KR102279523B1 - 브러쉬 세정 장치 - Google Patents
브러쉬 세정 장치 Download PDFInfo
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- KR102279523B1 KR102279523B1 KR1020180011670A KR20180011670A KR102279523B1 KR 102279523 B1 KR102279523 B1 KR 102279523B1 KR 1020180011670 A KR1020180011670 A KR 1020180011670A KR 20180011670 A KR20180011670 A KR 20180011670A KR 102279523 B1 KR102279523 B1 KR 102279523B1
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B1/00—Cleaning by methods involving the use of tools
- B08B1/10—Cleaning by methods involving the use of tools characterised by the type of cleaning tool
- B08B1/12—Brushes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67046—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly scrubbing means, e.g. brushes
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- B08B1/04—
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B1/00—Cleaning by methods involving the use of tools
- B08B1/20—Cleaning of moving articles, e.g. of moving webs or of objects on a conveyor
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B1/00—Cleaning by methods involving the use of tools
- B08B1/30—Cleaning by methods involving the use of tools by movement of cleaning members over a surface
- B08B1/32—Cleaning by methods involving the use of tools by movement of cleaning members over a surface using rotary cleaning members
- B08B1/34—Cleaning by methods involving the use of tools by movement of cleaning members over a surface using rotary cleaning members rotating about an axis parallel to the surface
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/02—Cleaning by the force of jets or sprays
- B08B3/022—Cleaning travelling work
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67706—Mechanical details, e.g. roller, belt
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68764—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a movable susceptor, stage or support, others than those only rotating on their own vertical axis, e.g. susceptors on a rotating caroussel
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
도 2는 도 1의 평면도,
도 3은 본 발명에 따른 브러쉬 세정 장치를 설명하기 위한 도면,
도 4 내지 도 6은 본 발명에 따른 브러쉬 세정 장치로서, 토크감지부와 속도제어부를 설명하기 위한 도면,
도 7 및 도 8은 본 발명에 따른 브러쉬 세정 장치로서, 세정제어부를 설명하기 위한 도면,
도 9 및 도 10은 본 발명의 다른 실시예에 따른 브러쉬 세정 장치를 설명하기 위한 도면이다.
102 : 제1브러쉬 104 : 제2브러쉬
110 : 기판 스피닝 유닛 120 : 세정 유체 분사부
200 : 토크감지부 300 : 속도제어부
400,400' : 세정제어부 500 : 표면검출부
Claims (28)
- 브러쉬 세정 장치에 있어서,
롤 형태로 형성되어 회전하는 외주면이 기판의 표면의 중심부를 가로지르는 위치에서 회전 접촉하는 세정브러쉬와;
상기 세정 브러쉬에 의해 접촉 세정되는 상기 기판에 대하여, 상기 기판과의 마찰에 따른 상기 세정 브러쉬의 회전 토크를 세정 공정의 시간 경과에 따라 감지하는 토크감지부와;
상기 기판에 세정 유체를 분사하는 세정 유체 분사부와;
상기 토크감지부에서 감지된 신호에 따라 상기 기판의 세정 조건을 제어하되, 상기 세정 유체 분사부에 의한 상기 세정 유체의 분사량 및 분사 압력 중 어느 하나 이상을 제어하는 세정 제어부를;
포함하여 구성된 것을 특징으로 하는 브러쉬 세정 장치.
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- 제1항에 있어서,
상기 세정브러쉬의 일단을 지지하는 브러쉬지지대를 포함하는 것을 특징으로 하는 브러쉬 세정 장치.
- 제1항에 있어서,
상기 세정브러쉬의 일단 및 타단을 지지하는 브러쉬지지대를 포함하는 것을 특징으로 하는 브러쉬 세정 장치.
- 제1항에 있어서,
상기 기판을 지지하면서 회전시키는 기판 스피닝 유닛을; 더 포함하고,
상기 세정제어부는, 상기 기판 스피닝 유닛에 의한 상기 기판의 회전 속도를 제어하는 것을 특징으로 하는 브러쉬 세정 장치.
- 제1항에 있어서,
상기 세정 유체 분사부는 기판의 표면에 대해 오실레이션(oscillation) 가능하게 제공되며,
상기 세정제어부는, 상기 세정 유체 분사부의 오실레이션 각도 및 오실레이션 속도 중 어느 하나 이상을 제어하는 것을 특징으로 하는 브러쉬 세정 장치.
