 | 2020-12-04 | 清华大学 | 薄膜晶体管 |
CN108336091B (zh) * | 2017-01-20 | 2021-01-05 | 清华大学 | 薄膜晶体管 |
CN106784009B (zh) * | 2017-01-22 | 2019-06-25 | 温州大学 | 基于pet柔性衬底的背栅黑磷场效应晶体管及制备方法 |
CN108423637B (zh) | 2017-02-15 | 2022-11-22 | 松下知识产权经营株式会社 | 光电转换材料以及使用该光电转换材料的太阳能电池 |
US10269564B2 (en) * | 2017-03-17 | 2019-04-23 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method of forming a semiconductor device using layered etching and repairing of damaged portions |
CN107424911B (zh) * | 2017-04-25 | 2020-07-31 | 郑州轻工业学院 | 具有垂直结构的SnSe2/MoSe2新型异质结的制备方法及其场效应性能改性方法 |
US10263107B2 (en) * | 2017-05-01 | 2019-04-16 | The Regents Of The University Of California | Strain gated transistors and method |
WO2018217682A1 (en) | 2017-05-23 | 2018-11-29 | Alpha Assembly Solutions Inc. | Graphene enhanced and engineered materials for membrane touch switch and other flexible electronic structures |
US10263080B2 (en) | 2017-05-24 | 2019-04-16 | Qualcomm Incorporated | Transistor with fluorinated graphene spacer |
US10354955B2 (en) * | 2017-06-19 | 2019-07-16 | Qualcomm Incorporated | Graphene as interlayer dielectric |
US10418490B2 (en) * | 2017-07-04 | 2019-09-17 | Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd | Field effect transistor and manufacturing method thereof |
WO2019078861A1 (en) * | 2017-10-19 | 2019-04-25 | Hewlett-Packard Development Company, L.P. | PRINTABLE AMMONIUM CHALCOGENOMETALLATE FLUIDS |
US10658470B2 (en) * | 2017-11-14 | 2020-05-19 | Taiwan Semiconductor Manufacturing Co., Ltd. | Device with doped phosphorene and method for doping phosphorene |
KR101960809B1 (ko) * | 2018-01-12 | 2019-03-21 | 한국표준과학연구원 | 단전자 펌프를 포함하는 반도체 소자 |
CN110970308B (zh) * | 2018-09-30 | 2023-07-21 | 中国科学院苏州纳米技术与纳米仿生研究所 | 薄膜晶体管及其异质结有源层的制作方法 |
KR102739120B1 (ko) * | 2018-10-25 | 2024-12-05 | 삼성전자주식회사 | 실리신 전자 소자 |
KR102118608B1 (ko) * | 2018-10-26 | 2020-06-04 | 한국과학기술연구원 | 이차원 나노물질과 더블레이어절연층 수직구조 기반 스위칭 소자 |
US10811601B2 (en) * | 2019-01-22 | 2020-10-20 | Northrop Grumman Systems Corporation | Semiconductor devices using insulator-metal phase change materials and method for fabrication |
US11158807B2 (en) * | 2019-10-18 | 2021-10-26 | Taiwan Semiconductor Manufacturing Company, Ltd. | Field effect transistor and method of manufacturing the same |
KR20210094332A (ko) | 2020-01-21 | 2021-07-29 | 삼성전자주식회사 | 2d 채널을 포함하는 트랜지스터 |
KR102805278B1 (ko) | 2020-03-31 | 2025-05-12 | 삼성전자주식회사 | 2차원 물질기반 배선 도전층 콘택구조, 이를 포함하는 전자소자 및 그 제조방법 |
US12031987B2 (en) * | 2020-04-17 | 2024-07-09 | Akhan Semiconductor, Inc. | System and method for transistor pathogen detector |
KR102418527B1 (ko) * | 2020-08-11 | 2022-07-06 | 연세대학교 산학협력단 | 스트레인이 가해진 2차원 물질 제조 방법 |
KR102581497B1 (ko) * | 2021-04-12 | 2023-09-21 | 포항공과대학교 산학협력단 | 반도체성 2차원 물질 기반 트랜지스터 제조방법 |
CN115966582A (zh) * | 2021-05-31 | 2023-04-14 | 南京大学 | 单片异质集成的microLED显示芯片及其制备方法 |
KR102753693B1 (ko) * | 2022-06-17 | 2025-01-10 | 성균관대학교산학협력단 | 2차원 물질 분산액을 이용하여 잉크젯 프린팅된 반도체 소자 및 이의 제조방법 |
