KR102187752B1 - 박리 방법 및 박리 장치 - Google Patents
박리 방법 및 박리 장치 Download PDFInfo
- Publication number
- KR102187752B1 KR102187752B1 KR1020140051827A KR20140051827A KR102187752B1 KR 102187752 B1 KR102187752 B1 KR 102187752B1 KR 1020140051827 A KR1020140051827 A KR 1020140051827A KR 20140051827 A KR20140051827 A KR 20140051827A KR 102187752 B1 KR102187752 B1 KR 102187752B1
- Authority
- KR
- South Korea
- Prior art keywords
- layer
- substrate
- peeling
- light
- film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000000926 separation method Methods 0.000 title 2
- 239000000758 substrate Substances 0.000 claims abstract description 269
- 238000000034 method Methods 0.000 claims abstract description 80
- 239000000463 material Substances 0.000 claims description 47
- 239000011148 porous material Substances 0.000 claims 1
- 238000001179 sorption measurement Methods 0.000 abstract description 30
- 238000004519 manufacturing process Methods 0.000 abstract description 29
- 239000010410 layer Substances 0.000 description 454
- 239000010408 film Substances 0.000 description 86
- 239000012790 adhesive layer Substances 0.000 description 41
- 229920005989 resin Polymers 0.000 description 34
- 239000011347 resin Substances 0.000 description 34
- 239000004065 semiconductor Substances 0.000 description 23
- 238000007789 sealing Methods 0.000 description 22
- 239000011368 organic material Substances 0.000 description 21
- 239000000956 alloy Substances 0.000 description 18
- 239000007769 metal material Substances 0.000 description 18
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 18
- 229910052721 tungsten Inorganic materials 0.000 description 18
- 239000010937 tungsten Substances 0.000 description 18
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 16
- 238000010586 diagram Methods 0.000 description 15
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 11
- 229910045601 alloy Inorganic materials 0.000 description 11
- 230000000903 blocking effect Effects 0.000 description 11
- 229910044991 metal oxide Inorganic materials 0.000 description 11
- 150000004706 metal oxides Chemical class 0.000 description 11
- 239000011733 molybdenum Substances 0.000 description 11
- 125000006850 spacer group Chemical group 0.000 description 11
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 10
- 229910052751 metal Inorganic materials 0.000 description 10
- 239000002184 metal Substances 0.000 description 10
- 229910052750 molybdenum Inorganic materials 0.000 description 10
- 239000011810 insulating material Substances 0.000 description 9
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 8
- 229910052581 Si3N4 Inorganic materials 0.000 description 8
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 8
- 229910052782 aluminium Inorganic materials 0.000 description 8
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 8
- 239000011521 glass Substances 0.000 description 8
- 239000012535 impurity Substances 0.000 description 8
- 229910052759 nickel Inorganic materials 0.000 description 8
- 239000002245 particle Substances 0.000 description 8
- 229910052710 silicon Inorganic materials 0.000 description 8
- 239000010703 silicon Substances 0.000 description 8
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 8
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 8
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 7
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 7
- 239000010949 copper Substances 0.000 description 7
- 239000007789 gas Substances 0.000 description 7
- 238000007639 printing Methods 0.000 description 7
- 229910052719 titanium Inorganic materials 0.000 description 7
- 239000010936 titanium Substances 0.000 description 7
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 6
- 238000000576 coating method Methods 0.000 description 6
- 229910052802 copper Inorganic materials 0.000 description 6
- 238000005530 etching Methods 0.000 description 6
- 230000035699 permeability Effects 0.000 description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 6
- 229910052709 silver Inorganic materials 0.000 description 6
- 239000004332 silver Substances 0.000 description 6
- 239000002356 single layer Substances 0.000 description 6
- 229910001316 Ag alloy Inorganic materials 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 5
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 5
- 238000005520 cutting process Methods 0.000 description 5
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 5
- 229910052737 gold Inorganic materials 0.000 description 5
- 239000010931 gold Substances 0.000 description 5
- 239000001257 hydrogen Substances 0.000 description 5
- 229910052739 hydrogen Inorganic materials 0.000 description 5
- 230000001976 improved effect Effects 0.000 description 5
- 229910052760 oxygen Inorganic materials 0.000 description 5
- 239000001301 oxygen Substances 0.000 description 5
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 5
