KR102257204B1 - Phosphor film and Method for Manufacturing the same, and Apparatus and Method for Measuring Optical Properties Using the same - Google Patents

Abstract

Disclosed are a phosphor film, a method for manufacturing the same, and an apparatus and method for measuring optical properties using the same.
According to an aspect of the present embodiment, there is provided an optical characteristic measuring apparatus for measuring optical characteristics of the phosphor film by irradiating a light source with a phosphor film, comprising: a light source unit for irradiating a light source of a preset wavelength band; An integrating sphere for total reflection of the light source irradiated with the phosphor film; A holder disposed inside the integrating sphere to place the phosphor film; And a detector that receives the light source totally reflected by the integrating sphere and detects an optical characteristic spectrum of the light source.

Description

Phosphor film and method for manufacturing the same, and apparatus for measuring optical properties using the same, and method for measuring optical properties using the same

The present invention relates to a phosphor film capable of accurately measuring the optical properties of a phosphor, a method of manufacturing the same, and an apparatus and a measurement method for measuring optical properties using the same.

The content described in this section merely provides background information on the present embodiment and does not constitute the prior art.

Phosphor is a material that absorbs high energy from a light source (excitation source) and emits light in the visible light region with low energy, and is used in lighting and display fields, and is a core material that is directly related to the efficiency and optical characteristics of the product. It is very important to measure the optical properties of the phosphor, since the luminous efficiency of the LED (Light Emitting Diode) to which the phosphor is applied may vary depending on the optical properties of the phosphor. A conventional optical characteristic measuring apparatus and a method of measuring optical characteristics of a phosphor using the same will be described with reference to FIG. 1.

1 is a diagram showing a conventional optical property measuring apparatus.

Typically, an optical characteristic measuring device measures optical characteristics of a phosphor such as luminance and quantum efficiency. A method of measuring the optical characteristics of a phosphor using the conventional optical characteristic measuring apparatus 100 is as follows.

The conventional optical characteristic measuring apparatus 100 excites a light source with a phosphor 110 using the light source unit 120. Here, the phosphor 110, which is a measurement object of the optical property measuring apparatus 100, is in a solid powder state, and is placed on the upper surface of the plate 140 while being contained in a quartz dish (not shown) as much as a quantity.

Here, the user or the like repeats the process of placing the phosphor 110 in a quartz dish (not shown) or emptying the phosphor 110 contained in a quartz dish (not shown) in order to measure the optical characteristics of the phosphor 110 . In this process, the powder of the phosphor 110 buried in a quartz dish (not shown) may contaminate the plate 140, but as the plate 140 is contaminated, the optical characteristics of the phosphor 110 may be distorted. This will be described with reference to FIG. 2.

2 is a photograph showing the state that the plate is contaminated.

Referring to FIG. 2, the plate 140 is a component in the integrating sphere 150, and a phosphor 110 contained in a quartz dish (not shown) is placed on the upper surface of the plate 140. As described above, the user or the like repeats the process of placing or emptying the phosphor 110 in a quartz dish (not shown). In this process, the phosphor 110 powder remains outside the quartz dish (not shown). . The upper surface of the plate 140 may be contaminated by a quartz dish (not shown) in which the phosphor 110 powder is embedded, and the quartz dish (not shown) itself is continuously in contact with the upper surface of the plate 140, thereby causing the plate 140 ) May decrease the reflectivity. In particular, as the reflectance of the plate 140 decreases, the amount of light of the reference (i.e., reference value) decreases, and when the quantum efficiency is calculated based on these measured values, a serious error in which the quantum efficiency exceeds 100% may occur. . Accordingly, in order to prevent contamination of the plate 140, the conventional optical property measuring apparatus 100 has inconvenient to have a separate member such as filter paper or the like.

In addition, as a light source (excitation light) is irradiated to the phosphor 110 placed on the plate 140, a phenomenon in which the light source is reabsorbed between particles in the phosphor 110 may occur. Reabsorption of the light source between particles in the phosphor 110 distorts the optical characteristic data, thereby lowering the reliability of the optical characteristic measuring apparatus 100. Reabsorption of the light source between particles in the phosphor 110 will be described with reference to FIGS. 3 and 4.