KR102760052B1 (ko) * | 2022-07-12 | 2025-01-24 | 삼성전자주식회사 | 2차원 물질을 포함하는 반도체 소자 및 그 제조방법 |
EP4585934A1 (en) * | 2022-09-05 | 2025-07-16 | Otowa Electric Co. Ltd. | Sensor device capable of measuring electric field intensity and method for measuring electric field intensity |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013502735A (ja) * | 2009-08-24 | 2013-01-24 | インターナショナル・ビジネス・マシーンズ・コーポレーション | 単一またはいくつかの層のグラフェン・ベースの光検出デバイスおよびその形成方法 |
JP2013512311A (ja) * | 2009-11-25 | 2013-04-11 | イー・アイ・デュポン・ドウ・ヌムール・アンド・カンパニー | 結晶性銅カルコゲニドナノ粒子の水性製造方法、そのように製造されたナノ粒子、ならびにこれらのナノ粒子を組み込んだインクおよびコーテッド基板 |
US20140042390A1 (en) * | 2011-02-16 | 2014-02-13 | The Regents Of University Of California | Interpenetrating networks of carbon nanostructures and nano-scale electroactive materials |
WO2014100723A1 (en) * | 2012-12-21 | 2014-06-26 | The Regents Of The University Of California | Vertically stacked heterostructures including graphene |
JP2014120712A (ja) * | 2012-12-19 | 2014-06-30 | Ricoh Co Ltd | 金属酸化物膜形成用塗布液、金属酸化物膜、電界効果型トランジスタ、及び電界効果型トランジスタの製造方法 |
Family Cites Families (47)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4443944B2 (ja) * | 2004-01-20 | 2010-03-31 | 独立行政法人科学技術振興機構 | トランジスタとその製造方法 |
US20070153362A1 (en) * | 2004-12-27 | 2007-07-05 | Regents Of The University Of California | Fabric having nanostructured thin-film networks |
US8574681B2 (en) * | 2007-05-14 | 2013-11-05 | Northwestern University | Ceramic composite thin films |
US20110104700A1 (en) * | 2008-05-30 | 2011-05-05 | Halloran Philip F | Molecular signature for fibrosis and atrophy |
JP5453045B2 (ja) * | 2008-11-26 | 2014-03-26 | 株式会社日立製作所 | グラフェン層が成長された基板およびそれを用いた電子・光集積回路装置 |
KR20130098884A (ko) * | 2010-05-05 | 2013-09-05 | 내셔널 유니버시티 오브 싱가포르 | 그래핀의 정공 도핑 |
IT1401734B1 (it) * | 2010-06-29 | 2013-08-02 | St Microelectronics Srl | Dispositivo elettronico comprendente uno strato di interfaccia di connessione basato su nanotubi, e procedimento di fabbricazione |
GB2483288A (en) * | 2010-09-03 | 2012-03-07 | Trinity College Dublin | Exfoliation process for forming semiconducting nanoflakes |
US9054616B2 (en) | 2010-09-03 | 2015-06-09 | Thrane & Thrane A/S | Assembly comprising a movable and brakable/dampable part and a method for braking a movable part |
WO2012093360A1 (en) * | 2011-01-04 | 2012-07-12 | Ecole Polytechnique Federale De Lausanne (Epfl) | Semiconductor device |
CN103493203B (zh) * | 2011-03-22 | 2016-12-28 | 曼彻斯特大学 | 晶体管器件以及用于制造晶体管器件的材料 |
US10723112B2 (en) * | 2011-05-23 | 2020-07-28 | National University Of Singapore | Method of transferring thin film |
KR101285475B1 (ko) | 2011-06-01 | 2013-07-12 | 제주대학교 산학협력단 | P-n 접합 Zn0 LED 및 그 제조방법 |
US10761043B2 (en) * | 2011-07-22 | 2020-09-01 | The Trustees Of The University Of Pennsylvania | Graphene-based nanopore and nanostructure devices and methods for macromolecular analysis |