- 238000004544 sputter deposition Methods 0.000 description 5
- 239000011787 zinc oxide Substances 0.000 description 5
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 4
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 4
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 4
- 229910052779 Neodymium Inorganic materials 0.000 description 4
- 229910052804 chromium Inorganic materials 0.000 description 4
- 239000011651 chromium Substances 0.000 description 4
- 238000004140 cleaning Methods 0.000 description 4
- 239000003822 epoxy resin Substances 0.000 description 4
- 239000007788 liquid Substances 0.000 description 4
- 239000011777 magnesium Substances 0.000 description 4
- 239000000203 mixture Substances 0.000 description 4
- QEFYFXOXNSNQGX-UHFFFAOYSA-N neodymium atom Chemical compound [Nd] QEFYFXOXNSNQGX-UHFFFAOYSA-N 0.000 description 4
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 4
- 229920000647 polyepoxide Polymers 0.000 description 4
- 229920001721 polyimide Polymers 0.000 description 4
- 239000000243 solution Substances 0.000 description 4
- 238000007740 vapor deposition Methods 0.000 description 4
- 239000004925 Acrylic resin Substances 0.000 description 3
- 229920000178 Acrylic resin Polymers 0.000 description 3
- 229910000838 Al alloy Inorganic materials 0.000 description 3
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 3
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 3
- 229910000861 Mg alloy Inorganic materials 0.000 description 3
- 229910021417 amorphous silicon Inorganic materials 0.000 description 3
- 229910017052 cobalt Inorganic materials 0.000 description 3
- 239000010941 cobalt Substances 0.000 description 3
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- 230000006866 deterioration Effects 0.000 description 3
- 238000009792 diffusion process Methods 0.000 description 3
- 238000000605 extraction Methods 0.000 description 3
- 229910052733 gallium Inorganic materials 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 229910003437 indium oxide Inorganic materials 0.000 description 3
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 3
- 229910052763 palladium Inorganic materials 0.000 description 3
- 238000009832 plasma treatment Methods 0.000 description 3
- 229910052814 silicon oxide Inorganic materials 0.000 description 3
- 229910052715 tantalum Inorganic materials 0.000 description 3
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 3
- 229920001187 thermosetting polymer Polymers 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- 239000011701 zinc Substances 0.000 description 3
- YVTHLONGBIQYBO-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) Chemical compound [O--].[Zn++].[In+3] YVTHLONGBIQYBO-UHFFFAOYSA-N 0.000 description 3
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 2
- -1 ITO Chemical compound 0.000 description 2
- GQPLMRYTRLFLPF-UHFFFAOYSA-N Nitrous Oxide Chemical compound [O-][N+]#N GQPLMRYTRLFLPF-UHFFFAOYSA-N 0.000 description 2
- 239000004642 Polyimide Substances 0.000 description 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 2
- 239000012298 atmosphere Substances 0.000 description 2
- DQXBYHZEEUGOBF-UHFFFAOYSA-N but-3-enoic acid;ethene Chemical compound C=C.OC(=O)CC=C DQXBYHZEEUGOBF-UHFFFAOYSA-N 0.000 description 2
- 238000011109 contamination Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 239000002274 desiccant Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000005038 ethylene vinyl acetate Substances 0.000 description 2
- 239000000945 filler Substances 0.000 description 2
- 229910052732 germanium Inorganic materials 0.000 description 2
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 2
- 230000005525 hole transport Effects 0.000 description 2
- 150000002431 hydrogen Chemical class 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 229910052742 iron Inorganic materials 0.000 description 2
- 239000012528 membrane Substances 0.000 description 2
- 239000002923 metal particle Substances 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- MWUXSHHQAYIFBG-UHFFFAOYSA-N nitrogen oxide Inorganic materials O=[N] MWUXSHHQAYIFBG-UHFFFAOYSA-N 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 239000005011 phenolic resin Substances 0.000 description 2
- 238000000206 photolithography Methods 0.000 description 2
- 239000000049 pigment Substances 0.000 description 2
- 229910052697 platinum Inorganic materials 0.000 description 2
- 229920001200 poly(ethylene-vinyl acetate) Polymers 0.000 description 2
- 229920002037 poly(vinyl butyral) polymer Polymers 0.000 description 2
- 239000009719 polyimide resin Substances 0.000 description 2
- 229920000915 polyvinyl chloride Polymers 0.000 description 2
- 239000004800 polyvinyl chloride Substances 0.000 description 2
- 229910052706 scandium Inorganic materials 0.000 description 2
- SIXSYDAISGFNSX-UHFFFAOYSA-N scandium atom Chemical compound [Sc] SIXSYDAISGFNSX-UHFFFAOYSA-N 0.000 description 2
- 238000007650 screen-printing Methods 0.000 description 2