3 is a diagram showing a state in which particles in a phosphor reabsorb the light source as the light source is irradiated.

3(a) and (b), the phosphor 110 applied to the plate 140 is in a solid powder state, and the gap between the particles 310 and the surrounding particles 320 is very narrow. As the light source is irradiated by the phosphor 110, a plurality of particles in the phosphor 110 reflects the light source, and at this time, a reabsorption phenomenon occurs in which the light source reflected by one particle 310 is absorbed by the surrounding particles 320. I can. The light source reabsorbed by the other particles 320 emit light again, but the luminous efficiency of the particles 320 decreases. That is, due to the decrease in luminous efficiency due to reabsorption between the particles 310 and 320 in the phosphor 110, the conventional optical property measuring apparatus 100 has a serious problem that it cannot accurately measure the optical properties of the phosphor 110. .

4 is a graph showing the reabsorption rate of a phosphor.

FIG. 4(a) is a graph showing an absorption area (Excitation) and an emission area (Emission) of YAG, which is a phosphor type, and FIG. 4(b) is a graph showing an absorption area (Silicate Yellow), which is a phosphor type. Excitation) and emission area (Emission).

As shown in FIG. 4, the phosphor 110 includes an overlapped region in which an absorption region (excitation) and an emission region (emission) overlap, and a reabsorption phenomenon of the phosphor 110 occurs in this region. do. As described above, as the light source reflected from the particles 310 in the phosphor 110 is reabsorbed by the other particles 320 around the phosphor 110, the luminous efficiency of the phosphor 110 decreases. In particular, when the phosphor 110 is in a powder state, since the distance between the particles 310 and the particles 320 is very narrow, the reabsorption phenomenon between the particles 310 and 320 in the phosphor 110 becomes more active, which is Soon, it acts as a cause of greatly reducing the luminous efficiency of the phosphor. That is, since the conventional optical property measuring apparatus 100 measures the optical properties of the phosphor 110 using the phosphor 110 in a powder state, it has a limitation that it cannot accurately detect the optical properties of the phosphor 110. .

Referring again to FIG. 1, the conventional optical characteristic measuring apparatus 100 transmits a light source reflected from the phosphor 110 to the detector 170 using an optical fiber 160. The detector 170 converts the optical signal into an electrical signal according to the wavelength and intensity of light, and outputs the optical characteristics of the phosphor 110 in the form of a spectrum. The server 180 receives the optical characteristic spectrum from the detector 170, analyzes and stores it, and provides appropriate data to the user.

As described above, the optical characteristic data of the phosphor 110 output by the conventional optical characteristic device 100 is due to reabsorption of the light source between the particles 310 and 320 in the phosphor 110 and contamination of the integrating sphere 150. It is very likely to be distorted. In order to solve this problem, there is a need for a measuring device and a method that can more accurately measure the optical characteristics of the phosphor 110.

An object of the present invention is to provide an apparatus and method for measuring optical properties using a phosphor film in order to reduce an error in optical property data of a phosphor.

According to an aspect of the present invention, there is provided an optical characteristic measuring apparatus for measuring optical characteristics of the phosphor film by irradiating a light source with a phosphor film, comprising: a light source unit for irradiating a light source of a preset wavelength band; An integrating sphere for total reflection of the light source irradiated with the phosphor film; A holder disposed inside the integrating sphere to place the phosphor film; And a detector that receives the light source totally reflected by the integrating sphere and detects an optical characteristic spectrum of the light source.

According to an aspect of the present invention, the integrating sphere is characterized in that it has a first through hole through which the light source irradiated from the light source unit is introduced.

According to an aspect of the present invention, the integrating sphere is characterized in that it has a second through-hole for totally reflecting the light source irradiated by the phosphor film and allowing the total reflected light source to flow out to the detector.

According to an aspect of the present invention, the holder in which the phosphor film is placed is inserted into the integrating sphere hollow.

According to an aspect of the present invention, the holder includes a through hole through which the phosphor film passes and a support portion in which the phosphor film is placed.