US10175195B2 (en) * | 2011-07-27 | 2019-01-08 | The Board Of Trustees Of The University Of Illinois | Nanopore sensors for biomolecular characterization |
KR101280119B1 (ko) | 2011-09-26 | 2013-06-28 | 서울대학교산학협력단 | 잉크젯 프린팅을 이용한 그래핀 시트의 패턴과 광대역 다이폴 안테나로의 응용 |
KR101335683B1 (ko) | 2011-10-06 | 2013-12-03 | 한국전기연구원 | 2차원 나노소재에 의해 전도성이 향상된 1차원 전도성 나노소재기반 전도성 필름 |
US8642432B2 (en) * | 2011-12-01 | 2014-02-04 | International Business Machines Corporation | N-dopant for carbon nanotubes and graphene |
US9299932B2 (en) * | 2011-12-28 | 2016-03-29 | Sony Corporation | Solid-state assembly of layers and an electric device comprising such assembly |
US8564027B2 (en) * | 2012-01-27 | 2013-10-22 | International Business Machines Corporation | Nano-devices formed with suspended graphene membrane |
US8790814B2 (en) * | 2012-02-16 | 2014-07-29 | Nanotek Instruments, Inc. | Inorganic nano sheet-enabled lithium-exchanging surface-mediated cells |
KR101634338B1 (ko) * | 2012-04-26 | 2016-06-28 | 광주과학기술원 | 발광 다이오드 및 이의 제조방법 |
TWI441947B (zh) * | 2012-07-20 | 2014-06-21 | Academia Sinica | 電化學石墨烯及包含其之電極複合材料與鋰電池 |
KR101391306B1 (ko) | 2012-07-27 | 2014-05-02 | 이엘케이 주식회사 | 인쇄법을 적용하는 터치 스크린 패널의 제조 방법 및 이에 의해 제조된 터치 스크린 패널 |
US8735271B2 (en) * | 2012-08-24 | 2014-05-27 | International Business Machines Corporation | Gate tunable tunnel diode |
GB201218952D0 (en) * | 2012-10-22 | 2012-12-05 | Cambridge Entpr Ltd | Functional inks based on layered materials and printed layered materials |
KR101919426B1 (ko) * | 2013-01-08 | 2018-11-19 | 삼성전자주식회사 | 그래핀 전자 소자 및 그 제조 방법 |
KR101532310B1 (ko) | 2013-02-18 | 2015-06-29 | 삼성전자주식회사 | 2차원 소재 적층 플렉서블 광센서 |
US9379232B2 (en) | 2013-02-18 | 2016-06-28 | Quantum Devices, Llc | Magneto-electric voltage controlled spin transistors |
US9899480B2 (en) * | 2013-03-15 | 2018-02-20 | University Of Notre Dame Du Lac | Single transistor random access memory using ion storage in two-dimensional crystals |
US9063063B2 (en) * | 2013-03-15 | 2015-06-23 | The United States Of America, As Represented By The Secretary Of The Navy | Low-dimensional material chemical vapor sensors |
ITVI20130077A1 (it) * | 2013-03-20 | 2014-09-21 | St Microelectronics Srl | Un materiale riempitivo a base di grafene con una elevata conducibilita' termica per il collegamento di chips in dispositivi a microstruttura |
US10809222B2 (en) * | 2013-04-25 | 2020-10-20 | The Trustees Of The University Of Pennsylvania | Opioid detection based on high quality graphene transistor arrays and a synthetic mu receptor |
US9449873B2 (en) * | 2013-06-19 | 2016-09-20 | Infineon Technologies Ag | Method for processing a carrier and an electronic component |
US9472686B2 (en) * | 2013-08-02 | 2016-10-18 | Northwestern University | Gate-tunable P-N heterojunction diode, and fabrication method and application of same |
WO2015031461A1 (en) * | 2013-08-28 | 2015-03-05 | Massachusetts Institute Of Technology | Seed for metal dichalcogenide growth by chemical vapor deposition |
