KR102253018B1 - 진공 챔버 내에서 사용하기 위한 캐리어, 진공 챔버 내의 이송 어레인지먼트를 테스트하기 위한 시스템, 진공 프로세싱 시스템, 및 진공 챔버 내의 이송 어레인지먼트를 테스트하기 위한 방법 - Google Patents
진공 챔버 내에서 사용하기 위한 캐리어, 진공 챔버 내의 이송 어레인지먼트를 테스트하기 위한 시스템, 진공 프로세싱 시스템, 및 진공 챔버 내의 이송 어레인지먼트를 테스트하기 위한 방법 Download PDFInfo
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- KR102253018B1 KR102253018B1 KR1020197008803A KR20197008803A KR102253018B1 KR 102253018 B1 KR102253018 B1 KR 102253018B1 KR 1020197008803 A KR1020197008803 A KR 1020197008803A KR 20197008803 A KR20197008803 A KR 20197008803A KR 102253018 B1 KR102253018 B1 KR 102253018B1
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/6776—Continuous loading and unloading into and out of a processing chamber, e.g. transporting belts within processing chambers
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Abstract
Description
도 1a 및 도 1b는 본원에서 설명되는 실시예들에 따른, 진공 챔버 내에서 사용하기 위한 캐리어의 개략도들을 도시하고;
도 2a 및 도 2b는 본원에서 설명되는 실시예들에 따른, 캐리어 및 이송 어레인지먼트의 개략도들을 도시하고;
도 3은 본원에서 설명되는 실시예들에 따른 진공 프로세싱 시스템의 개략도를 도시하고; 그리고
도 4는 본원에서 설명되는 실시예들에 따라, 진공 챔버 내의 이송 어레인지먼트를 테스트하기 위한 방법의 흐름도를 도시한다.
Claims (15)
- 캐리어의 본질적으로 수직 배향으로 진공 챔버 내에서의 트랙을 따르는 이송을 위한 캐리어로서, 상기 캐리어는
바디;
상기 트랙의 결함있는 또는 오정렬된 섹션을 식별하기 위한, 상기 바디에 연결된 하나 이상의 모션 센서들; 및
상기 진공 챔버 내에서의 상기 캐리어의 이송을 위해 상기 트랙과 기계적으로 접촉하도록 구성된 하나 이상의 접촉 엘리먼트들을 포함하는,
캐리어. - 캐리어의 본질적으로 수직 배향으로 진공 챔버 내에서의 트랙을 따르는 이송을 위한 캐리어로서, 상기 캐리어는
상기 트랙의 결함있는 또는 오정렬된 섹션을 식별하기 위한, 상기 캐리어에 작용하는 운동량(momentum) 및 상기 캐리어의 가속도 중 적어도 하나를 검출하도록 구성된 하나 이상의 모션 센서들; 및
상기 진공 챔버 내에서의 상기 캐리어의 이송을 위해 상기 트랙과 기계적으로 접촉하도록 구성된 하나 이상의 접촉 엘리먼트들을 포함하는,
캐리어. - 제1 항 또는 제2 항에 있어서,
상기 하나 이상의 모션 센서들은 가속도 센서들인,
캐리어. - 제1 항 또는 제2 항에 있어서,
상기 하나 이상의 모션 센서들에 연결되는 통신 디바이스를 더 포함하는,
캐리어. - 제4 항에 있어서,
상기 통신 디바이스는 상기 하나 이상의 모션 센서들에 의해 제공되는 모션 데이터를 외부 디바이스에 송신하도록 구성되는,
캐리어. - 제1 항 또는 제2 항에 있어서,
상기 캐리어는 기판 또는 마스크를 운반하도록 구성되지 않은 테스트 캐리어인,
캐리어. - 진공 챔버 내의 이송 어레인지먼트를 테스트하기 위한 시스템으로서,
하나 이상의 모션 센서들을 갖는 캐리어로서, 상기 캐리어는 캐리어의 본질적으로 수직 배향으로 진공 챔버 내에서의 트랙을 따르는 이송을 위해 구성되고, 상기 진공 챔버 내에서의 상기 캐리어의 이송을 위해 상기 트랙과 기계적으로 접촉하도록 구성된 하나 이상의 접촉 엘리먼트들을 포함하는 것인, 캐리어; 및
상기 트랙의 결함있는 또는 오정렬된 섹션을 식별하기 위해, 상기 하나 이상의 모션 센서들에 의해 제공된 모션 데이터를 분석하도록 구성된 프로세서 디바이스를 포함하는,
시스템. - 제7 항에 있어서,
상기 캐리어는 제1 항 또는 제2 항에 따라 구성되는,
시스템. - 진공 프로세싱 시스템으로서,
진공 챔버;
제1 항 또는 제2 항의 캐리어; 및
상기 진공 챔버 내에서의 상기 캐리어의 이송을 위해 구성된 이송 어레인지먼트를 포함하는,
진공 프로세싱 시스템. - 진공 챔버 내의 이송 어레인지먼트를 테스트하기 위한 방법으로서,
상기 진공 챔버 내의 트랙을 따라, 하나 이상의 모션 센서들을 갖는 캐리어를 이동시키는 단계로서, 상기 캐리어는 본질적으로 수직 배향을 가지고, 상기 캐리어는 상기 진공 챔버 내에서의 상기 캐리어의 이송을 위해 상기 트랙과 기계적으로 접촉하도록 구성된 하나 이상의 접촉 엘리먼트들을 더 포함하는 것인, 단계; 및
상기 트랙의 결함있는 또는 오정렬된 섹션을 식별하기 위해, 상기 하나 이상의 모션 센서들에 의해 제공된 센서 신호들을 분석하는 단계를 포함하는,
방법. - 제10 항에 있어서,
상기 센서 신호들을 분석하는 단계는, 상기 캐리어의 가속도 특징들을 결정하는 단계를 포함하는,
방법. - 제10 항 또는 제11 항에 있어서,
상기 센서 신호들을 분석하는 단계는, 상기 캐리어에 대한 충격들을 결정하는 단계를 포함하는,
방법. - 제12 항에 있어서,
적어도 하나의 충격이, 설정된 임계치를 초과하는 경우, 상기 트랙의 결함있는 컨디션을 결정하는 단계를 더 포함하는,
방법. - 삭제
- 삭제
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PCT/EP2017/077300 WO2019081010A1 (en) | 2017-10-25 | 2017-10-25 | SUPPORT FOR USE IN A VACUUM CHAMBER, SYSTEM FOR TESTING A TRANSPORT ARRANGEMENT IN A VACUUM CHAMBER, VACUUM PROCESSING SYSTEM AND METHOD FOR TESTING A TRANSPORT ARRANGEMENT IN A VACUUM CHAMBER |
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KR20190053864A KR20190053864A (ko) | 2019-05-20 |
KR102253018B1 true KR102253018B1 (ko) | 2021-05-17 |
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CN114641435A (zh) * | 2020-05-13 | 2022-06-17 | 应用材料公司 | 辊子运输系统载体、辊子运输系统和真空处理装置 |
CN115103926B (zh) * | 2020-05-13 | 2024-10-18 | 应用材料公司 | 用于辊运输系统的载体、辊运输系统和具有辊运输系统的真空处理设备 |
JP7216752B2 (ja) * | 2021-02-08 | 2023-02-01 | キヤノントッキ株式会社 | 計測装置、インライン型蒸着装置および調整方法 |
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