According to an aspect of the present invention, in the process of measuring the optical properties of the phosphor film by the optical property measuring apparatus using the phosphor film, the measurement process of measuring a reference value; An irradiation process of irradiating a light source with a phosphor film fixed to the holder; A total reflection process of totally reflecting the light reflected from the phosphor film fixed to the holder; A transmission process of transmitting the total reflected light to a detector; And a detecting process of outputting the optical properties of the phosphor film as a spectrum.

According to an aspect of the present invention, the irradiation process is characterized in that the phosphor film fixed to the holder irradiates a light source of a preset wavelength band.

According to an aspect of the present invention, in the process of measuring the optical properties of the phosphor film, a path for introducing a light source irradiated to the phosphor film fixed to the holder and a path for transmitting the total reflected light to the detector are in a straight line. It is characterized in that it is not formed in.

According to an aspect of the present invention, as a measurement object of the optical property measuring apparatus, silicon and phosphor powder are each contained in a preset ratio, and the number of phosphor particles per unit area varies according to the mixing ratio of the phosphor powder, and the unit It provides a phosphor film manufactured so that the probability of the phosphor reabsorbing a light source can be adjusted according to the number of phosphor particles per area.

According to an aspect of the present invention, the phosphor film is characterized in that the content of the phosphor powder to be mixed varies according to the type of phosphor.

According to an aspect of the present invention, the phosphor film is characterized in that it reflects a light source irradiated from the optical property measuring device.

According to an aspect of the present invention, the phosphor film is characterized in that it has a property of reabsorbing and reflecting a light source reflected by the phosphor particles in the phosphor film by other surrounding particles.

According to an aspect of the present invention, in the process of manufacturing a phosphor film placed in a holder in an optical characteristic measuring device, a design process of designing a mixing ratio of silicon and phosphor powder according to the type of phosphor; Injecting a predetermined ratio of silicon and phosphor powder into a stirring cup; Stirring the stirring cup into which the silicon and phosphor powders of the preset ratio are added; A degassing process of vacuum degassing the mixture formed by mixing the silicon and phosphor powders of the predetermined ratio; An application process of applying the mixed solution; A molding process of molding the mixed solution applied by the coating process into a thin film form; A curing process of curing the mixed liquid formed in the form of a thin film by the molding process; And a processing step of processing the mixed solution, which has been cured by the curing process, into a predetermined shape.

According to an aspect of the present invention, the preset shape is a shape in which the phosphor film can be placed in the holder.

As described above, according to an aspect of the present invention, by manufacturing a phosphor in a solid powder state in a film form and measuring it, contamination in the integrating sphere can be prevented and at the same time, it may occur due to reabsorption of light sources between particles in the phosphor. It has the advantage of correcting data distortion.

1 is a diagram showing a conventional optical property measuring apparatus.
2 is a photograph showing the state that the plate is contaminated.
3 is a diagram showing a state in which particles in a phosphor reabsorb the light source as the light source is irradiated.
4 is a graph showing the reabsorption rate of a phosphor.
5 is a front view and a side view of an optical property measuring apparatus according to an embodiment of the present invention.
6 is a plan view of an optical characteristic measuring apparatus according to an exemplary embodiment of the present invention.
7 is a cross-sectional view of an optical property measuring apparatus according to an embodiment of the present invention.
8 is a photograph of a phosphor film fixed to a holder according to an embodiment of the present invention.
9 is a flowchart illustrating a process of manufacturing a phosphor film according to an embodiment of the present invention.
10 is a photograph showing a phosphor film according to an embodiment of the present invention.
11 is a photograph showing a phosphor film when the mixing ratio of phosphor powder is varied according to an embodiment of the present invention.
12 is a graph showing optical characteristic spectra of a phosphor film measured at different mixing ratios of phosphor powders according to an exemplary embodiment of the present invention.
Fig. 13 is a graph showing emission spectra when a YAG phosphor is measured in a powder state and a film state.
Fig. 14 is a graph showing emission spectra when a silicate yellow phosphor is measured in a powder state and a film state.
15 is a flowchart illustrating a process of measuring optical properties of a phosphor using the optical property measuring apparatus using a phosphor film according to an embodiment of the present invention.