IN2013CH04799A (ko) * | 2013-10-24 | 2015-05-08 | Empire Technology Dev Llc | |
US10267763B2 (en) * | 2013-12-04 | 2019-04-23 | The Regents Of The University Of Michigan | Graphene nanoelectronic heterodyne sensor for rapid and sensitive vapor detection |
US10099938B2 (en) * | 2013-12-12 | 2018-10-16 | Samsung Electronics Co., Ltd. | Electrically conductive thin films |
US9548394B2 (en) * | 2014-04-22 | 2017-01-17 | Uchicago Argonne, Llc | All 2D, high mobility, flexible, transparent thin film transistor |
KR102245295B1 (ko) * | 2014-10-08 | 2021-04-27 | 삼성전자주식회사 | 실리신 물질층 및 이를 포함하는 전자 소자 |
US10269981B2 (en) * | 2014-11-17 | 2019-04-23 | Taiwan Semiconductor Manufacturing Company, Ltd. | Multi-channel field effect transistors using 2D-material |
US9859513B2 (en) * | 2014-11-25 | 2018-01-02 | University Of Kentucky Research Foundation | Integrated multi-terminal devices consisting of carbon nanotube, few-layer graphene nanogaps and few-layer graphene nanoribbons having crystallographically controlled interfaces |
KR102308620B1 (ko) | 2014-11-27 | 2021-10-05 | 삼성디스플레이 주식회사 | 유기 발광 표시 장치 |
KR102412965B1 (ko) * | 2014-12-30 | 2022-06-24 | 삼성전자주식회사 | 2차원 물질층을 포함하는 전자소자 및 잉크젯 프린팅을 이용한 전자소자의 제조방법 |
US9515257B2 (en) * | 2015-02-20 | 2016-12-06 | Northwestern University | Gate-tunable atomically-thin memristors and methods for preparing same and applications of same |
US9793214B1 (en) * | 2017-02-21 | 2017-10-17 | Texas Instruments Incorporated | Heterostructure interconnects for high frequency applications |
-
2014
- 2014-12-30 KR KR1020140194323A patent/KR102412965B1/ko active Active
-
2015
- 2015-06-02 US US14/728,583 patent/US9922825B2/en active Active
- 2015-11-02 JP JP2015215581A patent/JP6727790B2/ja active Active
- 2015-11-11 CN CN201510765524.4A patent/CN105742358B/zh active Active
-
2017
- 2017-11-20 US US15/817,979 patent/US10460935B2/en active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013502735A (ja) * | 2009-08-24 | 2013-01-24 | インターナショナル・ビジネス・マシーンズ・コーポレーション | 単一またはいくつかの層のグラフェン・ベースの光検出デバイスおよびその形成方法 |
JP2013512311A (ja) * | 2009-11-25 | 2013-04-11 | イー・アイ・デュポン・ドウ・ヌムール・アンド・カンパニー | 結晶性銅カルコゲニドナノ粒子の水性製造方法、そのように製造されたナノ粒子、ならびにこれらのナノ粒子を組み込んだインクおよびコーテッド基板 |
US20140042390A1 (en) * | 2011-02-16 | 2014-02-13 | The Regents Of University Of California | Interpenetrating networks of carbon nanostructures and nano-scale electroactive materials |
JP2014120712A (ja) * | 2012-12-19 | 2014-06-30 | Ricoh Co Ltd | 金属酸化物膜形成用塗布液、金属酸化物膜、電界効果型トランジスタ、及び電界効果型トランジスタの製造方法 |
WO2014100723A1 (en) * | 2012-12-21 | 2014-06-26 | The Regents Of The University Of California | Vertically stacked heterostructures including graphene |
Also Published As
Publication number | Publication date |
---|---|
KR20160081102A (ko) | 2016-07-08 |
US20180090317A1 (en) | 2018-03-29 |
CN105742358B (zh) | 2021-02-05 |