- 229920002050 silicone resin Polymers 0.000 description 2
- 238000005406 washing Methods 0.000 description 2
- 229910052725 zinc Inorganic materials 0.000 description 2
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical compound [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 229910000881 Cu alloy Inorganic materials 0.000 description 1
- 229910001182 Mo alloy Inorganic materials 0.000 description 1
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 1
- 229910001252 Pd alloy Inorganic materials 0.000 description 1
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
- 229910006404 SnO 2 Inorganic materials 0.000 description 1
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 1
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 description 1
- 229910001080 W alloy Inorganic materials 0.000 description 1
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 239000005407 aluminoborosilicate glass Substances 0.000 description 1
- 239000005354 aluminosilicate glass Substances 0.000 description 1
- QGZKDVFQNNGYKY-UHFFFAOYSA-N ammonia Natural products N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 1
- 229910052788 barium Inorganic materials 0.000 description 1
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 description 1
- QVQLCTNNEUAWMS-UHFFFAOYSA-N barium oxide Chemical compound [Ba]=O QVQLCTNNEUAWMS-UHFFFAOYSA-N 0.000 description 1
- UMIVXZPTRXBADB-UHFFFAOYSA-N benzocyclobutene Chemical compound C1=CC=C2CCC2=C1 UMIVXZPTRXBADB-UHFFFAOYSA-N 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000005388 borosilicate glass Substances 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 238000004299 exfoliation Methods 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 229910021389 graphene Inorganic materials 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 150000002484 inorganic compounds Chemical class 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 229910052741 iridium Inorganic materials 0.000 description 1
- GKOZUEZYRPOHIO-UHFFFAOYSA-N iridium atom Chemical compound [Ir] GKOZUEZYRPOHIO-UHFFFAOYSA-N 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 229910052746 lanthanum Inorganic materials 0.000 description 1
- FZLIPJUXYLNCLC-UHFFFAOYSA-N lanthanum atom Chemical compound [La] FZLIPJUXYLNCLC-UHFFFAOYSA-N 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 239000011259 mixed solution Substances 0.000 description 1
- 229910052758 niobium Inorganic materials 0.000 description 1
- 239000010955 niobium Substances 0.000 description 1
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 239000001272 nitrous oxide Substances 0.000 description 1
- 238000007645 offset printing Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 229910052762 osmium Inorganic materials 0.000 description 1
- SYQBFIAQOQZEGI-UHFFFAOYSA-N osmium atom Chemical compound [Os] SYQBFIAQOQZEGI-UHFFFAOYSA-N 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 239000012466 permeate Substances 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229920006122 polyamide resin Polymers 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 229910052703 rhodium Inorganic materials 0.000 description 1
- 239000010948 rhodium Substances 0.000 description 1
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 1
- 229910001887 tin oxide Inorganic materials 0.000 description 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B38/00—Ancillary operations in connection with laminating processes
- B32B38/10—Removing layers, or parts of layers, mechanically or chemically
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B43/00—Operations specially adapted for layered products and not otherwise provided for, e.g. repairing; Apparatus therefor
- B32B43/006—Delaminating
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B38/00—Ancillary operations in connection with laminating processes
- B32B38/18—Handling of layers or the laminate
- B32B38/1858—Handling of layers or the laminate using vacuum
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B41/00—Arrangements for controlling or monitoring lamination processes; Safety arrangements
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/19—Delaminating means
- Y10T156/1928—Differential fluid pressure delaminating means
- Y10T156/1944—Vacuum delaminating means [e.g., vacuum chamber, etc.]
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Electroluminescent Light Sources (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Folding Of Thin Sheet-Like Materials, Special Discharging Devices, And Others (AREA)
- Thin Film Transistor (AREA)
Abstract
물체가 형성된 제 1 기판에 제 2 기판을 접합하고, 이를 흡착 능력에 부분적으로 차이가 있는 흡착 척(흡착 스테이지, 진공 척이라고도 함) 또는 그것과 동등한 기능을 갖는 것을 사용하여 흡착 고정하고, 제 1 기판으로부터 제 2 기판을 박리함으로써 제 1 기판으로부터 물체를 박리하여 제 2 기판에 물체를 전재하는 제조 방법이다. 또한 이를 위한 장치다. 흡착 척 또는 그것과 동등한 기능을 갖는 것의 기판 고정면에는 흡착용 마이크로구멍이 제공된 부분과 흡착용 마이크로구멍이 제공되지 않는 부분이 있고 흡착용 마이크로구멍이 제공된 부분이 복수 개소에 있음으로써 1장의 제 1 기판으로부터 복수의 물체를 제 2 기판에 전재할 수 있다.