- 브러쉬 세정 장치에 있어서,
롤 형태로 형성되어 회전하는 외주면이 기판의 표면의 중심부를 가로지르는 위치에서 회전 접촉하는 세정브러쉬와;상기 세정 브러쉬에 의해 접촉 세정되는 상기 기판에 대하여, 상기 기판과의 마찰에 따른 상기 세정 브러쉬의 회전 토크를 세정 공정의 시간 경과에 따라 감지하는 토크감지부와;
상기 기판의 표면에 대해 오실레이션(oscillation) 가능하게 제공되며,상기 기판에 세정 유체를 분사하는 세정 유체 분사부와;
상기 토크감지부에서 감지된 신호에 따라 상기 기판의 세정 조건을 제어하되, 상기 세정 유체 분사부의 오실레이션 각도 및 오실레이션 속도 중 어느 하나 이상을 제어하는 세정제어부를;
포함하는 것을 특징으로 하는 브러쉬 세정 장치.
- 제 1항 또는 제5항 내지 제9항 중 어느 한 항에 있어서,
상기 세정 공정의 시간 경과에 따라, 상기 토크감지부에서 감지된 상기 세정브러쉬의 회전 토크가 기설정된 설정범위를 벗어나면, 상기 세정브러쉬의 회전 속도를 상기 세정 공정 중에 실시간으로 변동시키는 속도제어부를;
더 포함하고, 상기 세정브러쉬가 상기 기판에 회전 접촉하는 상기 세정 공정의 시간 경과 중에 상기 토크 감지부에 의해 감지된 회전토크값에 따라 상기 세정브러쉬의 회전 속도를 증감시키는 피드백 제어하는 것을 특징으로 하는 브러쉬 세정 장치.
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- 제 1항 또는 제5항 내지 제9항 중 어느 한 항에 있어서,
상기 세정 공정의 시간 경과에 따라, 상기 토크감지부에서 감지된 상기 세정브러쉬의 회전 토크가 기설정된 설정범위를 벗어나면, 기판 스피닝 유닛의 상기 기판의 회전 속도를 상기 세정 공정 중에 실시간으로 변동시키는 속도제어부를;
더 포함하고, 상기 세정브러쉬가 상기 기판에 회전 접촉하는 상기 세정 공정의 시간 경과 중에 상기 토크 감지부에 의해 감지된 회전토크값에 따라 상기 기판의 회전 속도를 증감시키는 피드백 제어하는 것을 특징으로 하는 브러쉬 세정 장치.
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Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
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KR1020180011670A KR102279523B1 (ko) | 2018-01-30 | 2018-01-30 | 브러쉬 세정 장치 |
CN201820340187.3U CN208390501U (zh) | 2018-01-30 | 2018-03-13 | 刷洗装置 |
CN201811474003.3A CN110090824B (zh) | 2018-01-30 | 2018-12-04 | 刷洗装置 |
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KR1020180011670A KR102279523B1 (ko) | 2018-01-30 | 2018-01-30 | 브러쉬 세정 장치 |
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KR20190092189A KR20190092189A (ko) | 2019-08-07 |
KR102279523B1 true KR102279523B1 (ko) | 2021-07-20 |
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Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
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KR102290610B1 (ko) * | 2019-11-20 | 2021-08-20 | 한국생산기술연구원 | 웨이퍼에 대한 세정용 브러쉬의 접촉 깊이 검출 장치 및 이의 깊이 검출 방법 |
KR102290611B1 (ko) * | 2019-11-20 | 2021-08-20 | 한국생산기술연구원 | 웨이퍼에 대한 세정용 브러쉬의 접촉 원점 검출 장치 및 이의 원점 검출 방법 |
CN111146116B (zh) * | 2019-11-28 | 2020-12-29 | 华海清科股份有限公司 | 一种晶圆清洗方法和晶圆后处理装置 |
CN114058795A (zh) * | 2021-11-01 | 2022-02-18 | 江苏龙创新材料科技有限公司 | 一种漆包线加工用的退火处理装置及使用方法 |
CN115101442A (zh) * | 2022-06-07 | 2022-09-23 | 上海华力集成电路制造有限公司 | 清洗系统以及清洗方法 |
KR102603694B1 (ko) * | 2022-12-05 | 2023-11-16 | 이영화 | 성형몰드 작업용 청소도유 장치 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009049432A (ja) * | 2008-11-17 | 2009-03-05 | Shibaura Mechatronics Corp | ブラシ洗浄装置およびブラシ洗浄方法 |