JP6727790B2 (ja) | 2020-07-22 |
CN105742358A (zh) | 2016-07-06 |
US9922825B2 (en) | 2018-03-20 |
US10460935B2 (en) | 2019-10-29 |
US20160190244A1 (en) | 2016-06-30 |
JP2016127267A (ja) | 2016-07-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR102412965B1 (ko) | 2차원 물질층을 포함하는 전자소자 및 잉크젯 프린팅을 이용한 전자소자의 제조방법 | |
KR102216543B1 (ko) | 그래핀-금속 접합 구조체 및 그 제조방법, 그래핀-금속 접합 구조체를 구비하는 반도체 소자 | |
US9269775B2 (en) | Tunneling devices and methods of manufacturing the same | |
US8946789B2 (en) | Semiconductor device, method of manufacturing the same, and electronic device including the semiconductor device | |
KR101156620B1 (ko) | 그라핀 채널층을 가지는 전계 효과 트랜지스터 | |
KR101813173B1 (ko) | 반도체소자와 그 제조방법 및 반도체소자를 포함하는 전자장치 | |
KR101813179B1 (ko) | 복층의 게이트 절연층을 구비한 그래핀 전자 소자 | |
US9064777B2 (en) | Graphene switching device having tunable barrier | |
KR101878734B1 (ko) | 그래핀 층상 구조체, 그의 제조방법 및 이를 채용한 투명전극과 트랜지스터 | |
KR102059131B1 (ko) | 그래핀 소자 및 이의 제조 방법 | |
US20130277644A1 (en) | Graphene switching device including tunable barrier | |
US9048310B2 (en) | Graphene switching device having tunable barrier | |
KR20160137298A (ko) | 금속-이차원 물질-반도체의 접합을 포함하는 반도체 소자 | |
US20140287575A1 (en) | Spatial orientation of the carbon nanotubes in electrophoretic deposition process | |
KR20130035621A (ko) | 압전형 구조체를 포함하는 광전자 소자 및 그 제조방법 | |
KR102464365B1 (ko) | 광 캐비티를 포함하는 발광 소자 | |
Hwang et al. | Gate-dependent asymmetric transport characteristics in pentacene barristors with graphene electrodes | |
Kim et al. | crystals MDPI | |
JP2018127377A (ja) | グラフェンナノリボン、グラフェンナノリボンの製造方法及び半導体装置 | |
EP2790238A1 (en) | Organic field effect transistor and method for production | |
Jeon et al. | Dipole-containing encapsulation on WSe2/MoS2 nanoflake pn diode with glass substrate toward an ideal performance | |
Pourfath et al. | High performance carbon nanotube field effect transistor with the potential for tera level integration |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 20141230 |
|
PG1501 | Laying open of application | ||
A201 | Request for examination | ||
PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 20191218 Comment text: Request for Examination of Application Patent event code: PA02011R01I Patent event date: 20141230 Comment text: Patent Application |
|
E902 | Notification of reason for refusal | ||
PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20210708 Patent event code: PE09021S01D |
|
E701 | Decision to grant or registration of patent right | ||
PE0701 | Decision of registration |
Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 20220321 |
|
GRNT | Written decision to grant | ||
PR0701 | Registration of establishment |
Comment text: Registration of Establishment Patent event date: 20220621 Patent event code: PR07011E01D |
|
PR1002 | Payment of registration fee |
Payment date: 20220622 End annual number: 3 Start annual number: 1 |
|
PG1601 | Publication of registration |