Description
도 2는 기판 홀더의 예를 도시한 도면.
도 3은 기판 홀더의 예를 도시한 도면.
도 4는 기판 홀더의 예를 도시한 도면.
도 5는 전자 기기의 제조 방법예를 도시한 도면.
도 6은 전자 기기의 제조 방법예를 도시한 도면.
도 7은 전자 기기의 제조 방법예를 도시한 도면.
도 8은 전자 기기의 제조 방법예를 도시한 도면.
도 9는 전자 기기의 제조 방법예를 도시한 도면.
도 10은 전자 기기의 제조 방법예를 도시한 도면.
도 11은 전자 기기의 제조 방법예를 도시한 도면.
도 12는 전자 기기의 제조 방법예를 도시한 도면.
도 13은 전자 기기의 제조 방법예를 도시한 도면.
도 14는 전자 기기의 제조 방법예를 도시한 도면.
도 15는 본 발명의 일 형태에 따른 발광 장치의 일례를 도시한 도면.
도 16은 본 발명의 일 형태에 따른 발광 장치의 일례를 도시한 도면.
도 17은 본 발명의 일 형태에 따른 발광 장치의 일례를 도시한 도면.
도 18은 본 발명의 일 형태에 따른 발광 장치의 일례를 도시한 도면.
102: 흡착용 구멍
103: 기판 홀더
104: 흡착용 마이크로구멍
105: 구멍이 제공되지 않는 부분
106: 오목부
107: 홈
108: 흡반
109: 롤러
110: 후크
111: 기판 홀더
200: 접합 기판
201: 제 1 기판
202: 제 1 박리층
203: 제 1 소자층
204: 제 1 접착층
205: 제 2 기판
206: 제 2 소자층
207: 제 2 박리층
208: 제 2 접착층
209: 필름 기판
210: 절결부
211: 스크라이브 홈
212: 제 1 소자 기판
213: 제 2 소자 기판
214: 가요성 인쇄 회로
215: 가요성 인쇄 회로
216: 절결부
301: 소자층
302: 유기 재료층
303: 광 추출부
304: 구동 회로부
305: 가요성 인쇄 회로
305a: 가요성 인쇄 회로
305b: 가요성 인쇄 회로
306: 도전층
307: 도전층
308: 기판
309: 기판
310: 접착층
311: 절연층
312: 절연층
313: 도전층
314: 절연층
314a: 절연층
314b: 절연층
315: 절연층
316: 도전층
317: 밀봉층
318: 접속체
318a: 접속체
318b: 접속체
319: 스페이서
320: 발광 소자
321: 하부 전극
322: EL층
323: 상부 전극
324: 트랜지스터
325: 절연층
326: 차광층
327: 착색층
328: 절연층
329: 도전층
330: p형 반도체층
331: 도전층
332: i형 반도체층
333: 도전층
334: n형 반도체층
335: 절연층
336: 절연층
337: 도전층
338: 도전층
339: 도전층
340: 절연층
341: 도전성 입자
342: 절연층
343: 도전층
344: 절연층
345: 도전층
346a: 도전층
346b: 도전층
Claims (20)
- 박리 방법에 있어서,
제 1 기판, 제 2 기판, 및 상기 제 1 기판과 상기 제 2 기판 사이의 박리층을 포함하는 접합 기판을 형성하는 단계;
상기 제 2 기판의 일부를 둘러싸도록 상기 제 2 기판에 홈을 형성하는 단계;
상기 제 2 기판의 상기 일부를 제 1 표면의 제 1 부분에 배치하는 단계;
흡인력에 의하여 상기 제 1 표면에 상기 접합 기판을 고정하는 단계; 및
상기 박리층을 따라 상기 제 2 기판의 상기 일부로부터 상기 제 1 기판을 박리하는 단계를 포함하고,
상기 제 1 표면은 상기 제 1 부분을 둘러싸는 제 2 부분을 더 포함하고,
상기 제 1 부분의 흡인력은 상기 제 2 부분의 흡인력보다 큰, 박리 방법. - 삭제
- 삭제
- 제 1 항에 있어서,
상기 제 1 부분은 복수의 구멍을 포함하고,
상기 제 2 부분은 구멍을 포함하지 않는, 박리 방법. - 삭제
- 삭제
- 삭제
- 삭제
- 박리 방법에 있어서,
제 1 기판, 제 2 기판, 및 상기 제 1 기판과 상기 제 2 기판 사이의 박리층을 포함하는 접합 기판을 형성하는 단계;
상기 제 2 기판의 일부를 둘러싸도록 상기 제 2 기판에 홈을 형성하는 단계;
상기 제 2 기판의 상기 일부를 제 1 표면의 제 1 부분에 배치하는 단계;
흡인력에 의하여 상기 제 1 표면에 상기 접합 기판을 고정하는 단계; 및
상기 박리층을 따라 상기 제 2 기판의 상기 일부로부터 상기 제 1 기판을 박리하는 단계를 포함하는, 박리 방법. - 제 1 항 또는 제 9 항에 있어서,
상기 제 2 기판과 상기 박리층 사이에 소자층이 제공되는, 박리 방법. - 제 10 항에 있어서,
상기 소자층과 상기 제 2 기판 각각은 가요성 재료를 포함하는, 박리 방법. - 제 9 항에 있어서,
상기 제 1 부분은 복수의 구멍을 포함하는, 박리 방법. - 제 1 항 또는 제 9 항에 있어서,
상기 제 1 표면과 반대의 제 2 표면에 오목부가 제공되는, 박리 방법. - 제 1 항 또는 제 9 항에 있어서,
상기 홈은 상기 박리층의 일부를 둘러싸는, 박리 방법. - 제 1 항 또는 제 9 항에 있어서,
상기 제 2 기판은 필름 기판인, 박리 방법. - 박리 장치에 있어서,
제 1 부분 및 제 2 부분을 포함하는 홀더; 및
배기 수단을 포함하고,
상기 제 1 부분은 복수의 구멍을 포함하고,
상기 제 2 부분은 구멍을 포함하지 않고,
상기 제 1 부분은 상기 제 2 부분에 의하여 분리되고,
상기 제 1 부분은 상기 복수의 구멍을 통하여 상기 배기 수단에 의하여 공기를 흡인하는, 박리 장치. - 제 16 항에 있어서,
상기 홀더는 상기 홀더의 표면에 오목부를 포함하는, 박리 장치. - 제 16 항에 있어서,
상기 홀더는 상기 홀더의 표면에 홈을 포함하고,
상기 복수의 구멍이 상기 홈과 겹치도록 제공되는, 박리 장치. - 제 16 항에 있어서,