In the present invention, various changes may be made and various embodiments may be provided, and specific embodiments will be illustrated in the drawings and described in detail. However, this is not intended to limit the present invention to a specific embodiment, it should be understood to include all changes, equivalents, or substitutes included in the spirit and scope of the present invention. In describing each drawing, similar reference numerals have been used for similar elements.

Terms such as first, second, A, and B may be used to describe various elements, but the elements should not be limited by the terms. The above terms are used only for the purpose of distinguishing one component from another component. For example, without departing from the scope of the present invention, a first element may be referred to as a second element, and similarly, a second element may be referred to as a first element. The term and/or includes a combination of a plurality of related listed items or any of a plurality of related listed items.

When a component is referred to as being "connected" or "connected" to another component, it is understood that it may be directly connected or connected to the other component, but other components may exist in the middle. It should be. On the other hand, when a component is referred to as being "directly connected" or "directly connected" to another component, it should be understood that there is no other component in the middle.

The terms used in the present application are only used to describe specific embodiments, and are not intended to limit the present invention. Singular expressions include plural expressions unless the context clearly indicates otherwise. In the present application, terms such as "comprise" or "have" should be understood as not precluding the possibility of existence or addition of features, numbers, steps, operations, components, parts, or combinations thereof described in the specification. .

Unless otherwise defined, all terms including technical or scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which the present invention belongs.

Terms as defined in a commonly used dictionary should be interpreted as having a meaning consistent with the meaning in the context of the related technology, and should not be interpreted as an ideal or excessively formal meaning unless explicitly defined in the present application. Does not.

In addition, each configuration, process, process, or method included in each embodiment of the present invention may be shared within a range not technically contradictory to each other.

5 is a front view and a side view of an optical characteristic measuring apparatus according to an exemplary embodiment of the present invention, and FIG. 6 is a plan view of an optical characteristic measuring apparatus according to an exemplary embodiment of the present invention. And Figure 7 is a cross-sectional view of an optical property measuring apparatus according to an embodiment of the present invention.

The optical characteristic measuring apparatus 500 according to an embodiment of the present invention measures the optical characteristics of the phosphor 510 manufactured in the form of a film, thereby measuring data such as quantum yield and emission spectrum of the phosphor. To the user. The conventional optical characteristic device 100 measured optical characteristics using the phosphor 110 in a powder state, but the optical characteristic measuring apparatus 500 according to an embodiment of the present invention uses the phosphor film 510 as a measurement object. There is a very big difference in that it is used.

As mentioned in the background art, in the process of transferring the phosphor 110 to a quartz dish (not shown) or removing the phosphor 110 from a quartz dish (not shown), a powder on the outside of the quartz dish (not shown) The phosphor 110 in the state remains. When the quartz dish (not shown) in this state is placed on the upper surface of the plate 140, the upper surface of the plate 140 may be contaminated by the phosphor 110 powder buried outside the quartz dish (not shown). Accordingly, there is a concern that the optical characteristic data of the phosphor 110 may be distorted as the reflectance of the plate 140 is lowered. However, the optical property measuring apparatus 500 according to an embodiment of the present invention may solve a data distortion problem due to contamination of the integrating sphere by using the phosphor film 510. In addition, the manufacturing apparatus or the like may minimize the reabsorption phenomenon between phosphor particles in the phosphor film 510 by controlling the mixing ratio of the phosphor in the phosphor film 510. Accordingly, the optical characteristic measuring apparatus 500 using the phosphor film 510 may derive optical characteristic data of a phosphor having a significantly smaller error range compared to a reference value.

5 to 7, the optical characteristic measuring apparatus 500 includes a housing 520, a light source unit 530, an integrating sphere 540, a holder 550, and a detector 560.

The phosphor film 510 is a phosphor manufactured in the form of a film and is used as a measurement object of the optical property measuring apparatus 500. The conventional optical characteristic measuring apparatus 100 measured optical characteristics using the phosphor 110 in a solid powder state, but in this case, contamination of the integrating sphere 150 and between the particles 310 and 320 in the phosphor 110 There is a problem that the probability that the optical characteristic data may be distorted increases as a problem such as reabsorption of a light source occurs. In order to solve this problem, the optical characteristic measuring apparatus 500 according to an exemplary embodiment of the present invention can more accurately derive data by measuring optical characteristics using the phosphor film 510.