KR101399840B1 (ko) * | 2013-04-22 | 2014-05-29 | 주식회사 케이씨텍 | 화학 기계적 연마 공정을 거친 기판의 세정 방법 및 기판의 세정 장치 |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7077916B2 (en) * | 2002-03-11 | 2006-07-18 | Matsushita Electric Industrial Co., Ltd. | Substrate cleaning method and cleaning apparatus |
JP2007165554A (ja) * | 2005-12-13 | 2007-06-28 | Dainippon Screen Mfg Co Ltd | 基板処理装置及び基板処理方法 |
JP4755519B2 (ja) * | 2006-03-30 | 2011-08-24 | 大日本スクリーン製造株式会社 | 基板処理装置および基板処理方法 |
US8578953B2 (en) * | 2006-12-20 | 2013-11-12 | Tokyo Electron Limited | Substrate cleaning apparatus, substrate cleaning method, and computer-readable storage medium |
CN201108161Y (zh) * | 2007-09-05 | 2008-09-03 | 莱奥孚姆有限公司 | 清洗表面的压力清洁刷 |
JP5890108B2 (ja) * | 2011-04-27 | 2016-03-22 | 株式会社Screenホールディングス | 洗浄処理方法 |
CN202933039U (zh) * | 2012-08-30 | 2013-05-15 | 上海携福电器有限公司 | 电动牙刷 |
EP2743779A2 (en) * | 2012-12-17 | 2014-06-18 | Canon Kabushiki Kaisha | Image forming apparatus that prevents surface speed difference from being generated between photosensitive drum and intermediate transfer belt |
JP6113552B2 (ja) * | 2013-03-29 | 2017-04-12 | 株式会社荏原製作所 | 研磨装置及び摩耗検知方法 |
KR101508513B1 (ko) * | 2013-07-22 | 2015-04-07 | 주식회사 케이씨텍 | 기판 세정에 사용되는 기판 회전 장치 |
CN104720913B (zh) * | 2013-12-19 | 2017-07-18 | 高露洁-棕榄公司 | 电动牙刷 |
KR101706975B1 (ko) * | 2014-02-14 | 2017-02-16 | 주식회사 케이씨텍 | 슬러리 조성물의 제조 방법 및 이에 의해 제조된 슬러리 조성물 |
US9700988B2 (en) * | 2014-08-26 | 2017-07-11 | Ebara Corporation | Substrate processing apparatus |
KR20170043664A (ko) * | 2014-10-31 | 2017-04-21 | 가부시키가이샤 에바라 세이사꾸쇼 | 기판 세정 장치 및 기판 세정 방법 |
KR101829640B1 (ko) * | 2015-11-05 | 2018-03-29 | 주식회사 케이씨텍 | 기판 세정 장치 및 이를 이용한 기판 세정 방법 |
KR101916211B1 (ko) * | 2015-12-07 | 2018-11-07 | 주식회사 케이씨텍 | 화학 기계적 연마 장치 및 그 방법 |
CN106944381A (zh) * | 2016-01-06 | 2017-07-14 | 中芯国际集成电路制造(上海)有限公司 | 晶圆清洗装置及其清洗方法 |
KR101852365B1 (ko) * | 2016-06-13 | 2018-04-26 | 주식회사 케이씨텍 | 브러쉬 세정 장치 및 그 제어방법 |
-
2018
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- 2018-03-13 CN CN201820340187.3U patent/CN208390501U/zh active Active
- 2018-12-04 CN CN201811474003.3A patent/CN110090824B/zh active Active
Patent Citations (2)
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JP2009049432A (ja) * | 2008-11-17 | 2009-03-05 | Shibaura Mechatronics Corp | ブラシ洗浄装置およびブラシ洗浄方法 |
KR101399840B1 (ko) * | 2013-04-22 | 2014-05-29 | 주식회사 케이씨텍 | 화학 기계적 연마 공정을 거친 기판의 세정 방법 및 기판의 세정 장치 |
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CN110090824B (zh) | 2022-04-19 |
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