상기 홀더와 상기 배기 수단 사이에 흡착 척을 더 포함하는, 박리 장치. - 삭제
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013097245 | 2013-05-07 | ||
JPJP-P-2013-097245 | 2013-05-07 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20140132276A KR20140132276A (ko) | 2014-11-17 |
KR102187752B1 true KR102187752B1 (ko) | 2020-12-07 |
Family
ID=51863937
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020140051827A Expired - Fee Related KR102187752B1 (ko) | 2013-05-07 | 2014-04-29 | 박리 방법 및 박리 장치 |
Country Status (4)
Country | Link |
---|---|
US (1) | US10155368B2 (ko) |
JP (2) | JP6468682B2 (ko) |
KR (1) | KR102187752B1 (ko) |
TW (1) | TWI658527B (ko) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20140147376A (ko) * | 2013-06-19 | 2014-12-30 | 삼성전자주식회사 | 적층형 컬러-깊이 센서 및 이를 채용한 3차원 영상 획득 장치 |
KR102437483B1 (ko) * | 2013-08-30 | 2022-08-26 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 적층의 가공 장치 및 가공 방법 |
KR102104334B1 (ko) * | 2013-09-04 | 2020-04-27 | 삼성디스플레이 주식회사 | 유기 발광 표시 장치의 제조방법 |
US9229481B2 (en) | 2013-12-20 | 2016-01-05 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
CN203910868U (zh) * | 2014-06-25 | 2014-10-29 | 京东方科技集团股份有限公司 | 一种激光剥离设备 |
JP6603486B2 (ja) | 2014-06-27 | 2019-11-06 | 株式会社半導体エネルギー研究所 | 発光装置の作製方法 |
KR102322479B1 (ko) * | 2015-02-25 | 2021-11-05 | 삼성디스플레이 주식회사 | 기판 분리장치 |
KR102409955B1 (ko) | 2015-08-25 | 2022-06-17 | 삼성디스플레이 주식회사 | 유기 발광 표시 패널 및 이의 제조 방법 |
US11114650B2 (en) * | 2017-10-26 | 2021-09-07 | Sakai Display Products Corporation | Method and apparatus for producing flexible OLED device including lift-off light irradiation |
WO2019215835A1 (ja) * | 2018-05-09 | 2019-11-14 | 堺ディスプレイプロダクト株式会社 | フレキシブル発光デバイスの製造方法および製造装置 |
JP6674591B1 (ja) * | 2018-05-09 | 2020-04-01 | 堺ディスプレイプロダクト株式会社 | フレキシブル発光デバイスの製造方法および製造装置 |
JP6694558B2 (ja) * | 2018-05-09 | 2020-05-13 | 堺ディスプレイプロダクト株式会社 | フレキシブル発光デバイスの製造方法および製造装置 |
KR102560167B1 (ko) * | 2018-10-04 | 2023-07-25 | 코닝 인코포레이티드 | 디본딩 서포트 장치 및 이를 이용한 디본딩 방법 |
CN111016402B (zh) * | 2019-12-17 | 2022-03-22 | 京东方科技集团股份有限公司 | 膜材剥离设备和膜材剥离方法 |
EP4459669A4 (en) | 2021-12-27 | 2025-05-14 | Mitsui Mining & Smelting Co., Ltd. | BLADE FASTENING DEVICE, BLADE DETACHING DEVICE AND BLADE DETACHING METHOD |
US12217121B2 (en) * | 2023-03-31 | 2025-02-04 | Torc Robotics, Inc. | Decoding and validation of machine-readable codes via multiple spectra of light |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005051117A (ja) | 2003-07-30 | 2005-02-24 | Oki Data Corp | 半導体装置の製造方法 |
Family Cites Families (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2802340B1 (fr) * | 1999-12-13 | 2003-09-05 | Commissariat Energie Atomique | Structure comportant des cellules photovoltaiques et procede de realisation |
TW564471B (en) | 2001-07-16 | 2003-12-01 | Semiconductor Energy Lab | Semiconductor device and peeling off method and method of manufacturing semiconductor device |