A detailed description of the phosphor film 510 will be described later with reference to FIGS. 9 to 13.

The housing 520 is formed on the outermost side of the optical characteristic measuring device 500, thereby protecting the components in the optical characteristic measuring device 500 and allowing the components in the optical characteristic measuring device 500 to be stably disposed. . The housing 520 has an opening and closing door (not shown) on one side, so that external light flows into the housing 520 while the optical property measuring device 500 measures the optical properties of the phosphor film 510 It should not be. In addition, the housing 520 may be implemented in a black color to block external light, but is not limited thereto, and may be configured in a different color as long as it can block light from the outside.

The light source unit 530 irradiates a light source in a direction in which the phosphor film 510 is positioned.

The light source unit 530 is disposed inside the housing 520 to output light to excite the phosphor film 510. The light source unit 530 excites phosphor particles in the phosphor film 510 by irradiating light in a preset wavelength band to the phosphor film 510. The light source unit 530 may be configured as a xenon lamp, but is not limited thereto, and may be configured as a laser diode LD for oscillating high-power laser light. However, the light source unit 530 must be capable of outputting light in a wavelength band capable of exciting the phosphor particles in the phosphor film 510.

The integrating sphere 540 totally reflects the light reflected by the phosphor film 510.

The light source irradiated from the light source unit 530 is reflected by the phosphor film 510, and thus, the integrating sphere 540 totally reflects the light reflected from the phosphor film 510 with a uniform light intensity. In general, the integrating sphere 540 may be configured in a spherical shape including a hollow, and the inside of the hollow is coated by a highly efficient reflective material such as _{barium sulfate (Ba 2} SO _{4 ), from the phosphor film 510} Reflected light can be totally reflected with uniform light intensity.

The integrating sphere 540 includes a first through hole 542 and a second through hole 544.

The first through hole 542 introduces light irradiated from the light source unit 530 into the integrating sphere 540 so that the light source can be irradiated to the phosphor film 510.

After the second through hole 544 is reflected by the phosphor film 510, the light totally reflected by the integrating sphere 540 is guided to the detector 560. Here, the second through-hole 544 is aligned so that it does not lie in a straight line with the first through-hole 542, so that the light incident on the first through-hole 542 is not totally reflected by the integrating sphere 540 and is 2 Prevents exiting through the through hole 544.

The holder 550 fixes the phosphor film 510 to be measured by the optical property measuring device 500.

The holder 550 will be described in detail with reference to FIG. 8.

8 is a photograph of a phosphor film fixed to a holder according to an embodiment of the present invention.

FIG. 8(a) is a photograph showing the structure of the holder 550, and FIG. 8(b) is a photograph of the phosphor film 510 fixed to the holder 550. As shown in FIG.

8(a) and (b), the holder 550 is a component of the optical property measurement device 500 for fixing the thin-film phosphor film 510, and the phosphor film ( As 510 is fixed, the phosphor film 510 may be inserted into the integrating sphere 540.

The holder 550 includes a through hole 810 and a support part 820.

The through hole 810 is a passage through which one end of the phosphor film 510 passes, and the phosphor film 510 passing through the through hole 810 may be placed in the support part 820.

The support part 820 is a kind of support on which the other end of the phosphor film 510 is placed, and the phosphor film 510 may be stably fixed to the holder 550 by the support part 820.

The through hole 810 and the support part 820 are configured to be spaced apart from each other at a predetermined interval, and thus, the light source may be sufficiently irradiated with the phosphor film 510 fixed in the holder 550.

Again, referring to FIGS. 5 to 7, the detector 560 measures a spectrum of the light source emitted from the second through hole 544.

The detector 560 is formed at a position facing each other with the second through hole 544, and thus receives the light emitted from the second through hole 544. The detector 560 is equipped with a spectrometer to implement optical characteristics such as reflectance and transmittance of the leaked light source in the form of a spectrum, and transmits it to a separate server (not shown). The emission spectrum of the phosphor film 510 detected by the detector 560 will be described later with reference to FIGS. 14 and 15.

