KR102359377B1 - 웨이퍼 습식 거치장치 - Google Patents
웨이퍼 습식 거치장치 Download PDFInfo
- Publication number
- KR102359377B1 KR102359377B1 KR1020200033427A KR20200033427A KR102359377B1 KR 102359377 B1 KR102359377 B1 KR 102359377B1 KR 1020200033427 A KR1020200033427 A KR 1020200033427A KR 20200033427 A KR20200033427 A KR 20200033427A KR 102359377 B1 KR102359377 B1 KR 102359377B1
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- South Korea
- Prior art keywords
- wafer
- groove
- water
- supply unit
- fluid supply
- Prior art date
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- 239000012530 fluid Substances 0.000 claims abstract 10
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract 10
- 238000001035 drying Methods 0.000 claims abstract 5
- 238000005507 spraying Methods 0.000 claims abstract 4
- 238000000926 separation method Methods 0.000 claims abstract 3
- 238000000034 method Methods 0.000 claims 3
- 238000002347 injection Methods 0.000 claims 2
- 239000007924 injection Substances 0.000 claims 2
- 238000007599 discharging Methods 0.000 claims 1
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68728—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a plurality of separate clamping members, e.g. clamping fingers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68785—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
또한, 공급된 웨이퍼의 이탈을 방지하기 위해 측면을 지지하는 가이드와 웨이퍼의 하부에 물을 분사하여 웨이퍼를 띄워주면서 웨이퍼의 표면이 마르는 것을 방지하기 위한 유체공급부를 포함하는 것을 특징으로 한다.
Description
도 2는 본 발명에 따른 웨이퍼 습식 거치장치를 도시한 사시도.
도 3 또는 도 4는 본 발명에 따른 웨이퍼 습식 거치장치의 동작예를 도시한 단면도.
2 : 공급관
3 : 플레이트
11 : 분사 홀
12 : 홈
100 : 웨이퍼 습식 거치장치
101 : 웨이퍼
102 : 물
Claims (6)
- 공급된 웨이퍼의 이탈을 방지하기 위해 측면을 지지하는 가이드와;
웨이퍼의 하부에 물을 분사하여 웨이퍼를 띄워주면서 웨이퍼의 표면이 마르는 것을 방지하기 위한 유체공급부와;
상기 유체공급부를 통해 분사된 물을 배출시키기 위해 상면에 홈이 형성된 플레이트를 포함하며,
상기 유체공급부를 통해서 공급되어 홈을 따라 배출되는 물은 홈에서 넘치도록 공급되어 홈의 외부로 넘치는 물이 상부에 올려지는 웨이퍼를 띄워주는 것을 특징으로 하는
웨이퍼 습식 거치장치.
- 공급된 웨이퍼의 이탈을 방지하기 위해 측면을 지지하는 가이드와;
웨이퍼의 하부에 물을 분사하여 웨이퍼를 띄워주면서 웨이퍼의 표면이 마르는 것을 방지하기 위한 유체공급부와;
상기 유체공급부를 통해 분사된 물을 배출시키기 위해 상면에 홈이 형성된 플레이트를 포함하며,
상기 유체공급부를 통해서 공급되는 물은 표면장력에 의해 홈을 따라 볼록하게 형성되어 홈을 따라 배출되면서 상부에 올려지는 웨이퍼를 띄워주는 것을 특징으로 하는
웨이퍼 습식 거치장치.
- 제 1항 또는 제 2항에 있어서,
상기 유체공급부는
상부로 복수 개의 분사 홀이 배열된 공급관이 방사형으로 배치된 것을 특징으로 하는
웨이퍼 습식 거치장치.
- 제 1항 또는 제 2항에 있어서,
상기 플레이트의 홈은 유체공급부를 따라 형성되는 제1 홈과;
제1 홈과 교차하도록 형성되어 물을 양측으로 배출시켜주기 위한 제2 홈으로 구성되는 것을 특징으로 하는
웨이퍼 습식 거치장치.
- 제 1항 또는 제 2항에 있어서,
웨이퍼의 상부에 물을 분사하여 웨이퍼의 표면이 마르는 것을 방지하기 위한 유체분사부를 더 포함하는 것을 특징으로 하는
웨이퍼 습식 거치장치.
- 삭제
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020200033427A KR102359377B1 (ko) | 2020-03-18 | 2020-03-18 | 웨이퍼 습식 거치장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020200033427A KR102359377B1 (ko) | 2020-03-18 | 2020-03-18 | 웨이퍼 습식 거치장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20210117393A KR20210117393A (ko) | 2021-09-29 |
KR102359377B1 true KR102359377B1 (ko) | 2022-02-08 |
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KR1020200033427A Active KR102359377B1 (ko) | 2020-03-18 | 2020-03-18 | 웨이퍼 습식 거치장치 |
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KR (1) | KR102359377B1 (ko) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003071709A (ja) | 2001-08-27 | 2003-03-12 | Applied Materials Inc | 基板の受け渡し方法および機械化学的研磨装置 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003007664A (ja) * | 2001-06-22 | 2003-01-10 | Ses Co Ltd | 枚葉式基板洗浄方法および枚葉式基板洗浄装置 |
DE10159833C1 (de) | 2001-12-06 | 2003-06-18 | Wacker Siltronic Halbleitermat | Verfahren zur Herstellung einer Vielzahl von Halbleiterscheiben |
KR20080071685A (ko) * | 2007-01-31 | 2008-08-05 | 세메스 주식회사 | 지지부재 및 상기 지지부재를 구비하는 기판 처리 장치 |
KR100969604B1 (ko) * | 2008-06-26 | 2010-07-12 | 주식회사 에이앤디코퍼레이션 | 기판 처리장치 및 방법 |
KR20100059549A (ko) * | 2008-11-26 | 2010-06-04 | 세메스 주식회사 | 기판 지지부재, 이를 갖는 기판 처리 장치 및 이를 이용한 기판 처리 방법 |
JP5877954B2 (ja) * | 2011-03-07 | 2016-03-08 | 株式会社ゼビオス | 非接触浮上搬送機能を有する基板処理装置 |
KR102050822B1 (ko) * | 2012-12-27 | 2019-12-02 | 세메스 주식회사 | 기판 처리 장치 |
KR20180011943A (ko) * | 2016-07-26 | 2018-02-05 | 주식회사 케이씨텍 | 화학 기계적 연마 시스템의 기판 로딩 장치 및 그 제어방법 |
-
2020
- 2020-03-18 KR KR1020200033427A patent/KR102359377B1/ko active Active
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003071709A (ja) | 2001-08-27 | 2003-03-12 | Applied Materials Inc | 基板の受け渡し方法および機械化学的研磨装置 |
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KR20210117393A (ko) | 2021-09-29 |
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