TWI272641B (en) | 2002-07-16 | 2007-02-01 | Semiconductor Energy Lab | Method of manufacturing a semiconductor device |
JP2004140267A (ja) | 2002-10-18 | 2004-05-13 | Semiconductor Energy Lab Co Ltd | 半導体装置およびその作製方法 |
CN102290422A (zh) | 2003-01-15 | 2011-12-21 | 株式会社半导体能源研究所 | 显示装置及其制造方法、剥离方法及发光装置的制造方法 |
US6913985B2 (en) * | 2003-06-20 | 2005-07-05 | Oki Data Corporation | Method of manufacturing a semiconductor device |
EP2259300B1 (en) | 2003-10-28 | 2020-04-08 | Semiconductor Energy Laboratory Co., Ltd. | Manufacture of semiconductor device |
US7229900B2 (en) | 2003-10-28 | 2007-06-12 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, method of manufacturing thereof, and method of manufacturing base material |
JP2006049800A (ja) | 2004-03-10 | 2006-02-16 | Seiko Epson Corp | 薄膜デバイスの供給体、薄膜デバイスの供給体の製造方法、転写方法、半導体装置の製造方法及び電子機器 |
US7452786B2 (en) | 2004-06-29 | 2008-11-18 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing thin film integrated circuit, and element substrate |
US7591863B2 (en) | 2004-07-16 | 2009-09-22 | Semiconductor Energy Laboratory Co., Ltd. | Laminating system, IC sheet, roll of IC sheet, and method for manufacturing IC chip |
WO2006011664A1 (en) | 2004-07-30 | 2006-02-02 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
US8698262B2 (en) | 2004-09-14 | 2014-04-15 | Semiconductor Energy Laboratory Co., Ltd. | Wireless chip and manufacturing method of the same |
US7307006B2 (en) | 2005-02-28 | 2007-12-11 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing semiconductor device |
WO2006123825A1 (en) | 2005-05-20 | 2006-11-23 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing method of semiconductor device |
US7456104B2 (en) | 2005-05-31 | 2008-11-25 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
US7972910B2 (en) | 2005-06-03 | 2011-07-05 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing method of integrated circuit device including thin film transistor |
US7510950B2 (en) | 2005-06-30 | 2009-03-31 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
US7465596B2 (en) | 2005-06-30 | 2008-12-16 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing method of semiconductor device |
US7723842B2 (en) | 2005-09-02 | 2010-05-25 | Semiconductor Energy Laboratory Co., Ltd | Integrated circuit device |
WO2007055142A1 (en) | 2005-11-11 | 2007-05-18 | Semiconductor Energy Laboratory Co., Ltd. | Layer having functionality, method for forming flexible substrate having the same, and method for manufacturing semiconductor device |
JP2007311590A (ja) | 2006-05-19 | 2007-11-29 | Seiko Epson Corp | 被転写物の転写方法、半導体装置の製造方法および転写装置 |
TWI379409B (en) | 2006-09-29 | 2012-12-11 | Semiconductor Energy Lab | Method for manufacturing semiconductor device |
CN102057488B (zh) | 2008-06-06 | 2013-09-18 | 株式会社半导体能源研究所 | 半导体装置的制造方法 |