Although not shown in the drawing, a guiding member such as an optical fiber (not shown) is provided between the second through hole 544 and the detector 560 to guide the light flowing out from the second through hole 544 Can be.

9 is a flowchart illustrating a process of manufacturing a phosphor film according to an embodiment of the present invention.

The phosphor film 510 is manufactured as liquid silicon and phosphor powder are mixed in a predetermined ratio and cured by a manufacturing apparatus or the like.

A manufacturing apparatus or the like designs a mixing ratio of silicon and phosphor powder according to the type of phosphor (S910). In general, the proportion of the phosphor powder may be composed of 0.5wt%, 2.5wt%, and 6.5wt%, but is not limited thereto, and the proportion of the phosphor powder incorporated into the phosphor film 510 varies depending on the type of phosphor. I can. However, on the basis of 100%, silicon is added as much as the content of the phosphor powder is excluded.

The manufacturing apparatus or the like puts the phosphor powder and silicon in a preset ratio into the stirring cup (S920).

The manufacturing apparatus or the like stirs a stirring cup containing phosphor powder and silicon in a preset ratio (S930).

The manufacturing apparatus or the like vacuum degassing the mixture formed as the phosphor powder and silicon are mixed (S940).

A manufacturing apparatus or the like applies the vacuum-degassed mixed solution (S950). The mixed solution is applied to an object having a flat surface, such as a plate (not shown) in which a manufacturing device or the like is disposed in a separate place.

The mixed liquid to which the manufacturing device is applied is molded (S960). A manufacturing apparatus or the like molds a mixed solution applied to a plate (not shown) or the like into a thin film having a predetermined thickness.

A manufacturing device or the like cures the molded mixed solution (S970).

A manufacturing device or the like processes the cured mixture into a predetermined shape (S980). The phosphor film 510 is fixed by a holder 550 to be described later. Accordingly, the manufacturing apparatus or the like processes the cured mixture into a shape having a predetermined shape so that the phosphor film 510 can be fixed in the holder 550.

The phosphor film 510 manufactured by this process is implemented in the shape of a photograph shown in FIGS. 10 and 11.

10 is a photograph showing a phosphor film according to an embodiment of the present invention.

Fig. 10(a) is a photograph of a state in which YAG, a type of phosphor, is manufactured as a phosphor film, and Fig. 10(b) is a state in which silicate yellow, a type of phosphor, is manufactured as a phosphor film. This is a picture taken.

10(a) and (b), it can be seen that the phosphor film 510 is implemented in the form of a thin film having a preset thickness, and is processed into a rectangular shape by a manufacturing apparatus or the like as it is fixed to the holder 550. have. The phosphor film 510 has a different color density depending on the content of the phosphor powder, which will be described later with reference to FIG. 11.

11 is a photograph showing a phosphor film when the mixing ratio of the phosphor powder is varied according to an embodiment of the present invention.

11 (a) to (c) are photographs of a state in which YAG, which is a kind of phosphor, is manufactured as a phosphor film 510.

FIG. 11(a) is a phosphor film 510 containing 0.5 wt% of YAG phosphor powder, and FIG. 11(b) is a phosphor film 510 containing 2.5 wt% of YAG phosphor powder to be. And Figure 11(c) is a phosphor film 510 in which the YAG phosphor powder is contained in an amount of 6.0 wt%.

As shown in FIG. 11, it can be seen that as the content of the phosphor powder increases, the color density of the phosphor film 510 increases. As the phosphor powder content increases, the number of phosphor particles per unit area of the phosphor film 510 increases, and thus, the distance between the phosphor particles and the particles decreases. As described above, as the distance between the particles and the particles is narrowed, the phenomenon of reabsorption of the light source between the phosphor particles increases, and thus, distortion of the optical property data may occur. This will be described with reference to FIG. 12.

12 is a graph showing optical characteristic spectra of phosphor films measured at different mixing ratios of phosphor powders according to an embodiment of the present invention.

FIG. 12(a) is a graph showing the optical characteristic spectrum of YAG, a type of phosphor, and FIG. 12(b) is a graph showing the optical characteristic spectrum of silicate yellow, a type of phosphor.

Referring to FIGS. 12A and 12B, it can be seen that the degree of distortion of the data is different according to the content of the phosphor powder contained in the phosphor film 510.

When measuring the optical characteristics of the phosphor 110 in a powder state contained in the quartz plate 140 using the conventional optical characteristic measuring apparatus 100, it can be seen that the most distortion of data occurs. This is because the distance between the particles 310 in the phosphor powder 110 and the surrounding particles 320 is very narrow, so that a phenomenon of reabsorption of a light source between the particles 310 and 320 in the phosphor 110 actively occurs. On the other hand, in the case of the phosphor film 510, since the number of phosphor particles existing per unit area is small, the probability of reabsorption of the light source reflected from one phosphor particle by other particles around it is significantly reduced. Accordingly, the short wavelength region of the emission spectrum of the phosphor film 510 is expanded. However, the degree of expansion of the short wavelength region differs depending on the type of phosphor. As mentioned in FIG. 4, in the case of a YAG phosphor having a relatively large absorption rate compared to other phosphors in the overlapped region of the emission and the emission, the phosphor powder and the phosphor film ( 510), the difference appears as large as 8%. On the other hand, in the case of a silicate yellow phosphor having a relatively low absorption rate compared to other phosphors in the overlapped region of the excitation and the emission, the phosphor powder and the phosphor film 510 ), the difference is about 3%, which is within the level of not having a large error range. Although the error range appears different depending on the type of phosphor, it can be seen that the optical property data is more accurate when the phosphor is manufactured with the phosphor film 510 and measured.

FIG. 13 is a graph showing emission spectra when a YAG phosphor was measured in a powder state and in a film state, and FIG. 14 is a graph showing an emission spectrum when a silicate yellow phosphor was measured in a powder state and a film. It is a graph showing the emission spectrum when measured in the state.

FIG. 13(a) is a graph comparing the spectrum obtained by measuring the YAG phosphor in a powder state with a reference value, and (b) is a graph showing a phosphor film containing 0.5 wt% of the YAG phosphor powder. It is a graph comparing the spectrum measured by the measuring device 500 and a reference value. 14(a) and (b), the difference between the measured value and the reference value is when optical properties are measured using a phosphor film 510 containing 0.5 wt% of YAG phosphor powder. You can see that there is less difference. As described above, when the phosphor is manufactured as the phosphor film 510 and the optical properties are measured using it, the probability of reabsorption of the light source between the phosphor particles contained in the phosphor film 510 is lowered. You can be provided with accurate data on the characteristics.

Similarly, Figure 14 (a) is a graph comparing the spectrum and the reference value when the silicate yellow (Silicate Yellow) phosphor is measured in a powder state, (b) is a silicate yellow (Silicate Yellow) phosphor powder containing 0.5wt% It is a graph in which the spectrum obtained when the obtained phosphor film is measured by the optical property measuring apparatus 500 is compared with a reference value. As compared with FIG. 13, it can be seen that the optical characteristic spectrum of the phosphor film 510 containing 0.5 wt% of the silicate yellow phosphor powder is not significantly different from that of the powder state. However, it can be seen that the optical characteristic spectrum of the phosphor film 510 containing 0.5 wt% of the silicate yellow phosphor powder is more similar to the reference value.

15 is a flowchart illustrating a process of measuring optical properties of a phosphor using the optical property measuring apparatus using a phosphor film according to an embodiment of the present invention.

A method of measuring the optical properties of the phosphor using the phosphor film 510 by the optical property measuring apparatus 500 has been described in detail with reference to FIGS. 5 to 14, and thus detailed descriptions will be omitted.