US8766269B2 (en) * | 2009-07-02 | 2014-07-01 | Semiconductor Energy Laboratory Co., Ltd. | Light-emitting device, lighting device, and electronic device |
US8507322B2 (en) | 2010-06-24 | 2013-08-13 | Akihiro Chida | Semiconductor substrate and method for manufacturing semiconductor device |
JP5902406B2 (ja) | 2010-06-25 | 2016-04-13 | 株式会社半導体エネルギー研究所 | 分離方法および半導体装置の作製方法 |
JP2012215737A (ja) | 2011-04-01 | 2012-11-08 | Sony Corp | 電子デバイスおよび表示装置の製造方法 |
JP2013052998A (ja) * | 2011-09-06 | 2013-03-21 | Asahi Glass Co Ltd | 剥離装置、及び電子デバイスの製造方法 |
KR102250061B1 (ko) | 2013-04-15 | 2021-05-07 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 발광 장치 |
-
2014
- 2014-04-29 KR KR1020140051827A patent/KR102187752B1/ko not_active Expired - Fee Related
- 2014-05-06 TW TW103116087A patent/TWI658527B/zh not_active IP Right Cessation
- 2014-05-06 US US14/270,676 patent/US10155368B2/en active Active
- 2014-05-07 JP JP2014095740A patent/JP6468682B2/ja not_active Expired - Fee Related
-
2018
- 2018-12-18 JP JP2018236113A patent/JP2019080067A/ja not_active Withdrawn
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005051117A (ja) | 2003-07-30 | 2005-02-24 | Oki Data Corp | 半導体装置の製造方法 |
Also Published As
Publication number | Publication date |
---|---|
JP2014237545A (ja) | 2014-12-18 |
TWI658527B (zh) | 2019-05-01 |
TW201515133A (zh) | 2015-04-16 |
US10155368B2 (en) | 2018-12-18 |
US20140332150A1 (en) | 2014-11-13 |
JP2019080067A (ja) | 2019-05-23 |
JP6468682B2 (ja) | 2019-02-13 |
KR20140132276A (ko) | 2014-11-17 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR102187752B1 (ko) | 박리 방법 및 박리 장치 | |
JP7137670B2 (ja) | 発光装置 | |
KR20210052597A (ko) | 표시 장치 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 20140429 |
|
PG1501 | Laying open of application | ||
A201 | Request for examination | ||
PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 20190425 Comment text: Request for Examination of Application Patent event code: PA02011R01I Patent event date: 20140429 Comment text: Patent Application |
|
E902 | Notification of reason for refusal | ||
PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20200617 Patent event code: PE09021S01D |
|
E701 | Decision to grant or registration of patent right | ||
PE0701 | Decision of registration |
Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 20200901 |
|
GRNT | Written decision to grant | ||
PR0701 | Registration of establishment |
Comment text: Registration of Establishment Patent event date: 20201201 Patent event code: PR07011E01D |
|
PR1002 | Payment of registration fee |
Payment date: 20201201 End annual number: 3 Start annual number: 1 |
|
PG1601 | Publication of registration | ||
PC1903 | Unpaid annual fee |
Termination category: Default of registration fee Termination date: 20240912 |