The optical characteristic measuring device 500 measures a reference value (S1510). As a transparent film (not shown) that does not contain a phosphor is fixed to the holder 550, the optical property measurement device 500 irradiates an excitation light source with a transparent film (not shown) that does not contain a phosphor. The excitation light source is absorbed into a transparent film (not shown) that does not contain a phosphor, and at this time, the amount of light other than the amount of light absorbed is set as a reference value. However, since the thickness of the transparent film (not shown) that does not contain a phosphor is very thin (about 150 μm) and has a high transmittance, the value measured by irradiating the light source in the state that nothing is fixed to the holder 550 can also be set as a reference value. I can. Here, the holder 550 can be moved in a right angle direction by the components in the optical property measuring device 500, and a user or the like manipulates the components in the optical property measuring device 500, so that the phosphor film ( The reference value can be measured even when 510) is fixed.

The optical characteristic measuring device 500 irradiates a light source with the phosphor film 510 fixed to the holder 550 (S1520).

The optical property measuring device 500 totally reflects the light reflected from the phosphor film 510 (S1530).

The optical characteristic measuring device 500 transmits the total reflected light to the detector 560 (S1540).

The optical characteristic measuring apparatus 500 outputs optical characteristics of the phosphor film 510 as a spectrum using the detector 560 (S1550).

In FIGS. 9 and 15, it is described that each process is sequentially executed, but this is merely illustrative of the technical idea of an embodiment of the present invention. In other words, a person of ordinary skill in the art to which an embodiment of the present invention belongs can change the order of the processes described in each drawing without departing from the essential characteristics of the embodiment of the present invention, or perform one or more of the processes. Since the process is executed in parallel and can be applied by various modifications and modifications, FIGS. 9 and 15 are not limited to a time-series order.

Meanwhile, the processes shown in FIGS. 9 and 15 can be implemented as computer-readable codes on a computer-readable recording medium. The computer-readable recording medium includes all types of recording devices that store data that can be read by a computer system. That is, the computer-readable recording medium is a magnetic storage medium (e.g., ROM, floppy disk, hard disk, etc.), optical reading medium (e.g., CD-ROM, DVD, etc.), and carrier wave (e.g., Internet It includes a storage medium such as (transmitted through). In addition, the computer-readable recording medium can be distributed over a computer system connected through a network to store and execute computer-readable codes in a distributed manner.

The above description is merely illustrative of the technical idea of the present embodiment, and those of ordinary skill in the technical field to which the present embodiment pertains will be able to make various modifications and variations without departing from the essential characteristics of the present embodiment. Accordingly, the present embodiments are not intended to limit the technical idea of the present embodiment, but to explain the technical idea, and the scope of the technical idea of the present embodiment is not limited by these embodiments. The scope of protection of this embodiment should be interpreted by the following claims, and all technical ideas within the scope equivalent thereto should be construed as being included in the scope of the present embodiment.

100: conventional optical property measurement device
110, 210: phosphor
120: light source unit
130: Monochromator
140: plate
150: integrating sphere
160: optical fiber
170: detector
180: server
310, 320: phosphor particles
500: optical property measurement device
510: phosphor film
520: housing
530: light source unit
540: integrating sphere
542: first through hole
544: second through hole
550: holder
560: detector
810: through hole
820: support

Claims (14)

In the optical property measuring device for measuring the optical properties of the phosphor film by irradiating light with a thin-film phosphor film,
A light source unit for irradiating light of a preset wavelength band;
An integrating sphere that is implemented in a spherical shape including a hollow, and totally reflects the light irradiated from the light source unit and reflected by the phosphor film with a uniform light intensity;
A holder disposed inside the integrating sphere to place the phosphor film; And
A detector for receiving the light totally reflected by the integrating sphere, and detecting an optical characteristic spectrum of the light,
The integrating sphere is
A first through hole flowing into the integrating sphere so that the light irradiated from the light source unit can be irradiated to the phosphor film; And
And a second through hole which is aligned so as not to lie in a straight line with the first through hole, and guides the light reflected by the phosphor film and then totally reflected by the integrating sphere to the detector,
The holder,
A support part for placing one end of the phosphor film and fixing the phosphor film to the holder; And
It includes a through hole through one end of the phosphor film to allow the phosphor film to be placed in the support,
The detector is formed at a position facing the second through hole to receive light emitted from the second through hole, and includes a spectrometer to implement the characteristics of the emitted light in a spectral form.
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